JP5983590B2 - 硬化性樹脂組成物、封止材、及びこれを用いた電子デバイス製品 - Google Patents
硬化性樹脂組成物、封止材、及びこれを用いた電子デバイス製品 Download PDFInfo
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- JP5983590B2 JP5983590B2 JP2013257548A JP2013257548A JP5983590B2 JP 5983590 B2 JP5983590 B2 JP 5983590B2 JP 2013257548 A JP2013257548 A JP 2013257548A JP 2013257548 A JP2013257548 A JP 2013257548A JP 5983590 B2 JP5983590 B2 JP 5983590B2
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Classifications
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- H—ELECTRICITY
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- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
- H01L23/293—Organic, e.g. plastic
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- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
- C08G59/22—Di-epoxy compounds
- C08G59/24—Di-epoxy compounds carbocyclic
- C08G59/245—Di-epoxy compounds carbocyclic aromatic
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- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
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- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/40—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
- C08G59/50—Amines
- C08G59/56—Amines together with other curing agents
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- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
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- C08G59/40—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
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- C08G59/621—Phenols
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- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
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- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/2612—Auxiliary members for layer connectors, e.g. spacers
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
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- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H01L2224/732—Location after the connecting process
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- H01L2924/181—Encapsulation
Description
上記アミン系硬化剤は、芳香族ポリアミンからなり、
上記フェノール系硬化剤は、フェノール性OH当量が90以下で、かつ軟化点又は融点が100℃以下のフェノール類からなり、
上記アミン系硬化剤として、少なくとも下記の一般式(1)で表されるジアミン化合物を含有することを特徴とする硬化性樹脂組成物にある。
本発明のさらに他の態様は、上記封止材が用いられていることを特徴とする電子デバイス製品にある。
硬化性樹脂組成物は、主剤と硬化剤とを含有している。本明細書において、硬化剤は、通常、アミン系硬化剤とフェノール系硬化剤との総称である。一般的な主剤と硬化剤との関係のように、主剤は一分子内に少なくとも2つ以上の官能基を含有する。即ち、マレイミド化合物及び/又はエポキシ化合物を含有する主剤は、エポキシ基とマレイミド基との合計で2つ以上の官能基を有する。マレイミド化合物及びエポキシ化合物は、硬化剤との反応により高分子化するプレポリマーであり、例えばモノマーである。
このようなエポキシ化合物としては、例えばビスフェノール型エポキシ樹脂、芳香族多官能エポキシ樹脂、フェノール系多官能エポキシ樹脂、ナフタレン型エポキシ樹脂、又はこれらのエポキシ樹脂のベンゼン環が水添された脂環骨格を有するエポキシ樹脂等が用いられる。ビスフェノール型エポキシ樹脂としては、例えばビスフェノールA型、ビスフェノールF型等が挙げられる。芳香族多官能エポキシ樹脂としては、例えばグリシジルアミン型等が挙げられる。フェノール系多官能エポキシ樹脂としては、例えばフェノールノボラック型、クレゾールノボラック型等が挙げられる。ナフタレン型エポキシ樹脂としては、例えばDIC社製のEPICLON HP−4032D等の2官能タイプのエポキシ樹脂が挙げられる。また、ナフタレン型のエポキシ樹脂としては、例えばDIC社製のEPICLON HP−4700等の4官能タイプのエポキシ樹脂も挙げられる。その他にも、エポキシ化合物としては、例えばトリメチロールプロパン、エチレングリコール等の脂肪族骨格を有するエポキシ樹脂を用いることも可能である。
一般式(1)で表される化合物としては、nが1〜10の範囲にある化合物から選ばれる1種の化合物を用いることができる。また、nの値が異なる2種以上の化合物からなる混合物を用いることもできる。耐熱性と靱性とをより向上できるという観点から、n=3の化合物を少なくとも用いることがさらにより好ましい。
硬化物の靱性と耐熱性とがより高いレベルで向上するという観点から、アミン系硬化剤とフェノール系硬化剤との合計量に対するフェノール系硬化剤の含有量は5〜85質量%であることが好ましい。
これらの中でも、硬化触媒はイミダゾール類であることが好ましい。この場合には、硬化性樹脂組成物の硬化速度が向上する。
封止材は、硬化性樹脂組成物の硬化物からなり、例えば電子デバイス製品等に好適である。特に、封止材は、SiC基板等を用いたパワーデバイスに好適である。この場合には、上記硬化性樹脂組成物の硬化物が有する優れた耐熱性及び靱性が充分にいかされる。特に、SiC基板等を用いたパワーデバイスは、例えば240℃を超える高温環境下に曝されるおそれがある。そのため、この場合には、硬化性樹脂組成物の硬化物が有する上述の優れた耐熱性がいかされる。
次に、硬化性樹脂組成物の実施例について説明する。
本例においては、主剤と硬化剤とを含有する硬化性樹脂組成物を作製する。本例の硬化性樹脂組成物は、主剤としてマレイミド化合物を含有する。また、硬化性樹脂組成物は、アミン系硬化剤として特定のジアミン化合物を含有し、フェノール系硬化剤として特定のフェノール類を含有する。
まず、アミン系硬化剤として、下記の式(2)で表されるジアミン化合物を合成する。以下、下記の式(2)で表されるジアミン化合物をアミン系硬化剤Aという。
また、図示を省略するが、核磁気共鳴(NMR)測定により、得られたジアミン化合物の構造を確認し、高速液体クロマトグラフィ(HPLC)によって、得られた化合物の純度を確認している。
具体的には、まず、マレイミド化合物として、フェニルメタン型ビスマレイミド(大和化成工業(株)製のBMI−2300、マレイミド当量179)を準備した。アミン系硬化剤としては、上述のように式(2)で表されるジアミン化合物を準備した。また、フェノール系硬化剤として、ハイドロキノン骨格を有するフェノール類であるDIC社製の「EPICLON EXB−9650」を準備した。以下、これをフェノール系硬化剤Aという。フェノール系硬化剤Aのフェノール性OH当量は57であり、軟化点は88℃である。また、密着助剤として、グリシドキシプロピルトリメトキシシランを準備した。また、硬化触媒として、四国化成工業(株)製の2−フェニルイミダゾールである「2PZ」を準備した。さらに、フィラー(球状シリカ)として(株)龍森製の「RD−8」を準備した。そして、これらのマレイミド化合物、ジアミン化合物、フェノール類、密着助剤、硬化触媒、及びフィラーを温度120℃に加熱したオープンロール型の混練機(東洋精機(株)製)中に投入し、5分間混練した。原料の配合割合は後述の表1に示す。このようにして、硬化性樹脂組成物を得た。
次に、実施例1とは、主剤、アミン系硬化剤、フェノール系硬化剤の種類や配合割合が異なる硬化性樹脂組成物を作製した。
各実施例及び比較例の硬化性樹脂組成物の作製にあたっては、実施例1で作製した上記式(2)で表されるジアミン化合物からなるアミン系硬化剤Aの他に、さらに3種類のアミン系硬化剤(アミン系硬化剤B〜D)を用いた。まず、これらのアミン系硬化剤B〜Dについて説明する。
具体的には、まず、反応溶媒としてのN,N−ジメチルアセトアミドに、ジチオフェニレンスルフィドとp−クロロニトロベンゼンとを、SH基とCl基との当量比が1:1.1(SH:Cl)となる割合で混合した。次いで、反応溶媒を温度60℃まで昇温させた後、反応溶媒に炭酸カリウムをジチオフェニレンスルフィドのSH基との当量比がSH:炭酸カリウム=1:1.1となる割合で添加した。
次に、各実施例1〜13及び比較例1〜5において作製した硬化性樹脂組成物の相溶性を評価した。具体的には、硬化性樹脂組成物の作製時における主剤と硬化剤との相溶性を目視により評価した。上述の温度120℃での5分間の混練によって、主剤と硬化剤とが相溶化して組成物が透明になった場合を「○」とし、相溶化せずに不透明のままであった場合を「×」として評価した。その結果を表1及び表2に示す。
具体的には、まず、トランスファー成形により、硬化性樹脂組成物を成形し、硬化させることにより硬化物を得た。なお、成形は、型温200℃、成形時間5分間という条件で行った。次いで、硬化物から耐熱性評価用の立方体試験片(5mm×5mm×5mm)と、靱性評価用の板状試験片(幅10mm×長さ80mm×厚さ4mm)を切り出した。
具体的には、立方体試験片の温度を320℃から室温(25℃)まで冷却する過程におけるTgを測定した。Tgの測定には、エスアイアイ・ナノテクノロジー(株)製の熱機械分析(TMA)装置「EXSTAR6000」を用いた。各試験片のTgの値を後述の表1及び表2に示す。また、各試験片のTg値に基づいて、各試験片の耐熱性を評価した。具体的には、Tgが262.5℃以上の場合を「◎」とし、262.5℃未満かつ250℃以上の場合を「○」とし、250℃未満の場合を「×」として評価した。その結果を表1及び表2に示す。なお、上述の温度262.5℃という評価基準温度は、SiC基板を用いた電子デバイス製品に求められる耐熱温度である250℃よりも5%高い温度である。
曲げ歪(%)=たわみ量×6×厚み/(支点間距離)2
次に、実施例1において作製した硬化性樹脂組成物の硬化物を封止材として用いた電子デバイス製品の実施例について説明する。
図3に示すごとく、本例の電子デバイス製品1は、ハイブリッド車用のパワーコントロールユニットに用いられる半導体モジュール(パワーカード)である。この電子デバイス製品1においては、パワーデバイス101、銅スペーサー102、及び放熱用銅板103、104がリフロー方式によりはんだ付けされて電子部品10を構成し、この電子部品10が電極端子105、106と共に封止材11により封止されている。なお、図3において、パワーデバイス101と銅スペーサー102との間、及びパワーデバイス101と放熱用銅板104との間の領域は、はんだからなる接合部108、109である。
10 電子部品
11 封止材
Claims (7)
- 上記一般式(1)におけるベンゼン骨格は、A原子を介してメタ位又はパラ位で結合していることを特徴とする請求項1に記載の硬化性樹脂組成物。
- 上記一般式(1)におけるXは、水素原子であることを特徴とする請求項1又は2に記載の硬化性樹脂組成物。
- 上記一般式(1)におけるAは、酸素原子であることを特徴とする請求項1〜3のいずれか1項に記載の硬化性樹脂組成物。
- 上記主剤は、少なくともマレイミド化合物を含有することを特徴とする請求項1〜4のいずれか1項に記載の硬化性樹脂組成物。
- 請求項1〜5のいずれか1項に記載の硬化性樹脂組成物の硬化物よりなることを特徴とする封止材(11)。
- 請求項6に記載の封止材(11)が用いられていることを特徴とする電子デバイス製品(1)。
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Publication number | Priority date | Publication date | Assignee | Title |
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Publication number | Priority date | Publication date | Assignee | Title |
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JP6579367B2 (ja) * | 2015-07-02 | 2019-09-25 | Dic株式会社 | エポキシ樹脂組成物、硬化物、繊維強化複合材料、繊維強化樹脂成形品、及び繊維強化樹脂成形品の製造方法 |
JP6688065B2 (ja) * | 2015-12-18 | 2020-04-28 | ナミックス株式会社 | エポキシ樹脂組成物 |
CA3231558A1 (en) | 2016-07-25 | 2018-02-01 | The Boeing Company | Epoxy resin |
Family Cites Families (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3849187A (en) * | 1970-03-08 | 1974-11-19 | Dexter Corp | Encapsulant compositions for semiconductors |
JPS56120727A (en) * | 1979-10-29 | 1981-09-22 | Nitto Electric Ind Co Ltd | Resin composition for electrically insulating base plate |
JPS5761554A (en) * | 1980-09-30 | 1982-04-14 | Hitachi Chemical Co Ltd | Manufacture of heat-resisting copper lined laminated plate |
JPS604522A (ja) * | 1983-06-23 | 1985-01-11 | Sumitomo Bakelite Co Ltd | 絶縁樹脂ペ−スト |
JPS61183318A (ja) * | 1985-02-08 | 1986-08-16 | Mitsubishi Petrochem Co Ltd | エポキシ樹脂硬化剤 |
US4593056A (en) * | 1985-06-21 | 1986-06-03 | Union Carbide Corporation | Epoxy/aromatic amine resin systems containing aromatic trihydroxy compounds as cure accelerators |
JPS6368637A (ja) | 1986-09-10 | 1988-03-28 | Mitsubishi Petrochem Co Ltd | 耐熱性樹脂組成物 |
JPH01279915A (ja) * | 1988-05-06 | 1989-11-10 | Fujitsu Ltd | 耐熱性エポキシ樹脂用硬化剤 |
US5015674A (en) * | 1988-08-05 | 1991-05-14 | Mitsui Toatsu Chemicals, Inc. | Composition of vinyl polymer-grafted, silicone polymer-modified epoxy resin and polymaleimide |
JPH0288629A (ja) * | 1988-09-26 | 1990-03-28 | Matsushita Electric Works Ltd | 半導体封止用エポキシ樹脂組成物 |
JP2642470B2 (ja) * | 1989-02-23 | 1997-08-20 | 株式会社東芝 | 封止用樹脂組成物及び樹脂封止型半導体装置 |
JPH05295086A (ja) * | 1992-04-22 | 1993-11-09 | Konishi Kk | 耐熱性樹脂組成物 |
KR970008355B1 (ko) * | 1992-09-29 | 1997-05-23 | 가부시키가이샤 도시바 | 수지밀봉형 반도체장치 |
JP3428699B2 (ja) * | 1993-09-24 | 2003-07-22 | ジャパンエポキシレジン株式会社 | エポキシ樹脂組成物 |
JPH07304846A (ja) * | 1994-05-09 | 1995-11-21 | Yuka Shell Epoxy Kk | エポキシ樹脂組成物 |
US5859153A (en) * | 1996-06-21 | 1999-01-12 | Minnesota Mining And Manufacturing Company | Novolak compounds useful as adhesion promoters for epoxy resins |
JP3853979B2 (ja) * | 1998-06-16 | 2006-12-06 | 日東電工株式会社 | 半導体装置の製法 |
WO2003040206A1 (fr) * | 2001-11-07 | 2003-05-15 | Toray Industries, Inc. | Compositions de resine epoxy pour materiaux composites a fibres, procede de production de ces materiaux, et materiaux composites a fibres |
JP2005350647A (ja) * | 2004-05-11 | 2005-12-22 | Nitto Denko Corp | 液状エポキシ樹脂組成物 |
CN104024337B (zh) * | 2011-11-15 | 2016-08-24 | 株式会社日本触媒 | 含硅烷组合物、固化性树脂组合物和密封材 |
KR101395707B1 (ko) * | 2011-12-16 | 2014-05-15 | 제일모직주식회사 | 반도체용 접착 필름 |
-
2013
- 2013-12-13 JP JP2013257548A patent/JP5983590B2/ja not_active Expired - Fee Related
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2014
- 2014-11-28 DE DE102014224365.3A patent/DE102014224365A1/de not_active Withdrawn
- 2014-12-09 US US14/564,704 patent/US20150166728A1/en not_active Abandoned
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11214677B2 (en) | 2017-03-22 | 2022-01-04 | Lg Chem, Ltd. | Resin composition for semiconductor package, prepreg and metal clad laminate using the same |
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JP2015113427A (ja) | 2015-06-22 |
US20150166728A1 (en) | 2015-06-18 |
DE102014224365A1 (de) | 2015-06-18 |
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