TWI427178B - 用於沉積薄膜之裝置、方法及系統 - Google Patents
用於沉積薄膜之裝置、方法及系統 Download PDFInfo
- Publication number
- TWI427178B TWI427178B TW099107789A TW99107789A TWI427178B TW I427178 B TWI427178 B TW I427178B TW 099107789 A TW099107789 A TW 099107789A TW 99107789 A TW99107789 A TW 99107789A TW I427178 B TWI427178 B TW I427178B
- Authority
- TW
- Taiwan
- Prior art keywords
- substrate
- substrate holder
- chambers
- chamber
- deposition source
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 113
- 238000000151 deposition Methods 0.000 title claims description 102
- 239000000758 substrate Substances 0.000 claims description 228
- 230000008569 process Effects 0.000 claims description 95
- 230000008021 deposition Effects 0.000 claims description 82
- 238000004148 unit process Methods 0.000 claims description 34
- 239000000463 material Substances 0.000 claims description 12
- 239000002994 raw material Substances 0.000 claims description 7
- 238000002360 preparation method Methods 0.000 claims description 6
- 238000001704 evaporation Methods 0.000 claims description 4
- 239000011368 organic material Substances 0.000 claims description 2
- 230000000873 masking effect Effects 0.000 claims 1
- 125000006850 spacer group Chemical group 0.000 claims 1
- 239000010408 film Substances 0.000 description 16
- 239000010409 thin film Substances 0.000 description 15
- 238000000427 thin-film deposition Methods 0.000 description 10
- 238000004519 manufacturing process Methods 0.000 description 8
- 238000005452 bending Methods 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 2
- 230000005525 hole transport Effects 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 229910001111 Fine metal Inorganic materials 0.000 description 1
- 206010047571 Visual impairment Diseases 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 230000002860 competitive effect Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/56—Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
- C23C14/568—Transferring the substrates through a series of coating stations
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/50—Substrate holders
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67173—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/166—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using selective deposition, e.g. using a mask
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Metallurgy (AREA)
- Manufacturing & Machinery (AREA)
- Organic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Physical Vapour Deposition (AREA)
- Electroluminescent Light Sources (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020090027351A KR101097737B1 (ko) | 2009-03-31 | 2009-03-31 | 박막 증착 장치와 박막 증착 방법 및 박막 증착 시스템 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201104008A TW201104008A (en) | 2011-02-01 |
TWI427178B true TWI427178B (zh) | 2014-02-21 |
Family
ID=42828832
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW099107789A TWI427178B (zh) | 2009-03-31 | 2010-03-17 | 用於沉積薄膜之裝置、方法及系統 |
Country Status (5)
Country | Link |
---|---|
JP (1) | JP5364200B2 (ja) |
KR (1) | KR101097737B1 (ja) |
CN (1) | CN102369306B (ja) |
TW (1) | TWI427178B (ja) |
WO (1) | WO2010114274A2 (ja) |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20100279021A1 (en) * | 2009-05-04 | 2010-11-04 | Samsung Mobile Display Co., Ltd. | Apparatus for depositing organic material and depositing method thereof |
KR101151234B1 (ko) * | 2010-03-30 | 2012-06-14 | 주식회사 케이씨텍 | 직립방식 증착장치 및 기판 이송 방법 |
JP2013167001A (ja) * | 2012-02-16 | 2013-08-29 | Hitachi High-Technologies Corp | 真空蒸着システム及び真空蒸着方法 |
KR102106414B1 (ko) * | 2013-04-26 | 2020-05-06 | 삼성디스플레이 주식회사 | 증착 챔버, 이를 포함하는 증착 시스템 및 유기 발광 표시장치 제조방법 |
KR20150053161A (ko) * | 2013-11-07 | 2015-05-15 | 삼성디스플레이 주식회사 | 증착 장치, 이를 이용한 유기발광 디스플레이 장치 제조 방법 |
WO2015086049A1 (en) * | 2013-12-10 | 2015-06-18 | Applied Materials, Inc. | Evaporation source for organic material, apparatus having an evaporation source for organic material, system having an evaporation deposition apparatus with an evaporation source for organic materials, and method for operating an evaporation source for organic material |
KR102229761B1 (ko) | 2014-03-17 | 2021-03-23 | 삼성디스플레이 주식회사 | 원자층 증착 장치 |
CN107002223B (zh) * | 2014-12-05 | 2019-11-05 | 应用材料公司 | 材料沉积系统和用于在材料沉积系统中沉积材料的方法 |
DE102016110884A1 (de) | 2016-06-14 | 2017-12-14 | Aixtron Se | Vorrichtung und Verfahren zum Abscheiden organischer Schichten auf ein oder mehreren Substraten |
CN106435482A (zh) * | 2016-10-27 | 2017-02-22 | 安徽恒致铜铟镓硒技术有限公司 | 独立箱式蒸发源装置 |
CN108701775A (zh) * | 2017-02-03 | 2018-10-23 | 应用材料公司 | 用于具有并排的基板的连续蒸发的设备和方法 |
EP3394881A1 (en) * | 2017-03-17 | 2018-10-31 | Applied Materials, Inc. | Methods of handling a mask device in a vacuum system, mask handling apparatus, and vacuum system |
CN110998869B (zh) * | 2017-08-09 | 2022-12-27 | 株式会社钟化 | 光电转换元件的制造方法 |
CN109423610B (zh) * | 2017-08-24 | 2020-12-04 | 京东方科技集团股份有限公司 | 一种蒸镀装置及蒸镀方法 |
KR101921648B1 (ko) * | 2017-12-28 | 2018-11-26 | 주식회사 올레드온 | 수직형 면증발원을 이용한 고해상도 amoled 소자의 클러스터형 양산장비 |
KR102355814B1 (ko) * | 2020-03-20 | 2022-01-26 | 주식회사 선익시스템 | 증착 장치 및 이를 이용한 유기물 증착 방법 |
KR102430349B1 (ko) * | 2020-04-14 | 2022-08-08 | 주식회사 선익시스템 | 클러스터 증착 시스템 |
KR102413664B1 (ko) * | 2020-04-20 | 2022-06-28 | 주식회사 선익시스템 | 클러스터 증착 시스템 |
KR102407505B1 (ko) * | 2020-04-29 | 2022-06-13 | 주식회사 선익시스템 | 증착 장치 및 인라인 증착 시스템 |
CN111663104A (zh) * | 2020-06-24 | 2020-09-15 | 武汉华星光电半导体显示技术有限公司 | 蒸镀系统及蒸镀方法 |
CN114875363A (zh) * | 2022-03-24 | 2022-08-09 | 广州华星光电半导体显示技术有限公司 | 蒸镀装置及显示面板的制作方法 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007239071A (ja) * | 2006-03-10 | 2007-09-20 | Fujifilm Corp | 真空蒸着装置 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0299959U (ja) * | 1989-01-24 | 1990-08-09 | ||
JPH051378A (ja) * | 1991-03-25 | 1993-01-08 | Shin Meiwa Ind Co Ltd | インライン成膜装置における基板ホルダの搬送装置 |
JP3232646B2 (ja) * | 1992-05-07 | 2001-11-26 | 日本板硝子株式会社 | 液晶表示素子用透明電導ガラスの製造方法 |
JPH0941142A (ja) * | 1995-07-26 | 1997-02-10 | Balzers & Leybold Deutsche Holding Ag | 真空中で被覆したい基板を交互に位置決めする装置 |
JP3909888B2 (ja) * | 1996-04-17 | 2007-04-25 | キヤノンアネルバ株式会社 | トレイ搬送式インライン成膜装置 |
JP4034860B2 (ja) * | 1997-10-31 | 2008-01-16 | キヤノンアネルバ株式会社 | トレイ搬送式成膜装置及び補助チャンバー |
JP4843873B2 (ja) * | 2001-07-05 | 2011-12-21 | ソニー株式会社 | 斜め蒸着装置および斜め蒸着方法 |
KR100430104B1 (ko) * | 2001-09-18 | 2004-05-03 | 디지웨이브 테크놀러지스 주식회사 | 선형 증착과 간접 가열을 이용한 진공증착장치 및 그증착방법 |
JP3822481B2 (ja) * | 2001-10-26 | 2006-09-20 | 株式会社アルバック | スパッタリング方法 |
JP2004146369A (ja) * | 2002-09-20 | 2004-05-20 | Semiconductor Energy Lab Co Ltd | 製造装置および発光装置の作製方法 |
JP4251857B2 (ja) * | 2002-11-27 | 2009-04-08 | 株式会社アルバック | 真空成膜装置及び真空成膜方法 |
KR20040088238A (ko) * | 2003-04-09 | 2004-10-16 | (주)네스디스플레이 | 진공증착 시스템과 방법 |
EP1775353B1 (de) * | 2005-09-15 | 2008-10-08 | Applied Materials GmbH & Co. KG | Beschichtungsanlage und Verfahren zum Betrieb einer Beschichtungsanlage |
JP2008019477A (ja) * | 2006-07-13 | 2008-01-31 | Canon Inc | 真空蒸着装置 |
-
2009
- 2009-03-31 KR KR1020090027351A patent/KR101097737B1/ko active IP Right Grant
-
2010
- 2010-03-17 TW TW099107789A patent/TWI427178B/zh not_active IP Right Cessation
- 2010-03-30 WO PCT/KR2010/001919 patent/WO2010114274A2/en active Application Filing
- 2010-03-30 JP JP2012503318A patent/JP5364200B2/ja not_active Expired - Fee Related
- 2010-03-30 CN CN201080015804.9A patent/CN102369306B/zh not_active Expired - Fee Related
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007239071A (ja) * | 2006-03-10 | 2007-09-20 | Fujifilm Corp | 真空蒸着装置 |
Also Published As
Publication number | Publication date |
---|---|
CN102369306B (zh) | 2014-01-22 |
WO2010114274A2 (en) | 2010-10-07 |
JP5364200B2 (ja) | 2013-12-11 |
CN102369306A (zh) | 2012-03-07 |
KR101097737B1 (ko) | 2011-12-22 |
JP2012522137A (ja) | 2012-09-20 |
WO2010114274A3 (en) | 2010-12-23 |
KR20100108994A (ko) | 2010-10-08 |
TW201104008A (en) | 2011-02-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |