JP7327659B2 - 検査用コネクタ及び検査用ユニット - Google Patents

検査用コネクタ及び検査用ユニット Download PDF

Info

Publication number
JP7327659B2
JP7327659B2 JP2022517001A JP2022517001A JP7327659B2 JP 7327659 B2 JP7327659 B2 JP 7327659B2 JP 2022517001 A JP2022517001 A JP 2022517001A JP 2022517001 A JP2022517001 A JP 2022517001A JP 7327659 B2 JP7327659 B2 JP 7327659B2
Authority
JP
Japan
Prior art keywords
pin
ground
signal
signal pin
barrel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2022517001A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2021215334A5 (https=
JPWO2021215334A1 (https=
Inventor
知明 小出
達也 田中
亨 山口
寿 山河
学 阿部
康祐 中谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
Original Assignee
Murata Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co Ltd filed Critical Murata Manufacturing Co Ltd
Publication of JPWO2021215334A1 publication Critical patent/JPWO2021215334A1/ja
Publication of JPWO2021215334A5 publication Critical patent/JPWO2021215334A5/ja
Application granted granted Critical
Publication of JP7327659B2 publication Critical patent/JP7327659B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
JP2022517001A 2020-04-22 2021-04-14 検査用コネクタ及び検査用ユニット Active JP7327659B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020075912 2020-04-22
JP2020075912 2020-04-22
PCT/JP2021/015483 WO2021215334A1 (ja) 2020-04-22 2021-04-14 検査用コネクタ及び検査用ユニット

Publications (3)

Publication Number Publication Date
JPWO2021215334A1 JPWO2021215334A1 (https=) 2021-10-28
JPWO2021215334A5 JPWO2021215334A5 (https=) 2022-08-31
JP7327659B2 true JP7327659B2 (ja) 2023-08-16

Family

ID=78269296

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022517001A Active JP7327659B2 (ja) 2020-04-22 2021-04-14 検査用コネクタ及び検査用ユニット

Country Status (4)

Country Link
JP (1) JP7327659B2 (https=)
CN (1) CN218938344U (https=)
TW (1) TWI778588B (https=)
WO (1) WO2021215334A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7826696B2 (ja) * 2022-01-05 2026-03-10 Ｉ－Ｐｅｘ株式会社 プローブ
JP7786408B2 (ja) * 2022-03-10 2025-12-16 株式会社村田製作所 検査用コネクタ
DE102022106991A1 (de) 2022-03-24 2023-09-28 Ingun Prüfmittelbau Gmbh Hochfrequenz-Prüfstiftvorrichtung
JP2023182281A (ja) * 2022-06-14 2023-12-26 株式会社村田製作所 検査用コネクタ

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030062914A1 (en) 2001-09-28 2003-04-03 Cosmin Iorga Surface mating compliant contact assembly with fixed signal path length
WO2009098770A1 (ja) 2008-02-07 2009-08-13 Advantest Corporation 品種交換ユニットおよび製造方法
JP2010133763A (ja) 2008-12-03 2010-06-17 Yokogawa Electric Corp 同軸プローブ構造
WO2016072193A1 (ja) 2014-11-07 2016-05-12 株式会社村田製作所 プローブ
WO2019069576A1 (ja) 2017-10-06 2019-04-11 株式会社村田製作所 プローブ
JP2019510348A (ja) 2016-03-23 2019-04-11 リーノ インダストリアル インコーポレイテッド テストソケット組立体

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001042002A (ja) * 1999-07-30 2001-02-16 Advantest Corp 半導体デバイス試験装置のタイミング校正用コンタクトボード・このコンタクトボードに接触するプローブ
US6515499B1 (en) * 2000-09-28 2003-02-04 Teradyne, Inc. Modular semiconductor tester interface assembly for high performance coaxial connections
US6447328B1 (en) * 2001-03-13 2002-09-10 3M Innovative Properties Company Method and apparatus for retaining a spring probe
JP2008070146A (ja) * 2006-09-12 2008-03-27 Yokowo Co Ltd 検査用ソケット
JP2014123482A (ja) * 2012-12-21 2014-07-03 Murata Mfg Co Ltd 検査用同軸コネクタ
US9645172B2 (en) * 2014-10-10 2017-05-09 Samtec, Inc. Cable assembly

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20030062914A1 (en) 2001-09-28 2003-04-03 Cosmin Iorga Surface mating compliant contact assembly with fixed signal path length
WO2009098770A1 (ja) 2008-02-07 2009-08-13 Advantest Corporation 品種交換ユニットおよび製造方法
JP2010133763A (ja) 2008-12-03 2010-06-17 Yokogawa Electric Corp 同軸プローブ構造
WO2016072193A1 (ja) 2014-11-07 2016-05-12 株式会社村田製作所 プローブ
JP2019510348A (ja) 2016-03-23 2019-04-11 リーノ インダストリアル インコーポレイテッド テストソケット組立体
WO2019069576A1 (ja) 2017-10-06 2019-04-11 株式会社村田製作所 プローブ

Also Published As

Publication number Publication date
TWI778588B (zh) 2022-09-21
TW202210841A (zh) 2022-03-16
WO2021215334A1 (ja) 2021-10-28
JPWO2021215334A1 (https=) 2021-10-28
CN218938344U (zh) 2023-04-28

Similar Documents

Publication Publication Date Title
JP7327659B2 (ja) 検査用コネクタ及び検査用ユニット
US9645172B2 (en) Cable assembly
JP5254919B2 (ja) 高性能テスターインタフェースモジュール
JP5788767B2 (ja) プローブブロックとそれを備えるプローブカード並びにプローブ装置
EP3669196B1 (en) Test device
JP6438915B2 (ja) 電気コネクタ
CN113167813B (zh) 探针嵌合构造以及探针
TW202045932A (zh) 測試裝置
JP7334791B2 (ja) 検査用コネクタ及び検査用ユニット
JP7184205B2 (ja) コネクタ測定用プローブ及びコネクタの測定方法
JP7243860B2 (ja) 検査用プローブ装置及びコネクタ検査方法
JP3225841U (ja) プローブをキャリブレーションするためのキャリブレーションアダプタ
WO2022201846A1 (ja) 検査用コネクタ
JP2023084007A (ja) 検査用コネクタ
JP7509159B2 (ja) 検査用コネクタ
KR102777517B1 (ko) 측정 유닛
JP7786408B2 (ja) 検査用コネクタ
JP2022138224A (ja) 検査用コネクタ
JP2022116470A (ja) プローブ装置
WO2023047618A1 (ja) 検査用コネクタ
TWM675114U (zh) 探針卡接頭
JP2025112476A (ja) プローブカード
JP2022189133A (ja) コネクタセット、及び同軸コネクタ
JP2025011485A (ja) 検査用プローブ
KR20090067571A (ko) 임피던스 측정을 위한 커넥터

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20220704

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20220704

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20230704

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20230717

R150 Certificate of patent or registration of utility model

Ref document number: 7327659

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150