JP6003449B2 - 半導体装置及びメモリの制御方法 - Google Patents

半導体装置及びメモリの制御方法 Download PDF

Info

Publication number
JP6003449B2
JP6003449B2 JP2012207076A JP2012207076A JP6003449B2 JP 6003449 B2 JP6003449 B2 JP 6003449B2 JP 2012207076 A JP2012207076 A JP 2012207076A JP 2012207076 A JP2012207076 A JP 2012207076A JP 6003449 B2 JP6003449 B2 JP 6003449B2
Authority
JP
Japan
Prior art keywords
signal
access
operation state
control unit
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2012207076A
Other languages
English (en)
Japanese (ja)
Other versions
JP2014063279A5 (https=
JP2014063279A (ja
Inventor
康之 江口
康之 江口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Socionext Inc
Original Assignee
Socionext Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Socionext Inc filed Critical Socionext Inc
Priority to JP2012207076A priority Critical patent/JP6003449B2/ja
Priority to US14/028,249 priority patent/US9218855B2/en
Publication of JP2014063279A publication Critical patent/JP2014063279A/ja
Publication of JP2014063279A5 publication Critical patent/JP2014063279A5/ja
Application granted granted Critical
Publication of JP6003449B2 publication Critical patent/JP6003449B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/14Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/14Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/148Details of power up or power down circuits, standby circuits or recovery circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C8/00Arrangements for selecting an address in a digital store
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K17/00Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/22Modifications for ensuring a predetermined initial state when the supply voltage has been applied

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Sources (AREA)
  • Memory System (AREA)
  • Dram (AREA)
JP2012207076A 2012-09-20 2012-09-20 半導体装置及びメモリの制御方法 Active JP6003449B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2012207076A JP6003449B2 (ja) 2012-09-20 2012-09-20 半導体装置及びメモリの制御方法
US14/028,249 US9218855B2 (en) 2012-09-20 2013-09-16 Semiconductor device and memory control method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012207076A JP6003449B2 (ja) 2012-09-20 2012-09-20 半導体装置及びメモリの制御方法

Publications (3)

Publication Number Publication Date
JP2014063279A JP2014063279A (ja) 2014-04-10
JP2014063279A5 JP2014063279A5 (https=) 2015-07-16
JP6003449B2 true JP6003449B2 (ja) 2016-10-05

Family

ID=50274336

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012207076A Active JP6003449B2 (ja) 2012-09-20 2012-09-20 半導体装置及びメモリの制御方法

Country Status (2)

Country Link
US (1) US9218855B2 (https=)
JP (1) JP6003449B2 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6341795B2 (ja) * 2014-08-05 2018-06-13 ルネサスエレクトロニクス株式会社 マイクロコンピュータ及びマイクロコンピュータシステム
JP2016036944A (ja) * 2014-08-06 2016-03-22 シャープ株式会社 画像形成装置
KR102319392B1 (ko) * 2015-06-09 2021-11-01 에스케이하이닉스 주식회사 메모리 시스템 및 이의 동작 방법
US11200001B2 (en) * 2020-05-15 2021-12-14 Micron Technology, Inc. Management of power during memory device reset and initialization

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01260690A (ja) * 1988-04-08 1989-10-17 Fujitsu Ltd メモリアクセス制御方式
US5430881A (en) * 1990-12-28 1995-07-04 Dia Semicon Systems Incorporated Supervisory control method and power saving control unit for computer system
JP2868650B2 (ja) * 1991-07-24 1999-03-10 キヤノン株式会社 表示装置
US5835435A (en) * 1997-12-02 1998-11-10 Intel Corporation Method and apparatus for dynamically placing portions of a memory in a reduced power consumtion state
JPH11184554A (ja) * 1997-12-24 1999-07-09 Mitsubishi Electric Corp クロック制御タイプ情報処理装置
JP2002082829A (ja) * 2000-09-06 2002-03-22 Nec Kofu Ltd 消費電力制御装置及び消費電力制御方法
JP2002244917A (ja) * 2001-02-15 2002-08-30 Matsushita Electric Ind Co Ltd アクセス管理装置、およびプログラム
JP4458699B2 (ja) * 2001-03-06 2010-04-28 株式会社東芝 半導体集積回路
JP4765222B2 (ja) * 2001-08-09 2011-09-07 日本電気株式会社 Dram装置
JP4104886B2 (ja) 2002-03-20 2008-06-18 株式会社ルネサステクノロジ 半導体装置
JP2004103153A (ja) * 2002-09-11 2004-04-02 Seiko Epson Corp 不揮発性半導体記憶装置の電圧発生回路
JP2005115906A (ja) * 2003-09-19 2005-04-28 Ricoh Co Ltd メモリ駆動システム
JP2005340879A (ja) * 2004-05-24 2005-12-08 Ricoh Co Ltd 画像形成装置
JP2005339310A (ja) 2004-05-28 2005-12-08 Renesas Technology Corp 半導体装置
JP2006099569A (ja) * 2004-09-30 2006-04-13 Kyocera Mita Corp メモリインタフェース回路及びクロック制御方法
JP2006171952A (ja) * 2004-12-14 2006-06-29 Renesas Technology Corp 半導体集積回路装置
JP4834434B2 (ja) * 2006-03-17 2011-12-14 富士通株式会社 記憶装置の電源制御方法
JP4851962B2 (ja) 2007-02-28 2012-01-11 株式会社東芝 メモリシステム
JP5228468B2 (ja) * 2007-12-17 2013-07-03 富士通セミコンダクター株式会社 システム装置およびシステム装置の動作方法
US9032235B2 (en) * 2012-07-31 2015-05-12 Kabushiki Kaisha Toshiba Semiconductor storage device and method for controlling the semiconductor storage device

Also Published As

Publication number Publication date
US9218855B2 (en) 2015-12-22
JP2014063279A (ja) 2014-04-10
US20140078850A1 (en) 2014-03-20

Similar Documents

Publication Publication Date Title
KR101832552B1 (ko) Dram 당 주소 매김 능력 모드를 위한 방법, 장치 및 시스템
US10566075B2 (en) Electronic device performing training on memory device by rank unit and training method thereof
US20190164594A1 (en) Memory device and operation method thereof
US9851744B2 (en) Address and control signal training
US9978437B2 (en) Apparatuses and methods for dynamic voltage and frequency switching for dynamic random access memory
US20150302907A1 (en) Apparatuses and methods for implementing masked write commands
JP6003449B2 (ja) 半導体装置及びメモリの制御方法
KR102269899B1 (ko) 메모리 장치 및 이를 포함하는 메모리 시스템
US9672882B1 (en) Conditional reference voltage calibration of a memory system in data transmisson
KR20190093102A (ko) 듀티 사이클을 조절하는 메모리 장치 및 이를 포함하는 메모리 시스템
KR20170036544A (ko) 메모리 시스템 및 이의 동작 방법
US9570135B2 (en) Apparatuses and methods to delay memory commands and clock signals
US9378791B2 (en) Apparatuses and methods for controlling a clock signal provided to a clock tree
US10423548B2 (en) Memory controller, control method for the memory controller, and control method for memory
US20150098295A1 (en) Apparatuses and methods including selectively providing a single or separate chip select signals
US10019170B2 (en) Controlling timing and edge transition of a delayed clock signal and data latching methods using such a delayed clock signal
US10991403B2 (en) Memory calibration with end point replay
US10242723B1 (en) Method and apparatus for background memory subsystem calibration
JP2007249738A (ja) メモリアクセス制御装置
JP2014063279A5 (https=)
US9891853B1 (en) Memory calibration abort
CN101609439A (zh) 具有分时总线的电子系统与共用电子系统的总线的方法
US11308010B2 (en) Memory system having memories of different capacities
US20110225444A1 (en) Memory interface having extended strobe burst for write timing calibration
JP6493044B2 (ja) マルチプロセッサシステム

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20150527

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20150527

A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A712

Effective date: 20150611

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20160413

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20160426

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20160624

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20160809

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20160822

R150 Certificate of patent or registration of utility model

Ref document number: 6003449

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150