KR102600799B1 - 프로브 핀 및 검사 지그 - Google Patents

프로브 핀 및 검사 지그 Download PDF

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Publication number
KR102600799B1
KR102600799B1 KR1020217011321A KR20217011321A KR102600799B1 KR 102600799 B1 KR102600799 B1 KR 102600799B1 KR 1020217011321 A KR1020217011321 A KR 1020217011321A KR 20217011321 A KR20217011321 A KR 20217011321A KR 102600799 B1 KR102600799 B1 KR 102600799B1
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KR
South Korea
Prior art keywords
probe pin
elastic
probe
contact
portions
Prior art date
Application number
KR1020217011321A
Other languages
English (en)
Korean (ko)
Other versions
KR20210062046A (ko
Inventor
나오야 사사노
히로타다 데라니시
다카히로 사카이
Original Assignee
오므론 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 오므론 가부시키가이샤 filed Critical 오므론 가부시키가이샤
Publication of KR20210062046A publication Critical patent/KR20210062046A/ko
Application granted granted Critical
Publication of KR102600799B1 publication Critical patent/KR102600799B1/ko

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Measuring Leads Or Probes (AREA)
KR1020217011321A 2018-11-08 2019-10-23 프로브 핀 및 검사 지그 KR102600799B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2018-210797 2018-11-08
JP2018210797A JP7354534B2 (ja) 2018-11-08 2018-11-08 プローブピンおよび検査治具
PCT/JP2019/041489 WO2020095679A1 (fr) 2018-11-08 2019-10-23 Broche de sonde et gabarit d'inspection

Publications (2)

Publication Number Publication Date
KR20210062046A KR20210062046A (ko) 2021-05-28
KR102600799B1 true KR102600799B1 (ko) 2023-11-10

Family

ID=70610983

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020217011321A KR102600799B1 (ko) 2018-11-08 2019-10-23 프로브 핀 및 검사 지그

Country Status (5)

Country Link
JP (1) JP7354534B2 (fr)
KR (1) KR102600799B1 (fr)
CN (1) CN112955754B (fr)
TW (1) TWI708441B (fr)
WO (1) WO2020095679A1 (fr)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111579836B (zh) * 2020-05-18 2023-01-17 武汉精毅通电子技术有限公司 一种适用于大电流高速信号测试的探针及连接器

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004138405A (ja) * 2002-10-15 2004-05-13 Renesas Technology Corp 半導体装置測定用プローブ
JP2009016291A (ja) 2007-07-09 2009-01-22 Sensata Technologies Massachusetts Inc ソケット用アダプタ
JP2009052913A (ja) 2007-08-23 2009-03-12 Yamaichi Electronics Co Ltd 同軸型コンタクト及び同軸多芯コネクタ
JP2014522960A (ja) 2011-06-17 2014-09-08 エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド 互いに噛み合わされた蛇行する検査接点を有する電子デバイス検査用のプローブモジュール
WO2017026304A1 (fr) 2015-08-07 2017-02-16 オムロン株式会社 Broche de sonde et gabarit d'inspection la comprenant
JP2017130421A (ja) 2016-01-22 2017-07-27 山一電機株式会社 コンタクト端子、コンタクト支持体、および、それを備える接続装置
JP2017146119A (ja) * 2016-02-15 2017-08-24 オムロン株式会社 プローブピンおよびこれを用いた検査装置
KR101903319B1 (ko) 2018-01-11 2018-10-01 오므론 가부시키가이샤 프로브 핀, 검사 지그, 검사 유닛 및 검사 장치
KR101911002B1 (ko) 2018-01-11 2018-10-24 오므론 가부시키가이샤 프로브 핀, 검사 지그, 검사 유닛 및 검사 장치

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2790074B2 (ja) * 1995-03-31 1998-08-27 日本電気株式会社 プローブ装置
JP2002134202A (ja) 2000-10-27 2002-05-10 Otax Co Ltd 電子部品用ソケット
WO2008133089A1 (fr) * 2007-04-20 2008-11-06 Nhk Spring Co., Ltd. Unité de contact conducteur
JP2010025844A (ja) * 2008-07-23 2010-02-04 Unitechno Inc コンタクトプローブおよび検査用ソケット
JP5597108B2 (ja) * 2010-11-29 2014-10-01 株式会社精研 接触検査用治具
JP5821432B2 (ja) * 2011-09-05 2015-11-24 日本電産リード株式会社 接続端子及び接続治具
JP5879906B2 (ja) * 2011-10-14 2016-03-08 オムロン株式会社 接触子およびこれを用いたプローブ
KR101672826B1 (ko) * 2016-02-03 2016-11-07 주식회사 프로이천 니들 타입 핀 보드
JP6624999B2 (ja) * 2016-03-31 2019-12-25 日鉄日新製鋼株式会社 自動車用端子
JP6515877B2 (ja) * 2016-06-17 2019-05-22 オムロン株式会社 プローブピン
JP6737002B2 (ja) * 2016-06-17 2020-08-05 オムロン株式会社 プローブピン
KR101938387B1 (ko) * 2017-02-16 2019-01-14 (주)에이피텍 테스트 핀 및 이를 포함하는 테스트 장치

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004138405A (ja) * 2002-10-15 2004-05-13 Renesas Technology Corp 半導体装置測定用プローブ
JP2009016291A (ja) 2007-07-09 2009-01-22 Sensata Technologies Massachusetts Inc ソケット用アダプタ
JP2009052913A (ja) 2007-08-23 2009-03-12 Yamaichi Electronics Co Ltd 同軸型コンタクト及び同軸多芯コネクタ
JP2014522960A (ja) 2011-06-17 2014-09-08 エレクトロ サイエンティフィック インダストリーズ インコーポレーテッド 互いに噛み合わされた蛇行する検査接点を有する電子デバイス検査用のプローブモジュール
WO2017026304A1 (fr) 2015-08-07 2017-02-16 オムロン株式会社 Broche de sonde et gabarit d'inspection la comprenant
JP2017130421A (ja) 2016-01-22 2017-07-27 山一電機株式会社 コンタクト端子、コンタクト支持体、および、それを備える接続装置
JP2017146119A (ja) * 2016-02-15 2017-08-24 オムロン株式会社 プローブピンおよびこれを用いた検査装置
KR101903319B1 (ko) 2018-01-11 2018-10-01 오므론 가부시키가이샤 프로브 핀, 검사 지그, 검사 유닛 및 검사 장치
KR101911002B1 (ko) 2018-01-11 2018-10-24 오므론 가부시키가이샤 프로브 핀, 검사 지그, 검사 유닛 및 검사 장치

Also Published As

Publication number Publication date
WO2020095679A1 (fr) 2020-05-14
CN112955754A (zh) 2021-06-11
JP7354534B2 (ja) 2023-10-03
JP2020076666A (ja) 2020-05-21
CN112955754B (zh) 2024-08-06
TWI708441B (zh) 2020-10-21
TW202019031A (zh) 2020-05-16
KR20210062046A (ko) 2021-05-28

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