JP6395482B2 - 光電変換装置、および、撮像システム - Google Patents

光電変換装置、および、撮像システム Download PDF

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Publication number
JP6395482B2
JP6395482B2 JP2014143672A JP2014143672A JP6395482B2 JP 6395482 B2 JP6395482 B2 JP 6395482B2 JP 2014143672 A JP2014143672 A JP 2014143672A JP 2014143672 A JP2014143672 A JP 2014143672A JP 6395482 B2 JP6395482 B2 JP 6395482B2
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JP
Japan
Prior art keywords
photoelectric conversion
voltage
electrode
conversion device
reset
Prior art date
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Expired - Fee Related
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JP2014143672A
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English (en)
Japanese (ja)
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JP2016021611A5 (cg-RX-API-DMAC7.html
JP2016021611A (ja
Inventor
和昭 田代
和昭 田代
紀之 海部
紀之 海部
高橋 秀和
秀和 高橋
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Canon Inc
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Canon Inc
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Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2014143672A priority Critical patent/JP6395482B2/ja
Priority to BR102015015323A priority patent/BR102015015323A2/pt
Priority to EP15174206.1A priority patent/EP2966857B1/en
Priority to CN201510394130.2A priority patent/CN105261624B/zh
Priority to RU2015127490A priority patent/RU2611209C2/ru
Priority to US14/794,653 priority patent/US9571768B2/en
Publication of JP2016021611A publication Critical patent/JP2016021611A/ja
Priority to US15/392,967 priority patent/US9826181B2/en
Publication of JP2016021611A5 publication Critical patent/JP2016021611A5/ja
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50—Control of the SSIS exposure
    • H04N25/57—Control of the dynamic range
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/011—Manufacture or treatment of image sensors covered by group H10F39/12
    • H10F39/016—Manufacture or treatment of image sensors covered by group H10F39/12 of thin-film-based image sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50—Control of the SSIS exposure
    • H04N25/57—Control of the dynamic range
    • H04N25/58—Control of the dynamic range involving two or more exposures
    • H04N25/587—Control of the dynamic range involving two or more exposures acquired sequentially, e.g. using the combination of odd and even image fields
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/12—Image sensors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/28—Systems for automatic generation of focusing signals
    • G02B7/36—Systems for automatic generation of focusing signals using image sharpness techniques, e.g. image processing techniques for generating autofocus signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50—Control of the SSIS exposure
    • H04N25/57—Control of the dynamic range
    • H04N25/59—Control of the dynamic range by controlling the amount of charge storable in the pixel, e.g. modification of the charge conversion ratio of the floating node capacitance
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/65—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to reset noise, e.g. KTC noise related to CMOS structures by techniques other than CDS
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/709—Circuitry for control of the power supply
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/766—Addressed sensors, e.g. MOS or CMOS sensors comprising control or output lines used for a plurality of functions, e.g. for pixel output, driving, reset or power
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/80—Constructional details of image sensors
    • H10F39/803—Pixels having integrated switching, control, storage or amplification elements
    • H10F39/8033—Photosensitive area
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/7795—Circuitry for generating timing or clock signals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/78—Readout circuits for addressed sensors, e.g. output amplifiers or A/D converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
JP2014143672A 2014-07-11 2014-07-11 光電変換装置、および、撮像システム Expired - Fee Related JP6395482B2 (ja)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2014143672A JP6395482B2 (ja) 2014-07-11 2014-07-11 光電変換装置、および、撮像システム
BR102015015323A BR102015015323A2 (pt) 2014-07-11 2015-06-24 dispositivo de conversão fotoelétrica e sistema de formação de imagem
EP15174206.1A EP2966857B1 (en) 2014-07-11 2015-06-29 Photoelectric conversion device and imaging system
CN201510394130.2A CN105261624B (zh) 2014-07-11 2015-07-07 光电转换装置和成像系统
RU2015127490A RU2611209C2 (ru) 2014-07-11 2015-07-08 Устройство фотоэлектрического преобразования и система формирования изображений
US14/794,653 US9571768B2 (en) 2014-07-11 2015-07-08 Photoelectric conversion device and imaging system
US15/392,967 US9826181B2 (en) 2014-07-11 2016-12-28 Photoelectric conversion device and imaging system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2014143672A JP6395482B2 (ja) 2014-07-11 2014-07-11 光電変換装置、および、撮像システム

Publications (3)

Publication Number Publication Date
JP2016021611A JP2016021611A (ja) 2016-02-04
JP2016021611A5 JP2016021611A5 (cg-RX-API-DMAC7.html) 2017-08-17
JP6395482B2 true JP6395482B2 (ja) 2018-09-26

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Country Link
US (2) US9571768B2 (cg-RX-API-DMAC7.html)
EP (1) EP2966857B1 (cg-RX-API-DMAC7.html)
JP (1) JP6395482B2 (cg-RX-API-DMAC7.html)
CN (1) CN105261624B (cg-RX-API-DMAC7.html)
BR (1) BR102015015323A2 (cg-RX-API-DMAC7.html)
RU (1) RU2611209C2 (cg-RX-API-DMAC7.html)

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Also Published As

Publication number Publication date
US20170111601A1 (en) 2017-04-20
CN105261624B (zh) 2018-05-29
US20160014364A1 (en) 2016-01-14
EP2966857B1 (en) 2018-04-25
RU2611209C2 (ru) 2017-02-21
CN105261624A (zh) 2016-01-20
RU2015127490A (ru) 2017-01-13
US9826181B2 (en) 2017-11-21
BR102015015323A2 (pt) 2016-05-31
US9571768B2 (en) 2017-02-14
EP2966857A1 (en) 2016-01-13
JP2016021611A (ja) 2016-02-04

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