JP6579840B2 - 欠陥測定方法、欠陥測定装置、および検査プローブ - Google Patents

欠陥測定方法、欠陥測定装置、および検査プローブ Download PDF

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JP6579840B2
JP6579840B2 JP2015142390A JP2015142390A JP6579840B2 JP 6579840 B2 JP6579840 B2 JP 6579840B2 JP 2015142390 A JP2015142390 A JP 2015142390A JP 2015142390 A JP2015142390 A JP 2015142390A JP 6579840 B2 JP6579840 B2 JP 6579840B2
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defect
magnetic
tube
range
cross
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JP2017026354A (ja
JP2017026354A5 (enExample
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豊和 多田
豊和 多田
秀彦 末次
秀彦 末次
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Sumitomo Chemical Co Ltd
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Priority to KR1020187003583A priority patent/KR102501069B1/ko
Priority to EP16824195.8A priority patent/EP3336533B1/en
Priority to SG11201800262YA priority patent/SG11201800262YA/en
Priority to PCT/JP2016/067808 priority patent/WO2017010215A1/ja
Priority to US15/744,700 priority patent/US10539535B2/en
Priority to CN201680041554.3A priority patent/CN107850571B/zh
Publication of JP2017026354A publication Critical patent/JP2017026354A/ja
Priority to SA518390730A priority patent/SA518390730B1/ar
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9013—Arrangements for scanning
    • G01N27/902—Arrangements for scanning by moving the sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws

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  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
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  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP2015142390A 2015-07-16 2015-07-16 欠陥測定方法、欠陥測定装置、および検査プローブ Active JP6579840B2 (ja)

Priority Applications (8)

Application Number Priority Date Filing Date Title
JP2015142390A JP6579840B2 (ja) 2015-07-16 2015-07-16 欠陥測定方法、欠陥測定装置、および検査プローブ
EP16824195.8A EP3336533B1 (en) 2015-07-16 2016-06-15 Defect measurement method and defect measurement device
SG11201800262YA SG11201800262YA (en) 2015-07-16 2016-06-15 Defect measurement method, defect measurement device, and testing probe
PCT/JP2016/067808 WO2017010215A1 (ja) 2015-07-16 2016-06-15 欠陥測定方法、欠陥測定装置、および検査プローブ
KR1020187003583A KR102501069B1 (ko) 2015-07-16 2016-06-15 결함 측정 방법, 결함 측정 장치 및 검사 프로브
US15/744,700 US10539535B2 (en) 2015-07-16 2016-06-15 Defect measurement method, defect measurement device, and testing probe
CN201680041554.3A CN107850571B (zh) 2015-07-16 2016-06-15 缺陷测量方法、缺陷测量装置及检查探针
SA518390730A SA518390730B1 (ar) 2015-07-16 2018-01-11 طريقة لقياس العيوب، وجهاز لقياسها، ومسبار اختبار

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JP (1) JP6579840B2 (enExample)
KR (1) KR102501069B1 (enExample)
CN (1) CN107850571B (enExample)
SA (1) SA518390730B1 (enExample)
SG (1) SG11201800262YA (enExample)
WO (1) WO2017010215A1 (enExample)

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WO2022196425A1 (ja) 2021-03-16 2022-09-22 住友化学株式会社 情報処理方法、プログラム、情報処理装置及びモデル生成方法

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CN113777155B (zh) * 2021-09-09 2024-05-03 国家石油天然气管网集团有限公司华南分公司 一种基于Halbach阵列式线圈的涡流探头
CN113777154B (zh) * 2021-09-09 2024-06-07 国家石油天然气管网集团有限公司华南分公司 一种增强涡流传感器线圈灵敏度的方法
CN115902290A (zh) * 2021-09-30 2023-04-04 中国石油化工股份有限公司 一种用于管道内仪器的测速装置及测速方法
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WO2022196425A1 (ja) 2021-03-16 2022-09-22 住友化学株式会社 情報処理方法、プログラム、情報処理装置及びモデル生成方法

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KR102501069B1 (ko) 2023-02-20
WO2017010215A1 (ja) 2017-01-19
CN107850571B (zh) 2021-03-30
US20180217097A1 (en) 2018-08-02
JP2017026354A (ja) 2017-02-02
SG11201800262YA (en) 2018-02-27
KR20180030991A (ko) 2018-03-27
SA518390730B1 (ar) 2021-12-06
EP3336533B1 (en) 2020-04-15
US10539535B2 (en) 2020-01-21
EP3336533A1 (en) 2018-06-20
EP3336533A4 (en) 2019-03-27
CN107850571A (zh) 2018-03-27

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