JP7223387B2 - デューティ補償装置 - Google Patents
デューティ補償装置 Download PDFInfo
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- JP7223387B2 JP7223387B2 JP2018099477A JP2018099477A JP7223387B2 JP 7223387 B2 JP7223387 B2 JP 7223387B2 JP 2018099477 A JP2018099477 A JP 2018099477A JP 2018099477 A JP2018099477 A JP 2018099477A JP 7223387 B2 JP7223387 B2 JP 7223387B2
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- duty
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- 238000005070 sampling Methods 0.000 claims description 56
- 238000005259 measurement Methods 0.000 claims description 17
- 230000001174 ascending effect Effects 0.000 claims description 6
- 102100040844 Dual specificity protein kinase CLK2 Human genes 0.000 description 36
- 101000749291 Homo sapiens Dual specificity protein kinase CLK2 Proteins 0.000 description 36
- 238000010586 diagram Methods 0.000 description 10
- 102100040862 Dual specificity protein kinase CLK1 Human genes 0.000 description 8
- 101000749294 Homo sapiens Dual specificity protein kinase CLK1 Proteins 0.000 description 8
- 238000001514 detection method Methods 0.000 description 2
- 230000007704 transition Effects 0.000 description 2
- 230000000295 complement effect Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/13—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals
- H03K5/135—Arrangements having a single output and transforming input signals into pulses delivered at desired time intervals by the use of time reference signals, e.g. clock signals
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/156—Arrangements in which a continuous pulse train is transformed into a train having a desired pattern
- H03K5/1565—Arrangements in which a continuous pulse train is transformed into a train having a desired pattern the output pulses having a constant duty cycle
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/01—Shaping pulses
- H03K5/04—Shaping pulses by increasing duration; by decreasing duration
- H03K5/05—Shaping pulses by increasing duration; by decreasing duration by the use of clock signals or other time reference signals
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
- H03K5/01—Shaping pulses
- H03K5/04—Shaping pulses by increasing duration; by decreasing duration
- H03K5/06—Shaping pulses by increasing duration; by decreasing duration by the use of delay lines or other analogue delay elements
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/0805—Details of the phase-locked loop the loop being adapted to provide an additional control signal for use outside the loop
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/085—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal
- H03L7/091—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal the phase or frequency detector using a sampling device
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/099—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop
- H03L7/0995—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop the oscillator comprising a ring oscillator
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- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Pulse Circuits (AREA)
- Manipulation Of Pulses (AREA)
Description
Claims (4)
- 入力されるクロックのデューティを、制御コードの値によって異なるデューティ調整量に基づいて調整して、当該調整後のクロックを出力するデューティ調整部と、
Nを3以上の整数とし、nを1~Nの各整数として、各期間Tnに亘って、前記クロックに対して非同期であって他の何れの期間における周波数とも異なる周波数のサンプリングクロックをサンプリングクロック生成部により生成し、前記サンプリングクロックが指示するタイミングにおいて前記デューティ調整部から出力されるクロックのレベルが所定値である事象を計数して、期間T n における当該事象の計数値、期間T n の時間および期間T n のサンプリングクロックの周波数に基づいて該クロックのデューティを測定するデューティ測定部と、
各期間Tnにおいて前記デューティ調整部へ前記制御コードを各値として出力して前記デューティ測定部によるデューティ測定の結果を受け取り、N個の期間T 1 ~T N それぞれにおいてデューティが所定範囲となる前記制御コードの値のうちから選択して、以降に前記デューティ調整部へ与える制御コードの値を決定する制御部と、
を備えるデューティ補償装置。 - 前記制御部は、N個の期間T1~TNそれぞれにおいて求めた制御コードの値を昇順または降順に並べたときの最大値および最小値を除く何れかの制御コードの値を、前記デューティ調整部へ与える制御コードの値として決定する、
請求項1に記載のデューティ補償装置。 - 前記制御部は、N個の期間T1~TNそれぞれにおいて求めた制御コードの値を昇順または降順に並べたときの中央値の制御コードの値を、前記デューティ調整部へ与える制御コードの値として決定する、
請求項1または2に記載のデューティ補償装置。 - 前記サンプリングクロック生成部は、
供給される電流の量によって遅延量が異なる複数の遅延セルがリング状に接続され前記サンプリングクロックを生成して出力するリングオシレータと、前記複数の遅延セルそれぞれに電流を供給する電流源と、を含み、
前記電流源が供給する電流の量によって異なる周波数のサンプリングクロックを前記リングオシレータにより生成して出力する、
請求項1~3の何れか1項に記載のデューティ補償装置。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018099477A JP7223387B2 (ja) | 2018-05-24 | 2018-05-24 | デューティ補償装置 |
CN201910413407.XA CN110535453A (zh) | 2018-05-24 | 2019-05-17 | 占空比补偿装置 |
US16/420,564 US10530351B2 (en) | 2018-05-24 | 2019-05-23 | Duty compensation device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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JP2018099477A JP7223387B2 (ja) | 2018-05-24 | 2018-05-24 | デューティ補償装置 |
Publications (2)
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JP2019205077A JP2019205077A (ja) | 2019-11-28 |
JP7223387B2 true JP7223387B2 (ja) | 2023-02-16 |
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JP2018099477A Active JP7223387B2 (ja) | 2018-05-24 | 2018-05-24 | デューティ補償装置 |
Country Status (3)
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US (1) | US10530351B2 (ja) |
JP (1) | JP7223387B2 (ja) |
CN (1) | CN110535453A (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11916554B2 (en) * | 2019-12-16 | 2024-02-27 | Intel Corporation | Techniques for duty cycle correction |
US11515865B1 (en) * | 2021-12-15 | 2022-11-29 | Macom Technology Solutions Holdings, Inc. | Serializer clock delay optimization |
CN115877914B (zh) * | 2023-01-17 | 2024-02-20 | 北京象帝先计算技术有限公司 | 信号控制方法、采样方法、装置、系统及电子设备 |
Citations (3)
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JP2006250934A (ja) | 2005-03-08 | 2006-09-21 | Synthesys Research Inc | デューティ・サイクルを測定するための方法及び装置 |
JP2010114875A (ja) | 2008-11-04 | 2010-05-20 | Hynix Semiconductor Inc | デューティ感知回路およびこれを備えるデューティ補正回路 |
JP2015149708A (ja) | 2014-02-04 | 2015-08-20 | 富士通株式会社 | デジタル式デューティサイクル補正回路及び方法 |
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JP2004348573A (ja) * | 2003-05-23 | 2004-12-09 | Renesas Technology Corp | クロック生成回路およびそれを含むシステム |
JP4623546B2 (ja) * | 2003-05-30 | 2011-02-02 | 株式会社リコー | 電圧制御発振器、pll回路、パルス変調信号生成回路、半導体レーザ変調装置及び画像形成装置 |
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TWI394373B (zh) * | 2007-10-17 | 2013-04-21 | Dadny Inc | 脈寬調變工作週期偵測電路 |
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2018
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-
2019
- 2019-05-17 CN CN201910413407.XA patent/CN110535453A/zh active Pending
- 2019-05-23 US US16/420,564 patent/US10530351B2/en active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
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JP2006250934A (ja) | 2005-03-08 | 2006-09-21 | Synthesys Research Inc | デューティ・サイクルを測定するための方法及び装置 |
JP2010114875A (ja) | 2008-11-04 | 2010-05-20 | Hynix Semiconductor Inc | デューティ感知回路およびこれを備えるデューティ補正回路 |
JP2015149708A (ja) | 2014-02-04 | 2015-08-20 | 富士通株式会社 | デジタル式デューティサイクル補正回路及び方法 |
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Publication number | Publication date |
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US10530351B2 (en) | 2020-01-07 |
US20190363704A1 (en) | 2019-11-28 |
CN110535453A (zh) | 2019-12-03 |
JP2019205077A (ja) | 2019-11-28 |
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