JP5142444B2 - Euvリソグラフィミラーにおいて脈理を回避する方法 - Google Patents

Euvリソグラフィミラーにおいて脈理を回避する方法 Download PDF

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Publication number
JP5142444B2
JP5142444B2 JP2002535847A JP2002535847A JP5142444B2 JP 5142444 B2 JP5142444 B2 JP 5142444B2 JP 2002535847 A JP2002535847 A JP 2002535847A JP 2002535847 A JP2002535847 A JP 2002535847A JP 5142444 B2 JP5142444 B2 JP 5142444B2
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JP
Japan
Prior art keywords
mirror
striae
glass
euv
ule
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
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JP2002535847A
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English (en)
Japanese (ja)
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JP2004511414A (ja
JP2004511414A5 (enExample
Inventor
エル ジュニア デイヴィス,クロード
イー ベスト,マイケル
ジェイ エドワーズ,メアリー
ダブリュ ホッブス,トーマス
エル マーレイ,グレゴリー
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Corning Inc
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Corning Inc
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Publication date
Application filed by Corning Inc filed Critical Corning Inc
Publication of JP2004511414A publication Critical patent/JP2004511414A/ja
Publication of JP2004511414A5 publication Critical patent/JP2004511414A5/ja
Application granted granted Critical
Publication of JP5142444B2 publication Critical patent/JP5142444B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B1/00Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B13/00Machines or devices designed for grinding or polishing optical surfaces on lenses or surfaces of similar shape on other work; Accessories therefor
    • B24B13/06Machines or devices designed for grinding or polishing optical surfaces on lenses or surfaces of similar shape on other work; Accessories therefor grinding of lenses, the tool or work being controlled by information-carrying means, e.g. patterns, punched tapes, magnetic tapes
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B19/00Other methods of shaping glass
    • C03B19/14Other methods of shaping glass by gas- or vapour- phase reaction processes
    • C03B19/1453Thermal after-treatment of the shaped article, e.g. dehydrating, consolidating, sintering
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B19/00Other methods of shaping glass
    • C03B19/14Other methods of shaping glass by gas- or vapour- phase reaction processes
    • C03B19/1469Means for changing or stabilising the shape or form of the shaped article or deposit
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B23/00Re-forming shaped glass
    • C03B23/02Re-forming glass sheets
    • C03B23/023Re-forming glass sheets by bending
    • C03B23/025Re-forming glass sheets by bending by gravity
    • C03B23/0252Re-forming glass sheets by bending by gravity by gravity only, e.g. sagging

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Manufacturing & Machinery (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Thermal Sciences (AREA)
  • Optical Elements Other Than Lenses (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Glass Melting And Manufacturing (AREA)
JP2002535847A 2000-10-13 2001-09-18 Euvリソグラフィミラーにおいて脈理を回避する方法 Expired - Lifetime JP5142444B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US24030300P 2000-10-13 2000-10-13
US60/240,303 2000-10-13
PCT/US2001/029100 WO2002032622A1 (en) 2000-10-13 2001-09-18 A method to avoid striae in euv lithography mirrors

Publications (3)

Publication Number Publication Date
JP2004511414A JP2004511414A (ja) 2004-04-15
JP2004511414A5 JP2004511414A5 (enExample) 2008-07-24
JP5142444B2 true JP5142444B2 (ja) 2013-02-13

Family

ID=22906005

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002535847A Expired - Lifetime JP5142444B2 (ja) 2000-10-13 2001-09-18 Euvリソグラフィミラーにおいて脈理を回避する方法

Country Status (4)

Country Link
US (1) US6776006B2 (enExample)
EP (1) EP1324857A4 (enExample)
JP (1) JP5142444B2 (enExample)
WO (1) WO2002032622A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3264827B2 (ja) 1995-07-26 2002-03-11 株式会社エヌ・ティ・ティ・データ Lanテスタ

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10127086A1 (de) * 2001-06-02 2002-12-05 Zeiss Carl Vorrichtung zur Reflexion von elektromagnetischen Wellen
JP4158009B2 (ja) * 2001-12-11 2008-10-01 信越化学工業株式会社 合成石英ガラスインゴット及び合成石英ガラスの製造方法
US6829908B2 (en) 2002-02-27 2004-12-14 Corning Incorporated Fabrication of inclusion free homogeneous glasses
US6832493B2 (en) 2002-02-27 2004-12-21 Corning Incorporated High purity glass bodies formed by zero shrinkage casting
US7053017B2 (en) * 2002-03-05 2006-05-30 Corning Incorporated Reduced striae extreme ultraviolet elements
US20040025542A1 (en) * 2002-06-07 2004-02-12 Ball Laura J. Method of making extreme ultraviolet lithography glass substrates
JP2004131373A (ja) * 2002-09-09 2004-04-30 Corning Inc シリカ・チタニア極端紫外線光学素子の製造方法
KR100556141B1 (ko) * 2003-03-27 2006-03-03 호야 가부시키가이샤 마스크 블랭크용 유리 기판 제조 방법 및 마스크 블랭크제조 방법
JP4792706B2 (ja) * 2003-04-03 2011-10-12 旭硝子株式会社 TiO2を含有するシリカガラスおよびその製造方法
JP5367204B2 (ja) * 2003-04-03 2013-12-11 旭硝子株式会社 TiO2を含有するシリカガラスおよびEUVリソグラフィ用光学部材
JP2010275189A (ja) * 2003-04-03 2010-12-09 Asahi Glass Co Ltd TiO2を含有するシリカガラスおよびEUVリソグラフィ用光学部材
WO2004092082A1 (ja) * 2003-04-11 2004-10-28 Nikon Corporation SiO2-TiO2系ガラスの製造方法、SiO2-TiO2系ガラス及び露光装置
DE202004021665U1 (de) 2003-04-26 2009-11-26 Schott Ag Glaskörper aus dotiertem Quarzglas
DE10318935A1 (de) * 2003-04-26 2004-11-18 Schott Glas Verfahren zur Herstellung von Glaskörpern aus dotiertem Quarzglas
US7155936B2 (en) 2003-08-08 2007-01-02 Corning Incorporated Doped silica glass articles and methods of forming doped silica glass boules and articles
DE102004015766B4 (de) * 2004-03-23 2016-05-12 Asahi Glass Co., Ltd. Verwendung eines SiO2-TiO2-Glases als strahlungsresistentes Substrat
JP5035516B2 (ja) 2005-12-08 2012-09-26 信越化学工業株式会社 フォトマスク用チタニアドープ石英ガラスの製造方法
DE102006020991B4 (de) * 2006-05-04 2009-09-10 Carl Zeiss Ag Verfahren zum Herstellen eines Formkörpers aus Glas oder Glaskeramik
US20080266651A1 (en) * 2007-04-24 2008-10-30 Katsuhiko Murakami Optical apparatus, multilayer-film reflective mirror, exposure apparatus, and device
KR101545361B1 (ko) 2007-05-09 2015-08-19 가부시키가이샤 니콘 포토마스크용 기판, 포토마스크용 기판의 성형 부재, 포토마스크용 기판의 제조 방법, 포토마스크, 및 포토마스크를 사용한 노광 방법
JP5042714B2 (ja) 2007-06-06 2012-10-03 信越化学工業株式会社 ナノインプリントモールド用チタニアドープ石英ガラス
JP2009013048A (ja) 2007-06-06 2009-01-22 Shin Etsu Chem Co Ltd ナノインプリントモールド用チタニアドープ石英ガラス
JP5287271B2 (ja) * 2009-01-13 2013-09-11 旭硝子株式会社 TiO2を含有するシリカガラスの成型方法およびそれによって成型されたEUVリソグラフィ用光学部材
DE102009033497A1 (de) * 2009-07-15 2011-01-20 Heraeus Quarzglas Gmbh & Co. Kg Optisches Bauteil aus synthetischen Quarz und Verfahren zur Herstellung des Bauteils
US8857214B2 (en) * 2011-11-18 2014-10-14 Sunedison Semiconductor Limited Methods for producing crucibles with a reduced amount of bubbles
US8524319B2 (en) 2011-11-18 2013-09-03 Memc Electronic Materials, Inc. Methods for producing crucibles with a reduced amount of bubbles
JP6241276B2 (ja) 2013-01-22 2017-12-06 信越化学工業株式会社 Euvリソグラフィ用部材の製造方法
JP5992842B2 (ja) * 2013-01-24 2016-09-14 信越石英株式会社 シリカチタニアガラスの製造方法及びシリカチタニアガラスの選別方法
CN103949952B (zh) * 2014-02-26 2016-04-13 四川欧瑞特光电科技有限公司 一种大外径变形镜主镜的加工方法
DE112015004415T5 (de) 2014-09-25 2017-07-13 Nantong Schmidt Opto-Electrical Technology Co. Ltd. Herstellungsverfahren für leichtgewichtige grossformatige teleskopspiegelrohlinge und gemäss demselben hergestellte spiegelrohlinge
DE102016217428A1 (de) 2016-09-13 2017-09-07 Carl Zeiss Smt Gmbh Verfahren zum Bearbeiten eines Werkstücks bei der Herstellung eines optischen Elements
CN111002115A (zh) * 2020-01-16 2020-04-14 程凯芬 一种防眩光玻璃及加工方法

Family Cites Families (74)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2272342A (en) 1934-08-27 1942-02-10 Corning Glass Works Method of making a transparent article of silica
BE438752A (enExample) * 1939-04-22
US2239551A (en) 1939-04-22 1941-04-22 Corning Glass Works Method of making sealing glasses and seals for quartz lamps
US2482698A (en) * 1943-05-06 1949-09-20 American Optical Corp Optical lens means having a nonspherical refracting surface
US3130029A (en) * 1959-06-23 1964-04-21 Bausch & Lomb Method for making fused multifocal lenses
US3155748A (en) * 1960-08-03 1964-11-03 American Optical Corp Method of making optical components
US3560182A (en) * 1968-01-24 1971-02-02 Ppg Industries Inc Bending glass sheets
US3958052A (en) 1974-06-12 1976-05-18 Corning Glass Works Subsurface-fortified glass laminates
US3930824A (en) * 1974-07-19 1976-01-06 Metrologic Instruments, Inc. Method of forming laser components
US4002512A (en) 1974-09-16 1977-01-11 Western Electric Company, Inc. Method of forming silicon dioxide
JPS54127284A (en) 1978-03-27 1979-10-03 Cho Lsi Gijutsu Kenkyu Kumiai Method of forming reflective pattern
US4130437A (en) 1978-04-12 1978-12-19 Corning Glass Works Photochromic glasses suitable for simultaneous heat treatment and shaping
US4282021A (en) 1978-10-02 1981-08-04 Corning Glass Works Method of making photochromic glasses suitable for simultaneous heat treatment and shaping
US4231827A (en) 1979-03-29 1980-11-04 Ppg Industries, Inc. Press polishing and laminating plastic transparencies using polycarbonate pressing plates
US4344816A (en) 1980-12-19 1982-08-17 Bell Telephone Laboratories, Incorporated Selectively etched bodies
JPS57106031A (en) 1980-12-23 1982-07-01 Toshiba Corp Transferring device for fine pattern
JPS60173551A (ja) 1984-02-20 1985-09-06 Hideki Matsumura X線など光線の反射投影によるパタ−ン転写法
JPS61291427A (ja) * 1985-06-17 1986-12-22 Hoya Corp モ−ルドレンズおよびその製造方法
US5146482A (en) 1985-08-15 1992-09-08 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Multispectral variable magnification glancing incidence x-ray telescope
US5016265A (en) 1985-08-15 1991-05-14 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Variable magnification variable dispersion glancing incidence imaging x-ray spectroscopic telescope
US4891830A (en) 1986-03-28 1990-01-02 Shimadzu Corporation X-ray reflective mask and system for image formation with use of the same
DE3752388T2 (de) 1986-07-11 2006-10-19 Canon K.K. Verkleinerndes Projektionsbelichtungssystem des Reflexionstyps für Röntgenstrahlung
US5165954A (en) 1986-09-02 1992-11-24 Microbeam, Inc. Method for repairing semiconductor masks & reticles
JPS63142301A (ja) 1986-12-04 1988-06-14 Nikon Corp 塁積効果の少ない光学薄膜
JPS63142302A (ja) 1986-12-04 1988-06-14 Nikon Corp レ−ザ−耐力の高い光学薄膜
EP0279670B1 (en) 1987-02-18 1997-10-29 Canon Kabushiki Kaisha A reflection type mask
US4776696A (en) 1987-03-20 1988-10-11 Michael C. Hettrick Optical system for high resolution spectrometer/monochromator
FR2626082B1 (fr) 1988-01-14 1991-10-18 Commissariat Energie Atomique Dispositif d'optique integree permettant de separer les composantes polarisees d'un champ electromagnetique guide et procede de realisation du dispositif
US5003567A (en) 1989-02-09 1991-03-26 Hawryluk Andrew M Soft x-ray reduction camera for submicron lithography
US4917934A (en) * 1989-04-27 1990-04-17 Corning Incorporated Telescope mirror blank and method of production
US5051326A (en) 1989-05-26 1991-09-24 At&T Bell Laboratories X-Ray lithography mask and devices made therewith
US5146518A (en) 1990-03-30 1992-09-08 The Furukawa Electric Co., Ltd. Optical directional coupler device and a method of driving same
US5043002A (en) 1990-08-16 1991-08-27 Corning Incorporated Method of making fused silica by decomposing siloxanes
US5152819A (en) 1990-08-16 1992-10-06 Corning Incorporated Method of making fused silica
JP3153230B2 (ja) 1990-09-10 2001-04-03 株式会社日立製作所 パタン形成方法
US5315629A (en) 1990-10-10 1994-05-24 At&T Bell Laboratories Ringfield lithography
US5203977A (en) 1991-03-11 1993-04-20 Regents Of The University Of California Magnetron sputtered boron films and TI/B multilayer structures
US5154744A (en) 1991-08-26 1992-10-13 Corning Incorporated Method of making titania-doped fused silica
US5173930A (en) 1991-11-22 1992-12-22 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration X-ray monochromator
US5304437A (en) 1992-04-03 1994-04-19 At&T Bell Laboratories Mask for x-ray pattern delineation
US5353322A (en) 1992-05-05 1994-10-04 Tropel Corporation Lens system for X-ray projection lithography camera
US5220590A (en) 1992-05-05 1993-06-15 General Signal Corporation X-ray projection lithography camera
US5395738A (en) 1992-12-29 1995-03-07 Brandes; George R. Electron lithography using a photocathode
US5356662A (en) * 1993-01-05 1994-10-18 At&T Bell Laboratories Method for repairing an optical element which includes a multilayer coating
US5332702A (en) 1993-04-16 1994-07-26 Corning Incorporated Low sodium zircon refractory and fused silica process
JP3513236B2 (ja) 1993-11-19 2004-03-31 キヤノン株式会社 X線マスク構造体、x線マスク構造体の製造方法、該x線マスク構造体を用いたx線露光装置及びx線露光方法、並びに該x線露光方法を用いて製造される半導体装置
JP2569426B2 (ja) 1994-03-24 1997-01-08 工業技術院長 超格子多層膜の製造方法
US5605490A (en) 1994-09-26 1997-02-25 The United States Of America As Represented By The Secretary Of The Army Method of polishing langasite
US5521031A (en) 1994-10-20 1996-05-28 At&T Corp. Pattern delineating apparatus for use in the EUV spectrum
US5510230A (en) 1994-10-20 1996-04-23 At&T Corp. Device fabrication using DUV/EUV pattern delineation
JP3064857B2 (ja) * 1995-03-28 2000-07-12 株式会社ニコン 光リソグラフィー用光学部材および合成石英ガラスの製造方法
US5868605A (en) 1995-06-02 1999-02-09 Speedfam Corporation In-situ polishing pad flatness control
US5637962A (en) 1995-06-09 1997-06-10 The Regents Of The University Of California Office Of Technology Transfer Plasma wake field XUV radiation source
US6007963A (en) 1995-09-21 1999-12-28 Sandia Corporation Method for extreme ultraviolet lithography
DE19546313C1 (de) 1995-12-12 1997-01-23 Schott Glaswerke Kupfer(II)-oxidhaltige Alumophosphatgläser
US5815310A (en) 1995-12-12 1998-09-29 Svg Lithography Systems, Inc. High numerical aperture ring field optical reduction system
US5698113A (en) 1996-02-22 1997-12-16 The Regents Of The University Of California Recovery of Mo/Si multilayer coated optical substrates
US5737137A (en) 1996-04-01 1998-04-07 The Regents Of The University Of California Critical illumination condenser for x-ray lithography
DE19616922A1 (de) 1996-04-27 1997-10-30 Zeiss Carl Fa Hochauflösendes lichtstarkes Objektiv
US6133577A (en) 1997-02-04 2000-10-17 Advanced Energy Systems, Inc. Method and apparatus for producing extreme ultra-violet light for use in photolithography
US6093484A (en) 1997-04-04 2000-07-25 Hoya Corporation Method for the production of glass product
US5956192A (en) 1997-09-18 1999-09-21 Svg Lithography Systems, Inc. Four mirror EUV projection optics
EP1030822B1 (en) * 1997-09-24 2010-06-23 Corning Incorporated FUSED SiO2-TiO2 GLASS METHOD
JPH11221742A (ja) 1997-09-30 1999-08-17 Hoya Corp 研磨方法及び研磨装置並びに磁気記録媒体用ガラス基板及び磁気記録媒体
US6118577A (en) 1998-08-06 2000-09-12 Euv, L.L.C Diffractive element in extreme-UV lithography condenser
US6312373B1 (en) 1998-09-22 2001-11-06 Nikon Corporation Method of manufacturing an optical system
US5970751A (en) 1998-09-22 1999-10-26 Corning Incorporated Fused SiO2 -TiO2 glass method
US6013399A (en) 1998-12-04 2000-01-11 Advanced Micro Devices, Inc. Reworkable EUV mask materials
US6178221B1 (en) * 1998-12-04 2001-01-23 Advanced Micro Devices, Inc. Lithography reflective mask
US6048652A (en) 1998-12-04 2000-04-11 Advanced Micro Devices, Inc. Backside polish EUV mask and method of manufacture
US6319634B1 (en) * 1999-03-12 2001-11-20 Corning Incorporated Projection lithography photomasks and methods of making
AU6208300A (en) 1999-07-22 2001-02-13 Corning Incorporated Extreme ultraviolet soft x-ray projection lithographic method system and lithography elements
WO2001007967A1 (en) 1999-07-22 2001-02-01 Corning Incorporated Extreme ultraviolet soft x-ray projection lithographic method and mask devices
US6368942B1 (en) * 2000-03-31 2002-04-09 Euv Llc Method for fabricating an ultra-low expansion mask blank having a crystalline silicon layer

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3264827B2 (ja) 1995-07-26 2002-03-11 株式会社エヌ・ティ・ティ・データ Lanテスタ

Also Published As

Publication number Publication date
EP1324857A4 (en) 2004-12-01
EP1324857A1 (en) 2003-07-09
US6776006B2 (en) 2004-08-17
US20020043080A1 (en) 2002-04-18
JP2004511414A (ja) 2004-04-15
WO2002032622A1 (en) 2002-04-25

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