JP6561825B2 - 搬送装置、基盤およびその製造方法 - Google Patents
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- 239000000758 substrate Substances 0.000 title claims description 77
- 238000004519 manufacturing process Methods 0.000 title claims description 12
- 230000002093 peripheral effect Effects 0.000 claims description 78
- 238000007747 plating Methods 0.000 claims description 67
- 239000000463 material Substances 0.000 claims description 30
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 claims description 10
- 238000010292 electrical insulation Methods 0.000 claims description 9
- 239000011347 resin Substances 0.000 claims description 9
- 229920005989 resin Polymers 0.000 claims description 9
- 239000011521 glass Substances 0.000 claims description 8
- 239000011248 coating agent Substances 0.000 claims description 7
- 238000000576 coating method Methods 0.000 claims description 7
- 239000002184 metal Substances 0.000 claims description 7
- 229910052751 metal Inorganic materials 0.000 claims description 7
- 239000004020 conductor Substances 0.000 claims description 6
- 229910052759 nickel Inorganic materials 0.000 claims description 5
- 229910045601 alloy Inorganic materials 0.000 claims description 4
- 239000000956 alloy Substances 0.000 claims description 4
- 229910017052 cobalt Inorganic materials 0.000 claims description 4
- 239000010941 cobalt Substances 0.000 claims description 4
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 claims description 4
- 238000000034 method Methods 0.000 claims description 4
- 238000007689 inspection Methods 0.000 description 32
- 230000032258 transport Effects 0.000 description 22
- 239000004809 Teflon Substances 0.000 description 5
- 229920006362 Teflon® Polymers 0.000 description 5
- 230000005611 electricity Effects 0.000 description 5
- 230000003068 static effect Effects 0.000 description 5
- -1 polypropylene Polymers 0.000 description 4
- 238000006073 displacement reaction Methods 0.000 description 3
- 229910052710 silicon Inorganic materials 0.000 description 3
- 239000004698 Polyethylene Substances 0.000 description 2
- 239000004642 Polyimide Substances 0.000 description 2
- 239000004743 Polypropylene Substances 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000013459 approach Methods 0.000 description 2
- 230000002950 deficient Effects 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 229920000573 polyethylene Polymers 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 229920001155 polypropylene Polymers 0.000 description 2
- 229920002635 polyurethane Polymers 0.000 description 2
- 239000004814 polyurethane Substances 0.000 description 2
- 229920000915 polyvinyl chloride Polymers 0.000 description 2
- 239000004800 polyvinyl chloride Substances 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000010935 stainless steel Substances 0.000 description 2
- 229910001220 stainless steel Inorganic materials 0.000 description 2
- 230000003746 surface roughness Effects 0.000 description 2
- 229910003266 NiCo Inorganic materials 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000003575 carbonaceous material Substances 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000005323 electroforming Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910003465 moissanite Inorganic materials 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 239000002210 silicon-based material Substances 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
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- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
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- H01L21/67703—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations between different workstations
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- H01L21/6773—Conveying cassettes, containers or carriers
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
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- B65G2201/00—Indexing codes relating to handling devices, e.g. conveyors, characterised by the type of product or load being conveyed or handled
- B65G2201/02—Articles
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- B65—CONVEYING; PACKING; STORING; HANDLING THIN OR FILAMENTARY MATERIAL
- B65G—TRANSPORT OR STORAGE DEVICES, e.g. CONVEYORS FOR LOADING OR TIPPING, SHOP CONVEYOR SYSTEMS OR PNEUMATIC TUBE CONVEYORS
- B65G2812/00—Indexing codes relating to the kind or type of conveyors
- B65G2812/01—Conveyors composed of several types of conveyors
- B65G2812/012—Conveyors composed of several types of conveyors for conveying material successively by a series of conveyors
- B65G2812/013—Conveyors composed of several types of conveyors for conveying material successively by a series of conveyors without relative movement between conveyors
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Description
本発明は上記の問題点に鑑みてなされたものであって、搬送中のワークの位置ずれを抑制して安定してワークを搬送できるとともに搬送装置を小型化できる、搬送装置、基盤およびその製造方法を提供することを目的とする。
本発明の一形態においては、第1基盤および第2基盤の各々が、円盤状の外形を有している。第2基盤の外周長さは、第1基盤の外周長さより長い。第2基盤による複数のワークの搬送速度は、第1基盤による複数のワークの搬送速度より大きい。
本発明の一形態においては、主部は、ニッケルおよびコバルトを含む合金で構成されている。
図1は、本発明の実施形態1に係る搬送装置が適用された検査装置の構成を示す平面図である。図2は、図1の検査装置のII−II線矢印方向から見た断面図である。図3は、図2中の点線で囲んだIII部を拡大して示す断面図である。図1においては、後述する供給部110を図示していない。
以下、本発明の実施形態2に係る搬送装置について説明する。なお、本実施形態に係る搬送装置は、第1基盤の主部の上面に被覆部が設けられている点のみ実施形態1に係る搬送装置と異なるため、実施形態1に係る搬送装置と同様の構成については説明を繰り返さない。
以下、本発明の実施形態3に係る搬送装置について説明する。なお、本実施形態に係る搬送装置は、第1基盤の中央部と外周部との厚さが異なる点のみ実施形態1に係る搬送装置と異なるため、実施形態1に係る搬送装置と同様の構成については説明を繰り返さない。
以下、本発明の実施形態4に係る搬送装置について説明する。なお、本実施形態に係る搬送装置は、第2基盤の中央部が金属で構成されている点のみ実施形態1に係る搬送装置と異なるため、実施形態1に係る搬送装置と同様の構成については説明を繰り返さない。
Claims (21)
- 複数のワークを整列させて順次搬送する第1基盤と、
前記第1基盤から供給された前記複数のワークを順次搬送する第2基盤と、
前記第1基盤を回転させる第1駆動部と、
前記第2基盤を回転させる第2駆動部とを備え、
前記第1基盤は、板状の主部、および、該主部の少なくとも外周部の下面を覆い、前記主部を構成する材料とは異なる材料で構成されて電気絶縁性を有する被覆部を含み、
前記第2基盤は、前記被覆部を構成する材料とは異なる材料で構成されて電気絶縁性を有する外周部を含み、
前記第2基盤の前記外周部の上面は、前記第1基盤の前記被覆部と摺接し、
前記第2基盤の前記外周部の前記上面に、前記第1基盤が順次搬送した前記複数のワークが載置される、搬送装置。 - 前記主部は、導電性材料で構成されている、請求項1に記載の搬送装置。
- 前記第1基盤および前記第2基盤の各々が、円盤状の外形を有し、
前記第2基盤の外周長さは、前記第1基盤の外周長さより長く、
前記第2基盤による前記複数のワークの搬送速度は、前記第1基盤による前記複数のワークの搬送速度より大きい、請求項1または請求項2に記載の搬送装置。 - 前記第1基盤の上方に、前記複数のワークを整列させるガイドが設けられており、
前記ガイドは、前記第1基盤上に位置する前記複数のワークが前記第1基盤の回転に伴って前記第1基盤の径方向の外側に移動するように、前記第1基盤の周方向に対して交差する方向に延在している部分を含む、請求項1から請求項3のいずれか1項に記載の搬送装置。 - 前記第2基盤の前記外周部は、ガラスで構成されており、
前記被覆部は、樹脂で構成されている、請求項1から請求項4のいずれか1項に記載の搬送装置。 - 前記主部の前記外周部の厚さが、10μm以上200μm以下である、請求項1から請求項5のいずれか1項に記載の搬送装置。
- 前記主部の前記外周部は、前記被覆部より厚く、
前記主部の前記外周部の剛性は、前記被覆部の剛性より高い、請求項6に記載の搬送装置。 - 前記主部は、金属で構成されている、請求項1から請求項7のいずれか1項に記載の搬送装置。
- 前記主部は、ニッケルおよびコバルトを含む合金で構成されている、請求項8に記載の搬送装置。
- 前記主部は、前記外周部と該外周部に周りを囲まれた中央部とから構成されており、
前記中央部は、前記外周部より厚い、請求項1から請求項9のいずれか1項に記載の搬送装置。 - 回転することによって複数のワークを整列させて順次搬送し、摺接する他の基盤の摺接部に前記複数のワークを載置する基盤であって、
板状の主部と、
前記主部の少なくとも外周部の下面を覆い、前記主部を構成する材料とは異なる材料で構成されて電気絶縁性を有し、前記摺接部と摺接する被覆部とを備える、基盤。 - 前記主部は、導電性材料で構成されている、請求項11に記載の基盤。
- 前記基盤は、円盤状の外形を有する、請求項11または請求項12に記載の基盤。
- 前記被覆部は、樹脂で構成されている、請求項11から請求項13のいずれか1項に記載の基盤。
- 前記主部の前記外周部の厚さが、10μm以上200μm以下である、請求項11から請求項14のいずれか1項に記載の基盤。
- 前記主部の前記外周部は、前記被覆部より厚く、
前記主部の前記外周部の剛性は、前記被覆部の剛性より高い、請求項15に記載の基盤。 - 前記主部は、金属で構成されている、請求項11から請求項16のいずれか1項に記載の基盤。
- 前記主部は、ニッケルおよびコバルトを含む合金で構成されている、請求項17に記載の基盤。
- 前記主部は、前記外周部と該外周部に周りを囲まれた中央部とから構成されており、
前記中央部は、前記外周部より厚い、請求項11から請求項18のいずれか1項に記載の基盤。 - 請求項11に記載の基盤の製造方法であって、
基板の主面に枠状の第1マスクを配置する工程と、
基板の前記主面上の前記第1マスク内の領域に第1めっき膜を形成する工程と、
前記第1めっき膜の少なくとも外周部の上面を覆う被覆部を形成する工程と、
前記被覆部を形成された前記第1めっき膜を前記基板から剥離する工程とを備える、基盤の製造方法。 - 前記第1めっき膜を形成する工程と前記被覆部を形成する工程との間に、
前記第1めっき膜の前記外周部の上面に枠状の第2マスクを配置する工程と、
前記第1めっき膜上の前記第2マスク内の領域に第2めっき膜を形成する工程とを備える、請求項20に記載の基盤の製造方法。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015248434A JP6561825B2 (ja) | 2015-12-21 | 2015-12-21 | 搬送装置、基盤およびその製造方法 |
CN201610814032.4A CN106892258B (zh) | 2015-12-21 | 2016-09-09 | 搬运装置、底座及其制造方法 |
KR1020160170151A KR101928300B1 (ko) | 2015-12-21 | 2016-12-14 | 반송 장치, 기반 및 그 제조 방법 |
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