JPWO2021215334A5 - - Google Patents

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Publication number
JPWO2021215334A5
JPWO2021215334A5 JP2022517001A JP2022517001A JPWO2021215334A5 JP WO2021215334 A5 JPWO2021215334 A5 JP WO2021215334A5 JP 2022517001 A JP2022517001 A JP 2022517001A JP 2022517001 A JP2022517001 A JP 2022517001A JP WO2021215334 A5 JPWO2021215334 A5 JP WO2021215334A5
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JP
Japan
Prior art keywords
pin
signal pin
center conductor
barrel
electrically connected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2022517001A
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English (en)
Japanese (ja)
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JP7327659B2 (ja
JPWO2021215334A1 (https=
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Publication date
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Priority claimed from PCT/JP2021/015483 external-priority patent/WO2021215334A1/ja
Publication of JPWO2021215334A1 publication Critical patent/JPWO2021215334A1/ja
Publication of JPWO2021215334A5 publication Critical patent/JPWO2021215334A5/ja
Application granted granted Critical
Publication of JP7327659B2 publication Critical patent/JP7327659B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2022517001A 2020-04-22 2021-04-14 検査用コネクタ及び検査用ユニット Active JP7327659B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020075912 2020-04-22
JP2020075912 2020-04-22
PCT/JP2021/015483 WO2021215334A1 (ja) 2020-04-22 2021-04-14 検査用コネクタ及び検査用ユニット

Publications (3)

Publication Number Publication Date
JPWO2021215334A1 JPWO2021215334A1 (https=) 2021-10-28
JPWO2021215334A5 true JPWO2021215334A5 (https=) 2022-08-31
JP7327659B2 JP7327659B2 (ja) 2023-08-16

Family

ID=78269296

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022517001A Active JP7327659B2 (ja) 2020-04-22 2021-04-14 検査用コネクタ及び検査用ユニット

Country Status (4)

Country Link
JP (1) JP7327659B2 (https=)
CN (1) CN218938344U (https=)
TW (1) TWI778588B (https=)
WO (1) WO2021215334A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7826696B2 (ja) * 2022-01-05 2026-03-10 Ｉ－Ｐｅｘ株式会社 プローブ
JP7786408B2 (ja) * 2022-03-10 2025-12-16 株式会社村田製作所 検査用コネクタ
DE102022106991A1 (de) 2022-03-24 2023-09-28 Ingun Prüfmittelbau Gmbh Hochfrequenz-Prüfstiftvorrichtung
JP2023182281A (ja) * 2022-06-14 2023-12-26 株式会社村田製作所 検査用コネクタ

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001042002A (ja) * 1999-07-30 2001-02-16 Advantest Corp 半導体デバイス試験装置のタイミング校正用コンタクトボード・このコンタクトボードに接触するプローブ
US6515499B1 (en) * 2000-09-28 2003-02-04 Teradyne, Inc. Modular semiconductor tester interface assembly for high performance coaxial connections
US6447328B1 (en) * 2001-03-13 2002-09-10 3M Innovative Properties Company Method and apparatus for retaining a spring probe
US20030062914A1 (en) * 2001-09-28 2003-04-03 Cosmin Iorga Surface mating compliant contact assembly with fixed signal path length
JP2008070146A (ja) * 2006-09-12 2008-03-27 Yokowo Co Ltd 検査用ソケット
DE112008003702T5 (de) * 2008-02-07 2010-11-25 Advantest Corporation Geräteabhängige Austauscheinheit und Herstellungsverfahren
JP2010133763A (ja) * 2008-12-03 2010-06-17 Yokogawa Electric Corp 同軸プローブ構造
JP2014123482A (ja) * 2012-12-21 2014-07-03 Murata Mfg Co Ltd 検査用同軸コネクタ
US9645172B2 (en) * 2014-10-10 2017-05-09 Samtec, Inc. Cable assembly
WO2016072193A1 (ja) * 2014-11-07 2016-05-12 株式会社村田製作所 プローブ
KR101882209B1 (ko) * 2016-03-23 2018-07-27 리노공업주식회사 동축 테스트소켓 조립체
JP6711469B2 (ja) * 2017-10-06 2020-06-17 株式会社村田製作所 プローブ

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