JP5725460B2 - スパッタリング装置 - Google Patents
スパッタリング装置 Download PDFInfo
- Publication number
- JP5725460B2 JP5725460B2 JP2012503125A JP2012503125A JP5725460B2 JP 5725460 B2 JP5725460 B2 JP 5725460B2 JP 2012503125 A JP2012503125 A JP 2012503125A JP 2012503125 A JP2012503125 A JP 2012503125A JP 5725460 B2 JP5725460 B2 JP 5725460B2
- Authority
- JP
- Japan
- Prior art keywords
- shield member
- targets
- target
- sputtering apparatus
- erosion
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000004544 sputter deposition Methods 0.000 title claims description 48
- 230000003628 erosive effect Effects 0.000 claims description 61
- 239000000758 substrate Substances 0.000 claims description 26
- 239000002245 particle Substances 0.000 description 51
- 239000010408 film Substances 0.000 description 31
- 230000001464 adherent effect Effects 0.000 description 23
- 239000007789 gas Substances 0.000 description 18
- 230000015572 biosynthetic process Effects 0.000 description 11
- 230000000052 comparative effect Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 239000000428 dust Substances 0.000 description 3
- 238000001755 magnetron sputter deposition Methods 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 238000010891 electric arc Methods 0.000 description 2
- 230000004907 flux Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 229910052719 titanium Inorganic materials 0.000 description 2
- 239000010936 titanium Substances 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 238000005422 blasting Methods 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000007772 electrode material Substances 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 239000013077 target material Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- OYQCBJZGELKKPM-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O-2].[Zn+2].[O-2].[In+3] OYQCBJZGELKKPM-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
- C23C14/352—Sputtering by application of a magnetic field, e.g. magnetron sputtering using more than one target
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/564—Means for minimising impurities in the coating chamber such as dust, moisture, residual gases
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
- H01J37/3408—Planar magnetron sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3441—Dark space shields
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012503125A JP5725460B2 (ja) | 2010-03-01 | 2011-02-28 | スパッタリング装置 |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2010044796 | 2010-03-01 | ||
JP2010044796 | 2010-03-01 | ||
PCT/JP2011/054503 WO2011108489A1 (ja) | 2010-03-01 | 2011-02-28 | スパッタリング装置 |
JP2012503125A JP5725460B2 (ja) | 2010-03-01 | 2011-02-28 | スパッタリング装置 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014255498A Division JP5921048B2 (ja) | 2010-03-01 | 2014-12-17 | スパッタリング方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPWO2011108489A1 JPWO2011108489A1 (ja) | 2013-06-27 |
JP5725460B2 true JP5725460B2 (ja) | 2015-05-27 |
Family
ID=44542141
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012503125A Active JP5725460B2 (ja) | 2010-03-01 | 2011-02-28 | スパッタリング装置 |
JP2014255498A Active JP5921048B2 (ja) | 2010-03-01 | 2014-12-17 | スパッタリング方法 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2014255498A Active JP5921048B2 (ja) | 2010-03-01 | 2014-12-17 | スパッタリング方法 |
Country Status (5)
Country | Link |
---|---|
JP (2) | JP5725460B2 (ko) |
KR (2) | KR101964487B1 (ko) |
CN (1) | CN102782182B (ko) |
TW (1) | TWI502091B (ko) |
WO (1) | WO2011108489A1 (ko) |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104169456B (zh) | 2012-03-14 | 2016-06-08 | 佳能安内华股份有限公司 | 溅镀装置 |
KR102081597B1 (ko) * | 2012-12-21 | 2020-04-16 | 엘지디스플레이 주식회사 | 스퍼터링 장치 및 산화물 반도체 물질의 스퍼터링 방법 |
KR102359244B1 (ko) | 2016-11-21 | 2022-02-08 | 한국알박(주) | 막 증착 방법 |
KR102376098B1 (ko) * | 2018-03-16 | 2022-03-18 | 가부시키가이샤 알박 | 성막 방법 |
EP3778983A4 (en) * | 2018-03-30 | 2021-05-26 | JFE Steel Corporation | TARGET EXCHANGE DEVICE AND SURFACE TREATMENT SYSTEM |
KR102412503B1 (ko) * | 2018-06-28 | 2022-06-23 | 한국알박(주) | 스퍼터링 장치 |
KR102351170B1 (ko) | 2018-06-28 | 2022-01-14 | 가부시키가이샤 알박 | 스퍼터 성막 장치 |
JP7263111B2 (ja) * | 2019-05-13 | 2023-04-24 | 株式会社アルバック | スパッタ成膜装置 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001214262A (ja) * | 2000-01-28 | 2001-08-07 | Toshiba Corp | スパッタ装置および半導体装置の製造方法 |
JP2008001988A (ja) * | 2006-06-23 | 2008-01-10 | Applied Materials Inc | 改善されたpvdターゲット |
JP2009263744A (ja) * | 2008-04-28 | 2009-11-12 | Canon Anelva Corp | スパッタ成膜方法、電子素子の製造方法、スパッタ装置 |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6783638B2 (en) * | 2001-09-07 | 2004-08-31 | Sputtered Films, Inc. | Flat magnetron |
US20070012557A1 (en) * | 2005-07-13 | 2007-01-18 | Applied Materials, Inc | Low voltage sputtering for large area substrates |
JP5265149B2 (ja) | 2006-07-21 | 2013-08-14 | アプライド マテリアルズ インコーポレイテッド | マルチカソード設計用冷却暗部シールド |
JP4769181B2 (ja) * | 2006-12-18 | 2011-09-07 | 株式会社東芝 | ターゲットとバッキングプレート |
KR101083443B1 (ko) * | 2007-03-01 | 2011-11-14 | 가부시키가이샤 알박 | 박막 형성 방법 및 박막 형성 장치 |
JP2009275281A (ja) * | 2008-05-19 | 2009-11-26 | Panasonic Corp | スパッタリング方法及び装置 |
-
2011
- 2011-02-28 KR KR1020147034086A patent/KR101964487B1/ko active IP Right Grant
- 2011-02-28 KR KR1020127025291A patent/KR20120130335A/ko active Application Filing
- 2011-02-28 CN CN201180011662.3A patent/CN102782182B/zh active Active
- 2011-02-28 JP JP2012503125A patent/JP5725460B2/ja active Active
- 2011-02-28 WO PCT/JP2011/054503 patent/WO2011108489A1/ja active Application Filing
- 2011-03-01 TW TW100106710A patent/TWI502091B/zh active
-
2014
- 2014-12-17 JP JP2014255498A patent/JP5921048B2/ja active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001214262A (ja) * | 2000-01-28 | 2001-08-07 | Toshiba Corp | スパッタ装置および半導体装置の製造方法 |
JP2008001988A (ja) * | 2006-06-23 | 2008-01-10 | Applied Materials Inc | 改善されたpvdターゲット |
JP2009263744A (ja) * | 2008-04-28 | 2009-11-12 | Canon Anelva Corp | スパッタ成膜方法、電子素子の製造方法、スパッタ装置 |
Also Published As
Publication number | Publication date |
---|---|
JPWO2011108489A1 (ja) | 2013-06-27 |
TW201202456A (en) | 2012-01-16 |
JP5921048B2 (ja) | 2016-05-24 |
WO2011108489A1 (ja) | 2011-09-09 |
JP2015092025A (ja) | 2015-05-14 |
CN102782182A (zh) | 2012-11-14 |
KR20150003915A (ko) | 2015-01-09 |
TWI502091B (zh) | 2015-10-01 |
KR20120130335A (ko) | 2012-11-30 |
KR101964487B1 (ko) | 2019-04-02 |
CN102782182B (zh) | 2015-09-09 |
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