JP4932482B2 - 調査対象器具の電磁挙動の直接観測のための無響室 - Google Patents
調査対象器具の電磁挙動の直接観測のための無響室 Download PDFInfo
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- JP4932482B2 JP4932482B2 JP2006523650A JP2006523650A JP4932482B2 JP 4932482 B2 JP4932482 B2 JP 4932482B2 JP 2006523650 A JP2006523650 A JP 2006523650A JP 2006523650 A JP2006523650 A JP 2006523650A JP 4932482 B2 JP4932482 B2 JP 4932482B2
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- 238000011835 investigation Methods 0.000 title claims description 16
- 230000005855 radiation Effects 0.000 claims description 21
- 238000010586 diagram Methods 0.000 claims description 14
- 238000004458 analytical method Methods 0.000 claims description 13
- 238000012360 testing method Methods 0.000 claims description 11
- 230000003287 optical effect Effects 0.000 claims description 3
- 239000004973 liquid crystal related substance Substances 0.000 claims description 2
- 238000012545 processing Methods 0.000 description 7
- 230000000694 effects Effects 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000013461 design Methods 0.000 description 2
- 230000003466 anti-cipated effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 238000012938 design process Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000002592 echocardiography Methods 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000000284 resting effect Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
- G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
Description
Claims (8)
- アンテナまたはその他の任意の電波放出もしくは受信器具の電磁挙動の調査構成であって、調査対象のそのような電磁器具(10)、ならびにこの器具(10)を操作する人間を受け入れるように設計された無響室を備え、また調査対象の前記電磁器具(10)によって放出または受信される放射を捕えるように設計された少なくとも1つの分析アンテナ(20)、ならびに前記分析アンテナ(20)からの出力信号を処理する手段(30)を備え、また調査対象の前記電磁器具(10)について生成された放射図を表示する手段(40)も備え、調査対象の前記電磁器具(10)を操作する人間が、前記器具(10)の電磁挙動に対する自らの前記器具(10)の操作の影響を直接観測できるように、前記放射図を表示する前記手段(40)が前記無響室内に配置され、
調査対象の前記電磁器具(10)を操作する人間を座らせる椅子と、この人間の一方の腕のための調整可能な支持とを備え、前記椅子および前記支持は、前記人間の全面的な位置変えを可能にするために調整可能であり、腕の正確な再配置によって、前記人間の体の残りの部分に対する電話の与えられた位置での電話の複数の連続的な使用を可能にすることを特徴とする調査構成。 - 試験対象の前記電磁器具(10)をほぼ取り囲んで置かれた円周上に配置された試験アンテナ(20)のネットワークを備えることを特徴とする請求項1に記載の調査構成。
- 円周をなす前記複数の分析アンテナ(20)と試験対象の前記電磁器具(10)との間の相対回転を、すべての前記分析アンテナ(20)によって形成される円のほぼ直径である回転軸の周りに自動的に生じさせることが可能な手段を備えることを特徴とする請求項2に記載の調査構成。
- 調査対象物(10)の前記放射図を表示する前記手段(40)が、前記無響室の内壁に接して配置された画面を含むことを特徴とする請求項1から3のいずれかに記載の請求項のいずれかに記載の調査構成。
- 調査対象物(10)の前記放射図を表示する前記手段(40)が、前記無響室内で前記器具を操作する人間に直接付けられる、または前記無響室内に配置された別の人間に装着されるビューイング・ゴーグルを含むことを特徴とする請求項1から3のいずれかに記載の調査構成。
- 前記画面(40)が、モニタまたは従来の光学的投影画面の表示面から構成され、この面が、前記室の1つの壁の平面にほぼ沿って配置されることを特徴とする請求項4に記載の調査構成。
- 前記画面(40)が、フラット・モニタ、特に液晶またはプラズマ・モニタの表示面から構成されることを特徴とする請求項6に記載の調査構成。
- 前記画面(40)が、従来の光学的投影画面であることを特徴とする請求項6に記載の調査構成。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR0309985A FR2859023B1 (fr) | 2003-08-18 | 2003-08-18 | Chambre anechoique a observation directe du comportement electromagnetique d'un outil a etudier |
FR0309985 | 2003-08-18 | ||
PCT/FR2004/002153 WO2005019844A1 (fr) | 2003-08-18 | 2004-08-18 | Chambre anechoïque a observation directe du comportement electromagnetique d’un outil a etudier |
Publications (2)
Publication Number | Publication Date |
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JP2007502972A JP2007502972A (ja) | 2007-02-15 |
JP4932482B2 true JP4932482B2 (ja) | 2012-05-16 |
Family
ID=34112802
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006523650A Active JP4932482B2 (ja) | 2003-08-18 | 2004-08-18 | 調査対象器具の電磁挙動の直接観測のための無響室 |
Country Status (7)
Country | Link |
---|---|
US (1) | US7466142B2 (ja) |
EP (1) | EP1660895B1 (ja) |
JP (1) | JP4932482B2 (ja) |
CN (1) | CN1853110A (ja) |
CA (1) | CA2536022C (ja) |
FR (1) | FR2859023B1 (ja) |
WO (1) | WO2005019844A1 (ja) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101039534B (zh) * | 2006-03-15 | 2012-06-20 | 鸿富锦精密工业(深圳)有限公司 | 声音检测设备和自动传送装置 |
CN1964547A (zh) * | 2006-11-30 | 2007-05-16 | 中兴通讯股份有限公司 | 确定天线最小测试距离的方法 |
JP2008241661A (ja) * | 2007-03-29 | 2008-10-09 | Fujitsu Ltd | Emi測定システム |
US7830296B2 (en) * | 2007-07-11 | 2010-11-09 | Finisar Corporation | Anechoic structures for absorbing electromagnetic interference in a communications module |
WO2009091087A1 (en) * | 2008-01-14 | 2009-07-23 | Ktm Technology Co., Ltd. | Hemi-spherical type antenna chamber |
FR2927701B1 (fr) * | 2008-02-20 | 2010-04-09 | Satimo Sa | Dispositif et procede pour la determination d'au moins une grandeur associee au rayonnement electromagnetique d'un objet sous test. |
US8462039B2 (en) * | 2009-12-09 | 2013-06-11 | Electronics And Telecommunications Research Institute | Indoor electromagnetic environment implementing structure and a constructing method thereof |
Citations (10)
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JPH0221699A (ja) * | 1988-07-08 | 1990-01-24 | Matsushita Electric Ind Co Ltd | Emc試験用電磁波無響室およびそのシールド材 |
JPH06294833A (ja) * | 1993-04-08 | 1994-10-21 | Nippon Sheet Glass Co Ltd | アンテナ特性測定装置 |
JPH09101370A (ja) * | 1995-10-03 | 1997-04-15 | Fuji Electric Co Ltd | 椅子式ホールボディカウンタ |
JPH09114543A (ja) * | 1995-10-02 | 1997-05-02 | Xybernaut Corp | ハンドフリーコンピュータ装置 |
JPH11248772A (ja) * | 1998-02-27 | 1999-09-17 | Mitsubishi Electric Corp | マイクロ波通信機器用試験装置 |
JP2000009776A (ja) * | 1998-06-22 | 2000-01-14 | Advantest Corp | 無線通信特性試験装置 |
JP2000166656A (ja) * | 1998-12-11 | 2000-06-20 | Mitsubishi Electric Corp | 机 |
JP2002107396A (ja) * | 2000-09-29 | 2002-04-10 | Matsushita Electric Ind Co Ltd | 疑似人体とそれを用いた測定方法 |
JP2002251148A (ja) * | 2001-02-26 | 2002-09-06 | Fujitsu Kiden Ltd | 表示装置の設置方法 |
WO2003012465A1 (en) * | 2001-07-27 | 2003-02-13 | Advantest Corporation | Electromagnetic wave measuring apparatus |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2602872B2 (ja) * | 1988-01-20 | 1997-04-23 | 株式会社東芝 | 放射電磁界特性測定装置 |
DE4316642A1 (de) * | 1993-05-18 | 1994-11-24 | Siemens Ag | Abschirmkammer mit einer nicht störenden und störunempfindlichen Monitor-Anzeigevorrichtung |
FR2797327B1 (fr) * | 1999-08-03 | 2001-11-09 | France Telecom | Procede et dispositif de mesure en champ proche de rayonnements radioelectriques non controles |
US6329953B1 (en) * | 2000-09-29 | 2001-12-11 | Rangestar Wireless | Method and system for rating antenna performance |
-
2003
- 2003-08-18 FR FR0309985A patent/FR2859023B1/fr not_active Expired - Fee Related
-
2004
- 2004-08-18 US US10/568,667 patent/US7466142B2/en active Active
- 2004-08-18 CN CNA2004800270471A patent/CN1853110A/zh active Pending
- 2004-08-18 JP JP2006523650A patent/JP4932482B2/ja active Active
- 2004-08-18 CA CA2536022A patent/CA2536022C/fr active Active
- 2004-08-18 EP EP04786319.6A patent/EP1660895B1/fr active Active
- 2004-08-18 WO PCT/FR2004/002153 patent/WO2005019844A1/fr active Application Filing
Patent Citations (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0221699A (ja) * | 1988-07-08 | 1990-01-24 | Matsushita Electric Ind Co Ltd | Emc試験用電磁波無響室およびそのシールド材 |
JPH06294833A (ja) * | 1993-04-08 | 1994-10-21 | Nippon Sheet Glass Co Ltd | アンテナ特性測定装置 |
JPH09114543A (ja) * | 1995-10-02 | 1997-05-02 | Xybernaut Corp | ハンドフリーコンピュータ装置 |
JPH09101370A (ja) * | 1995-10-03 | 1997-04-15 | Fuji Electric Co Ltd | 椅子式ホールボディカウンタ |
JPH11248772A (ja) * | 1998-02-27 | 1999-09-17 | Mitsubishi Electric Corp | マイクロ波通信機器用試験装置 |
JP2000009776A (ja) * | 1998-06-22 | 2000-01-14 | Advantest Corp | 無線通信特性試験装置 |
JP2000166656A (ja) * | 1998-12-11 | 2000-06-20 | Mitsubishi Electric Corp | 机 |
JP2002107396A (ja) * | 2000-09-29 | 2002-04-10 | Matsushita Electric Ind Co Ltd | 疑似人体とそれを用いた測定方法 |
JP2002251148A (ja) * | 2001-02-26 | 2002-09-06 | Fujitsu Kiden Ltd | 表示装置の設置方法 |
WO2003012465A1 (en) * | 2001-07-27 | 2003-02-13 | Advantest Corporation | Electromagnetic wave measuring apparatus |
Also Published As
Publication number | Publication date |
---|---|
CN1853110A (zh) | 2006-10-25 |
US20060208746A1 (en) | 2006-09-21 |
US7466142B2 (en) | 2008-12-16 |
EP1660895A1 (fr) | 2006-05-31 |
CA2536022C (fr) | 2014-08-12 |
CA2536022A1 (fr) | 2005-03-03 |
FR2859023B1 (fr) | 2005-12-23 |
EP1660895B1 (fr) | 2018-07-25 |
JP2007502972A (ja) | 2007-02-15 |
WO2005019844A1 (fr) | 2005-03-03 |
FR2859023A1 (fr) | 2005-02-25 |
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