JP2013224858A5 - - Google Patents

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Publication number
JP2013224858A5
JP2013224858A5 JP2012096837A JP2012096837A JP2013224858A5 JP 2013224858 A5 JP2013224858 A5 JP 2013224858A5 JP 2012096837 A JP2012096837 A JP 2012096837A JP 2012096837 A JP2012096837 A JP 2012096837A JP 2013224858 A5 JP2013224858 A5 JP 2013224858A5
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JP
Japan
Prior art keywords
mass
charge ratio
measurement
range
product ion
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JP2012096837A
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English (en)
Japanese (ja)
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JP2013224858A (ja
JP5821767B2 (ja
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Priority to JP2012096837A priority Critical patent/JP5821767B2/ja
Priority claimed from JP2012096837A external-priority patent/JP5821767B2/ja
Priority to CN201310138953.XA priority patent/CN103376301B/zh
Priority to US13/866,654 priority patent/US8916818B2/en
Publication of JP2013224858A publication Critical patent/JP2013224858A/ja
Publication of JP2013224858A5 publication Critical patent/JP2013224858A5/ja
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Publication of JP5821767B2 publication Critical patent/JP5821767B2/ja
Expired - Fee Related legal-status Critical Current
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JP2012096837A 2012-04-20 2012-04-20 クロマトグラフタンデム四重極型質量分析装置 Expired - Fee Related JP5821767B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2012096837A JP5821767B2 (ja) 2012-04-20 2012-04-20 クロマトグラフタンデム四重極型質量分析装置
CN201310138953.XA CN103376301B (zh) 2012-04-20 2013-04-19 色谱串联四极型质谱仪
US13/866,654 US8916818B2 (en) 2012-04-20 2013-04-19 Chromatograph tandem quadrupole mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012096837A JP5821767B2 (ja) 2012-04-20 2012-04-20 クロマトグラフタンデム四重極型質量分析装置

Publications (3)

Publication Number Publication Date
JP2013224858A JP2013224858A (ja) 2013-10-31
JP2013224858A5 true JP2013224858A5 (enExample) 2014-08-21
JP5821767B2 JP5821767B2 (ja) 2015-11-24

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JP2012096837A Expired - Fee Related JP5821767B2 (ja) 2012-04-20 2012-04-20 クロマトグラフタンデム四重極型質量分析装置

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US (1) US8916818B2 (enExample)
JP (1) JP5821767B2 (enExample)
CN (1) CN103376301B (enExample)

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JP6868592B2 (ja) * 2018-06-04 2021-05-12 日本電子株式会社 クロマトグラフ質量分析システム及び測定条件表示方法
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WO2020059144A1 (ja) * 2018-09-21 2020-03-26 株式会社島津製作所 質量分析装置及び質量分析方法
WO2020084738A1 (ja) * 2018-10-25 2020-04-30 株式会社島津製作所 質量分析装置およびプログラム
WO2020100182A1 (ja) * 2018-11-12 2020-05-22 株式会社島津製作所 クロマトグラフ装置
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JP2023133783A (ja) * 2022-03-14 2023-09-27 株式会社島津製作所 分析装置
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