JP5144634B2 - 基板レス半導体パッケージ製造用耐熱性粘着シート、及びその粘着シートを用いる基板レス半導体パッケージ製造方法 - Google Patents

基板レス半導体パッケージ製造用耐熱性粘着シート、及びその粘着シートを用いる基板レス半導体パッケージ製造方法 Download PDF

Info

Publication number
JP5144634B2
JP5144634B2 JP2009291523A JP2009291523A JP5144634B2 JP 5144634 B2 JP5144634 B2 JP 5144634B2 JP 2009291523 A JP2009291523 A JP 2009291523A JP 2009291523 A JP2009291523 A JP 2009291523A JP 5144634 B2 JP5144634 B2 JP 5144634B2
Authority
JP
Japan
Prior art keywords
heat
pressure
adhesive sheet
manufacturing
sensitive adhesive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2009291523A
Other languages
English (en)
Japanese (ja)
Other versions
JP2011134811A (ja
Inventor
晋史 星野
幸生 有満
一之 木内
秋桐 村田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nitto Denko Corp
Original Assignee
Nitto Denko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Priority to JP2009291523A priority Critical patent/JP5144634B2/ja
Priority to US12/974,620 priority patent/US8436481B2/en
Priority to CN201010615030.5A priority patent/CN102134453B/zh
Publication of JP2011134811A publication Critical patent/JP2011134811A/ja
Application granted granted Critical
Publication of JP5144634B2 publication Critical patent/JP5144634B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • H01L21/568Temporary substrate used as encapsulation process aid
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • H01L24/23Structure, shape, material or disposition of the high density interconnect connectors after the connecting process
    • H01L24/24Structure, shape, material or disposition of the high density interconnect connectors after the connecting process of an individual high density interconnect connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/93Batch processes
    • H01L24/95Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
    • H01L24/96Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being encapsulated in a common layer, e.g. neo-wafer or pseudo-wafer, said common layer being separable into individual assemblies after connecting
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • H01L2224/23Structure, shape, material or disposition of the high density interconnect connectors after the connecting process
    • H01L2224/24Structure, shape, material or disposition of the high density interconnect connectors after the connecting process of an individual high density interconnect connector
    • H01L2224/241Disposition
    • H01L2224/24135Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/24137Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • H01L23/3114Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed the device being a chip scale package, e.g. CSP
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/538Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
    • H01L23/5389Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates the chips being integrally enclosed by the interconnect and support structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01005Boron [B]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01006Carbon [C]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01013Aluminum [Al]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01019Potassium [K]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01024Chromium [Cr]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01029Copper [Cu]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01032Germanium [Ge]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01033Arsenic [As]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01042Molybdenum [Mo]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01047Silver [Ag]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01051Antimony [Sb]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01075Rhenium [Re]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01078Platinum [Pt]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01079Gold [Au]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01082Lead [Pb]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/28Web or sheet containing structurally defined element or component and having an adhesive outermost layer
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T428/00Stock material or miscellaneous articles
    • Y10T428/28Web or sheet containing structurally defined element or component and having an adhesive outermost layer
    • Y10T428/2852Adhesive compositions
    • Y10T428/287Adhesive compositions including epoxy group or epoxy polymer

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)
  • Adhesive Tapes (AREA)
JP2009291523A 2009-12-22 2009-12-22 基板レス半導体パッケージ製造用耐熱性粘着シート、及びその粘着シートを用いる基板レス半導体パッケージ製造方法 Active JP5144634B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2009291523A JP5144634B2 (ja) 2009-12-22 2009-12-22 基板レス半導体パッケージ製造用耐熱性粘着シート、及びその粘着シートを用いる基板レス半導体パッケージ製造方法
US12/974,620 US8436481B2 (en) 2009-12-22 2010-12-21 Heat-resistant adhesive sheet for substrateless semiconductor package fabrication and method for fabricating substrateless semiconductor package using the adhesive sheet
CN201010615030.5A CN102134453B (zh) 2009-12-22 2010-12-22 无基板半导体封装制造用耐热性粘合片

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009291523A JP5144634B2 (ja) 2009-12-22 2009-12-22 基板レス半導体パッケージ製造用耐熱性粘着シート、及びその粘着シートを用いる基板レス半導体パッケージ製造方法

Publications (2)

Publication Number Publication Date
JP2011134811A JP2011134811A (ja) 2011-07-07
JP5144634B2 true JP5144634B2 (ja) 2013-02-13

Family

ID=44151688

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2009291523A Active JP5144634B2 (ja) 2009-12-22 2009-12-22 基板レス半導体パッケージ製造用耐熱性粘着シート、及びその粘着シートを用いる基板レス半導体パッケージ製造方法

Country Status (3)

Country Link
US (1) US8436481B2 (zh)
JP (1) JP5144634B2 (zh)
CN (1) CN102134453B (zh)

Families Citing this family (51)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4107417B2 (ja) * 2002-10-15 2008-06-25 日東電工株式会社 チップ状ワークの固定方法
US8507322B2 (en) 2010-06-24 2013-08-13 Akihiro Chida Semiconductor substrate and method for manufacturing semiconductor device
JP5541248B2 (ja) * 2011-08-16 2014-07-09 東レ先端素材株式会社 電子部品製造用粘着テープ
KR101285852B1 (ko) 2011-08-23 2013-07-15 도레이첨단소재 주식회사 자석부착층을 갖는 점착테이프를 이용한 전자부품의 봉지 방법
CN103635553B (zh) * 2011-09-22 2016-05-11 琳得科株式会社 难燃粘着片
JP5903920B2 (ja) 2012-02-16 2016-04-13 富士通株式会社 半導体装置の製造方法及び電子装置の製造方法
JP5810957B2 (ja) * 2012-02-17 2015-11-11 富士通株式会社 半導体装置の製造方法及び電子装置の製造方法
JP5810958B2 (ja) 2012-02-17 2015-11-11 富士通株式会社 半導体装置の製造方法及び電子装置の製造方法
US20130240141A1 (en) * 2012-03-13 2013-09-19 Nitto Denko Corporation Heat-resistant pressure-sensitive adhesive tape for production of semiconductor device and method for producing semiconductor device using the tape
CN103305140A (zh) * 2012-03-13 2013-09-18 日东电工株式会社 半导体器件生产用耐热性压敏粘合带和使用其生产半导体器件的方法
JP2013230618A (ja) * 2012-04-27 2013-11-14 Dow Corning Toray Co Ltd 離型フィルム、圧縮成型方法、および圧縮成型装置
JP2014107397A (ja) * 2012-11-27 2014-06-09 Nitto Denko Corp 半導体装置の製造方法
JP6043959B2 (ja) 2013-03-26 2016-12-14 パナソニックIpマネジメント株式会社 半導体パッケージの製造方法、半導体チップ支持キャリア及びチップ搭載装置
WO2014199993A1 (ja) * 2013-06-14 2014-12-18 電気化学工業株式会社 半導体検査用の耐熱性粘着シート
EP3040390B1 (en) * 2013-08-29 2019-07-17 Mitsui Chemicals Tohcello, Inc. Adhesive film and method for manufacturing seminconductor device
TWI524998B (zh) * 2013-09-25 2016-03-11 友達光電股份有限公司 基板之黏結及分離的方法
JP6143665B2 (ja) * 2013-12-26 2017-06-07 Towa株式会社 半導体封止方法及び半導体封止装置
US9508703B2 (en) 2014-04-30 2016-11-29 Taiwan Semiconductor Manufacturing Company, Ltd. Stacked dies with wire bonds and method
US9676968B1 (en) * 2014-05-12 2017-06-13 Denka Company Limited Heat-resistant adhesive sheet for semiconductor inspection and semiconductor inspection method
US9673096B2 (en) * 2014-11-14 2017-06-06 Infineon Technologies Ag Method for processing a semiconductor substrate and a method for processing a semiconductor wafer
JP6536152B2 (ja) * 2015-04-24 2019-07-03 大日本印刷株式会社 樹脂封止部品の製造方法
KR102612643B1 (ko) * 2015-09-01 2023-12-11 린텍 가부시키가이샤 점착 시트
JP6713471B2 (ja) * 2015-09-01 2020-06-24 リンテック株式会社 粘着シート
JP6787900B2 (ja) * 2015-09-01 2020-11-18 リンテック株式会社 粘着シート
WO2017038919A1 (ja) * 2015-09-01 2017-03-09 リンテック株式会社 粘着シート
JP6785558B2 (ja) * 2016-01-28 2020-11-18 三井化学東セロ株式会社 外観性能に優れたプロセス用離型フィルム、その用途、及びそれを用いた樹脂封止半導体の製造方法
JP6818406B2 (ja) * 2015-12-03 2021-01-20 三井化学東セロ株式会社 プロセス用離型フィルム、その用途、及びそれを用いた樹脂封止半導体の製造方法
JP7461281B2 (ja) * 2015-12-03 2024-04-03 三井化学東セロ株式会社 プロセス用離型フィルム、その用途、及びそれを用いた樹脂封止半導体の製造方法
JP2017105560A (ja) * 2015-12-07 2017-06-15 フジコピアン株式会社 テープカッター
CN106128965A (zh) * 2016-07-27 2016-11-16 桂林电子科技大学 一种无基板封装器件的制作方法
KR102326621B1 (ko) * 2016-09-20 2021-11-15 린텍 가부시키가이샤 반도체 가공용 점착 시트
KR102542796B1 (ko) 2017-01-20 2023-06-14 미쓰이 가가쿠 토세로 가부시키가이샤 점착성 필름 및 전자 장치의 제조 방법
CN110337711B (zh) * 2017-02-28 2022-11-04 琳得科株式会社 粘合片
JP6761115B2 (ja) * 2017-03-31 2020-09-23 リンテック株式会社 半導体装置の製造方法及び両面粘着シート
KR102436947B1 (ko) 2018-03-28 2022-08-25 미쓰이 가가쿠 토세로 가부시키가이샤 점착성 필름 및 전자 장치의 제조 방법
WO2019188542A1 (ja) 2018-03-28 2019-10-03 三井化学東セロ株式会社 粘着性フィルムおよび電子装置の製造方法
KR102542225B1 (ko) 2018-03-30 2023-06-12 미쓰이 가가쿠 토세로 가부시키가이샤 전자 장치의 제조 방법
JP7156755B2 (ja) * 2018-04-18 2022-10-19 信越ポリマー株式会社 粘着性基板及び該粘着性基板から対象物を分離する方法
JP2021130197A (ja) * 2018-05-22 2021-09-09 デンカ株式会社 半導体封止プロセス用離型フィルム及びそれを用いた電子部品の製造方法
WO2020012567A1 (ja) * 2018-07-10 2020-01-16 株式会社Fuji モールド体及びパッケージの製造方法、並びにモールド体製造装置
EP3852134A4 (en) 2018-09-11 2022-06-15 Mitsui Chemicals Tohcello, Inc. ADHESIVE FILM AND METHOD OF MAKING AN ELECTRONIC DEVICE
JPWO2020071159A1 (ja) 2018-10-05 2021-09-24 三井化学東セロ株式会社 粘着性フィルムおよび電子装置の製造方法
WO2020096011A1 (ja) * 2018-11-09 2020-05-14 日立化成株式会社 半導体装置製造用仮保護フィルム、リール体、及び、半導体装置を製造する方法
JP6752403B1 (ja) * 2019-03-14 2020-09-09 三井化学東セロ株式会社 電子装置の製造方法
EP3940765A4 (en) 2019-03-14 2022-12-14 Mitsui Chemicals Tohcello, Inc. ELECTRONIC DEVICE PRODUCTION METHOD
SG11202109903XA (en) 2019-03-14 2021-10-28 Mitsui Chemicals Tohcello Inc Method for manufacturing electronic device
EP3960445A4 (en) 2019-04-26 2023-01-04 Mitsui Chemicals Tohcello, Inc. ADHESIVE FILM AND METHOD OF MAKING AN ELECTRONIC DEVICE
JP7269336B2 (ja) * 2019-06-03 2023-05-08 三井化学東セロ株式会社 電子装置の製造方法
CN112210313B (zh) * 2019-07-10 2023-10-27 日东电工(上海松江)有限公司 半导体器件生产用耐热性压敏粘合片
JP7569882B2 (ja) 2020-11-27 2024-10-18 アールエム東セロ株式会社 プロセス用離型フィルム、その用途、及びそれを用いた樹脂封止半導体の製造方法
CN113436979B (zh) * 2021-06-15 2024-02-27 矽磐微电子(重庆)有限公司 半导体封装方法

Family Cites Families (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5320789A (en) * 1991-11-06 1994-06-14 Japan Atomic Energy Research Institute Surface modification of fluorine resin with laser light
US7214424B2 (en) * 1999-03-01 2007-05-08 Nitto Denko Corporation Heat-peelable pressure-sensitive adhesive sheet
JP2000248240A (ja) * 1999-03-01 2000-09-12 Nitto Denko Corp 加熱剥離型粘着シート
JP3575480B2 (ja) * 1999-11-10 2004-10-13 日立化成工業株式会社 半導体用接着フィルム
US6887580B2 (en) * 2000-02-01 2005-05-03 Nippon Steel Chemical Co., Ltd. Adhesive polyimide resin and adhesive laminate
JP4403631B2 (ja) 2000-04-24 2010-01-27 ソニー株式会社 チップ状電子部品の製造方法、並びにその製造に用いる擬似ウエーハの製造方法
JP2001313350A (ja) 2000-04-28 2001-11-09 Sony Corp チップ状電子部品及びその製造方法、並びにその製造に用いる疑似ウエーハ及びその製造方法
JP4651799B2 (ja) * 2000-10-18 2011-03-16 日東電工株式会社 エネルギー線硬化型熱剥離性粘着シート、及びこれを用いた切断片の製造方法
JP4703833B2 (ja) * 2000-10-18 2011-06-15 日東電工株式会社 エネルギー線硬化型熱剥離性粘着シート、及びこれを用いた切断片の製造方法
JP2004179306A (ja) * 2002-11-26 2004-06-24 Lintec Corp 樹脂封止工程用粘着テープ
JP4397653B2 (ja) 2003-08-26 2010-01-13 日東電工株式会社 半導体装置製造用接着シート
JP2005179496A (ja) * 2003-12-19 2005-07-07 Nitto Denko Corp 加熱剥離型粘着シート
JP4781633B2 (ja) * 2004-03-29 2011-09-28 リンテック株式会社 粘着シート
WO2006009029A1 (ja) * 2004-07-15 2006-01-26 Dai Nippon Printing Co., Ltd. 半導体装置及び半導体装置製造用基板並びに半導体装置製造用基板の製造方法
JP4776188B2 (ja) * 2004-08-03 2011-09-21 古河電気工業株式会社 半導体装置製造方法およびウエハ加工用テープ
JP2006160872A (ja) * 2004-12-07 2006-06-22 Nitto Denko Corp 熱剥離型粘着シート及び電子部品、回路基板
JP2006318999A (ja) * 2005-05-10 2006-11-24 Nitto Denko Corp 半導体装置製造用接着フィルム
JP2007129016A (ja) * 2005-11-02 2007-05-24 Nitto Denko Corp 半導体装置製造用接着シート
US20080063871A1 (en) * 2006-09-11 2008-03-13 Jung Ki S Adhesive film composition for semiconductor assembly, associated dicing die bonding film and semiconductor package
JP2008101183A (ja) * 2006-09-20 2008-05-01 Hitachi Chem Co Ltd 粘接着シート、これを用いて製造される半導体装置及び半導体装置の製造方法
CN101536172B (zh) * 2006-10-30 2012-05-30 住友电木株式会社 液体树脂组合物、具粘合剂层的半导体晶片、具粘合剂层的半导体元件、封装件及其制法
JP5283838B2 (ja) * 2006-11-04 2013-09-04 日東電工株式会社 熱剥離性粘着シート及び被着体回収方法
US7691225B2 (en) * 2007-01-15 2010-04-06 Nitto Denko Corporation Thermal-release double-coated pressure-sensitive adhesive tape or sheet and method of processing adherend
JP4994429B2 (ja) * 2008-08-04 2012-08-08 日東電工株式会社 ダイシング・ダイボンドフィルム
JP4848434B2 (ja) * 2009-01-30 2011-12-28 日東電工株式会社 熱伝導性粘着剤組成物および熱伝導性粘着シート
JP5137937B2 (ja) 2009-12-16 2013-02-06 日東電工株式会社 半導体装置製造用耐熱性粘着シート、該シートに用いる粘着剤、及び該シートを用いた半導体装置の製造方法

Also Published As

Publication number Publication date
US8436481B2 (en) 2013-05-07
JP2011134811A (ja) 2011-07-07
CN102134453A (zh) 2011-07-27
US20110151625A1 (en) 2011-06-23
CN102134453B (zh) 2014-10-08

Similar Documents

Publication Publication Date Title
JP5144634B2 (ja) 基板レス半導体パッケージ製造用耐熱性粘着シート、及びその粘着シートを用いる基板レス半導体パッケージ製造方法
JP5137937B2 (ja) 半導体装置製造用耐熱性粘着シート、該シートに用いる粘着剤、及び該シートを用いた半導体装置の製造方法
JP5718005B2 (ja) 半導体装置製造用耐熱性粘着テープ及びそのテープを用いた半導体装置の製造方法。
JP5473262B2 (ja) 粘接着剤組成物、粘接着シートおよび半導体装置の製造方法
JP4790074B2 (ja) ダイシング・ダイボンドフィルム
KR101370245B1 (ko) 점접착제 조성물, 점접착 시트 및 반도체장치의 제조방법
JP2008247936A (ja) 粘接着剤組成物、粘接着シートおよび半導体装置の製造方法
JP2009135377A (ja) ダイシング・ダイボンドフィルム
US8247503B2 (en) Adhesive composition and adhesive sheet
JP2006303472A (ja) ダイシング・ダイボンドフィルム
JP2008135448A (ja) ダイシング・ダイボンドフィルム
JP2008133330A (ja) 粘接着剤組成物、粘接着シートおよび半導体装置の製造方法
JP2007314603A (ja) 粘接着剤組成物、粘接着シートおよび半導体装置の製造方法
JP5237647B2 (ja) 粘接着剤組成物、粘接着シートおよび半導体装置の製造方法
JP5005325B2 (ja) 粘接着剤組成物、粘接着シートおよび半導体装置の製造方法
JP2012190992A (ja) 半導体装置用フィルムの製造方法
EP2639278A1 (en) Heat-resistant pressure-sensitive adhesive tape for production of semiconductor device and method for producing seminconductor device using the tape
JP5414256B2 (ja) 接着剤組成物、接着シートおよび半導体装置の製造方法
JP5500787B2 (ja) 接着剤組成物、接着シートおよび半導体装置の製造方法
JP5234594B2 (ja) 粘接着剤組成物、粘接着シートおよび半導体装置の製造方法
KR20130103947A (ko) 반도체 장치 제조용 내열성 점착 테이프 및 그 테이프를 사용한 반도체 장치의 제조 방법
JP5877858B2 (ja) 接着剤組成物、接着シートおよび半導体装置の製造方法
JP2009203332A (ja) 粘接着剤組成物、粘接着シートおよび半導体装置の製造方法
KR101093322B1 (ko) 점접착제 조성물, 점접착 시트 및 반도체장치의 제조방법
JP2008247937A (ja) 粘接着剤組成物、粘接着シートおよび半導体装置の製造方法

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20111205

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20120413

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120417

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A821

Effective date: 20120606

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120606

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20120626

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120926

Free format text: JAPANESE INTERMEDIATE CODE: A821

Effective date: 20120926

A911 Transfer to examiner for re-examination before appeal (zenchi)

Free format text: JAPANESE INTERMEDIATE CODE: A911

Effective date: 20121003

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20121023

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20121122

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20151130

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

Ref document number: 5144634

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250