JP5771422B2 - 顕微鏡 - Google Patents

顕微鏡 Download PDF

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Publication number
JP5771422B2
JP5771422B2 JP2011059176A JP2011059176A JP5771422B2 JP 5771422 B2 JP5771422 B2 JP 5771422B2 JP 2011059176 A JP2011059176 A JP 2011059176A JP 2011059176 A JP2011059176 A JP 2011059176A JP 5771422 B2 JP5771422 B2 JP 5771422B2
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JP
Japan
Prior art keywords
illumination light
light
optical element
microscope
illumination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2011059176A
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English (en)
Japanese (ja)
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JP2012098692A (ja
JP2012098692A5 (enExample
Inventor
池滝　慶記
慶記 池滝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Priority to JP2011059176A priority Critical patent/JP5771422B2/ja
Priority to CN201110162402.8A priority patent/CN102288588B/zh
Priority to US13/162,993 priority patent/US8699132B2/en
Publication of JP2012098692A publication Critical patent/JP2012098692A/ja
Publication of JP2012098692A5 publication Critical patent/JP2012098692A5/ja
Application granted granted Critical
Publication of JP5771422B2 publication Critical patent/JP5771422B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/06—Means for illuminating specimens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0068—Optical details of the image generation arrangements using polarisation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0072—Optical details of the image generation details concerning resolution or correction, including general design of CSOM objectives
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0076—Optical details of the image generation arrangements using fluorescence or luminescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N2021/6417—Spectrofluorimetric devices
    • G01N2021/6419—Excitation at two or more wavelengths

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2011059176A 2010-06-17 2011-03-17 顕微鏡 Expired - Fee Related JP5771422B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2011059176A JP5771422B2 (ja) 2010-06-17 2011-03-17 顕微鏡
CN201110162402.8A CN102288588B (zh) 2010-06-17 2011-06-16 显微镜
US13/162,993 US8699132B2 (en) 2010-06-17 2011-06-17 Ultra-high resolution microscope

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2010138096 2010-06-17
JP2010138096 2010-06-17
JP2010227698 2010-10-07
JP2010227698 2010-10-07
JP2011059176A JP5771422B2 (ja) 2010-06-17 2011-03-17 顕微鏡

Publications (3)

Publication Number Publication Date
JP2012098692A JP2012098692A (ja) 2012-05-24
JP2012098692A5 JP2012098692A5 (enExample) 2014-04-10
JP5771422B2 true JP5771422B2 (ja) 2015-08-26

Family

ID=45328431

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011059176A Expired - Fee Related JP5771422B2 (ja) 2010-06-17 2011-03-17 顕微鏡

Country Status (3)

Country Link
US (1) US8699132B2 (enExample)
JP (1) JP5771422B2 (enExample)
CN (1) CN102288588B (enExample)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
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DE102010013830A1 (de) * 2010-03-26 2011-09-29 Carl Zeiss Microlmaging Gmbh Mikroskop und Verfahren zur mikroskopischen Erfassung von Licht einer Probe
US9052500B2 (en) * 2011-11-01 2015-06-09 Intelligent Imaging Innovations, Inc. Fast pinhole changer for confocal microscopy or spatial filter
FR2993677B1 (fr) * 2012-07-18 2015-03-27 Valeo Etudes Electroniques Dispositif et procede d'emission d'un faisceau lumineux destine a former une image, systeme de projection et afficheur utilisant ledit dispositif
DE102012214568A1 (de) * 2012-08-16 2014-02-20 Leica Microsystems Cms Gmbh Optische Anordnung und ein Mikroskop
CN103090787B (zh) * 2013-01-29 2016-01-20 哈尔滨工业大学 基于被测表面荧光激发的共焦显微测量装置
JP2014182239A (ja) 2013-03-19 2014-09-29 Olympus Corp 超解像顕微鏡
JP6234105B2 (ja) * 2013-08-05 2017-11-22 オリンパス株式会社 超解像顕微鏡
CN103411554B (zh) * 2013-08-15 2015-11-18 哈尔滨工业大学 基于量子点效应的量子随动针孔微结构角谱扫描测量装置
CN103735249B (zh) * 2013-12-27 2015-04-22 中国科学院苏州生物医学工程技术研究所 荧光检测仪
WO2015151461A1 (ja) * 2014-04-01 2015-10-08 株式会社ニコン 超解像観察装置及び超解像観察方法
US10257918B2 (en) * 2015-09-28 2019-04-09 Kla-Tencor Corporation System and method for laser-sustained plasma illumination
EP3365721B1 (en) 2015-10-19 2022-04-27 Deutsches Krebsforschungszentrum Chromatic phase plate
WO2017199407A1 (ja) * 2016-05-19 2017-11-23 株式会社ニコン 顕微鏡
DE102016119727A1 (de) * 2016-10-17 2018-04-19 Carl Zeiss Microscopy Gmbh Vorrichtung zur Strahlmanipulation für ein Scanning-Mikroskop und Mikroskop
DE102016122528A1 (de) * 2016-11-22 2018-05-24 Carl Zeiss Microscopy Gmbh Verfahren zum Steuern oder Regeln einer Mikroskopbeleuchtung
CN112513707B (zh) * 2018-04-17 2023-05-26 克莫麦特公司 对象的描绘
CN108982428A (zh) * 2018-05-23 2018-12-11 哈尔滨工业大学 椭球反射镜照明自适应谐波共焦显微测量方法
CN108918475A (zh) * 2018-05-23 2018-11-30 哈尔滨工业大学 基于径向偏振光照明反射式共焦收集谐波显微成像方法
US20210315535A1 (en) * 2018-10-23 2021-10-14 Lensfree Ltd. System and method for use in x-ray imaging
DE102019218912A1 (de) 2019-12-04 2021-06-10 Carl Zeiss Microscopy Gmbh Verfahren und Vorrichtung zur Beleuchtung einer Probenebene
CN115297765A (zh) * 2020-02-19 2022-11-04 热电科学仪器有限公司 结构化照明的相位掩模
CN116683271B (zh) * 2023-08-04 2023-11-21 北京卓镭激光技术有限公司 一种脉冲宽度连续可调的光纤激光器

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0801759B1 (de) 1994-02-01 2001-08-08 Stefan Dr. Hell Vorrichtung und verfahren zum optischen messen eines probenpunktes einer probe mit hoher ortsauflösung
US5866911A (en) 1994-07-15 1999-02-02 Baer; Stephen C. Method and apparatus for improving resolution in scanned optical system
JP3164989B2 (ja) 1994-12-28 2001-05-14 科学技術振興事業団 試料観察方法および多波長光光学顕微鏡
JP3020453B2 (ja) 1996-11-13 2000-03-15 科学技術振興事業団 光学顕微鏡
JP3350442B2 (ja) 1998-04-09 2002-11-25 科学技術振興事業団 顕微鏡システム
JP4614495B2 (ja) * 2000-03-23 2011-01-19 オリンパス株式会社 二重共鳴吸収顕微鏡
US6859313B2 (en) * 2001-03-23 2005-02-22 Japan Science & Technology Corporation Super resolution microscope
JP2003167196A (ja) * 2001-12-04 2003-06-13 Nikon Corp 反射屈折光学系
JP2003262798A (ja) * 2002-03-12 2003-09-19 Olympus Optical Co Ltd 顕微鏡
JP4334835B2 (ja) * 2002-08-28 2009-09-30 独立行政法人科学技術振興機構 顕微鏡
JP2004239660A (ja) * 2003-02-04 2004-08-26 Japan Science & Technology Agency 顕微鏡
JP2004317741A (ja) * 2003-04-15 2004-11-11 Olympus Corp 顕微鏡およびその光学調整方法
EP1683074A1 (en) * 2003-11-10 2006-07-26 Technology Innovations, LLC Digital imaging assembly and methods thereof
US20060043302A1 (en) * 2003-11-10 2006-03-02 Prelewitz David F Digital imaging assembly & methods thereof
JP2006047912A (ja) * 2004-08-09 2006-02-16 Olympus Corp 超解像顕微鏡
JP2006058477A (ja) * 2004-08-18 2006-03-02 Olympus Corp 超解像顕微鏡
JP4425098B2 (ja) * 2004-09-06 2010-03-03 浜松ホトニクス株式会社 蛍光顕微鏡および蛍光相関分光解析装置
JP2008058003A (ja) * 2006-08-29 2008-03-13 Olympus Corp 顕微鏡
EP2171516A1 (en) * 2007-07-06 2010-04-07 National University of Signapore Fluorescence focal modulation microscopy system and method
WO2009031418A1 (ja) * 2007-09-05 2009-03-12 Nikon Corporation 顕微鏡装置
JP2010015026A (ja) * 2008-07-04 2010-01-21 Olympus Corp 超解像顕微鏡およびこれに用いる空間変調光学素子
US8275226B2 (en) * 2008-12-09 2012-09-25 Spectral Applied Research Ltd. Multi-mode fiber optically coupling a radiation source module to a multi-focal confocal microscope
US8174761B2 (en) * 2009-06-10 2012-05-08 Universitat Heidelberg Total internal reflection interferometer with laterally structured illumination

Also Published As

Publication number Publication date
JP2012098692A (ja) 2012-05-24
CN102288588A (zh) 2011-12-21
US20110310475A1 (en) 2011-12-22
US8699132B2 (en) 2014-04-15
CN102288588B (zh) 2015-10-14

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