WO2020096011A1 - 半導体装置製造用仮保護フィルム、リール体、及び、半導体装置を製造する方法 - Google Patents
半導体装置製造用仮保護フィルム、リール体、及び、半導体装置を製造する方法 Download PDFInfo
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- WO2020096011A1 WO2020096011A1 PCT/JP2019/043750 JP2019043750W WO2020096011A1 WO 2020096011 A1 WO2020096011 A1 WO 2020096011A1 JP 2019043750 W JP2019043750 W JP 2019043750W WO 2020096011 A1 WO2020096011 A1 WO 2020096011A1
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- WIPO (PCT)
- Prior art keywords
- protective film
- temporary protective
- semiconductor device
- manufacturing
- adhesive layer
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- C—CHEMISTRY; METALLURGY
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- C—CHEMISTRY; METALLURGY
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09J—ADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
- C09J133/00—Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
- C09J133/04—Homopolymers or copolymers of esters
- C09J133/14—Homopolymers or copolymers of esters of esters containing halogen, nitrogen, sulfur or oxygen atoms in addition to the carboxy oxygen
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- C09J133/00—Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
- C09J133/18—Homopolymers or copolymers of nitriles
- C09J133/20—Homopolymers or copolymers of acrylonitrile
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- C09J7/00—Adhesives in the form of films or foils
- C09J7/20—Adhesives in the form of films or foils characterised by their carriers
- C09J7/22—Plastics; Metallised plastics
- C09J7/25—Plastics; Metallised plastics based on macromolecular compounds obtained otherwise than by reactions involving only carbon-to-carbon unsaturated bonds
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- C09J7/00—Adhesives in the form of films or foils
- C09J7/30—Adhesives in the form of films or foils characterised by the adhesive composition
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- C09J7/00—Adhesives in the form of films or foils
- C09J7/30—Adhesives in the form of films or foils characterised by the adhesive composition
- C09J7/35—Heat-activated
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- C09J7/00—Adhesives in the form of films or foils
- C09J7/30—Adhesives in the form of films or foils characterised by the adhesive composition
- C09J7/38—Pressure-sensitive adhesives [PSA]
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
- H01L21/561—Batch processing
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6835—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using temporarily an auxiliary support
- H01L21/6836—Wafer tapes, e.g. grinding or dicing support tapes
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
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- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
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- C09J2203/00—Applications of adhesives in processes or use of adhesives in the form of films or foils
- C09J2203/326—Applications of adhesives in processes or use of adhesives in the form of films or foils for bonding electronic components such as wafers, chips or semiconductors
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- C09J2433/00—Presence of (meth)acrylic polymer
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- C09J2463/00—Presence of epoxy resin
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/93—Batch processes
- H01L2224/95—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips
- H01L2224/97—Batch processes at chip-level, i.e. with connecting carried out on a plurality of singulated devices, i.e. on diced chips the devices being connected to a common substrate, e.g. interposer, said common substrate being separable into individual assemblies after connecting
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
- H01L23/31—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
- H01L23/3107—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
- H01L2924/181—Encapsulation
Definitions
- the present invention relates to a temporary protective film for manufacturing a semiconductor device, a reel body, and a method for manufacturing a semiconductor device.
- a semiconductor package having a structure in which a sealing layer for sealing a semiconductor element is provided only on one surface side of a semiconductor substrate such as a lead frame and an organic substrate, and the back surface of the semiconductor substrate is exposed has been proposed. ..
- the semiconductor package having such a structure temporarily protects the back surface of the semiconductor substrate by, for example, attaching a temporary protection film having an adhesive layer to the back surface of the semiconductor substrate having an opening, and in that state, It is manufactured by a method of sealing the semiconductor element mounted on the front surface side and then peeling off the temporary protective film.
- the temporary protective film it is possible to prevent problems such as encapsulation resin wrapping around the back surface of the semiconductor substrate during encapsulation molding. (For example, patent document 1).
- the temporary protective film used for manufacturing the semiconductor device can be attached to the semiconductor substrate at room temperature and can be easily peeled off from the semiconductor substrate after heating at a high temperature.
- a temporary protective film having a relatively good sticking property at room temperature it is difficult to peel the temporary protective film from the semiconductor substrate after heating at a high temperature of 180 ° C. or higher, or the temporary protective film is peeled off. After that, a part of the adhesive layer may remain on the semiconductor substrate or the sealing layer.
- the present invention is a semiconductor device that can be easily attached to a semiconductor substrate at room temperature and can be easily peeled off after being heated at a high temperature while suppressing the generation of a residue on the semiconductor substrate and the sealing layer.
- a temporary protective film for manufacturing is provided.
- One aspect of the present invention is, in a method of manufacturing a semiconductor device having a semiconductor substrate and a semiconductor element mounted on the semiconductor substrate, a surface of the semiconductor substrate opposite to a surface on which the semiconductor element is mounted.
- the present invention relates to a temporary protection film for manufacturing a semiconductor device for temporarily protecting a film.
- the temporary protective film includes a support film and an adhesive layer provided on one side or both sides of the support film.
- the adhesive layer contains acrylic rubber.
- the temporary protective film is attached to a copper alloy plate having a surface of a copper alloy at 25 ° C so that the adhesive layer contacts the copper alloy plate, and the obtained bonded body is kept at 180 ° C for 60 minutes and 200 When heated at 60 ° C.
- the 90 ° peel strength of the temporary protective film with respect to the copper alloy plate is 5 N / m or more at 25 ° C. before the bonded body is heated, and the bonded body is It is 150 N / m or less at 50 ° C. after being heated.
- Another aspect of the present invention relates to a reel body including a reel having a tubular winding portion and the semiconductor device manufacturing temporary protection film wound around the winding portion.
- Yet another aspect of the present invention is, on one side of the semiconductor substrate, a step of attaching the semiconductor device manufacturing temporary protective film in a direction in which the adhesive layer is in contact with the semiconductor substrate, and the semiconductor substrate A step of mounting a semiconductor element on the surface opposite to the temporary protective film, and forming a sealing layer for sealing the semiconductor element, and sealing the semiconductor substrate, the semiconductor element and the sealing layer.
- the present invention relates to a method for manufacturing a semiconductor device, which includes: a step of obtaining a stop-molded body;
- ADVANTAGE OF THE INVENTION while being easy to stick to the board
- a film is provided.
- FIG. 6 is a cross-sectional view showing an embodiment of a method for manufacturing a semiconductor device.
- FIG. 6 is a cross-sectional view showing an embodiment of a method for manufacturing a semiconductor device.
- FIG. 1 is a cross-sectional view showing a temporary protective film according to one embodiment.
- the temporary protective film 10 shown in FIG. 1 includes a support film 1 and an adhesive layer 2 provided on one surface of the support film 1.
- An adhesive layer may be formed on both sides of the support film 1.
- This temporary protective film is used for temporarily protecting the surface of the semiconductor substrate opposite to the surface on which the semiconductor element is mounted in a method of manufacturing a semiconductor device having a semiconductor element mounted on the semiconductor substrate. Be done.
- a temporary protective film can be attached to the semiconductor substrate to temporarily protect the semiconductor substrate during the step of forming a sealing layer that seals the semiconductor element mounted on the semiconductor substrate (for example, a lead frame).
- Adhesive layer 2 contains acrylic rubber.
- Acrylic rubber is generally a copolymer containing (meth) acrylic acid alkyl ester as a main monomer unit.
- the proportion of the monomer unit ((meth) acrylic acid alkyl ester unit) derived from the (meth) acrylic acid alkyl ester in the acrylic rubber may be 50% by mass or more with respect to the entire acrylic rubber.
- the (meth) acrylic acid alkyl ester that constitutes the acrylic rubber is, for example, at least one selected from the group consisting of n-butyl (meth) acrylate, ethyl (meth) acrylate, and methyl (meth) acrylate. May be.
- Examples of monomers other than the (meth) acrylic acid alkyl ester constituting the acrylic rubber include (meth) acrylic acid, 2-hydroxyethyl (meth) acrylate and acrylonitrile.
- the acrylic rubber may be a copolymer containing a (meth) acrylic acid alkyl ester unit, a (meth) acrylic acid unit and / or a 2-hydroxyethyl acrylate unit, and an acrylonitrile unit. It may be a copolymer containing an acid alkyl ester unit, a (meth) acrylic acid unit and / or a 2-hydroxyethyl acrylate unit, an acrylonitrile unit, and a glycidyl (meth) acrylate unit.
- Proportion of the total of (meth) acrylic acid alkyl ester unit having an alkyl group having no substituent, (meth) acrylic acid unit, 2-hydroxyethyl acrylate unit, and acrylonitrile unit, or alkyl having no substituent The ratio of the total of the (meth) acrylic acid alkyl ester unit having a group, the (meth) acrylic acid unit, the 2-hydroxyethyl acrylate unit, the acrylonitrile unit, and the glycidyl (meth) acrylate unit is the mass of the entire acrylic rubber. May be 90% by mass or more, 95% by mass or more, or 97% by mass or more.
- the glass transition temperature (Tg) of the acrylic rubber is ⁇ 70 to 40 ° C., ⁇ 60 ° C. to 30 ° C., or ⁇ 50 ° C. to 20 ° C., from the viewpoint of maintaining the adhesiveness of the adhesive layer at room temperature.
- the glass transition temperature of the acrylic rubber means a value measured by differential scanning calorimetry, differential calorimetry, dynamic viscoelasticity measurement, or thermomechanical analysis.
- the glass transition temperature may be a theoretical value obtained from the type of monomer units and the copolymerization ratio.
- the weight average molecular weight of acrylic rubber can affect the cohesive strength of the adhesive layer.
- An adhesive layer having a weak cohesive force tends to easily generate a residue on the sealing layer after peeling.
- the weight average molecular weight of the acrylic rubber may be 50,000 or more, 100,000 or more, or 150,000 or more, and may be 900,000 or less.
- the weight average molecular weight of the acrylic rubber here means a value measured by gel permeation chromatography.
- acrylic rubber commercially available products may be used without departing from the spirit of the present invention.
- Commercially available acrylic rubbers include, for example, HTR-280 DR (manufactured by Nagase Chemtex Co., Ltd., weight average molecular weight 800,000 to 900,000), WS-023 EK30 (manufactured by Nagase Chemtex Co., Ltd., weight average molecular weight 450,000 to 500,000). You may use it in combination of 2 or more types of acrylic rubber.
- the content of the acrylic rubber in the adhesive layer 2 may be 50 mass% or more, 60 mass% or more, 70 mass% or more, or 80 mass% or more, and 100 mass% or less, based on the mass of the adhesive layer 2. May be
- the temporary protective film 10 has a predetermined adhesive force to the semiconductor substrate after being attached to the semiconductor substrate at room temperature and after the subsequent heat treatment.
- the adhesive strength of the temporary protective film 10 to the semiconductor substrate can be evaluated by the 90-degree peel strength of the temporary protective film 10 to a copper alloy plate having a copper alloy surface, which is assumed to be a lead frame as an example of the semiconductor substrate.
- the temporary protective film 10 is attached to a copper alloy plate at 25 ° C. so that the adhesive layer 2 is in contact with the copper alloy plate, and the obtained bonded body is 180 ° C. for 60 minutes and 200 ° C. for 60 minutes.
- the 90 degree peel strength of the temporary protective film to the copper alloy plate is 5 N / m or more at 25 ° C.
- the 90 degree peel strength before the bonded body is heated at 180 ° C. for 60 minutes and at 200 ° C. for 60 minutes in this order may be referred to as “adhesive strength after bonding at room temperature”.
- the 90-degree peel strength after the bonded body is heated at 180 ° C. for 60 minutes and at 200 ° C. for 60 minutes in this order may be referred to as “adhesive strength after heat treatment”.
- a temporary protective film having a size of 40 mm ⁇ 160 mm is pressure-bonded to the copper alloy plate with a load of 20 N in an environment of 25 ° C.
- the copper alloy plate has a size of, for example, 50 mm ⁇ 157 mm.
- the copper alloy forming the copper alloy plate may be, for example, a Cu—Fe—P alloy such as CDA194.
- the copper alloy plate one having an outermost layer of a copper alloy which is not coated with palladium plating or the like is used.
- the peeling speed is 50 mm / min.
- the adhesive strength after being applied at room temperature is measured in an environment of 25 ° C.
- the adhesive strength after the heat treatment is measured in an environment of 50 ° C.
- the adhesive strength of the temporary protective film after being attached at room temperature may be 10 N / m or more, 20 N / m or more or 30 N / m or more at 25 ° C., 200 N / m or less, or 150 N / m or less. ..
- the adhesive strength after heat treatment of the temporary protective film may be 100 N / m or less at 90C, 90 N / m or less, or 10 N / m or more.
- the adhesive layer 2 may further contain a release property imparting agent.
- the peelability-imparting agent is a component that reduces the adhesive force of the adhesive layer after heating to the semiconductor substrate or the sealing layer as compared with the case where the adhesive layer does not contain the peelability-imparting agent.
- the interaction with the semiconductor substrate is weakened due to the influence of the functional group existing on the surface, or the surface free energy is changed to lower the wettability of the adhesive layer. A change in the condition of the outermost surface occurs.
- the peelability-imparting agent can include, for example, an aliphatic compound having a linear, branched, or alicyclic hydrocarbon group.
- the aliphatic compound may have at least one functional group selected from an epoxy group, a hydroxyl group and an amino group.
- the aliphatic compound may have at least one functional group selected from an amino group, a carboxy group, an isocyanate group, and a ureido group.
- the release property-imparting agent may contain an aliphatic epoxy compound having an aliphatic group and a glycidyl ether group bonded to the aliphatic group.
- the aliphatic epoxy compound may have two or more epoxy groups and may further have a hydroxyl group.
- the aliphatic epoxy compound may have a hydrocarbon group having 2 to 10 carbon atoms.
- the aliphatic epoxy compound that can be used as the release property-imparting agent include at least one aliphatic compound (or fat selected from the group consisting of sorbitol polyglycidyl ether, ethylene glycol diglycidyl ether, and glycerol polyglycidyl ether). Group epoxy resin) may be included. These aliphatic compounds may be used alone or in combination of two or more.
- the peelability-imparting agent may be a compound having an alkoxysilyl group.
- the compound having an alkoxysilyl group is represented by, for example, the following formula (1).
- X represents a phenyl group, a glycidoxy group, an acryloyloxy group, a methacryloyloxy group, a mercapto group, an amino group, a vinyl group, or an isocyanate group
- s represents an integer of 0 to 10
- R 11 , R 12 and R 13 each independently represent an alkyl group having 1 to 10 carbon atoms.
- Examples of the alkyl group having 1 to 10 carbon atoms represented by R 11 , R 12 or R 13 include methyl group, ethyl group, propyl group, butyl group, pentyl group, hexyl group, heptyl group, octyl group and nonyl group. , A decyl group, an isopropyl group, and an isobutyl group.
- R 11 , R 12 and R 13 may each independently be a methyl group, an ethyl group or a pentyl group.
- X may be an amino group, a glycidoxy group, a mercapto group or an isocyanate group, or a glycidoxy group or a mercapto group.
- the total content of the peelability imparting agent is 0.1 parts by mass or more and less than 50 parts by mass, 40 parts by mass or less, 35 parts by mass or less, or 30 parts by mass or less with respect to 100 parts by mass of the acrylic rubber.
- it may be 1 part by mass or more and less than 50 parts by mass, 40 parts by mass or less, 35 parts by mass or less, or 30 parts by mass or less, and 3 parts by mass or more and less than 50 parts by mass, 40 parts by mass or less, 35 parts by mass.
- the content of the acrylic rubber and the release property imparting agent may be 80 to 100% by mass, 90 to 100% by mass or 95 to 100% by mass based on the mass of the adhesive layer.
- the adhesive layer 2 may further include other components.
- other components include antioxidants, ultraviolet absorbers, fillers (for example, inorganic fillers, conductive particles or pigments), lubricants such as wax, tackifiers, plasticizers, curing accelerators, and fluorescent dyes. Can be mentioned.
- the thickness of the adhesive layer 2 may be, for example, 1 to 100 ⁇ m. When the adhesive layer 2 is thick, the residue of the adhesive layer after peeling tends to be further suppressed. Therefore, the thickness of the adhesive layer 2 may be 2 ⁇ m or more, 5 ⁇ m or more, 6 ⁇ m or more, or 8 ⁇ m or more. The thickness of the adhesive layer 2 may be 80 ⁇ m or less, or 60 ⁇ m or less from the viewpoint of suppressing problems in wire bonding. If the thickness of the adhesive layer 2 is less than 2 ⁇ m, the adhesive force may be insufficient, and a problem may occur that the adhesive layer 2 is peeled off from the adherend during the process.
- the thickness of the adhesive layer 2 may be 2 ⁇ m or more and 80 ⁇ m or less, or 60 ⁇ m or less, 5 ⁇ m or more and 80 ⁇ m or less, or 60 ⁇ m or less, and 6 ⁇ m or more and 80 ⁇ m or less, or 60 ⁇ m or less. It may be 8 ⁇ m or more and 80 ⁇ m or less, or 60 ⁇ m or less.
- the support film 1 includes, for example, aromatic polyimide, aromatic polyamide, aromatic polyamideimide, aromatic polysulfone, aromatic polyether sulfone, polyphenylene sulfide, aromatic polyether ketone, polyarylate, aromatic polyether ether ketone, or It may be a polyethylene naphthalate film.
- the linear thermal expansion coefficient of the support film 1 at 20 to 200 ° C. may be 3.0 ⁇ 10 ⁇ 5 / ° C. or less.
- the heat shrinkage percentage of the support film 1 when heated at 200 ° C. for 2 hours may be 0.15% or less.
- aromatic polyimide films often have these properties.
- the support film 1 may be subjected to surface treatment such as plasma treatment, corona treatment, and primer treatment.
- the thickness of the support film 1 may be 200 ⁇ m or less, 100 ⁇ m or less, or 50 ⁇ m or less, or 10 ⁇ m or more, from the viewpoint of suppressing warpage of the semiconductor substrate after attaching the temporary protection film to the semiconductor substrate. Good.
- the temporary protective film may further include a cover film that covers the surface of the adhesive layer 2 opposite to the support film 1.
- the cover film may be, for example, a polyethylene terephthalate film (PET).
- PET polyethylene terephthalate film
- the cover film may have a peelable layer.
- the thickness of the cover film may be 10-100 ⁇ m, or 20-100 ⁇ m.
- the temporary protective film 10 may be obtained by applying a varnish containing acrylic rubber, a solvent such as cyclohexanone or methyl ethyl ketone, and optionally other components such as a peelability imparting agent to the support film 1 and heating the varnish. It can be obtained by a method including removing the solvent from the coating film and forming the adhesive layer 2 on the support film 1.
- the method of applying the varnish to the support film is not particularly limited, and examples thereof include a method using roll coating, reverse roll coating, gravure coating, bar coating, comma coating, die coating, and reduced pressure die coating.
- the semiconductor device may be manufactured by winding a long temporary protective film on a reel and unwinding the temporary protective film from the obtained reel body.
- the reel body in this case has a reel having a tubular winding portion, and the temporary protective film according to the above-described embodiment wound around the winding portion.
- a lead frame as an example of a semiconductor substrate and a semiconductor element mounted thereon, and a sealing layer for sealing the semiconductor element on the semiconductor element side of the lead frame. It is possible to manufacture a semiconductor device which has a lead frame whose back surface is exposed for external connection.
- a semiconductor device having such a configuration is sometimes called a Non Lead Type Package. Specific examples thereof include QFN (Quad Flat Non-leaded Package) and SON (Small Outline Non-leaded Package).
- FIGS. 2 and 3 are cross-sectional views showing the method for manufacturing the semiconductor device according to the embodiment.
- the method according to the embodiment of FIGS. 2 and 3 includes a temporary protective film 10 on one surface (back surface) of a lead frame 11 having a plurality of die pads 11a and inner leads 11b in a direction in which the adhesive layer 2 contacts the lead frame 11.
- the step of peeling off 10 and the sealing molded body 20 are divided into a plurality of semiconductor devices 100 each having one semiconductor element 14. Including that a step.
- the temporary protective film 10 can be attached to the lead frame 11 at room temperature (for example, 5 to 35 ° C.).
- the attaching method is not particularly limited, but may be, for example, a roll laminating method.
- the material of the lead frame 11 is not particularly limited, but may be, for example, an iron-based alloy such as 42 alloy, copper, or a copper alloy.
- the surface of the lead frame may be coated with palladium, gold, silver or the like.
- the surface of the lead frame may be physically roughened in order to improve the adhesion with the sealing material.
- a chemical treatment such as an epoxy bleed-out (EBO) prevention treatment for preventing the bleed-out of the silver paste may be applied to the lead frame surface.
- EBO epoxy bleed-out
- the semiconductor element 14 is usually adhered to the die pad 11a via an adhesive (for example, silver paste).
- the adhesive may be cured by heat treatment (for example, 140 to 200 ° C., 30 minutes to 2 hours).
- the wire 12 is not particularly limited, but may be, for example, a gold wire, a copper wire, an aluminum- or palladium-coated copper wire.
- the semiconductor element and the inner lead may be bonded to the wire 12 by heating at 200 to 270 ° C. for 3 to 60 minutes and utilizing ultrasonic waves and pressing pressure.
- the lead frame 11 may be subjected to plasma treatment.
- the plasma treatment include a method of injecting a gas such as argon, nitrogen, or oxygen at a predetermined gas flow rate under a reduced pressure condition (for example, 10 Pa or less) and performing plasma irradiation.
- the irradiation output of plasma in the plasma treatment may be 10 to 500 W, for example.
- the plasma treatment time may be, for example, 5 to 50 seconds.
- the gas flow rate in the plasma treatment may be 5 to 50 sccm.
- the encapsulating material is used to form the encapsulating layer 13.
- the encapsulation molded body 20 having the plurality of semiconductor elements 14 and the encapsulating layer 13 encapsulating them collectively is obtained. Since the temporary protective film 10 is provided during the sealing and molding, the sealing material is prevented from wrapping around to the back surface side of the lead frame 11.
- the temperature (sealing temperature) during the formation of the sealing layer 13 may be 140 to 200 ° C, or 160 to 180 ° C.
- the pressure during the formation of the sealing layer (sealing pressure) may be 6 to 15 MPa, or 7 to 10 MPa.
- the heating time (sealing time) in the sealing molding may be 1 to 5 minutes or 2 to 3 minutes.
- the material of the encapsulant is not particularly limited, and examples thereof include epoxy resins such as cresol novolac epoxy resin, phenol novolac epoxy resin, biphenyl diepoxy resin, and naphthol novolac epoxy resin.
- the encapsulant may include additives such as fillers, flame retardant materials (eg brominated compounds), waxes and the like.
- the temporary protective film 10 is peeled off from the lead frame 11 and the sealing layer 13 of the obtained molded encapsulation 20.
- the temporary protective film 10 may be peeled off before or after the sealing layer 13 is cured.
- the temperature at which the temporary protective film 10 is peeled off is not particularly limited, but may be room temperature (for example, 5 to 35 ° C.). This temperature may be above the glass transition temperature of the adhesive layer. In this case, the releasability of the temporary protective film from the lead frame and the sealing layer is further improved. If the Tg of the acrylic rubber in the adhesive layer is, for example, 5 ° C. or lower, or 0 ° C. or lower, good releasability at room temperature can be easily obtained.
- the semiconductor device manufactured using the temporary protective film according to one embodiment is excellent in terms of high density, small area, thinness, and the like. Therefore, the semiconductor device can be used for electronic devices such as mobile phones, smartphones, personal computers, and tablets.
- Acrylic rubber WS-023 EK30 (trade name, manufactured by Nagase Chemtex Co., Ltd., weight average molecular weight: 500,000, glass transition temperature (theoretical value calculated from copolymerization ratio): -10 ° C) HTR-280 DR (trade name, manufactured by Nagase Chemtex Co., Ltd., weight average molecular weight: 900,000, glass transition temperature (theoretical value calculated from copolymerization ratio): -29 ° C)
- Exfoliating agent EX-614B (trade name, manufactured by Nagase Chemtex Co., Ltd., sorbitol polyglycidyl ether, epoxy equivalent: 174)
- EX-810 (trade name, manufactured by Nagase Chemtex Co., Ltd., ethylene glycol diglycidyl ether, epoxy equivalent: 113)
- Temporary Protective Film An aromatic polyimide film (manufactured by Ube Industries, Ltd., trade name: UPILEX25SGADS, film thickness: 25 ⁇ m) was prepared as a support film. Varnish A, B, C, D or E was coated on this support film. The coating film was dried by heating at 90 ° C. for 2 minutes and 180 ° C. for 2 minutes to form an adhesive layer having a thickness of 2, 6, 10 or 60 ⁇ m, and the adhesive layer of Examples 1 to 9 and Comparative Examples 1 and 2 was formed. A temporary protective film was obtained. The combinations of the varnish and the thickness of the adhesive layer in each of the examples and the comparative examples are as shown in Table 2.
- Adhesive strength of adhesive layer (1) Adhesive strength after pasting at room temperature As an adherend, a CDA194 plate (Cu-Fe-P alloy, manufactured by Shinko Electric Industry Co., Ltd.) and a CDA194 palladium-plated plate (PPF, Shinko Electric Co., Ltd.) Industrial Co., Ltd.) was prepared. These lead frames had a size of 50 mm x 157 mm. Each of the temporary protective films cut out in a size of 40 mm ⁇ 160 mm was attached to these lead frames with a hand roller at 25 ° C. and a load of 20 N in a direction in which the adhesive layer was in contact with the lead frames.
- each temporary protective film was peeled off at a speed of 50 mm / min in the direction of 90 degrees with respect to the main surface of the lead frame at 25 ° C.
- the maximum value (N / m) of the load per 10 mm width of the adhesive layer at that time was recorded as the adhesive force (90-degree peel strength) after the bonding at room temperature.
- the temporary protective film was peeled off at a speed of 50 mm / min in a direction of 90 degrees with respect to the main surface of the lead frame at 50 ° C.
- the maximum value (N / m) of the load per 10 mm width of the adhesive layer at that time was recorded as the adhesive force (90-degree peel strength) after the heat treatment.
- Residue of adhesive layer after encapsulation molding CDA194 frame (lead frame, manufactured by Shinko Denki Kogyo Co., Ltd.) was provided with the temporary protective films of Examples and Comparative Examples at a temperature of 25 ° C. in a direction in which the adhesive layer was in contact with the lead frame. It was attached under the condition of 20N.
- the obtained bonded body was heated in an oven under an air atmosphere at 180 ° C. for 60 minutes and then at 200 ° C. for 60 minutes while changing the conditions in this order.
- the surface of the lead frame opposite to the temporary protective film was subjected to plasma treatment under an argon gas atmosphere (flow rate: 20 sccm) for 150 W for 15 seconds.
- a sealing layer on the surface of the lead frame opposite to the temporary protective film with a sealing material (trade name: GE-300, manufactured by Hitachi Chemical Co., Ltd.) did.
- the sealing conditions were 175 ° C., 6.8 MPa, and 2 minutes.
- each temporary protective film was peeled off at a speed of 50 mm / min in the direction of 90 ° with respect to the surface of the lead frame.
- the state of the adhesive layer remaining on the sealing layer after peeling off the temporary protective film was confirmed.
- the ratio of the area occupied by the residue of the adhesive layer to the surface area of the sealing layer was determined.
- the peelability after sealing and molding was evaluated according to the following five-stage criteria. 5: 60-100% 4:40 to less than 60% 3: 20% to less than 40% 2: 10% to less than 20% 1: 0% to less than 10%
- the temporary protective film of each example could be attached to the lead frame at room temperature, and could be easily peeled off from the lead frame after the heat treatment. After the encapsulation molding, the temporary protective film could be peeled from the encapsulation molded body while suppressing the generation of the residue on the lead frame and the encapsulating layer.
- SYMBOLS 1 Support film, 2 ... Adhesive layer, 10 ... Temporary protective film, 11 ... Lead frame, 11a ... Die pad, 11b ... Inner lead, 12 ... Wire, 13 ... Sealing layer, 14 ... Semiconductor element, 20 ... Sealing molding Body, 100 ... Semiconductor device.
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Abstract
Description
図1は、一実施形態に係る仮保護フィルムを示す断面図である。図1に示す仮保護フィルム10は、支持フィルム1と、支持フィルム1の片面上に設けられた接着層2と、から構成される。支持フィルム1の両面上に接着層が形成されていてもよい。この仮保護フィルムは、半導体基板及び半導体基板に搭載された半導体素子を有する半導体装置を製造する方法において、半導体基板の半導体素子が搭載される面とは反対側の面を仮保護するために用いられる。例えば、半導体基板(例えばリードフレーム)に搭載された半導体素子を封止する封止層を形成する工程の間、仮保護フィルムを半導体基板に貼り付けて、半導体基板を仮保護することができる。
一実施形態に係る仮保護フィルムを用いて、例えば、半導体基板の一例としてのリードフレーム及びこれに搭載された半導体素子と、リードフレームの半導体素子側で半導体素子を封止する封止層とを有し、リードフレームの裏面が外部接続用に露出している、半導体装置を製造することができる。このような構成を有する半導体装置は、Non Lead Type Packageといわれることがある。その具体例としては、QFN(QuadFlat Non-leaded Package)、SON(Small Outline Non-leaded Package)が挙げられる。
1-1.塗工用ワニスの作製
表1に示す組成(単位:質量部)を有する樹脂組成物と溶剤としてのシクロヘキサノンとを混合し、混合物を攪拌して、溶剤以外の成分の濃度が12質量%であるワニスA~Eを得た。表に示すアクリルゴム及び剥離性付与剤の詳細は以下のとおりである。
アクリルゴム
・WS-023 EK30(商品名、ナガセケムテックス株式会社製、重量平均分子量:50万、ガラス転移温度(共重合比から計算される理論値):-10℃)
・HTR-280 DR(商品名、ナガセケムテックス株式会社製、重量平均分子量:90万、ガラス転移温度(共重合比から計算される理論値):-29℃)
剥離性付与剤
・EX-614B(商品名、ナガセケムテックス株式会社製、ソルビトールポリグリシジルエーテル、エポキシ当量:174)
・EX-810(商品名、ナガセケムテックス株式会社製、エチレングリコールジグリシジルエーテル、エポキシ当量:113)
支持フィルムとして、芳香族ポリイミドフィルム(宇部興産株式会社製、商品名:UPILEX25SGADS、膜厚:25μm)を準備した。この支持フィルム上に、ワニスA、B、C、D又はEを塗布した。塗膜を90℃で2分間、及び180℃で2分間の加熱によって乾燥し、厚さ2、6、10又は60μmの接着層を形成して、実施例1~9及び比較例1、2の仮保護フィルムを得た。各実施例及び比較例におけるワニスと接着層の厚さとの組み合わせは、表2に示されるとおりである。
2-1.接着層の接着力
(1)常温での貼付け後の接着力
被着体として、CDA194板(Cu-Fe-P系合金、新光電気工業株式会社製)、及びCDA194パラジウムメッキ板(PPF、新光電気工業株式会社製)を準備した。これらリードフレームは、50mm×157mmのサイズを有していた。これらリードフレームに、40mm×160mmのサイズに切り出された各仮保護フィルムを、接着層がリードフレームに接する向きで、ハンドローラーを用いて25℃、荷重20Nの条件で貼り付けた。次いで、フォースゲージを用いて、25℃においてリードフレームの主面に対して90度の方向に50mm/分の速度で各仮保護フィルムを引き剥がした。そのときの接着層の幅10mm当たりの荷重の最大値(N/m)を、常温貼付け後の接着力(90度ピール強度)として記録した。
被着体として、CDA194板(Cu-Fe-P系合金、新光電気工業株式会社製)、及びCDA194パラジウムメッキ板(PPF、新光電気工業株式会社製)を準備した。これらリードフレームは、50mm×157mmのサイズを有していた。これらリードフレームに、40mm×160mmのサイズに切り出された各仮保護フィルムを、接着層がリードフレームに接する向きで、ハンドローラーを用いて25℃、荷重20Nの条件で貼り付けた。得られた貼合体を、空気雰囲気下、オーブン内で、180℃で60分間、次いで200℃で60分間の加熱処理に供した。その後、フォースゲージを用いて、50℃においてリードフレームの主面に対して90度の方向に50mm/分の速度で仮保護フィルムを引き剥がした。そのときの接着層の幅10mm当たりの荷重の最大値(N/m)を、加熱処理後の接着力(90度ピール強度)として記録した。
CDA194フレーム(リードフレーム、新光電気工業株式会社製)に、実施例及び比較例の仮保護フィルムを、接着層がリードフレームに接する向きで、25℃、荷重20Nの条件で貼り付けた。得られた貼合体を、空気雰囲気下、オーブン内で、180℃で60分間、次いで200℃で60分の順で条件を変更しながら加熱した。リードフレームの仮保護フィルムとは反対側の面を、アルゴンガス雰囲気下(流量:20sccm)、150W、15秒の条件でプラズマ処理した。
モールド成形機(アピックヤマダ株式会社製)を用いて、リードフレームの仮保護フィルムとは反対側の面上に封止材(商品名:GE-300、日立化成株式会社製)により封止層を形成した。封止条件は、175℃、6.8MPa、2分間とした。その後、50℃においてリードフレームの面に対して90°の方向に50mm/分の速度で各仮保護フィルムを引き剥がした。仮保護フィルムを引き剥がした後の封止層上に残存した接着層の状態を確認した。封止層の表面の面積に対する、接着層の残留物が占める面積の割合を求めた。接着層の残留物が占める面積の割合に基づいて、封止成形後の剥離性を以下の5段階の基準で評価した。
5:60~100%
4:40~60%未満
3:20%以上40%未満
2:10%以上20%未満
1:0%~10%未満
Claims (11)
- 半導体基板及び該半導体基板に搭載された半導体素子を有する半導体装置を製造する方法において、前記半導体基板の前記半導体素子が搭載される面とは反対側の面を仮保護するための半導体装置製造用仮保護フィルムであって、
当該仮保護フィルムが、支持フィルムと、前記支持フィルムの片面又は両面上に設けられた接着層と、を備え、
前記接着層がアクリルゴムを含有し、
前記仮保護フィルムを、銅合金の表面を有する銅合金板に、前記接着層が前記銅合金板に接するように25℃で貼り付け、それにより得られた貼合体を180℃で60分間及び200℃で60分間の順で加熱したときに、前記仮保護フィルムの前記銅合金板に対する90度ピール強度が、前記貼合体が加熱される前に25℃において5N/m以上で、前記貼合体が加熱された後に50℃において150N/m以下である、半導体装置製造用仮保護フィルム。 - 前記接着層の厚さが2μm以上100μm以下である、請求項1に記載の半導体装置製造用仮保護フィルム。
- 前記アクリルゴムが、(メタ)アクリル酸アルキルエステル単位と、(メタ)アクリル酸単位及び/又はアクリル酸2-ヒドロキシエチル単位と、アクリロニトリル単位とを含む共重合体であり、これら単量体単位の合計の割合が、前記アクリルゴム全体の質量に対して90質量%以上である、請求項1又は2に記載の半導体装置製造用仮保護フィルム。
- 前記アクリルゴムのガラス転移温度が-50~20℃である。請求項1~3のいずれか一項に記載の半導体装置製造用仮保護フィルム。
- 前記アクリルゴムの重量平均分子量が150000~900000である、請求項1~4のいずれか一項に記載の半導体装置製造用仮保護フィルム。
- 前記接着層が、剥離性付与剤を更に含有する、請求項1~5のいずれか一項に記載の半導体装置製造用仮保護フィルム。
- 前記剥離性付与剤の含有量が、前記アクリルゴム100質量部に対して0.1質量部以上50質量部未満である、請求項6に記載の半導体装置製造用仮保護フィルム。
- 前記剥離性付与剤が、脂肪族基及び該脂肪族基に結合したグリシジルエーテル基を有する脂肪族エポキシ化合物を含む、請求項6又は7に記載の半導体装置製造用仮保護フィルム。
- 前記接着層の前記支持フィルムとは反対側の面を覆うカバーフィルムを更に備える、請求項1~8のいずれか一項に記載の半導体装置製造用仮保護フィルム。
- 筒状の巻取部を有するリールと、前記巻取部に巻き取られた請求項1~9のいずれか一項に記載の半導体装置製造用仮保護フィルムと、を備える、リール体。
- 半導体基板の片面に、請求項1~9のいずれか一項に記載の半導体装置製造用仮保護フィルムを、その接着層が前記半導体基板に接する向きで貼り付ける工程と、
前記半導体基板の前記仮保護フィルムとは反対側の面上に半導体素子を搭載する工程と、
前記半導体素子を封止する封止層を形成して、前記半導体基板、前記半導体素子及び前記封止層を有する封止成形体を得る工程と、
前記封止成形体から前記仮保護フィルムを剥離する工程と、
をこの順に備える、半導体装置を製造する方法。
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2019
- 2019-11-07 US US17/288,913 patent/US20210395577A1/en active Pending
- 2019-11-07 WO PCT/JP2019/043750 patent/WO2020096011A1/ja active Application Filing
- 2019-11-07 CN CN201980070533.8A patent/CN112930261A/zh active Pending
- 2019-11-07 JP JP2020555602A patent/JP7151782B2/ja active Active
- 2019-11-07 KR KR1020217016518A patent/KR20210089191A/ko not_active Application Discontinuation
- 2019-11-07 SG SG11202103537PA patent/SG11202103537PA/en unknown
- 2019-11-08 TW TW108140620A patent/TWI820249B/zh active
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2021
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CN112930261A (zh) | 2021-06-08 |
JPWO2020096011A1 (ja) | 2021-10-07 |
US20210395577A1 (en) | 2021-12-23 |
TWI820249B (zh) | 2023-11-01 |
KR20210089191A (ko) | 2021-07-15 |
TW202025315A (zh) | 2020-07-01 |
PH12021551006A1 (en) | 2021-10-04 |
SG11202103537PA (en) | 2021-05-28 |
JP7151782B2 (ja) | 2022-10-12 |
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