JP7006573B2 - 単結晶引き上げ装置、および、シリコン単結晶の製造方法 - Google Patents
単結晶引き上げ装置、および、シリコン単結晶の製造方法 Download PDFInfo
- Publication number
- JP7006573B2 JP7006573B2 JP2018224843A JP2018224843A JP7006573B2 JP 7006573 B2 JP7006573 B2 JP 7006573B2 JP 2018224843 A JP2018224843 A JP 2018224843A JP 2018224843 A JP2018224843 A JP 2018224843A JP 7006573 B2 JP7006573 B2 JP 7006573B2
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- JP
- Japan
- Prior art keywords
- single crystal
- pulling device
- crystal pulling
- chamber
- purge tube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/02—Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/22—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal
- C30B15/26—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal using television detectors; using photo or X-ray detectors
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
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- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018224843A JP7006573B2 (ja) | 2018-11-30 | 2018-11-30 | 単結晶引き上げ装置、および、シリコン単結晶の製造方法 |
TW108126505A TWI715122B (zh) | 2018-11-30 | 2019-07-26 | 驅氣管、單晶提拉裝置、及矽單晶的製造方法 |
KR1020190151644A KR102315979B1 (ko) | 2018-11-30 | 2019-11-22 | 퍼지 튜브, 단결정 인상 장치 및 실리콘 단결정의 제조 방법 |
CN201911202817.6A CN111501088B (zh) | 2018-11-30 | 2019-11-29 | 吹扫管、单晶提拉装置及硅单晶的制造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2018224843A JP7006573B2 (ja) | 2018-11-30 | 2018-11-30 | 単結晶引き上げ装置、および、シリコン単結晶の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2020083735A JP2020083735A (ja) | 2020-06-04 |
JP7006573B2 true JP7006573B2 (ja) | 2022-01-24 |
Family
ID=70906374
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2018224843A Active JP7006573B2 (ja) | 2018-11-30 | 2018-11-30 | 単結晶引き上げ装置、および、シリコン単結晶の製造方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP7006573B2 (zh) |
KR (1) | KR102315979B1 (zh) |
CN (1) | CN111501088B (zh) |
TW (1) | TWI715122B (zh) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US12037698B2 (en) * | 2022-01-06 | 2024-07-16 | Globalwafers Co., Ltd | Ingot puller apparatus having a flange that extends from the funnel or from the silicon feed tube |
US11866845B2 (en) | 2022-01-06 | 2024-01-09 | Globalwafers Co., Ltd. | Methods for growing single crystal silicon ingots that involve silicon feed tube inert gas control |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001002489A (ja) | 1999-06-17 | 2001-01-09 | Mitsubishi Materials Corp | 単結晶引上装置 |
JP2011246341A (ja) | 2010-04-26 | 2011-12-08 | Sumco Corp | シリコン単結晶引き上げ装置及びシリコン単結晶の製造方法 |
Family Cites Families (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2795036B2 (ja) * | 1992-02-04 | 1998-09-10 | 信越半導体株式会社 | 単結晶引上装置 |
JP2569053Y2 (ja) * | 1992-10-09 | 1998-04-22 | コマツ電子金属株式会社 | 半導体単結晶製造装置 |
JP3203342B2 (ja) * | 1993-03-25 | 2001-08-27 | ワッカー・エヌエスシーイー株式会社 | 単結晶体の製造装置 |
JP4097729B2 (ja) * | 1996-05-22 | 2008-06-11 | Sumco Techxiv株式会社 | 半導体単結晶製造装置 |
JP3838013B2 (ja) * | 2000-09-26 | 2006-10-25 | 信越半導体株式会社 | シリコン単結晶の製造方法 |
EP1356139B1 (en) * | 2001-01-26 | 2006-08-09 | MEMC Electronic Materials, Inc. | Low defect density silicon substantially free of oxidation induced stacking faults having a vacancy-dominated core |
JP4734139B2 (ja) * | 2006-02-27 | 2011-07-27 | Sumco Techxiv株式会社 | 位置測定方法 |
JP5664573B2 (ja) * | 2012-02-21 | 2015-02-04 | 信越半導体株式会社 | シリコン融液面の高さ位置の算出方法およびシリコン単結晶の引上げ方法ならびにシリコン単結晶引上げ装置 |
KR101554394B1 (ko) * | 2013-12-19 | 2015-09-18 | 주식회사 엘지실트론 | 잉곳의 성장공정을 관찰하기 위한 뷰 포트 및 이를 포함하는 잉곳성장장치 |
JP6390579B2 (ja) * | 2015-10-19 | 2018-09-19 | 信越半導体株式会社 | 単結晶の製造方法 |
JP6202119B2 (ja) * | 2016-03-14 | 2017-09-27 | 株式会社Sumco | シリコン単結晶の製造方法 |
-
2018
- 2018-11-30 JP JP2018224843A patent/JP7006573B2/ja active Active
-
2019
- 2019-07-26 TW TW108126505A patent/TWI715122B/zh active
- 2019-11-22 KR KR1020190151644A patent/KR102315979B1/ko active IP Right Grant
- 2019-11-29 CN CN201911202817.6A patent/CN111501088B/zh active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001002489A (ja) | 1999-06-17 | 2001-01-09 | Mitsubishi Materials Corp | 単結晶引上装置 |
JP2011246341A (ja) | 2010-04-26 | 2011-12-08 | Sumco Corp | シリコン単結晶引き上げ装置及びシリコン単結晶の製造方法 |
Also Published As
Publication number | Publication date |
---|---|
KR102315979B1 (ko) | 2021-10-21 |
CN111501088B (zh) | 2022-06-17 |
CN111501088A (zh) | 2020-08-07 |
JP2020083735A (ja) | 2020-06-04 |
KR20200066193A (ko) | 2020-06-09 |
TWI715122B (zh) | 2021-01-01 |
TW202022171A (zh) | 2020-06-16 |
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