JP7122119B2 - 発光ダイオード - Google Patents
発光ダイオード Download PDFInfo
- Publication number
- JP7122119B2 JP7122119B2 JP2018017456A JP2018017456A JP7122119B2 JP 7122119 B2 JP7122119 B2 JP 7122119B2 JP 2018017456 A JP2018017456 A JP 2018017456A JP 2018017456 A JP2018017456 A JP 2018017456A JP 7122119 B2 JP7122119 B2 JP 7122119B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- type
- type layer
- light emitting
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000012535 impurity Substances 0.000 claims description 201
- 239000004065 semiconductor Substances 0.000 claims description 145
- 230000004888 barrier function Effects 0.000 claims description 60
- 150000001875 compounds Chemical class 0.000 claims description 35
- 229910052733 gallium Inorganic materials 0.000 claims description 17
- 229910052782 aluminium Inorganic materials 0.000 claims description 13
- 229910052785 arsenic Inorganic materials 0.000 claims description 12
- 230000007704 transition Effects 0.000 claims description 12
- 239000000203 mixture Substances 0.000 claims description 8
- 229910052738 indium Inorganic materials 0.000 claims description 5
- 229910052698 phosphorus Inorganic materials 0.000 claims description 3
- 239000000758 substrate Substances 0.000 description 86
- 238000005253 cladding Methods 0.000 description 75
- 239000007789 gas Substances 0.000 description 49
- 238000000034 method Methods 0.000 description 39
- 230000008569 process Effects 0.000 description 23
- 239000002994 raw material Substances 0.000 description 23
- 239000002019 doping agent Substances 0.000 description 22
- 229910021478 group 5 element Inorganic materials 0.000 description 21
- 238000004519 manufacturing process Methods 0.000 description 20
- 239000012159 carrier gas Substances 0.000 description 14
- 239000000969 carrier Substances 0.000 description 13
- 230000000052 comparative effect Effects 0.000 description 13
- 238000009792 diffusion process Methods 0.000 description 12
- 229910052751 metal Inorganic materials 0.000 description 12
- 239000002184 metal Substances 0.000 description 12
- 230000002265 prevention Effects 0.000 description 10
- 238000010586 diagram Methods 0.000 description 9
- 229910000980 Aluminium gallium arsenide Inorganic materials 0.000 description 8
- 239000000463 material Substances 0.000 description 8
- 238000009826 distribution Methods 0.000 description 7
- 238000007740 vapor deposition Methods 0.000 description 6
- 229910052697 platinum Inorganic materials 0.000 description 5
- 229910004298 SiO 2 Inorganic materials 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 229910052737 gold Inorganic materials 0.000 description 4
- 238000010030 laminating Methods 0.000 description 4
- 230000031700 light absorption Effects 0.000 description 4
- 150000002739 metals Chemical class 0.000 description 4
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 3
- 229910000990 Ni alloy Inorganic materials 0.000 description 3
- 239000013078 crystal Substances 0.000 description 3
- 238000001004 secondary ion mass spectrometry Methods 0.000 description 3
- 229910052719 titanium Inorganic materials 0.000 description 3
- XYFCBTPGUUZFHI-UHFFFAOYSA-N Phosphine Chemical compound P XYFCBTPGUUZFHI-UHFFFAOYSA-N 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000000470 constituent Substances 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- ILXWFJOFKUNZJA-UHFFFAOYSA-N ethyltellanylethane Chemical compound CC[Te]CC ILXWFJOFKUNZJA-UHFFFAOYSA-N 0.000 description 2
- 230000005496 eutectics Effects 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 239000007769 metal material Substances 0.000 description 2
- 238000001451 molecular beam epitaxy Methods 0.000 description 2
- 230000006798 recombination Effects 0.000 description 2
- 238000005215 recombination Methods 0.000 description 2
- HJUGFYREWKUQJT-UHFFFAOYSA-N tetrabromomethane Chemical compound BrC(Br)(Br)Br HJUGFYREWKUQJT-UHFFFAOYSA-N 0.000 description 2
- JLTRXTDYQLMHGR-UHFFFAOYSA-N trimethylaluminium Chemical compound C[Al](C)C JLTRXTDYQLMHGR-UHFFFAOYSA-N 0.000 description 2
- XCZXGTMEAKBVPV-UHFFFAOYSA-N trimethylgallium Chemical compound C[Ga](C)C XCZXGTMEAKBVPV-UHFFFAOYSA-N 0.000 description 2
- IBEFSUTVZWZJEL-UHFFFAOYSA-N trimethylindium Chemical compound C[In](C)C IBEFSUTVZWZJEL-UHFFFAOYSA-N 0.000 description 2
- 238000001039 wet etching Methods 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- RBFQJDQYXXHULB-UHFFFAOYSA-N arsane Chemical compound [AsH3] RBFQJDQYXXHULB-UHFFFAOYSA-N 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 229910052804 chromium Inorganic materials 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000001747 exhibiting effect Effects 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- 229910052749 magnesium Inorganic materials 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 229910000073 phosphorus hydride Inorganic materials 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000007790 scraping Methods 0.000 description 1
- 229910052711 selenium Inorganic materials 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 229910052715 tantalum Inorganic materials 0.000 description 1
- -1 thickness Substances 0.000 description 1
- 238000013519 translation Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 238000000927 vapour-phase epitaxy Methods 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/08—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a plurality of light emitting regions, e.g. laterally discontinuous light emitting layer or photoluminescent region integrated within the semiconductor body
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/0004—Devices characterised by their operation
- H01L33/0008—Devices characterised by their operation having p-n or hi-lo junctions
- H01L33/0016—Devices characterised by their operation having p-n or hi-lo junctions having at least two p-n junctions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
- H01L33/0066—Processes for devices with an active region comprising only III-V compounds with a substrate not being a III-V compound
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/04—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction
- H01L33/06—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a quantum effect structure or superlattice, e.g. tunnel junction within the light emitting region, e.g. quantum confinement structure or tunnel barrier
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
- H01L33/30—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table
- H01L33/305—Materials of the light emitting region containing only elements of Group III and Group V of the Periodic Table characterised by the doping materials
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Led Devices (AREA)
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW107116194A TWI673889B (zh) | 2017-05-25 | 2018-05-11 | 發光二極體及穿隧接合層之製造方法 |
KR1020180055190A KR102000396B1 (ko) | 2017-05-25 | 2018-05-15 | 발광 다이오드 및 터널 접합층의 제조 방법 |
US15/981,988 US10439103B2 (en) | 2017-05-25 | 2018-05-17 | Light-emitting diode and method for manufacturing tunnel junction layer |
DE102018112228.4A DE102018112228A1 (de) | 2017-05-25 | 2018-05-22 | Lichtemissionsdiode und Verfahren zum Herstellen einer Tunnelkontakschicht |
CN201810501874.3A CN108933186A (zh) | 2017-05-25 | 2018-05-23 | 发光二极管和隧道结层的制造方法 |
US16/401,361 US10693036B2 (en) | 2017-05-25 | 2019-05-02 | Method for manufacturing tunnel junction layer |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017103197 | 2017-05-25 | ||
JP2017103197 | 2017-05-25 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2018201009A JP2018201009A (ja) | 2018-12-20 |
JP7122119B2 true JP7122119B2 (ja) | 2022-08-19 |
Family
ID=64668397
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018017456A Active JP7122119B2 (ja) | 2017-05-25 | 2018-02-02 | 発光ダイオード |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP7122119B2 (ko) |
KR (1) | KR102000396B1 (ko) |
TW (1) | TWI673889B (ko) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2020167373A (ja) * | 2019-03-28 | 2020-10-08 | ウシオオプトセミコンダクター株式会社 | 赤外led素子 |
WO2020196739A1 (ja) * | 2019-03-28 | 2020-10-01 | ウシオオプトセミコンダクター株式会社 | 赤外led素子 |
JP7201574B2 (ja) * | 2019-12-05 | 2023-01-10 | ウシオ電機株式会社 | 赤外led素子 |
JP7309920B2 (ja) * | 2020-02-19 | 2023-07-18 | 天津三安光電有限公司 | 多接合ledのトンネル接合、多接合led、及びその製作方法 |
JPWO2022196374A1 (ko) * | 2021-03-18 | 2022-09-22 | ||
JP7344434B2 (ja) * | 2021-09-10 | 2023-09-14 | 日亜化学工業株式会社 | 発光素子の製造方法 |
CN113611595B (zh) * | 2021-10-09 | 2021-12-21 | 材料科学姑苏实验室 | 一种半导体结构及其制备方法 |
JP7397348B2 (ja) * | 2021-11-22 | 2023-12-13 | 日亜化学工業株式会社 | 発光素子 |
WO2024076160A1 (ko) * | 2022-10-05 | 2024-04-11 | 엘지전자 주식회사 | 디스플레이 화소용 적색 반도체 발광소자 및 이를 포함하는 디스플레이 장치 |
Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002050790A (ja) | 2000-08-04 | 2002-02-15 | Hitachi Cable Ltd | 化合物半導体発光ダイオードアレイ |
WO2002023640A1 (en) | 2000-09-14 | 2002-03-21 | Optowell Co., Ltd. | Nitride compound semiconductor light emitting device having a tunnel junction structure and fabrication method thereof |
JP2004128502A (ja) | 2002-09-30 | 2004-04-22 | Lumileds Lighting Us Llc | トンネル接合を含む発光装置 |
JP2004336039A (ja) | 2003-04-30 | 2004-11-25 | Agilent Technol Inc | トンネル接合構造を組み込んだGaAsベースの長波長レーザ |
JP2007311632A (ja) | 2006-05-19 | 2007-11-29 | Furukawa Electric Co Ltd:The | 面発光レーザ素子 |
JP2008235878A (ja) | 2007-02-19 | 2008-10-02 | Showa Denko Kk | 太陽電池及びその製造方法 |
JP2011192913A (ja) | 2010-03-16 | 2011-09-29 | Denso Corp | 半導体レーザ構造 |
JP2011198931A (ja) | 2010-03-18 | 2011-10-06 | Showa Denko Kk | Iii族窒化物半導体発光素子の製造方法 |
JP2012521090A (ja) | 2009-03-16 | 2012-09-10 | ザ・ボーイング・カンパニー | 太陽電池内のトンネル接合の高濃度ドープ層 |
JP2013197485A (ja) | 2012-03-22 | 2013-09-30 | Sharp Corp | エピタキシャル基板及びこれを用いた半導体素子の製造方法 |
JP2014229743A (ja) | 2013-05-22 | 2014-12-08 | 株式会社デンソー | 半導体レーザ |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6437060A (en) * | 1987-08-03 | 1989-02-07 | Nippon Telegraph & Telephone | Semiconductor element |
KR100380536B1 (ko) * | 2000-09-14 | 2003-04-23 | 주식회사 옵토웰 | 터널접합 구조를 가지는 질화물반도체 발광소자 |
US7095052B2 (en) * | 2004-10-22 | 2006-08-22 | Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. | Method and structure for improved LED light output |
DE102006039369A1 (de) | 2005-12-30 | 2007-07-05 | Osram Opto Semiconductors Gmbh | LED-Halbleiterkörper und Verwendung eines LED-Halbleiterkörpers |
JP4884810B2 (ja) | 2006-03-17 | 2012-02-29 | 古河電気工業株式会社 | 半導体発光素子及びその製造方法 |
DE102006046037B4 (de) * | 2006-09-28 | 2024-05-29 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | LED-Halbleiterkörper und Verwendung eines LED-Halbleiterkörpers |
KR100887050B1 (ko) * | 2007-12-06 | 2009-03-04 | 삼성전기주식회사 | 질화물 반도체 소자 |
DE102008056371A1 (de) * | 2008-11-07 | 2010-05-12 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung eines optoelektronischen Halbleiterchips und optoelektronischer Halbleiterchip |
TWI555226B (zh) * | 2011-07-12 | 2016-10-21 | 晶元光電股份有限公司 | 具有多層發光疊層的發光元件 |
KR101978632B1 (ko) * | 2011-12-15 | 2019-09-03 | 엘지이노텍 주식회사 | 발광소자 |
CN103999188B (zh) * | 2011-12-23 | 2017-02-22 | 索泰克公司 | 用于光敏器件的稀释氮化物材料的形成方法及相关结构体 |
TWI597862B (zh) * | 2013-08-30 | 2017-09-01 | 晶元光電股份有限公司 | 具阻障層的光電半導體元件 |
-
2018
- 2018-02-02 JP JP2018017456A patent/JP7122119B2/ja active Active
- 2018-05-11 TW TW107116194A patent/TWI673889B/zh not_active IP Right Cessation
- 2018-05-15 KR KR1020180055190A patent/KR102000396B1/ko active IP Right Grant
Patent Citations (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002050790A (ja) | 2000-08-04 | 2002-02-15 | Hitachi Cable Ltd | 化合物半導体発光ダイオードアレイ |
WO2002023640A1 (en) | 2000-09-14 | 2002-03-21 | Optowell Co., Ltd. | Nitride compound semiconductor light emitting device having a tunnel junction structure and fabrication method thereof |
JP2004128502A (ja) | 2002-09-30 | 2004-04-22 | Lumileds Lighting Us Llc | トンネル接合を含む発光装置 |
JP2004336039A (ja) | 2003-04-30 | 2004-11-25 | Agilent Technol Inc | トンネル接合構造を組み込んだGaAsベースの長波長レーザ |
JP2007311632A (ja) | 2006-05-19 | 2007-11-29 | Furukawa Electric Co Ltd:The | 面発光レーザ素子 |
JP2008235878A (ja) | 2007-02-19 | 2008-10-02 | Showa Denko Kk | 太陽電池及びその製造方法 |
JP2012521090A (ja) | 2009-03-16 | 2012-09-10 | ザ・ボーイング・カンパニー | 太陽電池内のトンネル接合の高濃度ドープ層 |
JP2011192913A (ja) | 2010-03-16 | 2011-09-29 | Denso Corp | 半導体レーザ構造 |
JP2011198931A (ja) | 2010-03-18 | 2011-10-06 | Showa Denko Kk | Iii族窒化物半導体発光素子の製造方法 |
JP2013197485A (ja) | 2012-03-22 | 2013-09-30 | Sharp Corp | エピタキシャル基板及びこれを用いた半導体素子の製造方法 |
JP2014229743A (ja) | 2013-05-22 | 2014-12-08 | 株式会社デンソー | 半導体レーザ |
Non-Patent Citations (1)
Title |
---|
Enrique Barrigon, et al.,Highly conductive p++-AlGaAs/n++-GaInP tunnel junctions for ultra-high concentrator solar cells,PROGRESS IN PHOTOVOLTAICS,2014年02月15日,Vol.22,pp.399-404 |
Also Published As
Publication number | Publication date |
---|---|
TWI673889B (zh) | 2019-10-01 |
JP2018201009A (ja) | 2018-12-20 |
KR102000396B1 (ko) | 2019-07-15 |
TW201901982A (zh) | 2019-01-01 |
KR20180129648A (ko) | 2018-12-05 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP7122119B2 (ja) | 発光ダイオード | |
US9281439B2 (en) | Nitride semiconductor element and method for producing same | |
US10693036B2 (en) | Method for manufacturing tunnel junction layer | |
JP4835377B2 (ja) | 半導体発光素子 | |
JP5169012B2 (ja) | 半導体発光素子 | |
US20110037049A1 (en) | Nitride semiconductor light-emitting device | |
JP2008288248A (ja) | 半導体発光素子 | |
JP2007042751A (ja) | 半導体発光素子 | |
US7528417B2 (en) | Light-emitting diode device and production method thereof | |
JP2008103534A (ja) | 半導体発光素子 | |
US20090146163A1 (en) | High brightness light emitting diode structure | |
JP2012129357A (ja) | 半導体発光素子 | |
US20090152584A1 (en) | Light emitting device with bonded interface | |
WO2014167773A1 (ja) | 半導体発光素子及びその製造方法 | |
US20060220032A1 (en) | Semiconductor light emitting device | |
JP4835376B2 (ja) | 半導体発光素子 | |
JP2006040998A (ja) | 半導体発光素子、半導体発光素子用エピタキシャルウェハ | |
JP6153351B2 (ja) | 半導体発光装置 | |
US20130049042A1 (en) | Light emitting device | |
JP7373435B2 (ja) | 半導体発光素子 | |
JP2001168382A (ja) | 半導体発光素子 | |
JP3788444B2 (ja) | 発光ダイオード及びその製造方法 | |
JP2011165800A (ja) | 発光ダイオード及びその製造方法、並びに発光ダイオードランプ | |
JPH05218498A (ja) | 横方向に接合を有する発光ダイオード | |
JPH09172198A (ja) | 発光ダイオードおよびその製造方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20201118 |
|
A711 | Notification of change in applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A711 Effective date: 20201209 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A821 Effective date: 20201209 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20211020 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20211109 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20211214 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20220201 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20220331 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20220802 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20220808 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 7122119 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
S533 | Written request for registration of change of name |
Free format text: JAPANESE INTERMEDIATE CODE: R313533 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |