JP5364200B2 - 薄膜蒸着装置と薄膜蒸着方法及び薄膜蒸着システム - Google Patents
薄膜蒸着装置と薄膜蒸着方法及び薄膜蒸着システム Download PDFInfo
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- JP5364200B2 JP5364200B2 JP2012503318A JP2012503318A JP5364200B2 JP 5364200 B2 JP5364200 B2 JP 5364200B2 JP 2012503318 A JP2012503318 A JP 2012503318A JP 2012503318 A JP2012503318 A JP 2012503318A JP 5364200 B2 JP5364200 B2 JP 5364200B2
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- 238000000427 thin-film deposition Methods 0.000 title claims description 32
- 238000007736 thin film deposition technique Methods 0.000 title claims description 12
- 239000000758 substrate Substances 0.000 claims description 170
- 238000000034 method Methods 0.000 claims description 104
- 230000008569 process Effects 0.000 claims description 94
- 238000007740 vapor deposition Methods 0.000 claims description 45
- 238000004148 unit process Methods 0.000 claims description 36
- 238000000151 deposition Methods 0.000 claims description 22
- 230000008021 deposition Effects 0.000 claims description 22
- 239000000463 material Substances 0.000 claims description 13
- 238000002360 preparation method Methods 0.000 claims description 4
- 239000011368 organic material Substances 0.000 claims description 2
- 230000008020 evaporation Effects 0.000 claims 1
- 238000001704 evaporation Methods 0.000 claims 1
- 239000010409 thin film Substances 0.000 description 20
- 238000002347 injection Methods 0.000 description 9
- 239000007924 injection Substances 0.000 description 9
- 239000002994 raw material Substances 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 5
- 230000005525 hole transport Effects 0.000 description 4
- 238000005507 spraying Methods 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 239000010408 film Substances 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 238000010276 construction Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 206010047571 Visual impairment Diseases 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 239000000446 fuel Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 230000008439 repair process Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000007665 sagging Methods 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000005019 vapor deposition process Methods 0.000 description 1
- 230000008016 vaporization Effects 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/568—Transferring the substrates through a series of coating stations
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67173—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/166—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using selective deposition, e.g. using a mask
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Organic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Materials Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Physical Vapour Deposition (AREA)
- Electroluminescent Light Sources (AREA)
Description
120:搬出チャンバー
200:工程チャンバー
310、320:マスクチャンバー
511:基板引込み口
512:基板引出口
520、530:基板ホルダー
521:支持台
522:クランプ
523:温度制御手段
600:緩衝チャンバー
410:燃料供給装置
G:基板
M:マスク
PL:工程ライン
Claims (10)
- 一列に連結された多数のチャンバーのそれぞれに第1及び第2の工程ラインを構築するステップと、
前記第1の工程ラインに沿って搬送された第1の基板を特定のチャンバーに引き込んで第1の単位工程を行うステップと、
前記第1の基板の単位工程が行われる間に前記第2の工程ラインに沿って搬送された第2の基板を前記特定のチャンバーに引き込んで第2の単位工程に必要な事前準備をするステップと、
前記第1の単位工程が終了すれば、事前準備を終えた第2の基板に対して前記第2の単位工程を行うステップと、
前記第2の基板の単位工程が行われる間に前記第1の基板を前記特定のチャンバーから引き出すステップと、を含み、
前記第1の単位工程は、蒸着源を用いて前記第1の基板の方向に原料物質を供給するステップを含み、
前記第2の単位工程は、前記蒸着源を回転させて前記第2の基板の方向に前記原料物質を供給するステップを含む薄膜蒸着方法。 - 前記第1及び第2の単位工程においては、有機材料を気化させて供給する請求項1に記載の薄膜蒸着方法。
- 前記第1及び第2の基板を水平状態に配置して搬送する請求項1に記載の薄膜蒸着方法。
- 前記第1及び第2の基板を垂直状態に配置して搬送する請求項1に記載の薄膜蒸着方法。
- 前記第1及び第2の基板を垂直状態に配置して単位工程を行う請求項1に記載の薄膜蒸着方法。
- 前記事前準備は、
前記第2の基板を所定の位置に整列するステップと、
前記第2の基板の上に蒸着マスクを配置して整列するステップと、
のうちの少なくともいずれか一つを含む請求項1に記載の薄膜蒸着方法。 - 一列に連結された多数のチャンバーと、
前記多数のチャンバーに形成された第1及び第2の工程ラインと、
を備え、
前記多数のチャンバーのうちの少なくとも一つのチャンバーの内部には、
前記第1の工程ラインをなす第1の基板ホルダーと、
前記第2の工程ラインをなし、且つ、第1の基板ホルダーから離間している第2の基板ホルダーと、
前記第1及び第2の基板ホルダーの間に配設され、蒸着原料を供給する蒸着源と、が設けられ、
前記蒸着源は、前記第1の基板ホルダーと第2の基板ホルダーとの間において回転可能であり、且つ、前記第1及び第2の基板ホルダーの方向に順次に前記蒸着原料を供給し、
前記第1及び第2の基板ホルダーは、
基板を支持する支持台と、
前記支持台を垂直状態に立てたり、水平状態に横たえたりする駆動部をさらに備える、薄膜蒸着システム。 - 前記蒸着源は、点状、線状及び面状の蒸着源のうちの少なくともいずれか一種である請求項7に記載の薄膜蒸着システム。
- 前記多数のチャンバーは、
単位工程を行う多数の工程チャンバーと、
前記多数の工程チャンバーの間に連結された多数の緩衝チャンバーと、
を備える請求項7に記載の薄膜蒸着システム。 - 前記多数の工程チャンバーには、
蒸着マスクを提供するか、あるいは、蒸着マスクを取り替えるためのマスクチャンバーが連結される請求項9に記載の薄膜蒸着システム。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR10-2009-0027351 | 2009-03-31 | ||
KR1020090027351A KR101097737B1 (ko) | 2009-03-31 | 2009-03-31 | 박막 증착 장치와 박막 증착 방법 및 박막 증착 시스템 |
PCT/KR2010/001919 WO2010114274A2 (en) | 2009-03-31 | 2010-03-30 | Apparatus for depositing film and method for depositing film and system for depositing film |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2012522137A JP2012522137A (ja) | 2012-09-20 |
JP5364200B2 true JP5364200B2 (ja) | 2013-12-11 |
Family
ID=42828832
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012503318A Expired - Fee Related JP5364200B2 (ja) | 2009-03-31 | 2010-03-30 | 薄膜蒸着装置と薄膜蒸着方法及び薄膜蒸着システム |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP5364200B2 (ja) |
KR (1) | KR101097737B1 (ja) |
CN (1) | CN102369306B (ja) |
TW (1) | TWI427178B (ja) |
WO (1) | WO2010114274A2 (ja) |
Cited By (1)
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WO2016087005A1 (en) * | 2014-12-05 | 2016-06-09 | Applied Materials, Inc. | Material deposition system and method for depositing material in a material deposition system |
Families Citing this family (20)
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US20100279021A1 (en) * | 2009-05-04 | 2010-11-04 | Samsung Mobile Display Co., Ltd. | Apparatus for depositing organic material and depositing method thereof |
KR101151234B1 (ko) * | 2010-03-30 | 2012-06-14 | 주식회사 케이씨텍 | 직립방식 증착장치 및 기판 이송 방법 |
JP2013167001A (ja) * | 2012-02-16 | 2013-08-29 | Hitachi High-Technologies Corp | 真空蒸着システム及び真空蒸着方法 |
KR102106414B1 (ko) * | 2013-04-26 | 2020-05-06 | 삼성디스플레이 주식회사 | 증착 챔버, 이를 포함하는 증착 시스템 및 유기 발광 표시장치 제조방법 |
KR20150053161A (ko) * | 2013-11-07 | 2015-05-15 | 삼성디스플레이 주식회사 | 증착 장치, 이를 이용한 유기발광 디스플레이 장치 제조 방법 |
EP3080327A1 (en) * | 2013-12-10 | 2016-10-19 | Applied Materials, Inc. | Evaporation source for organic material, apparatus having an evaporation source for organic material, system having an evaporation deposition apparatus with an evaporation source for organic materials, and method for operating an evaporation source for organic material |
KR102229761B1 (ko) | 2014-03-17 | 2021-03-23 | 삼성디스플레이 주식회사 | 원자층 증착 장치 |
DE102016110884A1 (de) | 2016-06-14 | 2017-12-14 | Aixtron Se | Vorrichtung und Verfahren zum Abscheiden organischer Schichten auf ein oder mehreren Substraten |
CN106435482A (zh) * | 2016-10-27 | 2017-02-22 | 安徽恒致铜铟镓硒技术有限公司 | 独立箱式蒸发源装置 |
JP2019510129A (ja) * | 2017-02-03 | 2019-04-11 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 隣り合う基板を有する連続蒸発のための装置及び方法 |
CN108966676B (zh) * | 2017-03-17 | 2023-08-04 | 应用材料公司 | 在真空系统处理掩模装置的方法、掩模处理组件和用于在基板上沉积材料的真空系统 |
CN110998869B (zh) * | 2017-08-09 | 2022-12-27 | 株式会社钟化 | 光电转换元件的制造方法 |
CN109423610B (zh) | 2017-08-24 | 2020-12-04 | 京东方科技集团股份有限公司 | 一种蒸镀装置及蒸镀方法 |
KR101921648B1 (ko) * | 2017-12-28 | 2018-11-26 | 주식회사 올레드온 | 수직형 면증발원을 이용한 고해상도 amoled 소자의 클러스터형 양산장비 |
KR102355814B1 (ko) * | 2020-03-20 | 2022-01-26 | 주식회사 선익시스템 | 증착 장치 및 이를 이용한 유기물 증착 방법 |
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KR102413664B1 (ko) * | 2020-04-20 | 2022-06-28 | 주식회사 선익시스템 | 클러스터 증착 시스템 |
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-
2009
- 2009-03-31 KR KR1020090027351A patent/KR101097737B1/ko active IP Right Grant
-
2010
- 2010-03-17 TW TW099107789A patent/TWI427178B/zh not_active IP Right Cessation
- 2010-03-30 WO PCT/KR2010/001919 patent/WO2010114274A2/en active Application Filing
- 2010-03-30 CN CN201080015804.9A patent/CN102369306B/zh not_active Expired - Fee Related
- 2010-03-30 JP JP2012503318A patent/JP5364200B2/ja not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2016087005A1 (en) * | 2014-12-05 | 2016-06-09 | Applied Materials, Inc. | Material deposition system and method for depositing material in a material deposition system |
TWI619823B (zh) * | 2014-12-05 | 2018-04-01 | 應用材料股份有限公司 | 真空沈積系統及用以於其中沈積材料之方法 |
Also Published As
Publication number | Publication date |
---|---|
KR20100108994A (ko) | 2010-10-08 |
WO2010114274A3 (en) | 2010-12-23 |
JP2012522137A (ja) | 2012-09-20 |
KR101097737B1 (ko) | 2011-12-22 |
CN102369306B (zh) | 2014-01-22 |
TW201104008A (en) | 2011-02-01 |
WO2010114274A2 (en) | 2010-10-07 |
TWI427178B (zh) | 2014-02-21 |
CN102369306A (zh) | 2012-03-07 |
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