JP5522443B2 - 走査型共焦点顕微鏡検査の改善、およびその関連技術 - Google Patents

走査型共焦点顕微鏡検査の改善、およびその関連技術 Download PDF

Info

Publication number
JP5522443B2
JP5522443B2 JP2009527884A JP2009527884A JP5522443B2 JP 5522443 B2 JP5522443 B2 JP 5522443B2 JP 2009527884 A JP2009527884 A JP 2009527884A JP 2009527884 A JP2009527884 A JP 2009527884A JP 5522443 B2 JP5522443 B2 JP 5522443B2
Authority
JP
Japan
Prior art keywords
assembly
mirror
microscope
light
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2009527884A
Other languages
English (en)
Japanese (ja)
Other versions
JP2010503884A (ja
JP2010503884A5 (https=
Inventor
ホウルト,ロバート・アラン
ブッシュ,スティーブ・モリス
シーリー,ジョージ・ロバート
コロントジス,ディオニシス
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PerkinElmer Singapore Pte Ltd
Original Assignee
PerkinElmer Singapore Pte Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PerkinElmer Singapore Pte Ltd filed Critical PerkinElmer Singapore Pte Ltd
Publication of JP2010503884A publication Critical patent/JP2010503884A/ja
Publication of JP2010503884A5 publication Critical patent/JP2010503884A5/ja
Application granted granted Critical
Publication of JP5522443B2 publication Critical patent/JP5522443B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0028Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders specially adapted for specific applications, e.g. for endoscopes, ophthalmoscopes, attachments to conventional microscopes
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0032Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052Optical details of the image generation
    • G02B21/0076Optical details of the image generation arrangements using fluorescence or luminescence
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B26/00Optical devices or arrangements for the control of light using movable or deformable optical elements
    • G02B26/08Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
    • G02B26/0816Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B23/00Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices
    • G02B23/16Housings; Caps; Mountings; Supports, e.g. with counterweight

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Ophthalmology & Optometry (AREA)
  • Radiology & Medical Imaging (AREA)
  • Surgery (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2009527884A 2006-09-14 2007-09-14 走査型共焦点顕微鏡検査の改善、およびその関連技術 Active JP5522443B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB0618057.4 2006-09-14
GBGB0618057.4A GB0618057D0 (en) 2006-09-14 2006-09-14 Improvements in and relating to scanning confocal microscopy
PCT/GB2007/003446 WO2008032055A1 (en) 2006-09-14 2007-09-14 Improvements in and relating to scanning confocal microscopy

Publications (3)

Publication Number Publication Date
JP2010503884A JP2010503884A (ja) 2010-02-04
JP2010503884A5 JP2010503884A5 (https=) 2010-09-16
JP5522443B2 true JP5522443B2 (ja) 2014-06-18

Family

ID=37309882

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009527884A Active JP5522443B2 (ja) 2006-09-14 2007-09-14 走査型共焦点顕微鏡検査の改善、およびその関連技術

Country Status (9)

Country Link
US (1) US8284484B2 (https=)
EP (1) EP2059844B1 (https=)
JP (1) JP5522443B2 (https=)
CN (2) CN102914861B (https=)
AU (1) AU2007296003B2 (https=)
CA (1) CA2663597C (https=)
GB (1) GB0618057D0 (https=)
SG (1) SG170814A1 (https=)
WO (1) WO2008032055A1 (https=)

Families Citing this family (60)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102869982B (zh) 2010-03-01 2014-04-30 奥林巴斯株式会社 光学分析装置、光学分析方法
WO2012002893A1 (en) * 2010-06-30 2012-01-05 Ge Healthcare Bio-Sciences Corp A system for synchronization in a line scanning imaging microscope
WO2012014778A1 (ja) 2010-07-26 2012-02-02 オリンパス株式会社 発光プローブを用いて溶液中の希薄粒子を検出する方法
CN103097878B (zh) 2010-09-10 2015-07-22 奥林巴斯株式会社 使用单个发光颗粒的光强度的光学分析方法
JP5893564B2 (ja) 2010-09-10 2016-03-23 オリンパス株式会社 複数の波長帯域の光計測を用いた光分析方法
JP5907882B2 (ja) 2010-10-19 2016-04-26 オリンパス株式会社 単一発光粒子の偏光特性を観測する光分析装置、光分析方法及びそのための光分析用コンピュータプログラム
EP2631631B1 (en) 2010-11-25 2016-01-20 Olympus Corporation Photometric analysis device and photometric analysis method using wavelength characteristic of light emitted from single illuminant particle
DE102010061612B4 (de) * 2010-12-29 2023-12-28 Leica Microsystems Cms Gmbh Verfahren zum Ermitteln von Scankoordinaten zum Betreiben einer Scaneinheit eines konfokalen Scan-Mikroskops und konfokales Scan-Mikroskop
EP2667183A4 (en) 2011-01-20 2017-05-10 Olympus Corporation Photoanalysis method and photoanalysis device using detection of light from single light-emitting particle
EP2669376B1 (en) 2011-01-26 2017-08-16 Olympus Corporation Method for identifying polymorphism of nucleic acid molecules
EP2669663B1 (en) 2011-01-26 2017-09-27 Olympus Corporation Method for identifying polymorphism of nucleic acid molecules
EP2693201A4 (en) 2011-03-29 2014-10-29 Olympus Corp PHOTOMETRIC ANALYSIS DEVICE, PHOTOMETRIC ANALYSIS METHOD, AND COMPUTER PROGRAM FOR PHOTOMETRIC ANALYSIS, DETECTING SINGLE LIGHT EMITTING PARTICLE
CN103477210B (zh) 2011-04-13 2015-09-23 奥林巴斯株式会社 利用单个发光粒子检测的光分析装置、光分析方法以及光分析用计算机程序
JP6013328B2 (ja) 2011-04-18 2016-10-25 オリンパス株式会社 標的粒子の定量方法
JP6013335B2 (ja) 2011-08-11 2016-10-25 オリンパス株式会社 標的粒子の計数方法
CN103733049B (zh) 2011-08-15 2016-01-20 奥林巴斯株式会社 利用单个发光粒子检测的光分析装置、光分析方法以及光分析用计算机程序
EP2749868B1 (en) 2011-08-26 2019-02-27 Olympus Corporation Single-particle detector using optical analysis, single-particle detection method using same, and computer program for single-particle detection
JP6013338B2 (ja) 2011-08-26 2016-10-25 オリンパス株式会社 単一発光粒子検出を用いた光分析装置、光分析方法及び光分析用コンピュータプログラム
JP6010035B2 (ja) 2011-08-30 2016-10-19 オリンパス株式会社 単一発光粒子検出を用いた光分析装置、光分析方法及び光分析用コンピュータプログラム
CN103765194B (zh) 2011-08-30 2016-02-17 奥林巴斯株式会社 目标粒子的检测方法
DE102011087196A1 (de) * 2011-11-28 2013-05-29 Leica Microsystems Cms Gmbh Mikroskopbeleuchtungssystem und -verfahren
DE102012201286B4 (de) * 2012-01-30 2025-07-24 Carl Zeiss Microscopy Gmbh Mikroskop und Verfahren für die wellenlängenselektive und örtlich hochauflösende Mikroskopie
WO2013122169A1 (ja) * 2012-02-15 2013-08-22 オリンパス株式会社 レーザ走査型観察装置
EP2816344A4 (en) 2012-02-17 2015-09-23 Olympus Corp OPTICAL ANALYSIS DEVICE USING SINGLE PARTICLE DETECTION TECHNIQUE, OPTICAL ANALYSIS METHOD, AND COMPUTER PROGRAM FOR OPTICAL ANALYSIS
CN104115003B (zh) 2012-02-22 2016-03-23 奥林巴斯株式会社 目标粒子的检测方法
JP6095645B2 (ja) 2012-03-21 2017-03-15 オリンパス株式会社 標的核酸分子の検出方法
WO2013157283A1 (ja) 2012-04-18 2013-10-24 オリンパス株式会社 標的粒子の検出方法
EP2840380A4 (en) 2012-04-18 2015-11-25 Olympus Corp SINGLE PARTICLE DETECTOR WITH PHOTO ANALYSIS, SINGLE PARTICLE PROCESSING AND COMPUTER PROGRAM FOR SINGLE PARTICLE DETECTION
WO2015015951A1 (ja) 2013-07-31 2015-02-05 オリンパス株式会社 単一発光粒子検出技術を用いた光学顕微鏡装置、顕微鏡観察法及び顕微鏡観察のためのコンピュータプログラム
DE102013215422B4 (de) * 2013-08-06 2022-02-24 Olympus Winter & Ibe Gmbh Optisches System eines Stereo-Videoendoskops mit seitlicher Blickrichtung und Stereo-Videoendoskop mit seitlicher Blickrichtung
US20150049375A1 (en) * 2013-08-16 2015-02-19 Optical Physics Company Compact beam director
EP3059577A4 (en) 2013-10-07 2017-05-31 Olympus Corporation Photometric analysis device employing single light-emitting particle detection, photometric analysis method, and computer program for photometric analysis
KR102197505B1 (ko) 2013-10-25 2020-12-31 마이크로소프트 테크놀로지 라이센싱, 엘엘씨 비디오 및 이미지 코딩 및 디코딩에서의 해시 값을 갖는 블록의 표현
EP3061253A1 (en) 2013-10-25 2016-08-31 Microsoft Technology Licensing, LLC Hash-based block matching in video and image coding
DE102013018672B4 (de) * 2013-11-07 2024-05-08 Carl Zeiss Microscopy Gmbh Multispot-scanning mikroskop
WO2015131326A1 (en) 2014-03-04 2015-09-11 Microsoft Technology Licensing, Llc Encoder-side decisions for block flipping and skip mode in intra block copy prediction
WO2015131325A1 (en) * 2014-03-04 2015-09-11 Microsoft Technology Licensing, Llc Hash table construction and availability checking for hash-based block matching
CN105706450B (zh) 2014-06-23 2019-07-16 微软技术许可有限责任公司 根据基于散列的块匹配的结果的编码器决定
CA2961089C (en) 2014-09-30 2023-03-28 Microsoft Technology Licensing, Llc Hash-based encoder decisions for video coding
KR101898220B1 (ko) 2015-08-04 2018-09-12 한국과학기술원 공초점 현미경 및 이를 이용한 영상 처리 방법
WO2017043531A1 (ja) * 2015-09-07 2017-03-16 大日本印刷株式会社 照明装置
CN108780222B (zh) * 2015-12-08 2021-07-06 密歇根大学董事会 用于实时横截面显微内镜的3d mems扫描仪
WO2017098597A1 (ja) 2015-12-09 2017-06-15 オリンパス株式会社 単一発光粒子検出を用いた光分析方法及び光分析装置
US10390039B2 (en) 2016-08-31 2019-08-20 Microsoft Technology Licensing, Llc Motion estimation for screen remoting scenarios
DE102016119730A1 (de) * 2016-10-17 2018-04-19 Carl Zeiss Microscopy Gmbh Optikgruppe für Detektionslicht für ein Mikroskop, Verfahren zur Mikroskopie und Mikroskop
US11095877B2 (en) 2016-11-30 2021-08-17 Microsoft Technology Licensing, Llc Local hash-based motion estimation for screen remoting scenarios
GB201704771D0 (en) * 2017-01-05 2017-05-10 Illumina Inc Modular optical analytic systems and methods
TWI631437B (zh) * 2017-11-06 2018-08-01 許家維 雷射投射鐘
CN109782564B (zh) * 2017-11-15 2021-03-23 许家维 雷射投射钟
DE112019000575B4 (de) 2018-01-29 2023-12-07 Hamilton Thorne, Inc. Modulare Objektivbaugruppe mit beweglichem Laserstrahl
NL2022286B1 (en) * 2018-09-19 2020-05-07 Illumina Inc Structured illumination of a sample
CN109752916A (zh) * 2018-12-26 2019-05-14 江苏大学 一种平面激光拍摄装置及其方法
CN109917544A (zh) * 2019-03-19 2019-06-21 北京遥感设备研究所 一种透射式扫描稳像光学系统
CN111307068B (zh) * 2020-04-02 2025-02-25 元素光电智能科技(苏州)有限公司 光学三维测量系统
US11202085B1 (en) 2020-06-12 2021-12-14 Microsoft Technology Licensing, Llc Low-cost hash table construction and hash-based block matching for variable-size blocks
CN112230709B (zh) * 2020-10-16 2023-12-12 南京大学 一种可实现高精度光输入的光电计算装置及校准方法
CN112162395A (zh) * 2020-10-27 2021-01-01 江苏三米科思半导体设备有限公司 一种深紫外斜入射高分辨率暗场照明光学系统
EP4264352A4 (en) * 2020-12-15 2024-11-20 The Trustees of Columbia University in the City of New York POINT-OF-CARE MICROSCOPE FOR REAL-TIME ACQUISITION OF VOLUMETRIC HISTOLOGICAL IMAGES IN VIVO
KR102576472B1 (ko) * 2021-08-11 2023-09-11 주식회사 나노바이오라이프 다채널 광학 진단 장치
CN113946057A (zh) * 2021-10-14 2022-01-18 深圳赛陆医疗科技有限公司 一种多模光纤匀光装置

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2661007B1 (fr) * 1990-04-12 1994-04-01 Etat Francais Delegue Armement Dispositif d'aiguillage optique pour faisceau laser.
JP2855893B2 (ja) * 1991-03-13 1999-02-10 富士電機株式会社 光スイッチおよび光学式センサ
US5334830A (en) * 1991-05-29 1994-08-02 Olympus Optical Co., Ltd. Scanning optical microscope having a compact confocal optical system for adjusting position of aperture
US6219182B1 (en) 1998-05-28 2001-04-17 Mckinley Optics, Inc. Multiple magnification stereo video telescope objective lens system
DE10039520A1 (de) * 2000-08-08 2002-02-21 Leica Microsystems Vorrichtung zur Untersuchung und Manipulation von mikroskopischen Objekten
CN2546893Y (zh) 2001-12-01 2003-04-23 鸿富锦精密工业(深圳)有限公司 光开关装置
CN1222795C (zh) 2002-06-21 2005-10-12 中国科学院上海微系统与信息技术研究所 一种采用双压电晶片驱动器制作的二维光开关矩阵及其方法
US6857752B2 (en) * 2003-04-11 2005-02-22 3M Innovative Properties Company Projection illumination system with tunnel integrator and field lens
US7220627B2 (en) * 2003-04-21 2007-05-22 Semiconductor Energy Laboratory Co., Ltd. Method for manufacturing a semiconductor device where the scanning direction changes between regions during crystallization and process
JP2005055718A (ja) * 2003-08-05 2005-03-03 Oki Electric Cable Co Ltd 光スイッチ素子
DE502004009281D1 (de) * 2003-09-25 2009-05-14 Leica Microsystems Mikroskop mit evaneszenter probenbeleuchtung
US7227113B2 (en) 2003-11-21 2007-06-05 Olympus Corporation Confocal laser scanning microscope
JP4724411B2 (ja) * 2003-11-21 2011-07-13 オリンパス株式会社 共焦点レーザスキャニング顕微鏡
DE102004034977A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop und Verwendung
DE102004034959A1 (de) * 2004-07-16 2006-02-16 Carl Zeiss Jena Gmbh Lichtrastermikroskop mit punktförmiger Lichtquellenverteilung und Verwendung
DE102004034954A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Verfahren zur Erfassung mindestens eines Probenbereiches mit einem Lichtrastermikroskop
JP2006058747A (ja) * 2004-08-23 2006-03-02 Hitachi Maxell Ltd 光スイッチ及び光スイッチング方法

Also Published As

Publication number Publication date
CN101595414B (zh) 2013-08-07
CN102914861A (zh) 2013-02-06
WO2008032055A9 (en) 2009-04-23
CA2663597C (en) 2014-10-28
EP2059844B1 (en) 2017-05-17
AU2007296003B2 (en) 2013-01-31
WO2008032055A1 (en) 2008-03-20
EP2059844A1 (en) 2009-05-20
JP2010503884A (ja) 2010-02-04
CA2663597A1 (en) 2008-03-20
SG170814A1 (en) 2011-05-30
US20090279169A1 (en) 2009-11-12
AU2007296003A1 (en) 2008-03-20
CN101595414A (zh) 2009-12-02
CN102914861B (zh) 2016-01-20
US8284484B2 (en) 2012-10-09
GB0618057D0 (en) 2006-10-25

Similar Documents

Publication Publication Date Title
JP5522443B2 (ja) 走査型共焦点顕微鏡検査の改善、およびその関連技術
CN101354481B (zh) 激光照射装置及使用其的激光加工系统
US11327288B2 (en) Method for generating an overview image using a large aperture objective
US6522433B2 (en) Interference lithography using holey fibers
US20140043469A1 (en) Chromatic sensor and method
JP2008250303A (ja) シート光を発生するための光学装置
CN111095073B (zh) 在激光扫描显微镜中扫描激发辐射和/或操纵辐射的光学组件以及激光扫描显微镜
US9696499B2 (en) Optical switch and beam stabilization device
JP5456178B2 (ja) 斜角光経路を形成する光学システム及びその方法
US8950078B2 (en) Apparatus with internal optical reference
KR20140052840A (ko) 레이저 조사 유닛 및 레이저 가공 장치
CN102648430B (zh) 用于扫描显微镜的移相滤光器
US20070058246A1 (en) Microscope arrangement
JPH11231222A (ja) 走査ユニット付顕微鏡、そのための配置および操作方法
JP2003098437A (ja) 走査顕微鏡及び目標物を走査するための方法
US20150029583A1 (en) Apparatus and Method for Transmitted Light Illumination for Light Microscopes and Microscope System
US10073257B2 (en) Apparatus and method for transmitted light illumination for light microscopes and microscope system
JPH10115784A (ja) 鏡筒を有する光学機器
JP2005532596A (ja) 観察点の位置の急速な3次元変調が可能な光学顕微鏡
US6855941B1 (en) Laser microscope
JP2004045288A (ja) レンズ測定装置
JP2000098237A (ja) 顕微鏡用俯視角度可変鏡筒
JP2013190760A (ja) 顕微鏡用照明装置
JP2011501244A (ja) 走査型共焦点顕微法およびそれに関する改善
KR0120646Y1 (ko) 광축 조정용 오토콜리메이터 장치

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100729

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20100729

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120821

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20121121

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20130409

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20130708

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20140311

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20140326

R150 Certificate of patent or registration of utility model

Ref document number: 5522443

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

S533 Written request for registration of change of name

Free format text: JAPANESE INTERMEDIATE CODE: R313533

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350