JP5252007B2 - 電子部品の製造方法 - Google Patents
電子部品の製造方法 Download PDFInfo
- Publication number
- JP5252007B2 JP5252007B2 JP2011050176A JP2011050176A JP5252007B2 JP 5252007 B2 JP5252007 B2 JP 5252007B2 JP 2011050176 A JP2011050176 A JP 2011050176A JP 2011050176 A JP2011050176 A JP 2011050176A JP 5252007 B2 JP5252007 B2 JP 5252007B2
- Authority
- JP
- Japan
- Prior art keywords
- resin
- electric element
- manufacturing
- wafer
- electronic component
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistors
- H05K3/303—Assembling printed circuits with electric components, e.g. with resistors with surface mounted components
- H05K3/305—Affixing by adhesive
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H3/00—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
- H03H3/007—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
- H03H3/08—Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of resonators or networks using surface acoustic waves
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders or supports
- H03H9/10—Mounting in enclosures
- H03H9/1064—Mounting in enclosures for surface acoustic wave [SAW] devices
- H03H9/1071—Mounting in enclosures for surface acoustic wave [SAW] devices the enclosure being defined by a frame built on a substrate and a cap, the frame having no mechanical contact with the SAW device
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/05—Holders or supports
- H03H9/10—Mounting in enclosures
- H03H9/1064—Mounting in enclosures for surface acoustic wave [SAW] devices
- H03H9/1085—Mounting in enclosures for surface acoustic wave [SAW] devices the enclosure being defined by a non-uniform sealing mass covering the non-active sides of the SAW device
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/4913—Assembling to base an electrical component, e.g., capacitor, etc.
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
- Wire Bonding (AREA)
- Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
Description
(実施の形態1)
図1は、実施の形態1に係る電子部品の製造方法の各工程を示す図である。図1を用いて各工程について説明する。
(実施の形態2)
図2は、実施の形態2に係る電子部品の製造方法の各工程を示す図である。図2を用いて各工程について説明する。
Claims (3)
- 複数の電気素子が形成されている第1の基体を準備する工程と、
第1の基体上に樹脂層を形成する工程と、
表面に複数の突起部を有する第2の基体を準備する工程と、
前記複数の突起部を前記樹脂層に押圧することにより、前記複数の突起部の側面の一部を前記樹脂層に接合する工程と、
前記第2の基体の裏面に研磨処理を施して、前記複数の突起部を個片化して複数の基板を形成する工程と、
前記第1の基体を分割することにより、前記複数の電気素子を個片化する工程とを備えた、電子部品の製造方法。 - 前記樹脂層を形成した後に、前記樹脂層に複数の凹部を設ける工程をさらに備えた、請求項1に記載の電子部品の製造方法。
- 前記樹脂層は感光性樹脂である、請求項2に記載の電子部品の製造方法。
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011050176A JP5252007B2 (ja) | 2011-03-08 | 2011-03-08 | 電子部品の製造方法 |
| US13/405,380 US9426897B2 (en) | 2011-03-08 | 2012-02-27 | Electronic component and method for manufacturing electronic component |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2011050176A JP5252007B2 (ja) | 2011-03-08 | 2011-03-08 | 電子部品の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2012186761A JP2012186761A (ja) | 2012-09-27 |
| JP5252007B2 true JP5252007B2 (ja) | 2013-07-31 |
Family
ID=46795406
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011050176A Expired - Fee Related JP5252007B2 (ja) | 2011-03-08 | 2011-03-08 | 電子部品の製造方法 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US9426897B2 (ja) |
| JP (1) | JP5252007B2 (ja) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014150128A (ja) * | 2013-01-31 | 2014-08-21 | Denso Corp | 電子装置 |
| JP6472945B2 (ja) | 2013-06-13 | 2019-02-20 | 太陽誘電株式会社 | 弾性波デバイス |
| CN108011608B (zh) * | 2017-12-13 | 2021-11-16 | 中国电子科技集团公司第二十六研究所 | 一种应用于声表面波滤波器的晶圆级封装结构及封装工艺 |
| JP2024101151A (ja) | 2023-01-17 | 2024-07-29 | 株式会社日立ハイテク | 圧力センサモジュール、圧力センサモジュールの製造方法 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH10163800A (ja) | 1996-11-25 | 1998-06-19 | Sanyo Electric Co Ltd | 弾性表面波装置及びその製造方法 |
| JPH1140522A (ja) * | 1997-07-17 | 1999-02-12 | Rohm Co Ltd | 半導体ウエハの製造方法、この方法により作製された半導体ウエハ、半導体チップの製造方法、およびこの方法により製造された半導体チップ、ならびにこの半導体チップを備えたicカード |
| TW434646B (en) * | 1997-11-21 | 2001-05-16 | Rohm Co Ltd | Semiconductor device and method for making the same |
| JP3819574B2 (ja) * | 1997-12-25 | 2006-09-13 | 三洋電機株式会社 | 半導体装置の製造方法 |
| JP3339838B2 (ja) * | 1999-06-07 | 2002-10-28 | ローム株式会社 | 半導体装置およびその製造方法 |
| JP2001127088A (ja) * | 1999-10-27 | 2001-05-11 | Mitsubishi Electric Corp | 半導体装置 |
| JP3827497B2 (ja) * | 1999-11-29 | 2006-09-27 | 株式会社ルネサステクノロジ | 半導体装置の製造方法 |
| JP3537400B2 (ja) | 2000-03-17 | 2004-06-14 | 松下電器産業株式会社 | 半導体内蔵モジュール及びその製造方法 |
| JP2001313350A (ja) * | 2000-04-28 | 2001-11-09 | Sony Corp | チップ状電子部品及びその製造方法、並びにその製造に用いる疑似ウエーハ及びその製造方法 |
| JP3683179B2 (ja) * | 2000-12-26 | 2005-08-17 | 松下電器産業株式会社 | 半導体装置及びその製造方法 |
| JP3981817B2 (ja) * | 2001-08-08 | 2007-09-26 | セイコーエプソン株式会社 | 半導体装置の製造方法 |
| JP3649169B2 (ja) * | 2001-08-08 | 2005-05-18 | 松下電器産業株式会社 | 半導体装置 |
| JP2003077946A (ja) * | 2001-08-31 | 2003-03-14 | Hitachi Ltd | 半導体装置の製造方法 |
| DE10164494B9 (de) * | 2001-12-28 | 2014-08-21 | Epcos Ag | Verkapseltes Bauelement mit geringer Bauhöhe sowie Verfahren zur Herstellung |
| JP4256115B2 (ja) * | 2002-05-28 | 2009-04-22 | 富士通マイクロエレクトロニクス株式会社 | マーク認識方法及び半導体装置の製造方法 |
| JP4178860B2 (ja) | 2002-07-17 | 2008-11-12 | 株式会社村田製作所 | 電子部品及び弾性表面波装置 |
| US7034387B2 (en) * | 2003-04-04 | 2006-04-25 | Chippac, Inc. | Semiconductor multipackage module including processor and memory package assemblies |
| US7057269B2 (en) * | 2002-10-08 | 2006-06-06 | Chippac, Inc. | Semiconductor multi-package module having inverted land grid array (LGA) package stacked over ball grid array (BGA) package |
| DE10310617B4 (de) * | 2003-03-10 | 2006-09-21 | Infineon Technologies Ag | Elektronisches Bauteil mit Hohlraum und ein Verfahren zur Herstellung desselben |
| EP1630605B1 (en) * | 2003-06-02 | 2017-10-11 | Toray Industries, Inc. | Photosensitive resin composition |
| JP2005064362A (ja) * | 2003-08-19 | 2005-03-10 | Nec Electronics Corp | 電子装置の製造方法及びその電子装置並びに半導体装置の製造方法 |
| JP4405246B2 (ja) * | 2003-11-27 | 2010-01-27 | スリーエム イノベイティブ プロパティズ カンパニー | 半導体チップの製造方法 |
| JP4455158B2 (ja) * | 2004-05-20 | 2010-04-21 | 株式会社ルネサステクノロジ | 半導体装置 |
| JP2006100587A (ja) | 2004-09-29 | 2006-04-13 | Fuji Photo Film Co Ltd | 固体撮像装置の製造方法 |
| JP2006211612A (ja) * | 2005-01-31 | 2006-08-10 | Sony Corp | Sawデバイス、通信モジュール及びsawデバイスの製造方法 |
| US7598606B2 (en) * | 2005-02-22 | 2009-10-06 | Stats Chippac Ltd. | Integrated circuit package system with die and package combination |
| US7195952B2 (en) * | 2005-03-22 | 2007-03-27 | Micrel, Inc. | Schottky diode device with aluminum pickup of backside cathode |
| JP2006351591A (ja) * | 2005-06-13 | 2006-12-28 | Sony Corp | マイクロデバイスのパッケージング方法及びマイクロデバイス |
| US7808075B1 (en) * | 2006-02-07 | 2010-10-05 | Marvell International Ltd. | Integrated circuit devices with ESD and I/O protection |
| JP5356791B2 (ja) | 2008-12-11 | 2013-12-04 | 株式会社ディスコ | 積層製品の製造方法 |
| US8039304B2 (en) * | 2009-08-12 | 2011-10-18 | Stats Chippac, Ltd. | Semiconductor device and method of dual-molding die formed on opposite sides of build-up interconnect structures |
| US8169058B2 (en) * | 2009-08-21 | 2012-05-01 | Stats Chippac, Ltd. | Semiconductor device and method of stacking die on leadframe electrically connected by conductive pillars |
| JP5634149B2 (ja) * | 2010-07-16 | 2014-12-03 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
| TWI430426B (zh) * | 2010-10-19 | 2014-03-11 | 國立交通大學 | 使用共用傳導層傳送晶片間多重信號之系統 |
-
2011
- 2011-03-08 JP JP2011050176A patent/JP5252007B2/ja not_active Expired - Fee Related
-
2012
- 2012-02-27 US US13/405,380 patent/US9426897B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US9426897B2 (en) | 2016-08-23 |
| US20120229991A1 (en) | 2012-09-13 |
| JP2012186761A (ja) | 2012-09-27 |
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