JP6691184B2 - 発光素子のマトリックスを組み立てるためのギャングボンディングプロセス - Google Patents
発光素子のマトリックスを組み立てるためのギャングボンディングプロセス Download PDFInfo
- Publication number
- JP6691184B2 JP6691184B2 JP2018175883A JP2018175883A JP6691184B2 JP 6691184 B2 JP6691184 B2 JP 6691184B2 JP 2018175883 A JP2018175883 A JP 2018175883A JP 2018175883 A JP2018175883 A JP 2018175883A JP 6691184 B2 JP6691184 B2 JP 6691184B2
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- Prior art keywords
- light emitting
- bonding
- solder
- temporary carrier
- conductive material
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000000034 method Methods 0.000 title claims description 87
- 239000011159 matrix material Substances 0.000 title claims description 48
- 230000008569 process Effects 0.000 title description 56
- 229910000679 solder Inorganic materials 0.000 claims description 101
- 230000004907 flux Effects 0.000 claims description 40
- 239000000853 adhesive Substances 0.000 claims description 22
- 230000001070 adhesive effect Effects 0.000 claims description 22
- 239000000758 substrate Substances 0.000 claims description 22
- 239000004020 conductor Substances 0.000 claims description 20
- 230000006835 compression Effects 0.000 claims description 17
- 238000007906 compression Methods 0.000 claims description 17
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 10
- 239000010410 layer Substances 0.000 claims description 10
- 238000007598 dipping method Methods 0.000 claims description 9
- 230000000007 visual effect Effects 0.000 claims description 7
- 238000007639 printing Methods 0.000 claims description 6
- 238000010438 heat treatment Methods 0.000 claims description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 5
- 239000013464 silicone adhesive Substances 0.000 claims description 4
- 238000001816 cooling Methods 0.000 claims description 3
- 239000004642 Polyimide Substances 0.000 claims description 2
- 238000009713 electroplating Methods 0.000 claims description 2
- 229920001721 polyimide Polymers 0.000 claims description 2
- 238000010348 incorporation Methods 0.000 claims 1
- IYZWUWBAFUBNCH-UHFFFAOYSA-N 2,6-dichlorobiphenyl Chemical compound ClC1=CC=CC(Cl)=C1C1=CC=CC=C1 IYZWUWBAFUBNCH-UHFFFAOYSA-N 0.000 description 41
- 239000000463 material Substances 0.000 description 11
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 7
- 239000010931 gold Substances 0.000 description 7
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 6
- 229910052737 gold Inorganic materials 0.000 description 6
- 230000015572 biosynthetic process Effects 0.000 description 4
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- 238000009736 wetting Methods 0.000 description 4
- 238000013459 approach Methods 0.000 description 3
- 239000003086 colorant Substances 0.000 description 3
- 238000001465 metallisation Methods 0.000 description 3
- 229910052759 nickel Inorganic materials 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000001704 evaporation Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 239000000155 melt Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 229910017944 Ag—Cu Inorganic materials 0.000 description 1
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- 241000791900 Selene vomer Species 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- 239000002313 adhesive film Substances 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 230000004888 barrier function Effects 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 150000001879 copper Chemical class 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000000374 eutectic mixture Substances 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- MSNOMDLPLDYDME-UHFFFAOYSA-N gold nickel Chemical compound [Ni].[Au] MSNOMDLPLDYDME-UHFFFAOYSA-N 0.000 description 1
- JVPLOXQKFGYFMN-UHFFFAOYSA-N gold tin Chemical compound [Sn].[Au] JVPLOXQKFGYFMN-UHFFFAOYSA-N 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 238000013507 mapping Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 238000013021 overheating Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 150000003071 polychlorinated biphenyls Chemical class 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
Classifications
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- H—ELECTRICITY
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- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/15—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components having potential barriers, specially adapted for light emission
- H01L27/153—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components having potential barriers, specially adapted for light emission in a repetitive configuration, e.g. LED bars
- H01L27/156—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components having potential barriers, specially adapted for light emission in a repetitive configuration, e.g. LED bars two-dimensional arrays
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- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
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- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/492—Bases or plates or solder therefor
- H01L23/4924—Bases or plates or solder therefor characterised by the materials
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
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- H01L2224/9512—Aligning the plurality of semiconductor or solid-state bodies
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- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L2224/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
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- H01L25/04—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
- H01L25/075—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00
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Description
(1)マトリックス配列のPCBのボンディングパッド上に半田キャップなどの導電性材料を形成するステップ、
(2)ギャングボンディングの準備のためにLEDマトリックスを当該マトリックス配列でキャリア上にソート及び配置するステップ、
(3)LEDマトリックスの電極に半田フラックスを付加するステップ、及び
(4)LEDマトリックスをPCB上にボンディングするステップ。
14 半田ペーストプリンタ
16 ステンシル
18 半田ペースト
20 スキージブレード
22 ステンシル開口
24 半田材料
26 半田キャップ
30 一時的キャリア
32 接着剤
34 ピックヘッド
36、38、40 LED
42 ボンディングヘッド
44 フラックスポット
46 フラックスプール
50 視覚的アライメントカメラ
Claims (20)
- 基板上に発光素子のマトリックスのボンディングを行うための方法であって、
前記基板のボンディングパッド上に複数のボンディングパッドを含むマトリックス配列で導電性材料を形成するステップと;
ピックヘッドで複数の発光素子をピックして一時的キャリア上に前記マトリックス配列で配置するステップと;
前記複数の発光素子を含む前記一時的キャリアをボンディングヘッドで保持するステップであって、前記ボンディングヘッドが前記一時的キャリアとは別個の部材である、前記一時的キャリアをボンディングヘッドで保持するステップと;
前記複数の発光素子上の電極と前記基板上の前記導電性材料とを接触させるように、前記ボンディングヘッドで前記一時的キャリアを移動させるステップと;
その後、前記発光素子と前記基板との間に導電性接合を形成するように、前記ボンディングヘッドで前記導電性材料に対して圧縮力を掛けながら前記発光素子に熱を加えるステップと、
を含む方法。 - 前記導電性材料は、半田を含む、請求項1に記載の方法。
- 前記ボンディングパッド上に半田を形成するステップは、半田ペーストプリンタを使用して前記ボンディングパッド上に前記半田をプリントする工程を含む、請求項2に記載の方法。
- 前記複数の発光素子上の前記電極と前記基板上の前記導電性材料とを接触させる前に、前記基板の前記ボンディングパッド上に半田キャップを形成するために前記半田のリフローを行うステップをさらに含む、請求項2に記載の方法。
- 導電性接合を形成するステップは、前記複数の発光素子上の前記電極と前記半田キャップとの間に半田接合を形成する工程を含む、請求項4に記載の方法。
- 前記半田キャップの厚さは、15〜35ミクロンである、請求項4に記載の方法。
- 前記一時的キャリアは、実装される発光素子の前記一時的キャリア上の位置を固定するための、前記発光素子が実装される接着剤の層を含む、請求項1に記載の方法。
- 前記発光素子が前記基板上にボンディングされた後で前記発光素子を前記接着剤から引き離すことができるように、前記接着剤の接着強度は、温度を上げると低下するように構成されている、請求項7に記載の方法。
- 前記接着剤は、シリコーン接着層を含むか、又はポリイミドのベースフィルムに組み込まれたシリコーン接着剤を含む、請求項7に記載の方法。
- 前記導電性材料は、スズ又はスズ系半田を含み、前記ボンディングパッド上の前記導電性材料は、前記ボンディングパッド上に電気メッキされたスズ又は無電解スズめっきにより形成されている、請求項1に記載の方法。
- 前記発光素子の各々は、ディスプレイパネルへの組込みのために、それぞれ赤色、緑色、又は青色の光を放出するように作動する、請求項1に記載の方法。
- 前記発光素子をピックして配置するステップは、ソートされた前記発光素子を別の発光素子に対する特定位置において前記一時的キャリア上に配置する前に、それぞれ赤色、緑色、又は青色の光を放出するように作動する前記発光素子のソーティングを行う工程をさらに含む、請求項11に記載の方法。
- 前記一時的キャリアに対する前記基板の位置合わせを行うために、前記基板上及び前記一時的キャリア上に基準マークを含む、請求項1に記載の方法。
- 前記発光素子の前記電極と前記基板上の前記導電性材料とを接触させる前に、前記一時的キャリアに対する前記基板の位置合わせを行うように、視覚的アライメントカメラで前記基準マークの各々の視覚的アライメントを行うステップをさらに備える、請求項13に記載の方法。
- フラックスによる前記発光素子の前記電極のウェッティングを同時に行うために、フラックスプール中への前記発光素子の前記電極のディッピングを行うステップをさらに備える、請求項1に記載の方法。
- 前記フラックスは、半田リフロー後の残留物が最小限となる高品質の無洗浄フラックスであるか、又は、前記フラックスは、前記発光素子を水ですすぐことにより除去可能なように水溶性である、請求項15に記載の方法。
- すべての前記導電性材料が前記発光素子上の対応する電極に接触するまで、前記導電性材料に対して圧縮力を掛ける工程を含む、請求項1に記載の方法。
- 前記導電性材料によりすべての前記発光素子の前記電極のウェッティングが行われるまで、及び導電性接合を形成するための冷却中、前記ボンディングヘッドは、前記導電性材料に対して前記圧縮力を掛けながら、同じ高さに維持される、請求項17に記載の方法。
- 前記ボンディングヘッドは、熱圧縮ボンダーに含まれ、パルス加熱素子を含む、請求項1に記載の方法。
- 前記基板の別の部分に対して一時的キャリア上に実装されたさらなる複数の発光素子のボンディングを行うために、前記さらなる複数の発光素子の電極と前記基板のさらなるボンディングパッド上の導電性材料とを接触させるとともに当該電極と当該導電性材料との間で導電性接合を形成するステップをさらに備える、請求項1に記載の方法。
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