CN218938344U - 检查用连接器以及检查用单元 - Google Patents

检查用连接器以及检查用单元 Download PDF

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Publication number
CN218938344U
CN218938344U CN202190000326.8U CN202190000326U CN218938344U CN 218938344 U CN218938344 U CN 218938344U CN 202190000326 U CN202190000326 U CN 202190000326U CN 218938344 U CN218938344 U CN 218938344U
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CN
China
Prior art keywords
pin
ground
signal pin
sleeve
electrically connected
Prior art date
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Active
Application number
CN202190000326.8U
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English (en)
Chinese (zh)
Inventor
小出知明
田中达也
山口亨
山河寿
阿部学
中谷康祐
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Murata Manufacturing Co Ltd
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Murata Manufacturing Co Ltd
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Publication date
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Publication of CN218938344U publication Critical patent/CN218938344U/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
CN202190000326.8U 2020-04-22 2021-04-14 检查用连接器以及检查用单元 Active CN218938344U (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020-075912 2020-04-22
JP2020075912 2020-04-22
PCT/JP2021/015483 WO2021215334A1 (ja) 2020-04-22 2021-04-14 検査用コネクタ及び検査用ユニット

Publications (1)

Publication Number Publication Date
CN218938344U true CN218938344U (zh) 2023-04-28

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ID=78269296

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202190000326.8U Active CN218938344U (zh) 2020-04-22 2021-04-14 检查用连接器以及检查用单元

Country Status (4)

Country Link
JP (1) JP7327659B2 (https=)
CN (1) CN218938344U (https=)
TW (1) TWI778588B (https=)
WO (1) WO2021215334A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7826696B2 (ja) * 2022-01-05 2026-03-10 Ｉ－Ｐｅｘ株式会社 プローブ
JP7786408B2 (ja) * 2022-03-10 2025-12-16 株式会社村田製作所 検査用コネクタ
DE102022106991A1 (de) 2022-03-24 2023-09-28 Ingun Prüfmittelbau Gmbh Hochfrequenz-Prüfstiftvorrichtung
JP2023182281A (ja) * 2022-06-14 2023-12-26 株式会社村田製作所 検査用コネクタ

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001042002A (ja) * 1999-07-30 2001-02-16 Advantest Corp 半導体デバイス試験装置のタイミング校正用コンタクトボード・このコンタクトボードに接触するプローブ
US6515499B1 (en) * 2000-09-28 2003-02-04 Teradyne, Inc. Modular semiconductor tester interface assembly for high performance coaxial connections
US6447328B1 (en) * 2001-03-13 2002-09-10 3M Innovative Properties Company Method and apparatus for retaining a spring probe
US20030062914A1 (en) * 2001-09-28 2003-04-03 Cosmin Iorga Surface mating compliant contact assembly with fixed signal path length
JP2008070146A (ja) * 2006-09-12 2008-03-27 Yokowo Co Ltd 検査用ソケット
DE112008003702T5 (de) * 2008-02-07 2010-11-25 Advantest Corporation Geräteabhängige Austauscheinheit und Herstellungsverfahren
JP2010133763A (ja) * 2008-12-03 2010-06-17 Yokogawa Electric Corp 同軸プローブ構造
JP2014123482A (ja) * 2012-12-21 2014-07-03 Murata Mfg Co Ltd 検査用同軸コネクタ
US9645172B2 (en) * 2014-10-10 2017-05-09 Samtec, Inc. Cable assembly
WO2016072193A1 (ja) * 2014-11-07 2016-05-12 株式会社村田製作所 プローブ
KR101882209B1 (ko) * 2016-03-23 2018-07-27 리노공업주식회사 동축 테스트소켓 조립체
JP6711469B2 (ja) * 2017-10-06 2020-06-17 株式会社村田製作所 プローブ

Also Published As

Publication number Publication date
TWI778588B (zh) 2022-09-21
TW202210841A (zh) 2022-03-16
WO2021215334A1 (ja) 2021-10-28
JP7327659B2 (ja) 2023-08-16
JPWO2021215334A1 (https=) 2021-10-28

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