JP4878123B2 - 固体撮像装置 - Google Patents
固体撮像装置 Download PDFInfo
- Publication number
- JP4878123B2 JP4878123B2 JP2005030804A JP2005030804A JP4878123B2 JP 4878123 B2 JP4878123 B2 JP 4878123B2 JP 2005030804 A JP2005030804 A JP 2005030804A JP 2005030804 A JP2005030804 A JP 2005030804A JP 4878123 B2 JP4878123 B2 JP 4878123B2
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- Prior art keywords
- transistor
- capacitive element
- imaging device
- state imaging
- solid
- Prior art date
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- 238000003384 imaging method Methods 0.000 title claims description 22
- 239000004065 semiconductor Substances 0.000 claims description 47
- 230000003321 amplification Effects 0.000 claims description 12
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 12
- 239000000758 substrate Substances 0.000 claims description 8
- 238000007599 discharging Methods 0.000 claims description 7
- 239000003990 capacitor Substances 0.000 description 22
- 101100150907 Caenorhabditis elegans swm-1 gene Proteins 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 238000005513 bias potential Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14603—Special geometry or disposition of pixel-elements, address-lines or gate-electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
- H04N25/50—Control of the SSIS exposure
- H04N25/57—Control of the dynamic range
- H04N25/59—Control of the dynamic range by controlling the amount of charge storable in the pixel, e.g. modification of the charge conversion ratio of the floating node capacitance
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Description
Claims (5)
- 半導体基板上に複数の画素部が1次元または2次元に配列された固体撮像装置であって、
前記複数の画素部それぞれが、
入射光強度に応じた量の電荷を発生する埋込型フォトダイオードと、
前記埋込型フォトダイオードに対して並列的に接続され前記埋込型フォトダイオードで発生した電荷を蓄積する容量素子と、
を備え、
前記容量素子が、1対の電極層と、この1対の電極層の間に挟まれた誘電体層とを含む、
ことを特徴とする固体撮像装置。 - 前記半導体基板上において前記埋込型フォトダイオードおよび前記容量素子それぞれの配置領域が互いに分かれていることを特徴とする請求項1記載の固体撮像装置。
- 前記容量素子が、前記埋込型フォトダイオードの上方に形成されており、前記1対の電極層および前記誘電体層が透明であり、
前記埋込型フォトダイオードが、前記容量素子を透過して入射した光を受光する、
ことを特徴とする請求項1記載の固体撮像装置。 - 前記複数の画素部それぞれが、
ゲート端子に入力する電圧値に応じた電圧値を出力する増幅用トランジスタと、
前記容量素子の蓄積電荷量に応じた電圧値を前記増幅用トランジスタのゲート端子に入力させる転送用トランジスタと、
前記容量素子の電荷を放電する放電用トランジスタと、
前記増幅用トランジスタから出力される電圧値を選択的に出力する選択用トランジスタと、
を更に備えることを特徴とする請求項1記載の固体撮像装置。 - 前記半導体基板上において、前記埋込型フォトダイオードおよび前記容量素子それぞれの配置領域が互いに分かれており、前記増幅用トランジスタ,前記転送用トランジスタ,前記放電用トランジスタおよび前記選択用トランジスタの配置領域が前記埋込型フォトダイオードの配置領域と前記容量素子の配置領域とに囲まれている、ことを特徴とする請求項4記載の固体撮像装置。
Priority Applications (8)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005030804A JP4878123B2 (ja) | 2005-02-07 | 2005-02-07 | 固体撮像装置 |
EP06712922.1A EP1850387B1 (en) | 2005-02-07 | 2006-02-02 | Solid-state image pickup device |
CNB2006800019035A CN100568519C (zh) | 2005-02-07 | 2006-02-02 | 固体摄像装置 |
KR1020077014452A KR101214268B1 (ko) | 2005-02-07 | 2006-02-02 | 고체 촬상 장치 |
US11/883,757 US8018515B2 (en) | 2005-02-07 | 2006-02-02 | Solid-state image pickup device |
KR1020127025167A KR101335142B1 (ko) | 2005-02-07 | 2006-02-02 | 고체 촬상 장치 |
PCT/JP2006/301779 WO2006082896A1 (ja) | 2005-02-07 | 2006-02-02 | 固体撮像装置 |
TW095103921A TWI413241B (zh) | 2005-02-07 | 2006-02-06 | Solid-state imaging device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005030804A JP4878123B2 (ja) | 2005-02-07 | 2005-02-07 | 固体撮像装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006216907A JP2006216907A (ja) | 2006-08-17 |
JP4878123B2 true JP4878123B2 (ja) | 2012-02-15 |
Family
ID=36777278
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2005030804A Active JP4878123B2 (ja) | 2005-02-07 | 2005-02-07 | 固体撮像装置 |
Country Status (7)
Country | Link |
---|---|
US (1) | US8018515B2 (ja) |
EP (1) | EP1850387B1 (ja) |
JP (1) | JP4878123B2 (ja) |
KR (2) | KR101335142B1 (ja) |
CN (1) | CN100568519C (ja) |
TW (1) | TWI413241B (ja) |
WO (1) | WO2006082896A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10212368B2 (en) | 2015-06-30 | 2019-02-19 | Hamamatsu Photonics K.K. | Solid-state imaging device |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7504616B2 (en) | 2006-04-10 | 2009-03-17 | Panasonic Corporation | Exposure device and image forming apparatus using the same |
KR100977834B1 (ko) * | 2007-12-31 | 2010-08-25 | 인제대학교 산학협력단 | 넓은 동적 범위을 갖는 씨모스 이미지 센서 |
JP5150283B2 (ja) * | 2008-01-30 | 2013-02-20 | 浜松ホトニクス株式会社 | 固体撮像装置 |
JP5155759B2 (ja) * | 2008-07-17 | 2013-03-06 | 浜松ホトニクス株式会社 | 固体撮像装置 |
JP5438331B2 (ja) * | 2009-01-30 | 2014-03-12 | 浜松ホトニクス株式会社 | 固体撮像装置 |
CN102157533B (zh) * | 2011-01-18 | 2013-07-17 | 江苏康众数字医疗设备有限公司 | 具有存储电容结构的非晶硅图像传感器 |
US8570012B2 (en) * | 2011-12-13 | 2013-10-29 | Texas Instruments Incorporated | Diode for use in a switched mode power supply |
US9967501B2 (en) | 2014-10-08 | 2018-05-08 | Panasonic Intellectual Property Management Co., Ltd. | Imaging device |
JP6782431B2 (ja) | 2016-01-22 | 2020-11-11 | パナソニックIpマネジメント株式会社 | 撮像装置 |
CN107026961B (zh) | 2016-01-29 | 2021-02-12 | 松下知识产权经营株式会社 | 摄像装置 |
CN111095560A (zh) * | 2017-11-30 | 2020-05-01 | 松下知识产权经营株式会社 | 摄像装置 |
Family Cites Families (23)
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---|---|---|---|---|
JPS6139569A (ja) * | 1984-07-31 | 1986-02-25 | Fuji Photo Film Co Ltd | 固体光検出デバイス |
JPS61204966A (ja) * | 1985-03-08 | 1986-09-11 | Fuji Photo Film Co Ltd | 固体撮像デバイス |
JPS6353968A (ja) | 1986-08-22 | 1988-03-08 | Nikon Corp | イメ−ジセンサ |
JPH05160379A (ja) * | 1991-12-06 | 1993-06-25 | Fuji Xerox Co Ltd | イメージセンサ及び画像読取装置 |
JPH09275201A (ja) * | 1996-04-04 | 1997-10-21 | Fuji Xerox Co Ltd | 固体撮像素子 |
JPH1098176A (ja) * | 1996-09-19 | 1998-04-14 | Toshiba Corp | 固体撮像装置 |
JPH10189908A (ja) * | 1996-12-20 | 1998-07-21 | Texas Instr Japan Ltd | 金属酸化物キャパシタの作製方法及び半導体メモリ装置の製造方法 |
JPH11164210A (ja) * | 1997-11-28 | 1999-06-18 | Nikon Corp | 動き検出用固体撮像装置 |
JPH11274454A (ja) | 1998-03-19 | 1999-10-08 | Canon Inc | 固体撮像装置及びその形成方法 |
CN1143396C (zh) | 1998-03-30 | 2004-03-24 | 恩益禧电子股份有限公司 | 固态图象传感器 |
US6963372B1 (en) * | 1998-04-24 | 2005-11-08 | Canon Kabushiki Kaisha | Solid-state image sensing apparatus and method of operating the same |
JP2000224495A (ja) | 1998-11-24 | 2000-08-11 | Canon Inc | 撮像装置及びそれを用いた撮像システム |
US6204524B1 (en) | 1999-07-14 | 2001-03-20 | Micron Technology, Inc. | CMOS imager with storage capacitor |
KR100477788B1 (ko) | 1999-12-28 | 2005-03-22 | 매그나칩 반도체 유한회사 | 커패시터가 접속된 포토다이오드를 갖는 씨모스이미지센서 및 그 제조방법 |
US6730897B2 (en) | 2000-12-29 | 2004-05-04 | Eastman Kodak Company | Linearity and dynamic range for complementary metal oxide semiconductor active pixel image sensors |
JP4130307B2 (ja) | 2001-01-15 | 2008-08-06 | Necエレクトロニクス株式会社 | 固体撮像装置 |
FR2820883B1 (fr) | 2001-02-12 | 2003-06-13 | St Microelectronics Sa | Photodiode a grande capacite |
JP3918442B2 (ja) | 2001-02-19 | 2007-05-23 | ソニー株式会社 | 半導体装置及びその製造方法 |
JP3734717B2 (ja) * | 2001-04-26 | 2006-01-11 | 富士通株式会社 | イメージセンサ |
KR100504562B1 (ko) * | 2001-07-18 | 2005-08-03 | 매그나칩 반도체 유한회사 | 씨모스 이미지 센서 |
JP4006207B2 (ja) * | 2001-09-27 | 2007-11-14 | シャープ株式会社 | 電荷検出装置並びにそれを含むmos型固体撮像装置およびccd型固体撮像装置 |
JP4117540B2 (ja) * | 2002-10-17 | 2008-07-16 | ソニー株式会社 | 固体撮像素子の制御方法 |
US7122408B2 (en) * | 2003-06-16 | 2006-10-17 | Micron Technology, Inc. | Photodiode with ultra-shallow junction for high quantum efficiency CMOS image sensor and method of formation |
-
2005
- 2005-02-07 JP JP2005030804A patent/JP4878123B2/ja active Active
-
2006
- 2006-02-02 US US11/883,757 patent/US8018515B2/en active Active
- 2006-02-02 WO PCT/JP2006/301779 patent/WO2006082896A1/ja active Application Filing
- 2006-02-02 EP EP06712922.1A patent/EP1850387B1/en active Active
- 2006-02-02 KR KR1020127025167A patent/KR101335142B1/ko active IP Right Grant
- 2006-02-02 CN CNB2006800019035A patent/CN100568519C/zh active Active
- 2006-02-02 KR KR1020077014452A patent/KR101214268B1/ko active IP Right Grant
- 2006-02-06 TW TW095103921A patent/TWI413241B/zh active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10212368B2 (en) | 2015-06-30 | 2019-02-19 | Hamamatsu Photonics K.K. | Solid-state imaging device |
Also Published As
Publication number | Publication date |
---|---|
US8018515B2 (en) | 2011-09-13 |
KR20070102496A (ko) | 2007-10-18 |
WO2006082896A1 (ja) | 2006-08-10 |
JP2006216907A (ja) | 2006-08-17 |
CN100568519C (zh) | 2009-12-09 |
KR101335142B1 (ko) | 2013-12-03 |
KR20120110159A (ko) | 2012-10-09 |
US20080192134A1 (en) | 2008-08-14 |
TW200644229A (en) | 2006-12-16 |
EP1850387A4 (en) | 2011-01-12 |
EP1850387B1 (en) | 2018-10-10 |
TWI413241B (zh) | 2013-10-21 |
KR101214268B1 (ko) | 2012-12-20 |
CN101103461A (zh) | 2008-01-09 |
EP1850387A1 (en) | 2007-10-31 |
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