JP7196484B2 - 誘電体組成物および電子部品 - Google Patents
誘電体組成物および電子部品 Download PDFInfo
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- JP7196484B2 JP7196484B2 JP2018171827A JP2018171827A JP7196484B2 JP 7196484 B2 JP7196484 B2 JP 7196484B2 JP 2018171827 A JP2018171827 A JP 2018171827A JP 2018171827 A JP2018171827 A JP 2018171827A JP 7196484 B2 JP7196484 B2 JP 7196484B2
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Description
[1]一般式AaBbC4O15+αで表される複合酸化物と、Alの酸化物と、を含み、
Aは少なくともBaを含み、Bは少なくともZrを含み、Cは少なくともNbを含み、
aが2.50以上3.50以下であり、bが0.50以上1.50以下である誘電体組成物である。
A1は、Mg、CaおよびSrからなる群から選ばれる1種以上を含み、B1は、TiおよびHfからなる群から選ばれる1種以上を含み、C1は、Taを含み、
xは0.50以下であり、yは0.50以下であり、zは0.50以下である[1]に記載の誘電体組成物である。
1.積層セラミックコンデンサ
1.1 積層セラミックコンデンサの全体構成
1.2 誘電体層
1.3 内部電極層
1.4 外部電極
2.誘電体組成物
2.1 複合酸化物
2.2 Alの酸化物
3.積層セラミックコンデンサの製造方法
4.本実施形態における効果
5.変形例
(1.1 積層セラミックコンデンサの全体構成)
本実施形態に係る電子部品の一例としての積層セラミックコンデンサ1が図1に示される。積層セラミックコンデンサ1は、誘電体層2と、内部電極層3と、が交互に積層された構成の素子本体10を有する。この素子本体10の両端部には、素子本体10の内部で交互に配置された内部電極層3と各々導通する一対の外部電極4が形成してある。素子本体10の形状に特に制限はないが、通常、直方体状とされる。また、素子本体10の寸法にも特に制限はなく、用途に応じて適当な寸法とすればよい。
誘電体層2は、後述する本実施形態に係る誘電体組成物から構成されている。その結果、誘電体層2を有する積層セラミックコンデンサは、高い機械的強度を有し、高い電界強度(たとえば、25V/μm)が印加されても、高い比誘電率(たとえば、200以上)を示すことができる。
本実施形態では、内部電極層3は、各端面が素子本体10の対向する2端部の表面に交互に露出するように積層してある。
外部電極4に含有される導電材は特に限定されない。たとえばNi、Cu、Sn、Ag、Pd、Pt、Auあるいはこれらの合金、導電性樹脂など公知の導電材を用いればよい。外部電極4の厚さは用途等に応じて適宜決定すればよい。
本実施形態に係る誘電体組成物は、Ba、ZrおよびNbを少なくとも含む複合酸化物と、Alの酸化物と、を含有している。誘電体組成物において、複合酸化物は主成分である。具体的には、複合酸化物は、本実施形態に係る誘電体組成物100質量%中に、80質量%以上含有され、90質量%以上含まれることが好ましい。
当該複合酸化物に含まれる酸素以外の元素は、価数を基準として、3つの元素グループ(「A」、「B」および「C」)に分けられ、当該複合酸化物は一般式AaBbC4O15+αで表される。
本実施形態に係る誘電体組成物は、上記の複合酸化物以外に、副成分として、Alの酸化物を含有する。Alの酸化物を含むことにより、誘電体組成物の抵抗率が高く、しかも高い電界強度を印加した場合であっても、良好な誘電特性が得られる。さらに、Alの酸化物を含むことにより、上記の複合酸化物から構成される主成分粒子の平均粒径を小さくすることができる。その結果、高い機械的強度を有する誘電体組成物が得られやすい。Alの酸化物としては、たとえば、Al2O3が例示される。
次に、図1に示す積層セラミックコンデンサ1の製造方法の一例について以下に説明する。
本実施形態では、誘電体組成物は、上述した組成を有する複合酸化物と、Alの酸化物とを含有している。
上述した実施形態では、本発明に係る電子部品が積層セラミックコンデンサである場合について説明したが、本発明に係る電子部品は、積層セラミックコンデンサに限定されず、上述した誘電体組成物を有する電子部品であれば何でもよい。
まず、誘電体組成物の主成分である複合酸化物の出発原料として、炭酸バリウム(BaCO3)、炭酸カルシウム(CaCO3)、炭酸ストロンチウム(SrCO3)、酸化マグネシウム(MgO)、酸化ジルコニウム(ZrO2)、酸化ハフニウム(HfO2)、酸化チタン(TiO2)、酸化ニオブ(Nb2O5)および酸化タンタル(Ta2O5)の粉末を準備した。また、Alの酸化物の出発原料として、酸化アルミニウム(Al2O3)および炭酸バリウム(BaCO3)の粉末を準備した。焼成後の誘電体組成物が表1に示す組成を有するように、準備した出発原料を秤量した。なお、Alの酸化物は、複合酸化物100質量%に対して5質量%含有されるように秤量した。
焼成後の誘電体組成物が表2に示す組成を有するように、準備した出発原料を秤量した以外は、実験1と同じ方法により、円盤状のセラミックコンデンサ試料を作製した。また、作製した円盤状のセラミックコンデンサ試料に対して、実験1と同じ方法により、抵抗率、直流電圧を印加しない場合の比誘電率、密度、平均粒径および3点曲げ強さを評価した。結果を表2に示す。
実施例3の試料において、焼成後の誘電体組成物が表3に示す組成を有するように、準備した出発原料を秤量した以外は、実験1と同じ方法により、円盤状のセラミックコンデンサ試料を作製した。また、作製した円盤状のセラミックコンデンサ試料に対して、実験1と同じ方法により、密度、平均粒径および3点曲げ強さを評価した。結果を表3に示す。
焼成後の誘電体組成物が表4に示す組成を有するように、準備した出発原料を秤量した以外は、実験1と同じ方法により、円盤状のセラミックコンデンサ試料および積層セラミックコンデンサ試料を作製した。また、作製した円盤状のセラミックコンデンサ試料および積層セラミックコンデンサ試料に対して、実験1と同じ方法により、抵抗率、直流電圧を印加しない場合の比誘電率、密度、平均粒径および3点曲げ強さを評価した。結果を表4に示す。
10… 素子本体
2… 誘電体層
3… 内部電極層
4… 外部電極
Claims (4)
- 一般式AaBbC4O15+αで表される複合酸化物と、Alの酸化物と、を含み、
前記Aは少なくともBaを含み、前記Bは少なくともZrを含み、前記Cは少なくともNbを含み、
前記aが2.50以上3.50以下であり、前記bが0.50以上1.50以下であり、
前記Alの酸化物は、Baを含む複合酸化物である誘電体組成物。 - 前記一般式は、(Ba1‐xA1x)a(Zr1‐yB1y)b(Nb1‐zC1z)4O15+αで表され、
前記A1は、Mg、CaおよびSrからなる群から選ばれる1種以上を含み、前記B1は、TiおよびHfからなる群から選ばれる1種以上を含み、前記C1は、Taを含み、
前記xは0.50以下であり、前記yは0.50以下であり、前記zは0.50以下である請求項1に記載の誘電体組成物。 - 密度が4.40g/cm3以上である請求項1または2に記載の誘電体組成物。
- 請求項1から3のいずれかに記載の誘電体組成物を含む誘電体層と、電極層と、を備える電子部品。
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