JP7396785B2 - 研削装置 - Google Patents
研削装置 Download PDFInfo
- Publication number
- JP7396785B2 JP7396785B2 JP2018027834A JP2018027834A JP7396785B2 JP 7396785 B2 JP7396785 B2 JP 7396785B2 JP 2018027834 A JP2018027834 A JP 2018027834A JP 2018027834 A JP2018027834 A JP 2018027834A JP 7396785 B2 JP7396785 B2 JP 7396785B2
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- grinding
- outer peripheral
- peripheral edge
- holding table
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000004140 cleaning Methods 0.000 claims description 91
- 230000002093 peripheral effect Effects 0.000 claims description 48
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 46
- 239000007921 spray Substances 0.000 claims description 24
- 238000003825 pressing Methods 0.000 claims description 12
- 235000012431 wafers Nutrition 0.000 description 124
- 239000006061 abrasive grain Substances 0.000 description 9
- 238000005507 spraying Methods 0.000 description 9
- 238000002347 injection Methods 0.000 description 8
- 239000007924 injection Substances 0.000 description 8
- 230000003028 elevating effect Effects 0.000 description 5
- 238000005406 washing Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 238000009966 trimming Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B55/00—Safety devices for grinding or polishing machines; Accessories fitted to grinding or polishing machines for keeping tools or parts of the machine in good working condition
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
- B24B7/226—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain in which the tool is supported by the workpiece
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B7/00—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
- B24B7/20—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
- B24B7/22—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
- B24B7/228—Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding thin, brittle parts, e.g. semiconductors, wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding Of Cylindrical And Plane Surfaces (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Polarising Elements (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
- Disintegrating Or Milling (AREA)
Description
5:搬出入手段 6:仮置きテーブル 7:洗浄手段 8:ターンテーブル
9a:第1の搬送手段 9b:第2の搬送手段 10:保持テーブル 11:ポーラス板
12:枠体 13:回転手段 14a,14b:コラム 15:支柱 16:ケース
17a,17b:支持部
20A,20B:研削手段 21:スピンドル 22:モータ
23:スピンドルハウジング 24:ホルダ 25:マウント 26:研削ホイール
27a,27b:研削砥石
30A,30B:研削送り手段 31:ボールネジ 32:モータ
33:ガイドレール 34:昇降板
40A,40B:厚み測定手段 41:第1のゲージ 42:第2のゲージ
50A,50B:洗浄ノズル 51:噴射口 52:洗浄水供給源 53:洗浄水
60:押付ノズル 61:噴射口 62:洗浄水
Claims (1)
- 円板状のウェーハを保持する保持テーブルと、該保持テーブルを回転させる回転手段と、環状に研削砥石を配設した研削ホイールを回転させ該保持テーブルが保持するウェーハを該研削砥石で研削する研削手段と、を備える研削装置であって、
該研削砥石は、ウェーハの半径部分に接触し、
該回転手段で回転する該保持テーブルが保持したウェーハの外周縁のうち該研削砥石が接触していない部分に残存する屑を洗い流す洗浄水を噴き付ける洗浄ノズルを備え、
該洗浄ノズルから噴射される該洗浄水の噴射方向は、該研削砥石の外側における、ウェーハの外周縁の接線方向で、かつ、該保持テーブルの回転方向に対向する方向であり、
さらに、ウェーハのうち該洗浄ノズルによって該洗浄水が噴き付けられる外周縁部分の上方側から洗浄水を噴き付けて該保持面に対してウェーハの該外周縁部分を押し付ける押付ノズルを備える研削装置。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018027834A JP7396785B2 (ja) | 2018-02-20 | 2018-02-20 | 研削装置 |
KR1020190007363A KR102654427B1 (ko) | 2018-02-20 | 2019-01-21 | 연삭 장치 |
TW108105273A TWI785206B (zh) | 2018-02-20 | 2019-02-18 | 研削裝置 |
CN201910119467.0A CN110170892B (zh) | 2018-02-20 | 2019-02-18 | 磨削装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018027834A JP7396785B2 (ja) | 2018-02-20 | 2018-02-20 | 研削装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2019141950A JP2019141950A (ja) | 2019-08-29 |
JP7396785B2 true JP7396785B2 (ja) | 2023-12-12 |
Family
ID=67689025
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018027834A Active JP7396785B2 (ja) | 2018-02-20 | 2018-02-20 | 研削装置 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP7396785B2 (ja) |
KR (1) | KR102654427B1 (ja) |
CN (1) | CN110170892B (ja) |
TW (1) | TWI785206B (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110517951B (zh) * | 2019-08-29 | 2022-11-29 | 上海华力集成电路制造有限公司 | 一种改善sti研磨前晶圆微刮伤的清洗方法 |
CN111660157A (zh) * | 2020-06-08 | 2020-09-15 | 苏州辰轩光电科技有限公司 | 减薄机 |
CN115889293B (zh) * | 2022-11-08 | 2024-04-16 | 西安奕斯伟材料科技股份有限公司 | 清洗硅片的周缘的装置、方法及清洗硅片的设备 |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02185359A (ja) * | 1989-01-11 | 1990-07-19 | Toshiba Corp | 研削方法及びその装置 |
JP3377161B2 (ja) * | 1995-12-25 | 2003-02-17 | 株式会社日平トヤマ | ウエハの処理システム |
JP4487353B2 (ja) * | 1999-11-26 | 2010-06-23 | ソニー株式会社 | 研磨装置および研磨方法 |
JP2003007668A (ja) * | 2001-06-27 | 2003-01-10 | Sumitomo Mitsubishi Silicon Corp | 半導体ウェーハの洗浄装置及び洗浄方法 |
JP2003211353A (ja) * | 2002-01-18 | 2003-07-29 | Nippei Toyama Corp | ウェーハの加工装置 |
JP2004066376A (ja) * | 2002-08-05 | 2004-03-04 | Nippei Toyama Corp | 半導体ウエーハ研削盤のクーラント噴射装置およびその方法 |
JP4102205B2 (ja) * | 2003-01-22 | 2008-06-18 | 株式会社日平トヤマ | ウェーハ研削装置 |
KR20060133208A (ko) * | 2005-06-20 | 2006-12-26 | 삼성전자주식회사 | 초음파 세정을 이용하는 웨이퍼 후면 연마 장치 |
JP2008098574A (ja) * | 2006-10-16 | 2008-04-24 | Disco Abrasive Syst Ltd | ウエーハの研磨装置 |
JP2013141738A (ja) * | 2012-01-12 | 2013-07-22 | Disco Corp | 加工装置 |
JP6157229B2 (ja) | 2013-06-10 | 2017-07-05 | 株式会社ディスコ | 研削装置及び研削方法 |
JP5651744B1 (ja) * | 2013-07-04 | 2015-01-14 | 株式会社カイジョー | 超音波洗浄装置及び超音波洗浄方法 |
TWI488983B (zh) * | 2013-10-08 | 2015-06-21 | 光洋應用材料科技股份有限公司 | 銅矽合金濺鍍靶材及銅矽合金記錄層 |
SG10201508329UA (en) * | 2014-10-10 | 2016-05-30 | Ebara Corp | Buffing apparatus and substrate processing apparatus |
KR102214510B1 (ko) * | 2016-01-18 | 2021-02-09 | 삼성전자 주식회사 | 기판 씨닝 장치, 이를 이용한 기판의 씨닝 방법, 및 반도체 패키지의 제조 방법 |
-
2018
- 2018-02-20 JP JP2018027834A patent/JP7396785B2/ja active Active
-
2019
- 2019-01-21 KR KR1020190007363A patent/KR102654427B1/ko active IP Right Grant
- 2019-02-18 CN CN201910119467.0A patent/CN110170892B/zh active Active
- 2019-02-18 TW TW108105273A patent/TWI785206B/zh active
Also Published As
Publication number | Publication date |
---|---|
TW201934254A (zh) | 2019-09-01 |
JP2019141950A (ja) | 2019-08-29 |
CN110170892B (zh) | 2023-11-03 |
CN110170892A (zh) | 2019-08-27 |
TWI785206B (zh) | 2022-12-01 |
KR102654427B1 (ko) | 2024-04-03 |
KR20190100023A (ko) | 2019-08-28 |
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