JP5635246B2 - Iii族窒化物半導体光素子及びエピタキシャル基板 - Google Patents
Iii族窒化物半導体光素子及びエピタキシャル基板 Download PDFInfo
- Publication number
- JP5635246B2 JP5635246B2 JP2009167177A JP2009167177A JP5635246B2 JP 5635246 B2 JP5635246 B2 JP 5635246B2 JP 2009167177 A JP2009167177 A JP 2009167177A JP 2009167177 A JP2009167177 A JP 2009167177A JP 5635246 B2 JP5635246 B2 JP 5635246B2
- Authority
- JP
- Japan
- Prior art keywords
- layer
- gallium nitride
- group iii
- type gallium
- based semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers
- H01S5/343—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser
- H01S5/34333—Structure or shape of the active region; Materials used for the active region comprising quantum well or superlattice structures, e.g. single quantum well [SQW] lasers, multiple quantum well [MQW] lasers or graded index separate confinement heterostructure [GRINSCH] lasers in AIIIBV compounds, e.g. AlGaAs-laser, InP-based laser with a well layer based on Ga(In)N or Ga(In)P, e.g. blue laser
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y20/00—Nanooptics, e.g. quantum optics or photonic crystals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/3202—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures grown on specifically orientated substrates, or using orientation dependent growth
- H01S5/320275—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures grown on specifically orientated substrates, or using orientation dependent growth semi-polar orientation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/0014—Measuring characteristics or properties thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/2004—Confining in the direction perpendicular to the layer structure
- H01S5/2009—Confining in the direction perpendicular to the layer structure by using electron barrier layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/2004—Confining in the direction perpendicular to the layer structure
- H01S5/2018—Optical confinement, e.g. absorbing-, reflecting- or waveguide-layers
- H01S5/2031—Optical confinement, e.g. absorbing-, reflecting- or waveguide-layers characterized by special waveguide layers, e.g. asymmetric waveguide layers or defined bandgap discontinuities
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semiconductor body to guide the optical wave ; Confining structures perpendicular to the optical axis, e.g. index or gain guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/305—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure
- H01S5/3054—Structure or shape of the active region; Materials used for the active region characterised by the doping materials used in the laser structure p-doping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/32—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures
- H01S5/3211—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures characterised by special cladding layers, e.g. details on band-discontinuities
- H01S5/3213—Structure or shape of the active region; Materials used for the active region comprising PN junctions, e.g. hetero- or double- heterostructures characterised by special cladding layers, e.g. details on band-discontinuities asymmetric clading layers
Landscapes
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Chemical & Material Sciences (AREA)
- Biophysics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Geometry (AREA)
- Led Devices (AREA)
- Semiconductor Lasers (AREA)
- Electrodes Of Semiconductors (AREA)
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009167177A JP5635246B2 (ja) | 2009-07-15 | 2009-07-15 | Iii族窒化物半導体光素子及びエピタキシャル基板 |
| PCT/JP2010/061839 WO2011007777A1 (ja) | 2009-07-15 | 2010-07-13 | Iii族窒化物半導体光素子、エピタキシャル基板 |
| EP10799835A EP2456026A1 (en) | 2009-07-15 | 2010-07-13 | Group iii nitride semiconductor optical element and epitaxial substrate |
| KR1020127000699A KR20120024955A (ko) | 2009-07-15 | 2010-07-13 | Ⅲ족 질화물 반도체 광소자 및 에피택셜 기판 |
| CN201080031731.2A CN102474076B (zh) | 2009-07-15 | 2010-07-13 | Iii族氮化物半导体光元件、外延衬底 |
| US12/836,117 US8304793B2 (en) | 2009-07-15 | 2010-07-14 | III-nitride semiconductor optical device and epitaxial substrate |
| TW099123335A TW201110414A (en) | 2009-07-15 | 2010-07-15 | Group iii nitride semiconductor optical element and epitaxial substrate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009167177A JP5635246B2 (ja) | 2009-07-15 | 2009-07-15 | Iii族窒化物半導体光素子及びエピタキシャル基板 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011023541A JP2011023541A (ja) | 2011-02-03 |
| JP2011023541A5 JP2011023541A5 (enExample) | 2012-04-26 |
| JP5635246B2 true JP5635246B2 (ja) | 2014-12-03 |
Family
ID=43449384
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009167177A Expired - Fee Related JP5635246B2 (ja) | 2009-07-15 | 2009-07-15 | Iii族窒化物半導体光素子及びエピタキシャル基板 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8304793B2 (enExample) |
| EP (1) | EP2456026A1 (enExample) |
| JP (1) | JP5635246B2 (enExample) |
| KR (1) | KR20120024955A (enExample) |
| CN (1) | CN102474076B (enExample) |
| TW (1) | TW201110414A (enExample) |
| WO (1) | WO2011007777A1 (enExample) |
Families Citing this family (46)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007080896A (ja) * | 2005-09-12 | 2007-03-29 | Sanyo Electric Co Ltd | 半導体素子 |
| JP5553035B2 (ja) * | 2011-01-24 | 2014-07-16 | 住友電気工業株式会社 | 窒化ガリウム系半導体レーザ素子 |
| JP5503574B2 (ja) * | 2011-02-21 | 2014-05-28 | 住友電気工業株式会社 | レーザダイオード |
| JP5361925B2 (ja) * | 2011-03-08 | 2013-12-04 | 株式会社東芝 | 半導体発光素子およびその製造方法 |
| JP6070548B2 (ja) * | 2011-05-18 | 2017-02-01 | 住友電気工業株式会社 | 化合物半導体基板 |
| JP2012248575A (ja) * | 2011-05-25 | 2012-12-13 | Sumitomo Electric Ind Ltd | 窒化物半導体レーザ素子、エピタキシャル基板、及び窒化物半導体レーザ素子を作製する方法 |
| JP2013033930A (ja) * | 2011-06-29 | 2013-02-14 | Sumitomo Electric Ind Ltd | Iii族窒化物半導体素子、及び、iii族窒化物半導体素子の製造方法 |
| JP5252042B2 (ja) | 2011-07-21 | 2013-07-31 | 住友電気工業株式会社 | Iii族窒化物半導体発光素子、及びiii族窒化物半導体発光素子を作製する方法 |
| US8946788B2 (en) | 2011-08-04 | 2015-02-03 | Avogy, Inc. | Method and system for doping control in gallium nitride based devices |
| JP5668647B2 (ja) * | 2011-09-06 | 2015-02-12 | 豊田合成株式会社 | Iii族窒化物半導体発光素子およびその製造方法 |
| JP5255106B2 (ja) * | 2011-10-24 | 2013-08-07 | 住友電気工業株式会社 | 窒化物半導体発光素子 |
| JP2013102043A (ja) * | 2011-11-08 | 2013-05-23 | Sumitomo Electric Ind Ltd | 半導体レーザ素子、及び、半導体レーザ素子の作製方法 |
| JP5940355B2 (ja) * | 2012-04-19 | 2016-06-29 | ソウル セミコンダクター カンパニー リミテッド | p型窒化物半導体層の製造方法 |
| KR102062382B1 (ko) | 2012-04-19 | 2020-01-03 | 서울반도체 주식회사 | 반도체 장치 및 이를 제조하는 방법 |
| JP5699983B2 (ja) * | 2012-04-27 | 2015-04-15 | 住友電気工業株式会社 | 窒化ガリウム系半導体を作製する方法、iii族窒化物半導体デバイスを作製する方法、及びiii族窒化物半導体デバイス |
| WO2013165134A1 (en) * | 2012-05-01 | 2013-11-07 | Seoul Opto Device Co., Ltd. | Method for fabricating p-type aluminum gallium nitride semiconductor |
| JP2014086507A (ja) * | 2012-10-22 | 2014-05-12 | Sumitomo Electric Ind Ltd | 窒化物半導体レーザ、窒化物半導体レーザを作製する方法 |
| TWI589018B (zh) * | 2012-11-19 | 2017-06-21 | 新世紀光電股份有限公司 | 氮化物半導體結構 |
| TWI535055B (zh) | 2012-11-19 | 2016-05-21 | 新世紀光電股份有限公司 | 氮化物半導體結構及半導體發光元件 |
| TWI631727B (zh) * | 2012-11-19 | 2018-08-01 | 新世紀光電股份有限公司 | 氮化物半導體結構 |
| TWI511325B (zh) * | 2012-11-19 | 2015-12-01 | Genesis Photonics Inc | 氮化物半導體結構及半導體發光元件 |
| TWI663745B (zh) * | 2012-11-19 | 2019-06-21 | 新世紀光電股份有限公司 | 氮化物半導體結構 |
| TWI524551B (zh) | 2012-11-19 | 2016-03-01 | 新世紀光電股份有限公司 | 氮化物半導體結構及半導體發光元件 |
| US10153394B2 (en) | 2012-11-19 | 2018-12-11 | Genesis Photonics Inc. | Semiconductor structure |
| TWI499080B (zh) | 2012-11-19 | 2015-09-01 | Genesis Photonics Inc | 氮化物半導體結構及半導體發光元件 |
| JP2014127708A (ja) * | 2012-12-27 | 2014-07-07 | Toshiba Corp | 半導体発光素子及び半導体発光素子の製造方法 |
| CN107104174A (zh) * | 2013-01-25 | 2017-08-29 | 新世纪光电股份有限公司 | 氮化物半导体结构及半导体发光元件 |
| CN108550670B (zh) * | 2013-01-25 | 2020-10-27 | 新世纪光电股份有限公司 | 氮化物半导体结构及半导体发光元件 |
| CN107482097A (zh) * | 2013-01-25 | 2017-12-15 | 新世纪光电股份有限公司 | 氮化物半导体结构及半导体发光元件 |
| CN107833956B (zh) * | 2013-01-25 | 2020-04-07 | 新世纪光电股份有限公司 | 氮化物半导体结构及半导体发光元件 |
| JP6453542B2 (ja) | 2013-02-14 | 2019-01-16 | ソウル セミコンダクター カンパニー リミテッド | 半導体装置及びこれの製造方法 |
| JP2015176936A (ja) * | 2014-03-13 | 2015-10-05 | 株式会社東芝 | 半導体装置 |
| KR102223037B1 (ko) | 2014-10-01 | 2021-03-05 | 삼성전자주식회사 | 반도체 발광소자 제조방법 |
| JP5953447B1 (ja) * | 2015-02-05 | 2016-07-20 | Dowaエレクトロニクス株式会社 | Iii族窒化物半導体発光素子およびその製造方法 |
| JP6479615B2 (ja) * | 2015-09-14 | 2019-03-06 | 株式会社東芝 | 半導体装置の製造方法 |
| JP6218791B2 (ja) * | 2015-10-28 | 2017-10-25 | シャープ株式会社 | 窒化物半導体レーザ素子 |
| TWI581454B (zh) * | 2016-01-04 | 2017-05-01 | 錼創科技股份有限公司 | 半導體發光元件 |
| TWI738640B (zh) | 2016-03-08 | 2021-09-11 | 新世紀光電股份有限公司 | 半導體結構 |
| TWI717386B (zh) | 2016-09-19 | 2021-02-01 | 新世紀光電股份有限公司 | 含氮半導體元件 |
| JP7043802B2 (ja) * | 2017-11-16 | 2022-03-30 | 住友電気工業株式会社 | 垂直共振型面発光レーザ、垂直共振型面発光レーザを作製する方法 |
| EP3731355A4 (en) * | 2018-03-13 | 2021-10-27 | Fujikura Ltd. | OPTICAL SEMICONDUCTOR ELEMENT, STRUCTURE FOR MANUFACTURING A SEMICONDUCTOR ELEMENT AND METHOD FOR MANUFACTURING AN OPTICAL SEMICONDUCTOR ELEMENT IN WHICH THE STRUCTURE IS USED |
| WO2021070469A1 (ja) * | 2019-10-09 | 2021-04-15 | パナソニック株式会社 | 窒化物半導体デバイス |
| JP7642553B2 (ja) | 2019-11-08 | 2025-03-10 | ヌヴォトンテクノロジージャパン株式会社 | 半導体発光素子、及び半導体発光素子の製造方法 |
| CN111786259A (zh) * | 2020-08-25 | 2020-10-16 | 北京蓝海创芯智能科技有限公司 | 一种提高载流子注入效率的氮化镓基激光器外延结构及其制备方法 |
| TWI839293B (zh) * | 2021-09-28 | 2024-04-11 | 晶元光電股份有限公司 | 發光元件及其製造方法 |
| TWI816186B (zh) * | 2021-09-28 | 2023-09-21 | 晶元光電股份有限公司 | 發光元件及其製造方法 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3269344B2 (ja) * | 1995-08-21 | 2002-03-25 | 松下電器産業株式会社 | 結晶成長方法および半導体発光素子 |
| JP2003133246A (ja) * | 1996-01-19 | 2003-05-09 | Matsushita Electric Ind Co Ltd | 窒化ガリウム系化合物半導体発光素子及び窒化ガリウム系化合物半導体の製造方法 |
| JP2000156544A (ja) * | 1998-09-17 | 2000-06-06 | Matsushita Electric Ind Co Ltd | 窒化物半導体素子の製造方法 |
| JP3788444B2 (ja) | 2003-03-31 | 2006-06-21 | 日立電線株式会社 | 発光ダイオード及びその製造方法 |
| US7239392B2 (en) * | 2003-05-22 | 2007-07-03 | Xitronix Corporation | Polarization modulation photoreflectance characterization of semiconductor electronic interfaces |
| KR101351396B1 (ko) | 2005-06-01 | 2014-02-07 | 재팬 사이언스 앤드 테크놀로지 에이젼시 | 반극성 (Ga,Al,In,B)N 박막들, 헤테로구조들, 및소자들의 성장 및 제조에 대한 기술 |
| JP2008258503A (ja) * | 2007-04-06 | 2008-10-23 | Sumitomo Electric Ind Ltd | 窒化物系半導体発光素子、および窒化物系半導体発光素子を作製する方法 |
| JP2009021279A (ja) | 2007-07-10 | 2009-01-29 | Hitachi Cable Ltd | 半導体エピタキシャルウエハ |
| JP2009021361A (ja) | 2007-07-11 | 2009-01-29 | Sumitomo Electric Ind Ltd | 窒化物系半導体発光素子、および窒化物系半導体発光素子を作製する方法 |
| WO2009047894A1 (ja) | 2007-10-09 | 2009-04-16 | Panasonic Corporation | Iii族窒化物結晶基板の製造方法、iii族窒化物結晶基板、iii族窒化物結晶基板を用いた半導体装置 |
| JP2009152448A (ja) | 2007-12-21 | 2009-07-09 | Dowa Electronics Materials Co Ltd | 窒化物半導体素子およびその製造方法 |
| JP4375497B1 (ja) * | 2009-03-11 | 2009-12-02 | 住友電気工業株式会社 | Iii族窒化物半導体素子、エピタキシャル基板、及びiii族窒化物半導体素子を作製する方法 |
-
2009
- 2009-07-15 JP JP2009167177A patent/JP5635246B2/ja not_active Expired - Fee Related
-
2010
- 2010-07-13 EP EP10799835A patent/EP2456026A1/en not_active Withdrawn
- 2010-07-13 KR KR1020127000699A patent/KR20120024955A/ko not_active Ceased
- 2010-07-13 CN CN201080031731.2A patent/CN102474076B/zh not_active Expired - Fee Related
- 2010-07-13 WO PCT/JP2010/061839 patent/WO2011007777A1/ja not_active Ceased
- 2010-07-14 US US12/836,117 patent/US8304793B2/en active Active
- 2010-07-15 TW TW099123335A patent/TW201110414A/zh unknown
Also Published As
| Publication number | Publication date |
|---|---|
| JP2011023541A (ja) | 2011-02-03 |
| US20110114916A1 (en) | 2011-05-19 |
| EP2456026A1 (en) | 2012-05-23 |
| KR20120024955A (ko) | 2012-03-14 |
| WO2011007777A1 (ja) | 2011-01-20 |
| CN102474076A (zh) | 2012-05-23 |
| CN102474076B (zh) | 2014-06-18 |
| US8304793B2 (en) | 2012-11-06 |
| TW201110414A (en) | 2011-03-16 |
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