JP7006573B2 - 単結晶引き上げ装置、および、シリコン単結晶の製造方法 - Google Patents

単結晶引き上げ装置、および、シリコン単結晶の製造方法 Download PDF

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JP7006573B2
JP7006573B2 JP2018224843A JP2018224843A JP7006573B2 JP 7006573 B2 JP7006573 B2 JP 7006573B2 JP 2018224843 A JP2018224843 A JP 2018224843A JP 2018224843 A JP2018224843 A JP 2018224843A JP 7006573 B2 JP7006573 B2 JP 7006573B2
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Prior art keywords
single crystal
pulling device
crystal pulling
chamber
purge tube
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JP2018224843A
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Japanese (ja)
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JP2020083735A (ja
Inventor
裕 早川
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Sumco Corp
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Sumco Corp
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Publication date
Application filed by Sumco Corp filed Critical Sumco Corp
Priority to JP2018224843A priority Critical patent/JP7006573B2/ja
Priority to TW108126505A priority patent/TWI715122B/zh
Priority to KR1020190151644A priority patent/KR102315979B1/ko
Priority to CN201911202817.6A priority patent/CN111501088B/zh
Publication of JP2020083735A publication Critical patent/JP2020083735A/ja
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    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/02Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B15/00Single-crystal growth by pulling from a melt, e.g. Czochralski method
    • C30B15/20Controlling or regulating
    • C30B15/22Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal
    • C30B15/26Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal using television detectors; using photo or X-ray detectors
    • CCHEMISTRY; METALLURGY
    • C30CRYSTAL GROWTH
    • C30BSINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
    • C30B29/00Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
    • C30B29/02Elements
    • C30B29/06Silicon

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  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
JP2018224843A 2018-11-30 2018-11-30 単結晶引き上げ装置、および、シリコン単結晶の製造方法 Active JP7006573B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2018224843A JP7006573B2 (ja) 2018-11-30 2018-11-30 単結晶引き上げ装置、および、シリコン単結晶の製造方法
TW108126505A TWI715122B (zh) 2018-11-30 2019-07-26 驅氣管、單晶提拉裝置、及矽單晶的製造方法
KR1020190151644A KR102315979B1 (ko) 2018-11-30 2019-11-22 퍼지 튜브, 단결정 인상 장치 및 실리콘 단결정의 제조 방법
CN201911202817.6A CN111501088B (zh) 2018-11-30 2019-11-29 吹扫管、单晶提拉装置及硅单晶的制造方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018224843A JP7006573B2 (ja) 2018-11-30 2018-11-30 単結晶引き上げ装置、および、シリコン単結晶の製造方法

Publications (2)

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JP2020083735A JP2020083735A (ja) 2020-06-04
JP7006573B2 true JP7006573B2 (ja) 2022-01-24

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JP2018224843A Active JP7006573B2 (ja) 2018-11-30 2018-11-30 単結晶引き上げ装置、および、シリコン単結晶の製造方法

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JP (1) JP7006573B2 (zh)
KR (1) KR102315979B1 (zh)
CN (1) CN111501088B (zh)
TW (1) TWI715122B (zh)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12037698B2 (en) * 2022-01-06 2024-07-16 Globalwafers Co., Ltd Ingot puller apparatus having a flange that extends from the funnel or from the silicon feed tube
US11866845B2 (en) 2022-01-06 2024-01-09 Globalwafers Co., Ltd. Methods for growing single crystal silicon ingots that involve silicon feed tube inert gas control

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001002489A (ja) 1999-06-17 2001-01-09 Mitsubishi Materials Corp 単結晶引上装置
JP2011246341A (ja) 2010-04-26 2011-12-08 Sumco Corp シリコン単結晶引き上げ装置及びシリコン単結晶の製造方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2795036B2 (ja) * 1992-02-04 1998-09-10 信越半導体株式会社 単結晶引上装置
JP2569053Y2 (ja) * 1992-10-09 1998-04-22 コマツ電子金属株式会社 半導体単結晶製造装置
JP3203342B2 (ja) * 1993-03-25 2001-08-27 ワッカー・エヌエスシーイー株式会社 単結晶体の製造装置
JP4097729B2 (ja) * 1996-05-22 2008-06-11 Sumco Techxiv株式会社 半導体単結晶製造装置
JP3838013B2 (ja) * 2000-09-26 2006-10-25 信越半導体株式会社 シリコン単結晶の製造方法
EP1356139B1 (en) * 2001-01-26 2006-08-09 MEMC Electronic Materials, Inc. Low defect density silicon substantially free of oxidation induced stacking faults having a vacancy-dominated core
JP4734139B2 (ja) * 2006-02-27 2011-07-27 Sumco Techxiv株式会社 位置測定方法
JP5664573B2 (ja) * 2012-02-21 2015-02-04 信越半導体株式会社 シリコン融液面の高さ位置の算出方法およびシリコン単結晶の引上げ方法ならびにシリコン単結晶引上げ装置
KR101554394B1 (ko) * 2013-12-19 2015-09-18 주식회사 엘지실트론 잉곳의 성장공정을 관찰하기 위한 뷰 포트 및 이를 포함하는 잉곳성장장치
JP6390579B2 (ja) * 2015-10-19 2018-09-19 信越半導体株式会社 単結晶の製造方法
JP6202119B2 (ja) * 2016-03-14 2017-09-27 株式会社Sumco シリコン単結晶の製造方法

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001002489A (ja) 1999-06-17 2001-01-09 Mitsubishi Materials Corp 単結晶引上装置
JP2011246341A (ja) 2010-04-26 2011-12-08 Sumco Corp シリコン単結晶引き上げ装置及びシリコン単結晶の製造方法

Also Published As

Publication number Publication date
KR102315979B1 (ko) 2021-10-21
CN111501088B (zh) 2022-06-17
CN111501088A (zh) 2020-08-07
JP2020083735A (ja) 2020-06-04
KR20200066193A (ko) 2020-06-09
TWI715122B (zh) 2021-01-01
TW202022171A (zh) 2020-06-16

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