JP5142444B2 - Euvリソグラフィミラーにおいて脈理を回避する方法 - Google Patents
Euvリソグラフィミラーにおいて脈理を回避する方法 Download PDFInfo
- Publication number
- JP5142444B2 JP5142444B2 JP2002535847A JP2002535847A JP5142444B2 JP 5142444 B2 JP5142444 B2 JP 5142444B2 JP 2002535847 A JP2002535847 A JP 2002535847A JP 2002535847 A JP2002535847 A JP 2002535847A JP 5142444 B2 JP5142444 B2 JP 5142444B2
- Authority
- JP
- Japan
- Prior art keywords
- mirror
- striae
- glass
- euv
- ule
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 206010040925 Skin striae Diseases 0.000 title claims description 37
- 238000000034 method Methods 0.000 title claims description 26
- 238000001900 extreme ultraviolet lithography Methods 0.000 title claims description 22
- 239000011521 glass Substances 0.000 claims description 36
- 239000000463 material Substances 0.000 claims description 34
- 238000005498 polishing Methods 0.000 claims description 8
- 238000000227 grinding Methods 0.000 claims description 6
- 238000004519 manufacturing process Methods 0.000 claims description 5
- 230000007062 hydrolysis Effects 0.000 claims description 3
- 238000006460 hydrolysis reaction Methods 0.000 claims description 3
- 239000002585 base Substances 0.000 description 16
- 239000010410 layer Substances 0.000 description 11
- 230000003287 optical effect Effects 0.000 description 11
- 238000000206 photolithography Methods 0.000 description 7
- 239000000853 adhesive Substances 0.000 description 5
- 230000001070 adhesive effect Effects 0.000 description 5
- 238000000576 coating method Methods 0.000 description 5
- 238000003384 imaging method Methods 0.000 description 5
- 229910052710 silicon Inorganic materials 0.000 description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 4
- 239000010703 silicon Substances 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 229910052750 molybdenum Inorganic materials 0.000 description 3
- 238000002310 reflectometry Methods 0.000 description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 229910010413 TiO 2 Inorganic materials 0.000 description 2
- 238000000137 annealing Methods 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000010408 film Substances 0.000 description 2
- 238000009501 film coating Methods 0.000 description 2
- 230000004927 fusion Effects 0.000 description 2
- 238000001755 magnetron sputter deposition Methods 0.000 description 2
- 239000011733 molybdenum Substances 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- 229910017305 Mo—Si Inorganic materials 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 1
- 229910052783 alkali metal Inorganic materials 0.000 description 1
- 150000001340 alkali metals Chemical class 0.000 description 1
- 229910052784 alkaline earth metal Inorganic materials 0.000 description 1
- 150000001342 alkaline earth metals Chemical class 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000005219 brazing Methods 0.000 description 1
- 238000005266 casting Methods 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 239000011247 coating layer Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000005357 flat glass Substances 0.000 description 1
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 238000001659 ion-beam spectroscopy Methods 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 239000003562 lightweight material Substances 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 238000001393 microlithography Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000006060 molten glass Substances 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 239000000843 powder Substances 0.000 description 1
- 239000002243 precursor Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 239000013464 silicone adhesive Substances 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 239000011734 sodium Substances 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 239000010936 titanium Substances 0.000 description 1
- 229910052719 titanium Inorganic materials 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B1/00—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B13/00—Machines or devices designed for grinding or polishing optical surfaces on lenses or surfaces of similar shape on other work; Accessories therefor
- B24B13/06—Machines or devices designed for grinding or polishing optical surfaces on lenses or surfaces of similar shape on other work; Accessories therefor grinding of lenses, the tool or work being controlled by information-carrying means, e.g. patterns, punched tapes, magnetic tapes
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B19/00—Other methods of shaping glass
- C03B19/14—Other methods of shaping glass by gas- or vapour- phase reaction processes
- C03B19/1453—Thermal after-treatment of the shaped article, e.g. dehydrating, consolidating, sintering
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B19/00—Other methods of shaping glass
- C03B19/14—Other methods of shaping glass by gas- or vapour- phase reaction processes
- C03B19/1469—Means for changing or stabilising the shape or form of the shaped article or deposit
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03B—MANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
- C03B23/00—Re-forming shaped glass
- C03B23/02—Re-forming glass sheets
- C03B23/023—Re-forming glass sheets by bending
- C03B23/025—Re-forming glass sheets by bending by gravity
- C03B23/0252—Re-forming glass sheets by bending by gravity by gravity only, e.g. sagging
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Thermal Sciences (AREA)
- Optical Elements Other Than Lenses (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Glass Melting And Manufacturing (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US24030300P | 2000-10-13 | 2000-10-13 | |
| US60/240,303 | 2000-10-13 | ||
| PCT/US2001/029100 WO2002032622A1 (en) | 2000-10-13 | 2001-09-18 | A method to avoid striae in euv lithography mirrors |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2004511414A JP2004511414A (ja) | 2004-04-15 |
| JP2004511414A5 JP2004511414A5 (enExample) | 2008-07-24 |
| JP5142444B2 true JP5142444B2 (ja) | 2013-02-13 |
Family
ID=22906005
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002535847A Expired - Lifetime JP5142444B2 (ja) | 2000-10-13 | 2001-09-18 | Euvリソグラフィミラーにおいて脈理を回避する方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6776006B2 (enExample) |
| EP (1) | EP1324857A4 (enExample) |
| JP (1) | JP5142444B2 (enExample) |
| WO (1) | WO2002032622A1 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3264827B2 (ja) | 1995-07-26 | 2002-03-11 | 株式会社エヌ・ティ・ティ・データ | Lanテスタ |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
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| DE10127086A1 (de) * | 2001-06-02 | 2002-12-05 | Zeiss Carl | Vorrichtung zur Reflexion von elektromagnetischen Wellen |
| JP4158009B2 (ja) * | 2001-12-11 | 2008-10-01 | 信越化学工業株式会社 | 合成石英ガラスインゴット及び合成石英ガラスの製造方法 |
| US6829908B2 (en) | 2002-02-27 | 2004-12-14 | Corning Incorporated | Fabrication of inclusion free homogeneous glasses |
| US6832493B2 (en) | 2002-02-27 | 2004-12-21 | Corning Incorporated | High purity glass bodies formed by zero shrinkage casting |
| US7053017B2 (en) * | 2002-03-05 | 2006-05-30 | Corning Incorporated | Reduced striae extreme ultraviolet elements |
| US20040025542A1 (en) * | 2002-06-07 | 2004-02-12 | Ball Laura J. | Method of making extreme ultraviolet lithography glass substrates |
| JP2004131373A (ja) * | 2002-09-09 | 2004-04-30 | Corning Inc | シリカ・チタニア極端紫外線光学素子の製造方法 |
| KR100556141B1 (ko) * | 2003-03-27 | 2006-03-03 | 호야 가부시키가이샤 | 마스크 블랭크용 유리 기판 제조 방법 및 마스크 블랭크제조 방법 |
| JP4792706B2 (ja) * | 2003-04-03 | 2011-10-12 | 旭硝子株式会社 | TiO2を含有するシリカガラスおよびその製造方法 |
| JP5367204B2 (ja) * | 2003-04-03 | 2013-12-11 | 旭硝子株式会社 | TiO2を含有するシリカガラスおよびEUVリソグラフィ用光学部材 |
| JP2010275189A (ja) * | 2003-04-03 | 2010-12-09 | Asahi Glass Co Ltd | TiO2を含有するシリカガラスおよびEUVリソグラフィ用光学部材 |
| WO2004092082A1 (ja) * | 2003-04-11 | 2004-10-28 | Nikon Corporation | SiO2-TiO2系ガラスの製造方法、SiO2-TiO2系ガラス及び露光装置 |
| DE202004021665U1 (de) | 2003-04-26 | 2009-11-26 | Schott Ag | Glaskörper aus dotiertem Quarzglas |
| DE10318935A1 (de) * | 2003-04-26 | 2004-11-18 | Schott Glas | Verfahren zur Herstellung von Glaskörpern aus dotiertem Quarzglas |
| US7155936B2 (en) | 2003-08-08 | 2007-01-02 | Corning Incorporated | Doped silica glass articles and methods of forming doped silica glass boules and articles |
| DE102004015766B4 (de) * | 2004-03-23 | 2016-05-12 | Asahi Glass Co., Ltd. | Verwendung eines SiO2-TiO2-Glases als strahlungsresistentes Substrat |
| JP5035516B2 (ja) | 2005-12-08 | 2012-09-26 | 信越化学工業株式会社 | フォトマスク用チタニアドープ石英ガラスの製造方法 |
| DE102006020991B4 (de) * | 2006-05-04 | 2009-09-10 | Carl Zeiss Ag | Verfahren zum Herstellen eines Formkörpers aus Glas oder Glaskeramik |
| US20080266651A1 (en) * | 2007-04-24 | 2008-10-30 | Katsuhiko Murakami | Optical apparatus, multilayer-film reflective mirror, exposure apparatus, and device |
| KR101545361B1 (ko) | 2007-05-09 | 2015-08-19 | 가부시키가이샤 니콘 | 포토마스크용 기판, 포토마스크용 기판의 성형 부재, 포토마스크용 기판의 제조 방법, 포토마스크, 및 포토마스크를 사용한 노광 방법 |
| JP5042714B2 (ja) | 2007-06-06 | 2012-10-03 | 信越化学工業株式会社 | ナノインプリントモールド用チタニアドープ石英ガラス |
| JP2009013048A (ja) | 2007-06-06 | 2009-01-22 | Shin Etsu Chem Co Ltd | ナノインプリントモールド用チタニアドープ石英ガラス |
| JP5287271B2 (ja) * | 2009-01-13 | 2013-09-11 | 旭硝子株式会社 | TiO2を含有するシリカガラスの成型方法およびそれによって成型されたEUVリソグラフィ用光学部材 |
| DE102009033497A1 (de) * | 2009-07-15 | 2011-01-20 | Heraeus Quarzglas Gmbh & Co. Kg | Optisches Bauteil aus synthetischen Quarz und Verfahren zur Herstellung des Bauteils |
| US8857214B2 (en) * | 2011-11-18 | 2014-10-14 | Sunedison Semiconductor Limited | Methods for producing crucibles with a reduced amount of bubbles |
| US8524319B2 (en) | 2011-11-18 | 2013-09-03 | Memc Electronic Materials, Inc. | Methods for producing crucibles with a reduced amount of bubbles |
| JP6241276B2 (ja) | 2013-01-22 | 2017-12-06 | 信越化学工業株式会社 | Euvリソグラフィ用部材の製造方法 |
| JP5992842B2 (ja) * | 2013-01-24 | 2016-09-14 | 信越石英株式会社 | シリカチタニアガラスの製造方法及びシリカチタニアガラスの選別方法 |
| CN103949952B (zh) * | 2014-02-26 | 2016-04-13 | 四川欧瑞特光电科技有限公司 | 一种大外径变形镜主镜的加工方法 |
| DE112015004415T5 (de) | 2014-09-25 | 2017-07-13 | Nantong Schmidt Opto-Electrical Technology Co. Ltd. | Herstellungsverfahren für leichtgewichtige grossformatige teleskopspiegelrohlinge und gemäss demselben hergestellte spiegelrohlinge |
| DE102016217428A1 (de) | 2016-09-13 | 2017-09-07 | Carl Zeiss Smt Gmbh | Verfahren zum Bearbeiten eines Werkstücks bei der Herstellung eines optischen Elements |
| CN111002115A (zh) * | 2020-01-16 | 2020-04-14 | 程凯芬 | 一种防眩光玻璃及加工方法 |
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| US6368942B1 (en) * | 2000-03-31 | 2002-04-09 | Euv Llc | Method for fabricating an ultra-low expansion mask blank having a crystalline silicon layer |
-
2001
- 2001-08-30 US US09/943,252 patent/US6776006B2/en not_active Expired - Lifetime
- 2001-09-18 EP EP01979254A patent/EP1324857A4/en not_active Withdrawn
- 2001-09-18 WO PCT/US2001/029100 patent/WO2002032622A1/en not_active Ceased
- 2001-09-18 JP JP2002535847A patent/JP5142444B2/ja not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3264827B2 (ja) | 1995-07-26 | 2002-03-11 | 株式会社エヌ・ティ・ティ・データ | Lanテスタ |
Also Published As
| Publication number | Publication date |
|---|---|
| EP1324857A4 (en) | 2004-12-01 |
| EP1324857A1 (en) | 2003-07-09 |
| US6776006B2 (en) | 2004-08-17 |
| US20020043080A1 (en) | 2002-04-18 |
| JP2004511414A (ja) | 2004-04-15 |
| WO2002032622A1 (en) | 2002-04-25 |
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