JP7354534B2 - プローブピンおよび検査治具 - Google Patents

プローブピンおよび検査治具 Download PDF

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Publication number
JP7354534B2
JP7354534B2 JP2018210797A JP2018210797A JP7354534B2 JP 7354534 B2 JP7354534 B2 JP 7354534B2 JP 2018210797 A JP2018210797 A JP 2018210797A JP 2018210797 A JP2018210797 A JP 2018210797A JP 7354534 B2 JP7354534 B2 JP 7354534B2
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JP
Japan
Prior art keywords
probe pin
elastic
accommodating
contact
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2018210797A
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English (en)
Japanese (ja)
Other versions
JP2020076666A (ja
Inventor
直哉 笹野
宏真 寺西
貴浩 酒井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Corp filed Critical Omron Corp
Priority to JP2018210797A priority Critical patent/JP7354534B2/ja
Priority to CN201980071406.XA priority patent/CN112955754B/zh
Priority to PCT/JP2019/041489 priority patent/WO2020095679A1/fr
Priority to KR1020217011321A priority patent/KR102600799B1/ko
Priority to TW108139674A priority patent/TWI708441B/zh
Publication of JP2020076666A publication Critical patent/JP2020076666A/ja
Application granted granted Critical
Publication of JP7354534B2 publication Critical patent/JP7354534B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
JP2018210797A 2018-11-08 2018-11-08 プローブピンおよび検査治具 Active JP7354534B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2018210797A JP7354534B2 (ja) 2018-11-08 2018-11-08 プローブピンおよび検査治具
CN201980071406.XA CN112955754B (zh) 2018-11-08 2019-10-23 探针和检查工具
PCT/JP2019/041489 WO2020095679A1 (fr) 2018-11-08 2019-10-23 Broche de sonde et gabarit d'inspection
KR1020217011321A KR102600799B1 (ko) 2018-11-08 2019-10-23 프로브 핀 및 검사 지그
TW108139674A TWI708441B (zh) 2018-11-08 2019-11-01 檢查治具

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018210797A JP7354534B2 (ja) 2018-11-08 2018-11-08 プローブピンおよび検査治具

Publications (2)

Publication Number Publication Date
JP2020076666A JP2020076666A (ja) 2020-05-21
JP7354534B2 true JP7354534B2 (ja) 2023-10-03

Family

ID=70610983

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018210797A Active JP7354534B2 (ja) 2018-11-08 2018-11-08 プローブピンおよび検査治具

Country Status (5)

Country Link
JP (1) JP7354534B2 (fr)
KR (1) KR102600799B1 (fr)
CN (1) CN112955754B (fr)
TW (1) TWI708441B (fr)
WO (1) WO2020095679A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111579836B (zh) * 2020-05-18 2023-01-17 武汉精毅通电子技术有限公司 一种适用于大电流高速信号测试的探针及连接器

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004138405A (ja) 2002-10-15 2004-05-13 Renesas Technology Corp 半導体装置測定用プローブ
JP2009016291A (ja) 2007-07-09 2009-01-22 Sensata Technologies Massachusetts Inc ソケット用アダプタ
JP2009052913A (ja) 2007-08-23 2009-03-12 Yamaichi Electronics Co Ltd 同軸型コンタクト及び同軸多芯コネクタ
WO2017026304A1 (fr) 2015-08-07 2017-02-16 オムロン株式会社 Broche de sonde et gabarit d'inspection la comprenant
JP2017146119A (ja) 2016-02-15 2017-08-24 オムロン株式会社 プローブピンおよびこれを用いた検査装置
JP2017223628A (ja) 2016-06-17 2017-12-21 オムロン株式会社 プローブピン

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2790074B2 (ja) * 1995-03-31 1998-08-27 日本電気株式会社 プローブ装置
JP2002134202A (ja) 2000-10-27 2002-05-10 Otax Co Ltd 電子部品用ソケット
JPWO2008133089A1 (ja) * 2007-04-20 2010-07-22 日本発條株式会社 導電性接触子ユニット
JP2010025844A (ja) * 2008-07-23 2010-02-04 Unitechno Inc コンタクトプローブおよび検査用ソケット
JP5597108B2 (ja) * 2010-11-29 2014-10-01 株式会社精研 接触検査用治具
US8970238B2 (en) * 2011-06-17 2015-03-03 Electro Scientific Industries, Inc. Probe module with interleaved serpentine test contacts for electronic device testing
JP5821432B2 (ja) * 2011-09-05 2015-11-24 日本電産リード株式会社 接続端子及び接続治具
JP5879906B2 (ja) * 2011-10-14 2016-03-08 オムロン株式会社 接触子およびこれを用いたプローブ
JP2017130421A (ja) * 2016-01-22 2017-07-27 山一電機株式会社 コンタクト端子、コンタクト支持体、および、それを備える接続装置
KR101672826B1 (ko) * 2016-02-03 2016-11-07 주식회사 프로이천 니들 타입 핀 보드
JP6624999B2 (ja) * 2016-03-31 2019-12-25 日鉄日新製鋼株式会社 自動車用端子
JP6737002B2 (ja) * 2016-06-17 2020-08-05 オムロン株式会社 プローブピン
KR101938387B1 (ko) * 2017-02-16 2019-01-14 (주)에이피텍 테스트 핀 및 이를 포함하는 테스트 장치
CN111033272B (zh) * 2018-01-11 2022-07-26 欧姆龙株式会社 探针、检查工具、检查单元和检查装置
CN114441813A (zh) * 2018-01-11 2022-05-06 欧姆龙株式会社 探针、检查工具、检查单元和检查装置

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004138405A (ja) 2002-10-15 2004-05-13 Renesas Technology Corp 半導体装置測定用プローブ
JP2009016291A (ja) 2007-07-09 2009-01-22 Sensata Technologies Massachusetts Inc ソケット用アダプタ
JP2009052913A (ja) 2007-08-23 2009-03-12 Yamaichi Electronics Co Ltd 同軸型コンタクト及び同軸多芯コネクタ
WO2017026304A1 (fr) 2015-08-07 2017-02-16 オムロン株式会社 Broche de sonde et gabarit d'inspection la comprenant
JP2017146119A (ja) 2016-02-15 2017-08-24 オムロン株式会社 プローブピンおよびこれを用いた検査装置
JP2017223628A (ja) 2016-06-17 2017-12-21 オムロン株式会社 プローブピン

Also Published As

Publication number Publication date
KR102600799B1 (ko) 2023-11-10
JP2020076666A (ja) 2020-05-21
KR20210062046A (ko) 2021-05-28
TWI708441B (zh) 2020-10-21
CN112955754B (zh) 2024-08-06
CN112955754A (zh) 2021-06-11
TW202019031A (zh) 2020-05-16
WO2020095679A1 (fr) 2020-05-14

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