JPWO2021215334A1 - - Google Patents
Info
- Publication number
- JPWO2021215334A1 JPWO2021215334A1 JP2022517001A JP2022517001A JPWO2021215334A1 JP WO2021215334 A1 JPWO2021215334 A1 JP WO2021215334A1 JP 2022517001 A JP2022517001 A JP 2022517001A JP 2022517001 A JP2022517001 A JP 2022517001A JP WO2021215334 A1 JPWO2021215334 A1 JP WO2021215334A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020075912 | 2020-04-22 | ||
| JP2020075912 | 2020-04-22 | ||
| PCT/JP2021/015483 WO2021215334A1 (ja) | 2020-04-22 | 2021-04-14 | 検査用コネクタ及び検査用ユニット |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPWO2021215334A1 true JPWO2021215334A1 (https=) | 2021-10-28 |
| JPWO2021215334A5 JPWO2021215334A5 (https=) | 2022-08-31 |
| JP7327659B2 JP7327659B2 (ja) | 2023-08-16 |
Family
ID=78269296
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022517001A Active JP7327659B2 (ja) | 2020-04-22 | 2021-04-14 | 検査用コネクタ及び検査用ユニット |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP7327659B2 (https=) |
| CN (1) | CN218938344U (https=) |
| TW (1) | TWI778588B (https=) |
| WO (1) | WO2021215334A1 (https=) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7826696B2 (ja) * | 2022-01-05 | 2026-03-10 | Ｉ－Ｐｅｘ株式会社 | プローブ |
| JP7786408B2 (ja) * | 2022-03-10 | 2025-12-16 | 株式会社村田製作所 | 検査用コネクタ |
| DE102022106991A1 (de) | 2022-03-24 | 2023-09-28 | Ingun Prüfmittelbau Gmbh | Hochfrequenz-Prüfstiftvorrichtung |
| JP2023182281A (ja) * | 2022-06-14 | 2023-12-26 | 株式会社村田製作所 | 検査用コネクタ |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001042002A (ja) * | 1999-07-30 | 2001-02-16 | Advantest Corp | 半導体デバイス試験装置のタイミング校正用コンタクトボード・このコンタクトボードに接触するプローブ |
| US20030062914A1 (en) * | 2001-09-28 | 2003-04-03 | Cosmin Iorga | Surface mating compliant contact assembly with fixed signal path length |
| JP2008070146A (ja) * | 2006-09-12 | 2008-03-27 | Yokowo Co Ltd | 検査用ソケット |
| WO2009098770A1 (ja) * | 2008-02-07 | 2009-08-13 | Advantest Corporation | 品種交換ユニットおよび製造方法 |
| JP2010032531A (ja) * | 2000-09-28 | 2010-02-12 | Teradyne Inc | 高性能テスターインタフェースモジュール |
| JP2010133763A (ja) * | 2008-12-03 | 2010-06-17 | Yokogawa Electric Corp | 同軸プローブ構造 |
| WO2016072193A1 (ja) * | 2014-11-07 | 2016-05-12 | 株式会社村田製作所 | プローブ |
| WO2019069576A1 (ja) * | 2017-10-06 | 2019-04-11 | 株式会社村田製作所 | プローブ |
| JP2019510348A (ja) * | 2016-03-23 | 2019-04-11 | リーノ インダストリアル インコーポレイテッド | テストソケット組立体 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6447328B1 (en) * | 2001-03-13 | 2002-09-10 | 3M Innovative Properties Company | Method and apparatus for retaining a spring probe |
| JP2014123482A (ja) * | 2012-12-21 | 2014-07-03 | Murata Mfg Co Ltd | 検査用同軸コネクタ |
| US9645172B2 (en) * | 2014-10-10 | 2017-05-09 | Samtec, Inc. | Cable assembly |
-
2021
- 2021-04-14 WO PCT/JP2021/015483 patent/WO2021215334A1/ja not_active Ceased
- 2021-04-14 JP JP2022517001A patent/JP7327659B2/ja active Active
- 2021-04-14 CN CN202190000326.8U patent/CN218938344U/zh active Active
- 2021-04-20 TW TW110114119A patent/TWI778588B/zh active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001042002A (ja) * | 1999-07-30 | 2001-02-16 | Advantest Corp | 半導体デバイス試験装置のタイミング校正用コンタクトボード・このコンタクトボードに接触するプローブ |
| JP2010032531A (ja) * | 2000-09-28 | 2010-02-12 | Teradyne Inc | 高性能テスターインタフェースモジュール |
| US20030062914A1 (en) * | 2001-09-28 | 2003-04-03 | Cosmin Iorga | Surface mating compliant contact assembly with fixed signal path length |
| JP2008070146A (ja) * | 2006-09-12 | 2008-03-27 | Yokowo Co Ltd | 検査用ソケット |
| WO2009098770A1 (ja) * | 2008-02-07 | 2009-08-13 | Advantest Corporation | 品種交換ユニットおよび製造方法 |
| JP2010133763A (ja) * | 2008-12-03 | 2010-06-17 | Yokogawa Electric Corp | 同軸プローブ構造 |
| WO2016072193A1 (ja) * | 2014-11-07 | 2016-05-12 | 株式会社村田製作所 | プローブ |
| JP2019510348A (ja) * | 2016-03-23 | 2019-04-11 | リーノ インダストリアル インコーポレイテッド | テストソケット組立体 |
| WO2019069576A1 (ja) * | 2017-10-06 | 2019-04-11 | 株式会社村田製作所 | プローブ |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI778588B (zh) | 2022-09-21 |
| TW202210841A (zh) | 2022-03-16 |
| WO2021215334A1 (ja) | 2021-10-28 |
| JP7327659B2 (ja) | 2023-08-16 |
| CN218938344U (zh) | 2023-04-28 |
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