JP5821767B2 - クロマトグラフタンデム四重極型質量分析装置 - Google Patents

クロマトグラフタンデム四重極型質量分析装置 Download PDF

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JP5821767B2
JP5821767B2 JP2012096837A JP2012096837A JP5821767B2 JP 5821767 B2 JP5821767 B2 JP 5821767B2 JP 2012096837 A JP2012096837 A JP 2012096837A JP 2012096837 A JP2012096837 A JP 2012096837A JP 5821767 B2 JP5821767 B2 JP 5821767B2
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measurement
compound
mass
charge ratio
mass spectrometer
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JP2013224858A (ja
JP2013224858A5 (enExample
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麻里絵 関谷
麻里絵 関谷
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Shimadzu Corp
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Shimadzu Corp
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Priority to CN201310138953.XA priority patent/CN103376301B/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/86—Signal analysis
    • G01N30/8651—Recording, data aquisition, archiving and storage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/86—Signal analysis
    • G01N30/8675—Evaluation, i.e. decoding of the signal into analytical information
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/86—Signal analysis
    • G01N30/8658—Optimising operation parameters

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Library & Information Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2012096837A 2012-04-20 2012-04-20 クロマトグラフタンデム四重極型質量分析装置 Expired - Fee Related JP5821767B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2012096837A JP5821767B2 (ja) 2012-04-20 2012-04-20 クロマトグラフタンデム四重極型質量分析装置
US13/866,654 US8916818B2 (en) 2012-04-20 2013-04-19 Chromatograph tandem quadrupole mass spectrometer
CN201310138953.XA CN103376301B (zh) 2012-04-20 2013-04-19 色谱串联四极型质谱仪

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JP2012096837A JP5821767B2 (ja) 2012-04-20 2012-04-20 クロマトグラフタンデム四重極型質量分析装置

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JP2013224858A JP2013224858A (ja) 2013-10-31
JP2013224858A5 JP2013224858A5 (enExample) 2014-08-21
JP5821767B2 true JP5821767B2 (ja) 2015-11-24

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US (1) US8916818B2 (enExample)
JP (1) JP5821767B2 (enExample)
CN (1) CN103376301B (enExample)

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JP6834582B2 (ja) * 2017-02-23 2021-02-24 株式会社島津製作所 質量分析装置
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WO2019003365A1 (ja) * 2017-06-29 2019-01-03 株式会社島津製作所 四重極型質量分析装置
JP6791078B2 (ja) * 2017-09-21 2020-11-25 株式会社島津製作所 分析条件データ変換装置、データ処理システムおよび分析システム
JP6376262B2 (ja) * 2017-10-04 2018-08-22 株式会社島津製作所 クロマトグラフ質量分析装置用データ処理装置
JP6868592B2 (ja) * 2018-06-04 2021-05-12 日本電子株式会社 クロマトグラフ質量分析システム及び測定条件表示方法
EP3824349A1 (en) 2018-07-19 2021-05-26 Lintfield Limited Thioxanthone derivatives, composition comprising the same and pattern forming method comprising said composition
JP7070692B2 (ja) * 2018-09-21 2022-05-18 株式会社島津製作所 質量分析装置及び質量分析方法
WO2020084738A1 (ja) * 2018-10-25 2020-04-30 株式会社島津製作所 質量分析装置およびプログラム
JP7088306B2 (ja) * 2018-11-12 2022-06-21 株式会社島津製作所 クロマトグラフ装置
JP7201089B2 (ja) * 2019-07-04 2023-01-10 株式会社島津製作所 クロマトグラフ質量分析装置
EP4022666B1 (en) * 2019-08-30 2026-04-29 DH Technologies Development Pte. Ltd. Method for mass spectrometry
CN115605749B (zh) * 2020-05-25 2024-11-05 株式会社岛津制作所 色谱质量分析数据处理方法、色谱质量分析装置及色谱质量分析数据处理用程序
JP7838329B2 (ja) * 2022-03-14 2026-04-01 株式会社島津製作所 分析装置
WO2024147191A1 (ja) * 2023-01-06 2024-07-11 株式会社島津製作所 解析結果表示処理装置、解析結果表示処理方法、及び解析結果表示処理プログラム
CN120659993A (zh) * 2023-02-01 2025-09-16 株式会社岛津制作所 分析控制装置

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Publication number Publication date
CN103376301A (zh) 2013-10-30
JP2013224858A (ja) 2013-10-31
US20140014833A1 (en) 2014-01-16
US8916818B2 (en) 2014-12-23
CN103376301B (zh) 2016-02-10

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