JP7551061B2 - アナログデジタル変換回路 - Google Patents

アナログデジタル変換回路 Download PDF

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Publication number
JP7551061B2
JP7551061B2 JP2021576414A JP2021576414A JP7551061B2 JP 7551061 B2 JP7551061 B2 JP 7551061B2 JP 2021576414 A JP2021576414 A JP 2021576414A JP 2021576414 A JP2021576414 A JP 2021576414A JP 7551061 B2 JP7551061 B2 JP 7551061B2
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potential
capacitive
comparator
switch
charge
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Japanese (ja)
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JPWO2022102035A1 (https=
Inventor
秀樹 林
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Sanken Electric Co Ltd
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Sanken Electric Co Ltd
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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H03M1/466—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors
    • H03M1/468—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter using switched capacitors in which the input S/H circuit is merged with the feedback DAC array
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/06—Continuously compensating for, or preventing, undesired influence of physical parameters
    • H03M1/0602—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic
    • H03M1/0604—Continuously compensating for, or preventing, undesired influence of physical parameters of deviations from the desired transfer characteristic at one point, i.e. by adjusting a single reference value, e.g. bias or gain error
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/124—Sampling or signal conditioning arrangements specially adapted for A/D converters
    • H03M1/1245—Details of sampling arrangements or methods
    • H03M1/125—Asynchronous, i.e. free-running operation within each conversion cycle
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters
    • H03M1/34—Analogue value compared with reference values
    • H03M1/38—Analogue value compared with reference values sequentially only, e.g. successive approximation type
    • H03M1/46—Analogue value compared with reference values sequentially only, e.g. successive approximation type with digital/analogue converter for supplying reference values to converter
    • H03M1/462—Details of the control circuitry, e.g. of the successive approximation register

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Power Engineering (AREA)
  • Analogue/Digital Conversion (AREA)
JP2021576414A 2020-11-12 2020-11-12 アナログデジタル変換回路 Active JP7551061B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/042169 WO2022102035A1 (ja) 2020-11-12 2020-11-12 アナログデジタル変換回路

Publications (2)

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JPWO2022102035A1 JPWO2022102035A1 (https=) 2022-05-19
JP7551061B2 true JP7551061B2 (ja) 2024-09-17

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JP2021576414A Active JP7551061B2 (ja) 2020-11-12 2020-11-12 アナログデジタル変換回路

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US (1) US11757460B2 (https=)
JP (1) JP7551061B2 (https=)
CN (1) CN114766080B (https=)
WO (1) WO2022102035A1 (https=)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20240348260A1 (en) * 2023-04-14 2024-10-17 Skyworks Solutions, Inc. Capacitive digital-to-analog converters with shaped output current
CN120357902B (zh) * 2025-06-23 2025-09-02 灿芯半导体(苏州)有限公司 一种pvt稳定的逐次逼近型模数转换器

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001267925A (ja) 2000-03-17 2001-09-28 Matsushita Electric Ind Co Ltd 逐次比較型ａｄ変換器
WO2010010661A1 (ja) 2008-07-21 2010-01-28 株式会社アドバンテスト Ａｄ変換装置
JP2010245927A (ja) 2009-04-08 2010-10-28 Mitsumi Electric Co Ltd 逐次比較型ａｄ変換回路
JP2011199443A (ja) 2010-03-18 2011-10-06 Fujitsu Semiconductor Ltd 逐次比較型ａ／ｄコンバータ、および逐次比較型ａ／ｄコンバータの比較時間検出方法

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JPS5115363A (ja) 1974-07-29 1976-02-06 Hitachi Ltd Anaroguudejitaruhenkanki
JPS6198022A (ja) * 1984-10-19 1986-05-16 Matsushita Electric Ind Co Ltd 遂次比較方式アナログデイジタル変換装置
JPS62133821A (ja) 1985-12-05 1987-06-17 Matsushita Electric Ind Co Ltd アナログ・デジタル変換器
JPH05122076A (ja) * 1991-10-25 1993-05-18 Nec Corp アナログデイジタル変換器
JPH08116258A (ja) * 1994-10-18 1996-05-07 Toshiba Corp アナログデジタル変換回路
JP2006173807A (ja) * 2004-12-13 2006-06-29 Sanyo Electric Co Ltd アナログデジタル変換器
JP2010063055A (ja) * 2008-09-08 2010-03-18 Sony Corp 逐次比較型ａ／ｄ変換器、逐次比較型ａ／ｄ変換器の制御方法、固体撮像装置および撮像装置
JP5482158B2 (ja) * 2009-12-04 2014-04-23 ヤマハ株式会社 逐次比較ａ／ｄ変換器
US8786483B1 (en) * 2013-03-14 2014-07-22 Analog Devices Technology Use of a DLL to optimize an ADC performance
US9041584B2 (en) * 2013-09-03 2015-05-26 Silicon Laboratories Inc. Dual-path comparator and method
US8957802B1 (en) * 2013-09-13 2015-02-17 Cadence Design Systems, Inc. Metastability error detection and correction system and method for successive approximation analog-to-digital converters
KR101524982B1 (ko) * 2014-07-31 2015-06-03 중앙대학교 산학협력단 비동기식 연속 근사 레지스터 아날로그 디지털 변환기 및 그에 포함되는 내부 클럭 발생기
KR102276893B1 (ko) * 2015-09-24 2021-07-12 삼성전자주식회사 축차 근사 레지스터 아날로그 디지털 변환기와 이를 포함하는 반도체 장치
US9614540B1 (en) * 2015-11-06 2017-04-04 International Business Machines Corporation Asynchronously clocked successive approximation register analog-to-digital converter
US9621179B1 (en) * 2016-03-11 2017-04-11 Applied Micro Circuits Corporation Metastability error reduction in asynchronous successive approximation analog to digital converter
RU2695493C2 (ru) * 2016-05-31 2019-07-23 Общество с ограниченной ответственностью "Научно-производственное предприятие Тачскрин технологии" Проекционно-ёмкостная сенсорная панель и способ её изготовления
US9893740B1 (en) * 2017-01-13 2018-02-13 Semiconductor Components Industries, Llc Methods and apparatus for an analog-to-digital converter
JP6899287B2 (ja) * 2017-09-01 2021-07-07 株式会社日立製作所 逐次比較型アナログデジタル変換器
CN207427126U (zh) * 2017-09-28 2018-05-29 成都启英泰伦科技有限公司 一种提高模数转换器转换速度的电路
US10454492B1 (en) * 2018-06-19 2019-10-22 Analog Devices, Inc. Analog-to-digital converter speed calibration techniques
US10291251B1 (en) * 2018-09-21 2019-05-14 Semiconductor Components Industries, Llc Imaging systems with sub-radix-2 charge sharing successive approximation register (SAR) analog-to-digital converters
CN114759926A (zh) * 2021-01-08 2022-07-15 博通集成电路（上海）股份有限公司 逐次逼近寄存器模数转换器电路
US11387838B1 (en) * 2021-03-19 2022-07-12 Microsoft Technology Licensing, Llc SAR analog-to-digital converter calibration

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001267925A (ja) 2000-03-17 2001-09-28 Matsushita Electric Ind Co Ltd 逐次比較型ａｄ変換器
WO2010010661A1 (ja) 2008-07-21 2010-01-28 株式会社アドバンテスト Ａｄ変換装置
JP2010245927A (ja) 2009-04-08 2010-10-28 Mitsumi Electric Co Ltd 逐次比較型ａｄ変換回路
JP2011199443A (ja) 2010-03-18 2011-10-06 Fujitsu Semiconductor Ltd 逐次比較型ａ／ｄコンバータ、および逐次比較型ａ／ｄコンバータの比較時間検出方法

Also Published As

Publication number Publication date
WO2022102035A1 (ja) 2022-05-19
CN114766080A (zh) 2022-07-19
US20220149852A1 (en) 2022-05-12
US11757460B2 (en) 2023-09-12
JPWO2022102035A1 (https=) 2022-05-19
CN114766080B (zh) 2025-10-28

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