TWI778588B - 檢查用連接器及檢查用單元 - Google Patents

檢查用連接器及檢查用單元 Download PDF

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Publication number
TWI778588B
TWI778588B TW110114119A TW110114119A TWI778588B TW I778588 B TWI778588 B TW I778588B TW 110114119 A TW110114119 A TW 110114119A TW 110114119 A TW110114119 A TW 110114119A TW I778588 B TWI778588 B TW I778588B
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TW
Taiwan
Prior art keywords
pin
ground
signal
sleeve
electrically connected
Prior art date
Application number
TW110114119A
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English (en)
Chinese (zh)
Other versions
TW202210841A (zh
Inventor
小出知明
田中達也
山口亨
山河寿
阿部学
中谷康祐
Original Assignee
日商村田製作所股份有限公司
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Application filed by 日商村田製作所股份有限公司 filed Critical 日商村田製作所股份有限公司
Publication of TW202210841A publication Critical patent/TW202210841A/zh
Application granted granted Critical
Publication of TWI778588B publication Critical patent/TWI778588B/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
TW110114119A 2020-04-22 2021-04-20 檢查用連接器及檢查用單元 TWI778588B (zh)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2020-075912 2020-04-22
JP2020075912 2020-04-22
PCT/JP2021/015483 WO2021215334A1 (ja) 2020-04-22 2021-04-14 検査用コネクタ及び検査用ユニット
WOPCT/JP2021/015483 2021-04-14

Publications (2)

Publication Number Publication Date
TW202210841A TW202210841A (zh) 2022-03-16
TWI778588B true TWI778588B (zh) 2022-09-21

Family

ID=78269296

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110114119A TWI778588B (zh) 2020-04-22 2021-04-20 檢查用連接器及檢查用單元

Country Status (4)

Country Link
JP (1) JP7327659B2 (https=)
CN (1) CN218938344U (https=)
TW (1) TWI778588B (https=)
WO (1) WO2021215334A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7826696B2 (ja) * 2022-01-05 2026-03-10 Ｉ－Ｐｅｘ株式会社 プローブ
JP7786408B2 (ja) * 2022-03-10 2025-12-16 株式会社村田製作所 検査用コネクタ
DE102022106991A1 (de) 2022-03-24 2023-09-28 Ingun Prüfmittelbau Gmbh Hochfrequenz-Prüfstiftvorrichtung
JP2023182281A (ja) * 2022-06-14 2023-12-26 株式会社村田製作所 検査用コネクタ

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020132514A1 (en) * 2001-03-13 2002-09-19 3M Innovative Properties Company Method and apparatus for retaining a spring probe
TW201429079A (zh) * 2012-12-21 2014-07-16 Murata Manufacturing Co 檢查用同軸連接器
US20160104956A1 (en) * 2014-10-10 2016-04-14 Samtec, Inc. Cable assembly
TW201621323A (zh) * 2014-11-07 2016-06-16 Murata Manufacturing Co 探針

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001042002A (ja) * 1999-07-30 2001-02-16 Advantest Corp 半導体デバイス試験装置のタイミング校正用コンタクトボード・このコンタクトボードに接触するプローブ
US6515499B1 (en) * 2000-09-28 2003-02-04 Teradyne, Inc. Modular semiconductor tester interface assembly for high performance coaxial connections
US20030062914A1 (en) * 2001-09-28 2003-04-03 Cosmin Iorga Surface mating compliant contact assembly with fixed signal path length
JP2008070146A (ja) * 2006-09-12 2008-03-27 Yokowo Co Ltd 検査用ソケット
DE112008003702T5 (de) * 2008-02-07 2010-11-25 Advantest Corporation Geräteabhängige Austauscheinheit und Herstellungsverfahren
JP2010133763A (ja) * 2008-12-03 2010-06-17 Yokogawa Electric Corp 同軸プローブ構造
KR101882209B1 (ko) * 2016-03-23 2018-07-27 리노공업주식회사 동축 테스트소켓 조립체
JP6711469B2 (ja) * 2017-10-06 2020-06-17 株式会社村田製作所 プローブ

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020132514A1 (en) * 2001-03-13 2002-09-19 3M Innovative Properties Company Method and apparatus for retaining a spring probe
CN1555489A (zh) * 2001-03-13 2004-12-15 3M 保持弹簧探针的方法和设备
TW201429079A (zh) * 2012-12-21 2014-07-16 Murata Manufacturing Co 檢查用同軸連接器
US20160104956A1 (en) * 2014-10-10 2016-04-14 Samtec, Inc. Cable assembly
TW201621323A (zh) * 2014-11-07 2016-06-16 Murata Manufacturing Co 探針

Also Published As

Publication number Publication date
TW202210841A (zh) 2022-03-16
WO2021215334A1 (ja) 2021-10-28
JP7327659B2 (ja) 2023-08-16
JPWO2021215334A1 (https=) 2021-10-28
CN218938344U (zh) 2023-04-28

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