JP7450350B2 - 切削装置 - Google Patents
切削装置 Download PDFInfo
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- JP7450350B2 JP7450350B2 JP2019148501A JP2019148501A JP7450350B2 JP 7450350 B2 JP7450350 B2 JP 7450350B2 JP 2019148501 A JP2019148501 A JP 2019148501A JP 2019148501 A JP2019148501 A JP 2019148501A JP 7450350 B2 JP7450350 B2 JP 7450350B2
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- cutting
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- 238000005520 cutting process Methods 0.000 title claims description 173
- 238000003754 machining Methods 0.000 claims description 53
- 239000002390 adhesive tape Substances 0.000 description 10
- 238000001514 detection method Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 238000003860 storage Methods 0.000 description 6
- 238000003384 imaging method Methods 0.000 description 5
- 238000004140 cleaning Methods 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 230000006870 function Effects 0.000 description 3
- 239000002346 layers by function Substances 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 238000005401 electroluminescence Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 239000011347 resin Substances 0.000 description 2
- 229920005989 resin Polymers 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000032258 transport Effects 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 239000000919 ceramic Substances 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 230000012447 hatching Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67092—Apparatus for mechanical treatment
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B19/00—Programme-control systems
- G05B19/02—Programme-control systems electric
- G05B19/18—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form
- G05B19/406—Numerical control [NC], i.e. automatically operating machines, in particular machine tools, e.g. in a manufacturing environment, so as to execute positioning, movement or co-ordinated operations by means of programme data in numerical form characterised by monitoring or safety
- G05B19/4069—Simulating machining process on screen
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B27/00—Other grinding machines or devices
- B24B27/06—Grinders for cutting-off
- B24B27/0616—Grinders for cutting-off using a tool turning around the workpiece
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
- H01L21/67253—Process monitoring, e.g. flow or thickness monitoring
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
- G05B2219/30—Nc systems
- G05B2219/50—Machine tool, machine tool null till machine tool work handling
- G05B2219/50282—Tool offset as function of cutting depth
Landscapes
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Engineering (AREA)
- Automation & Control Theory (AREA)
- Human Computer Interaction (AREA)
- Dicing (AREA)
- Numerical Control (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
Description
本発明の実施形態に係る切削装置を図面に基づいて説明する。図1は、実施形態に係る切削装置の斜視図である。図2は、図1に示された切削装置の加工対象の被加工物の一例を示す斜視図である。図3は、図1に示された切削装置の表示パネルに表示された加工条件登録画面を示す図である。図4は、図1に示された切削装置の表示パネルに表示された被加工物の3次元的な立体画像データを示す図である。図5は、図4に示された立体画像データの一部を拡大して表示パネルが表示した図である。図6は、図5に示された立体画像データの一部を更に拡大して表示パネルが表示した図である。
10 チャックテーブル
11 保持面
20 切削ユニット
21 切削ブレード
100 制御ユニット
110 加工条件登録部
120 入力ユニット
130 表示パネル
140 立体画像データ生成部
200 被加工物
401 立体画像データ
Claims (3)
- 被加工物を保持面で保持するチャックテーブルと、該チャックテーブルで保持された被加工物を切削ブレードで切削する切削ユニットと、該被加工物を加工する加工条件が登録される加工条件登録部と、入力ユニットで入力された該加工条件を表示する表示パネルと、各構成要素を制御する制御ユニットと、を備える切削装置であって、
該加工条件登録部には、該被加工物の形状及び大きさ、該切削ブレードの切り込み深さ、前記被加工物において切削加工を施すことを禁止するカット禁止範囲が該加工条件として登録され、
該制御ユニットは、
該加工条件登録部に登録された該加工条件での該被加工物の加工をシミュレーションし、加工された該被加工物の3次元的な立体画像データを生成する立体画像データ生成部を有し、
該立体画像データを該表示パネルに表示させる切削装置。 - 該立体画像データの表示倍率は、任意に調整できる請求項1記載の切削装置。
- 該立体画像データの表示角度は、任意に調整できる請求項1又は2記載の切削装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019148501A JP7450350B2 (ja) | 2019-08-13 | 2019-08-13 | 切削装置 |
KR1020200086502A KR20210019943A (ko) | 2019-08-13 | 2020-07-14 | 절삭 장치 |
TW109125623A TWI831993B (zh) | 2019-08-13 | 2020-07-29 | 切削裝置 |
CN202010793858.3A CN112394685A (zh) | 2019-08-13 | 2020-08-10 | 切削装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2019148501A JP7450350B2 (ja) | 2019-08-13 | 2019-08-13 | 切削装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2021033321A JP2021033321A (ja) | 2021-03-01 |
JP7450350B2 true JP7450350B2 (ja) | 2024-03-15 |
Family
ID=74603020
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2019148501A Active JP7450350B2 (ja) | 2019-08-13 | 2019-08-13 | 切削装置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP7450350B2 (ja) |
KR (1) | KR20210019943A (ja) |
CN (1) | CN112394685A (ja) |
TW (1) | TWI831993B (ja) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000235407A (ja) | 1999-02-15 | 2000-08-29 | Japan Science & Technology Corp | 表示方法及び表示プログラムを記録したコンピュータ読み取り可能な記録媒体及び表示装置 |
JP2008009661A (ja) | 2006-06-28 | 2008-01-17 | Keyence Corp | レーザ加工条件設定装置、レーザ加工装置、レーザ加工条件設定方法、レーザ加工条件設定プログラム、コンピュータで読み取り可能な記録媒体及び記録した機器 |
JP2009206206A (ja) | 2008-02-26 | 2009-09-10 | Disco Abrasive Syst Ltd | 加工装置 |
JP2018187707A (ja) | 2017-05-01 | 2018-11-29 | 株式会社ディスコ | 切削装置 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60126711A (ja) * | 1983-12-14 | 1985-07-06 | Fanuc Ltd | Νcデ−タ作成装置の処理状態表示方法 |
JPH07276206A (ja) * | 1994-04-12 | 1995-10-24 | Daido Steel Co Ltd | ワーク表面自動加工装置 |
JPH07295619A (ja) * | 1994-04-25 | 1995-11-10 | Mitsubishi Electric Corp | 工作機械の数値制御装置 |
JP2003197564A (ja) | 2001-12-21 | 2003-07-11 | Disco Abrasive Syst Ltd | 低誘電体絶縁材料を積層した基板のダイシング方法 |
KR102067983B1 (ko) * | 2017-11-23 | 2020-01-20 | 주식회사 탑 엔지니어링 | 기판 절단 장치 |
-
2019
- 2019-08-13 JP JP2019148501A patent/JP7450350B2/ja active Active
-
2020
- 2020-07-14 KR KR1020200086502A patent/KR20210019943A/ko active Search and Examination
- 2020-07-29 TW TW109125623A patent/TWI831993B/zh active
- 2020-08-10 CN CN202010793858.3A patent/CN112394685A/zh active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000235407A (ja) | 1999-02-15 | 2000-08-29 | Japan Science & Technology Corp | 表示方法及び表示プログラムを記録したコンピュータ読み取り可能な記録媒体及び表示装置 |
JP2008009661A (ja) | 2006-06-28 | 2008-01-17 | Keyence Corp | レーザ加工条件設定装置、レーザ加工装置、レーザ加工条件設定方法、レーザ加工条件設定プログラム、コンピュータで読み取り可能な記録媒体及び記録した機器 |
JP2009206206A (ja) | 2008-02-26 | 2009-09-10 | Disco Abrasive Syst Ltd | 加工装置 |
JP2018187707A (ja) | 2017-05-01 | 2018-11-29 | 株式会社ディスコ | 切削装置 |
Also Published As
Publication number | Publication date |
---|---|
CN112394685A (zh) | 2021-02-23 |
TWI831993B (zh) | 2024-02-11 |
JP2021033321A (ja) | 2021-03-01 |
TW202107558A (zh) | 2021-02-16 |
KR20210019943A (ko) | 2021-02-23 |
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