JP7138858B2 - フィルタ逆投影法によるct再構成処理方法 - Google Patents
フィルタ逆投影法によるct再構成処理方法 Download PDFInfo
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T11/00—2D [Two Dimensional] image generation
- G06T11/003—Reconstruction from projections, e.g. tomography
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T11/00—2D [Two Dimensional] image generation
- G06T11/003—Reconstruction from projections, e.g. tomography
- G06T11/006—Inverse problem, transformation from projection-space into object-space, e.g. transform methods, back-projection, algebraic methods
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
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- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B15/00—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
- G01B15/02—Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T3/00—Geometric image transformations in the plane of the image
- G06T3/40—Scaling of whole images or parts thereof, e.g. expanding or contracting
- G06T3/4023—Scaling of whole images or parts thereof, e.g. expanding or contracting based on decimating pixels or lines of pixels; based on inserting pixels or lines of pixels
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- G06T7/136—Segmentation; Edge detection involving thresholding
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- G01N2223/00—Investigating materials by wave or particle radiation
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- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/60—Specific applications or type of materials
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10072—Tomographic images
- G06T2207/10081—Computed x-ray tomography [CT]
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2211/00—Image generation
- G06T2211/40—Computed tomography
- G06T2211/421—Filtered back projection [FBP]
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Description
12…X線源
13…X線
14…X線検出器
16…回転テーブル
20…コントローラ
22…制御PC
W…ワーク(測定対象物)
Claims (4)
- X線CT装置を使って取得した測定対象物の透過像にフィルタ逆投影法を適用してCT再構成処理する際に、
前記透過像にフィルタ逆投影処理のためのフィルタを適用してフィルタ投影像を生成し、
該フィルタ投影像に対して、画像の低解像度化及び/又は枚数の間引きを行って、低解像度の投影像を生成し、
該低解像度の投影像を用いてCT再構成を行って、低解像度のボリュームデータを生成し、
該低解像度のボリュームデータの各ボクセルを仮分割し、
該仮分割したボクセルについて、仮分割前後のボクセル値を比較し、
該仮分割前後のボクセル値の差分が閾値よりも大きければ、その仮分割を有効として、前記ボリュームデータのボクセルにその仮分割のボクセルを反映して更に分割を続け、
前記仮分割前後のボクセル値の差分が閾値よりも小さければ、その仮分割を無効として、前記ボクセルの分割を終了することを特徴とするフィルタ逆投影法によるCT再構成処理方法。 - 前記画像の低解像度化を、2方向の画素をそれぞれ2つずつまとめて画素数を1/4にする2×2のビニングにより行うことを特徴とする請求項1に記載のフィルタ逆投影法によるCT再構成処理方法。
- 前記枚数の間引きを1枚おきに行うことを特徴とする請求項1又は2に記載のフィルタ逆投影法によるCT再構成処理方法。
- 1回のボクセルの仮分割を、3方向をそれぞれ2分割する2×2×2=8分割により行うことを特徴とする請求項1乃至3のいずれかに記載のフィルタ逆投影法によるCT再構成処理方法。
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JP2018127918A JP7138858B2 (ja) | 2018-07-04 | 2018-07-04 | フィルタ逆投影法によるct再構成処理方法 |
US16/455,912 US11004243B2 (en) | 2018-07-04 | 2019-06-28 | CT reconstruction method using filtered back projection |
DE102019004607.2A DE102019004607A1 (de) | 2018-07-04 | 2019-07-01 | Ct-rekonstruktionsverfahren unter verwendung einer gefilterten rückprojektion |
CN201910601553.5A CN110689591B (zh) | 2018-07-04 | 2019-07-04 | 基于滤波反投影法的ct重建处理方法 |
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JP7216953B2 (ja) | 2018-11-30 | 2023-02-02 | 国立大学法人 東京大学 | X線ctにおけるctボリュームの表面抽出方法 |
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JP2004519293A (ja) | 2001-03-12 | 2004-07-02 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 高速コンピュータ断層撮影方法 |
JP2012081101A (ja) | 2010-10-13 | 2012-04-26 | Ge Medical Systems Global Technology Co Llc | X線ct装置 |
JP2013535678A (ja) | 2010-07-09 | 2013-09-12 | ジーイー センシング アンド インスペクション テクノロジーズ ゲ−エムベーハー | コンピュータ断層撮影方法、コンピュータプログラム、コンピュータデバイスおよびコンピュータ断層撮影システム |
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CN110689591A (zh) | 2020-01-14 |
US11004243B2 (en) | 2021-05-11 |
CN110689591B (zh) | 2024-06-21 |
DE102019004607A1 (de) | 2020-01-09 |
US20200013200A1 (en) | 2020-01-09 |
JP2020008361A (ja) | 2020-01-16 |
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