JP5395336B2 - 薄膜トランジスタアレイ基板及びこれの製造方法 - Google Patents

薄膜トランジスタアレイ基板及びこれの製造方法 Download PDF

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Publication number
JP5395336B2
JP5395336B2 JP2007163971A JP2007163971A JP5395336B2 JP 5395336 B2 JP5395336 B2 JP 5395336B2 JP 2007163971 A JP2007163971 A JP 2007163971A JP 2007163971 A JP2007163971 A JP 2007163971A JP 5395336 B2 JP5395336 B2 JP 5395336B2
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protective film
gate
etching
line
region
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JP2008015510A5 (enExample
JP2008015510A (ja
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洪 基 秦
湘 甲 金
▲ぶん▼ 錫 呉
周 漢 金
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Samsung Display Co Ltd
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Samsung Display Co Ltd
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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1345—Conductors connecting electrodes to cell terminals
    • G02F1/13458—Terminal pads
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136227—Through-hole connection of the pixel electrode to the active element through an insulation layer
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/01—Manufacture or treatment
    • H10D86/021—Manufacture or treatment of multiple TFTs
    • H10D86/0231—Manufacture or treatment of multiple TFTs using masks, e.g. half-tone masks
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/451—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs characterised by the compositions or shapes of the interlayer dielectrics
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Thin Film Transistor (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
JP2007163971A 2006-06-30 2007-06-21 薄膜トランジスタアレイ基板及びこれの製造方法 Active JP5395336B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020060060246A KR101201972B1 (ko) 2006-06-30 2006-06-30 박막 트랜지스터 어레이 기판 및 이의 제조 방법
KR10-2006-0060246 2006-06-30

Publications (3)

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JP2008015510A JP2008015510A (ja) 2008-01-24
JP2008015510A5 JP2008015510A5 (enExample) 2011-06-30
JP5395336B2 true JP5395336B2 (ja) 2014-01-22

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JP2007163971A Active JP5395336B2 (ja) 2006-06-30 2007-06-21 薄膜トランジスタアレイ基板及びこれの製造方法

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Country Link
US (1) US20080042133A1 (enExample)
EP (1) EP1873833A1 (enExample)
JP (1) JP5395336B2 (enExample)
KR (1) KR101201972B1 (enExample)
CN (1) CN101097928B (enExample)
TW (1) TW200827891A (enExample)

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KR20070019457A (ko) * 2005-08-12 2007-02-15 삼성전자주식회사 박막 트랜지스터 표시판 및 이를 포함하는 액정표시장치
JP5380037B2 (ja) * 2007-10-23 2014-01-08 株式会社半導体エネルギー研究所 半導体装置の作製方法
KR101048927B1 (ko) * 2008-05-21 2011-07-12 엘지디스플레이 주식회사 액정표시장치 및 그 제조방법
KR20100069935A (ko) * 2008-12-17 2010-06-25 삼성전자주식회사 박막 트랜지스터 어레이 기판 및 이의 제조 방법
KR101569766B1 (ko) * 2009-01-29 2015-11-17 삼성디스플레이 주식회사 박막 트랜지스터 표시판 및 그 제조 방법
TW201037436A (en) * 2009-04-10 2010-10-16 Au Optronics Corp Pixel unit and fabricating method thereof
KR101648806B1 (ko) * 2009-07-20 2016-08-31 삼성디스플레이 주식회사 박막 트랜지스터 표시판 및 그 제조 방법
WO2011016286A1 (ja) * 2009-08-04 2011-02-10 シャープ株式会社 アクティブマトリックス基板、液晶表示パネル、液晶表示装置およびアクティブマトリックス基板の製造方法
JPWO2011016287A1 (ja) * 2009-08-04 2013-01-10 シャープ株式会社 アクティブマトリックス基板、液晶表示パネル、液晶表示装置およびアクティブマトリックス基板の製造方法
KR20120028050A (ko) * 2010-09-14 2012-03-22 삼성전자주식회사 박막 트랜지스터 표시판의 제조 방법
CN102637634B (zh) 2011-08-12 2014-02-26 北京京东方光电科技有限公司 一种阵列基板及其制作方法、显示装置
KR101980765B1 (ko) 2012-12-26 2019-08-28 엘지디스플레이 주식회사 에프에프에스 방식 액정표시장치용 어레이기판 및 그 제조방법
KR102232539B1 (ko) * 2013-11-13 2021-03-29 삼성디스플레이 주식회사 박막 트랜지스터, 이를 포함하는 표시 기판 및 박막 트랜지스터의 제조 방법
CN104241296B (zh) * 2014-08-21 2017-12-08 京东方科技集团股份有限公司 一种阵列基板及其制作方法和显示装置
KR102411154B1 (ko) 2015-07-09 2022-06-21 쑤저우 레킨 세미컨덕터 컴퍼니 리미티드 발광 소자
CN108573928B (zh) * 2018-04-13 2020-12-29 Tcl华星光电技术有限公司 一种tft阵列基板的制备方法及tft阵列基板、显示面板
TW202243178A (zh) * 2021-04-23 2022-11-01 元太科技工業股份有限公司 電子裝置及其線路結構
CN114023699B (zh) * 2021-10-29 2022-09-27 北海惠科光电技术有限公司 阵列基板的制备方法及其阵列基板
TWI806796B (zh) * 2022-11-01 2023-06-21 友達光電股份有限公司 薄膜電晶體

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JP4846301B2 (ja) * 2004-08-30 2011-12-28 サムスン エレクトロニクス カンパニー リミテッド 薄膜トランジスタ基板の製造方法及びストリッピング組成物
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KR20070049740A (ko) * 2005-11-09 2007-05-14 엘지.필립스 엘시디 주식회사 액정표시장치용 어레이기판과 그 제조방법

Also Published As

Publication number Publication date
TW200827891A (en) 2008-07-01
CN101097928A (zh) 2008-01-02
CN101097928B (zh) 2012-10-10
JP2008015510A (ja) 2008-01-24
US20080042133A1 (en) 2008-02-21
KR101201972B1 (ko) 2012-11-15
EP1873833A1 (en) 2008-01-02
KR20080001847A (ko) 2008-01-04

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