JP5674640B2 - 水性酸浴および銅を電解析出するための方法 - Google Patents
水性酸浴および銅を電解析出するための方法 Download PDFInfo
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- JP5674640B2 JP5674640B2 JP2011506614A JP2011506614A JP5674640B2 JP 5674640 B2 JP5674640 B2 JP 5674640B2 JP 2011506614 A JP2011506614 A JP 2011506614A JP 2011506614 A JP2011506614 A JP 2011506614A JP 5674640 B2 JP5674640 B2 JP 5674640B2
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- copper
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- aqueous acid
- acid bath
- beta
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Images
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D3/00—Electroplating: Baths therefor
- C25D3/02—Electroplating: Baths therefor from solutions
- C25D3/38—Electroplating: Baths therefor from solutions of copper
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D1/00—Electroforming
- C25D1/02—Tubes; Rings; Hollow bodies
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/42—Plated through-holes or plated via connections
- H05K3/423—Plated through-holes or plated via connections characterised by electroplating method
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/18—Electroplating using modulated, pulsed or reversing current
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- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/60—Electroplating characterised by the structure or texture of the layers
- C25D5/605—Surface topography of the layers, e.g. rough, dendritic or nodular layers
- C25D5/611—Smooth layers
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/42—Plated through-holes or plated via connections
- H05K3/421—Blind plated via connections
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- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electroplating And Plating Baths Therefor (AREA)
- Electroplating Methods And Accessories (AREA)
- Electrolytic Production Of Metals (AREA)
- Electrodes Of Semiconductors (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
Description
装置:Cornell cell1.8リットル;ポンプを用いる浴動;吹き込み空気なし。
レベラー:NH2-Gly-Leu-OH
プリント回路基板を浴中の異なるレベラー含量を有する銅で被覆した。まず第一に、試験を比較の目的のためにレベラーなしで行った。次いで、本発明による試験を、レベラー含量を増加させて行った。評価は、プリント回路基板上の前に規定した位置でミクロ部分を取り出すことによって行った。へこみをBMVの充填の尺度として用いた。図2は、概略的にこの試験のパラメータの決定を示す:従来方法によって導電性にされたBMVの壁に数字1を付与する。この導電層は、隣接したフォトレジスト層2の表面でめっき表面3、例えば、導体経路中に融合する。BMVにおけるめっきのベースは、銅層4と電気的に接触している。BMVは、本発明による方法を用いて銅5で充填する。しかし、最上部領域6は銅で充填しない(へこみ)。
ホール壁平坦化=(1−(A1およびA2の平均)/A3)×100
スローイング(最小)=B1/(A1およびA2の平均)×100
充填率=B1/(深さ+(A1およびA2の平均)×100
A1およびA2は、ホール端部から15μmの間隔で決定する。
スキースロープ(%)=((b−a)/a)×100
NH2-Gly-Leu-OHは、BMV充填特性を示す。しかし、従来のレベラーと対照的に、アミノ酸およびペプチドはスキースロープをまったく生じない。この有利な効果は、BMV充填を損なうことなしに、BMVの充填のための浴における線形状に選択的に影響を与えるために用いることができる。線形状を調べるために、試験基板を銅めっきし、前記基板はフォトレジストで生成されたチャネルを有する。前記チャネルを、本発明の実施例1で規定したように、レベラーとしてNH2-Gly-Leu-OHを用いる特定条件下で銅によって充填した。銅層は均一に成長し、トレンチに矩形構造2を形成した(図6)。
Claims (15)
- 銅を電解析出するための水性酸浴であって、前記浴は、少なくとも1種の銅イオン源、少なくとも1種の酸イオン源、少なくとも1種の光沢剤化合物および少なくとも1種のレベラー化合物を含み、少なくとも1種のレベラー化合物が、合成によって製造される官能化アミノ酸と合成によって製造される官能化ペプチドを含む群から選択され、ペプチドおよび/またはアミノ酸が、ポリアルキレングリコール基、ポリアルキレンイミン基およびポリビニルアルコール基を含む群から選択される少なくとも1種の部分で官能化されている、銅を電解析出するための水性酸浴。
- 前記少なくとも1種のレベラー化合物が、ジグリシン、トリグリシン、ポリグリシンおよびカルノシン(ベータ-アラニル-L-ヒスチジン)でない、請求項1に記載の銅を電解析出するための水性酸浴。
- ポリアルキレングリコール基およびポリアルキレンイミン基の少なくとも1つが、一般化学式-(X-CHR-CH2)n-R’(式中、XはOまたはNHであり、RはHまたはメチルであり、(X-CHR-CH2)部分における各Xおよび各Rは、別の(X-CHR-CH2)部分における各XおよびRと独立して選択することができ、さらにnは2から1000の整数であり、R’はH、アルキルまたはアリールである)を有する、請求項1または2に記載の銅を電解析出するための水性酸浴。
- -(X-CHR-CH2)n-R’が、ホモポリエチレングリコール基、ホモポリプロピレングリコール基、ホモポリエチレンイミン基、ならびにエチレングリコール単位、プロピレングリコール単位およびエチレンイミン単位を含む群から選択される、少なくとも2種の単位を含むコポリマー基を含む群から選択される、請求項3に記載の銅を電解析出するための水性酸浴。
- コポリマー基が、エチレングリコール単位およびプロピレングリコール単位を含むブロックコポリマーから形成される、請求項4に記載の銅を電解析出するための水性酸浴。
- -(X-CHR-CH2)n-R’が、300から35000ダルトンの平均分子量を有する、請求項3〜5のいずれか一項に記載の銅を電解析出するための水性酸浴。
- nが、20から500である、請求項3〜6のいずれか一項に記載の銅を電解析出するための水性酸浴。
- R’が、H、C1〜C8-アルキルおよびC5〜C12-アリールを含む群から選択される、請求項3〜7のいずれか一項に記載の銅を電解析出するための水性酸浴。
- ペプチドが、2から10のアミノ酸単位を含むオリゴペプチドである、請求項1〜8のいずれか一項に記載の銅を電解析出するための水性酸浴。
- 少なくとも1種の官能化ペプチドが、そのC末端において、ロイシン、イソロイシン、メチオニン、フェニルアラニン、トリプトファン、アスパラギン、グルタミン、チロシン、リシン、アルギニンおよびヒスチジンを含む群から選択される末端アミノ酸を含む、請求項1〜9のいずれか一項に記載の銅を電解析出するための水性酸浴。
- 少なくとも1種の官能化ペプチドが、ベータ-アラニン、ベータ-フェニルアラニン、ベータ-トリプトファン、ベータ-チロシン、ベータ-ロイシン、ベータ-イソロイシン、ベータ-グルタミン、ベータ-グルタミン酸、ベータ-ヒスチジン、ベータ-メチオニンおよびアスパラギン酸を含む群から選択される少なくとも1種のベータ-アミノ酸を含む、請求項1〜9のいずれか一項に記載の銅を電解析出するための水性酸浴。
- 少なくとも1種の光沢剤化合物が、有機チオール化合物、有機スルフィド化合物、有機ジスルフィド化合物および有機ポリスルフィド化合物を含む群から選択される、請求項1〜11のいずれか一項に記載の銅を電解析出するための水性酸浴。
- 加工品上に銅を電解析出するための方法であって、
(i)請求項1〜12のいずれか一項に記載の前記銅を電解析出するための水性酸浴、ならびに少なくとも1つのアノードを準備する工程、
(ii)前記加工品および少なくとも1つのアノードを前記水性酸浴と接触させる工程、および
(iii)前記加工品と前記少なくとも1つのアノードの間に電流の流れを発生させて、銅を加工品上に析出させる工程
を含む、銅を電解析出するための方法。 - 前記加工品が、プリント回路基板、チップキャリアまたは半導体ウェーハである、請求項13に記載の銅を電解析出するための方法。
- 銅が、プリント回路基板、チップキャリアまたはウェーハの、トレンチおよびブラインドマイクロビアに析出される、請求項13または14に記載の銅を電解析出するための方法。
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EP08008111.0 | 2008-04-28 | ||
PCT/EP2009/003353 WO2009132861A2 (en) | 2008-04-28 | 2009-04-27 | Aqueous, acid bath and method for the electrolytic deposition of copper |
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CN101960054A (zh) | 2011-01-26 |
US8679316B2 (en) | 2014-03-25 |
TW201000684A (en) | 2010-01-01 |
ATE506468T1 (de) | 2011-05-15 |
DE502008003271D1 (de) | 2011-06-01 |
EP2113587A1 (de) | 2009-11-04 |
JP2011522962A (ja) | 2011-08-04 |
EP2113587B1 (de) | 2011-04-20 |
KR20100135736A (ko) | 2010-12-27 |
WO2009132861A3 (en) | 2010-04-15 |
CN101960054B (zh) | 2012-07-04 |
TWI437133B (zh) | 2014-05-11 |
EP2113587B9 (de) | 2011-09-07 |
WO2009132861A2 (en) | 2009-11-05 |
US20110011746A1 (en) | 2011-01-20 |
KR101536029B1 (ko) | 2015-07-10 |
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