JP4816836B2 - 金属用研磨液及びそれを用いた研磨方法 - Google Patents
金属用研磨液及びそれを用いた研磨方法 Download PDFInfo
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- JP4816836B2 JP4816836B2 JP35288499A JP35288499A JP4816836B2 JP 4816836 B2 JP4816836 B2 JP 4816836B2 JP 35288499 A JP35288499 A JP 35288499A JP 35288499 A JP35288499 A JP 35288499A JP 4816836 B2 JP4816836 B2 JP 4816836B2
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- Prior art keywords
- acid
- metal
- polishing
- water
- surfactant
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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- 238000005498 polishing Methods 0.000 title claims description 238
- 229910052751 metal Inorganic materials 0.000 title claims description 210
- 239000002184 metal Substances 0.000 title claims description 210
- 239000007788 liquid Substances 0.000 title claims description 141
- 238000000034 method Methods 0.000 title claims description 55
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 98
- 239000003795 chemical substances by application Substances 0.000 claims description 75
- 239000007864 aqueous solution Substances 0.000 claims description 68
- 230000001681 protective effect Effects 0.000 claims description 62
- 239000004094 surface-active agent Substances 0.000 claims description 52
- 239000007800 oxidant agent Substances 0.000 claims description 49
- 229910044991 metal oxide Inorganic materials 0.000 claims description 48
- 150000004706 metal oxides Chemical class 0.000 claims description 48
- 239000002904 solvent Substances 0.000 claims description 34
- QRUDEWIWKLJBPS-UHFFFAOYSA-N benzotriazole Chemical compound C1=CC=C2N[N][N]C2=C1 QRUDEWIWKLJBPS-UHFFFAOYSA-N 0.000 claims description 18
- 239000012964 benzotriazole Substances 0.000 claims description 18
- 229910000881 Cu alloy Inorganic materials 0.000 claims description 17
- 239000002253 acid Substances 0.000 claims description 15
- KRKNYBCHXYNGOX-UHFFFAOYSA-N citric acid Chemical compound OC(=O)CC(O)(C(O)=O)CC(O)=O KRKNYBCHXYNGOX-UHFFFAOYSA-N 0.000 claims description 15
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 14
- 229910052802 copper Inorganic materials 0.000 claims description 14
- 239000010949 copper Substances 0.000 claims description 14
- 150000003839 salts Chemical class 0.000 claims description 14
- 239000002002 slurry Substances 0.000 claims description 13
- OFOBLEOULBTSOW-UHFFFAOYSA-N Malonic acid Chemical compound OC(=O)CC(O)=O OFOBLEOULBTSOW-UHFFFAOYSA-N 0.000 claims description 11
- 239000012141 concentrate Substances 0.000 claims description 11
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 claims description 10
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 claims description 10
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 claims description 9
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 claims description 9
- FEWJPZIEWOKRBE-UHFFFAOYSA-N Tartaric acid Natural products [H+].[H+].[O-]C(=O)C(O)C(O)C([O-])=O FEWJPZIEWOKRBE-UHFFFAOYSA-N 0.000 claims description 8
- BDAGIHXWWSANSR-UHFFFAOYSA-N methanoic acid Natural products OC=O BDAGIHXWWSANSR-UHFFFAOYSA-N 0.000 claims description 8
- BJEPYKJPYRNKOW-UHFFFAOYSA-N alpha-hydroxysuccinic acid Natural products OC(=O)C(O)CC(O)=O BJEPYKJPYRNKOW-UHFFFAOYSA-N 0.000 claims description 7
- NLXLAEXVIDQMFP-UHFFFAOYSA-N Ammonia chloride Chemical compound [NH4+].[Cl-] NLXLAEXVIDQMFP-UHFFFAOYSA-N 0.000 claims description 6
- FERIUCNNQQJTOY-UHFFFAOYSA-N Butyric acid Chemical compound CCCC(O)=O FERIUCNNQQJTOY-UHFFFAOYSA-N 0.000 claims description 6
- AEMRFAOFKBGASW-UHFFFAOYSA-N Glycolic acid Chemical compound OCC(O)=O AEMRFAOFKBGASW-UHFFFAOYSA-N 0.000 claims description 6
- WNLRTRBMVRJNCN-UHFFFAOYSA-N adipic acid Chemical compound OC(=O)CCCCC(O)=O WNLRTRBMVRJNCN-UHFFFAOYSA-N 0.000 claims description 6
- 150000001408 amides Chemical class 0.000 claims description 6
- ROOXNKNUYICQNP-UHFFFAOYSA-N ammonium persulfate Chemical compound [NH4+].[NH4+].[O-]S(=O)(=O)OOS([O-])(=O)=O ROOXNKNUYICQNP-UHFFFAOYSA-N 0.000 claims description 6
- WPYMKLBDIGXBTP-UHFFFAOYSA-N benzoic acid Chemical compound OC(=O)C1=CC=CC=C1 WPYMKLBDIGXBTP-UHFFFAOYSA-N 0.000 claims description 6
- XBDQKXXYIPTUBI-UHFFFAOYSA-N dimethylselenoniopropionate Natural products CCC(O)=O XBDQKXXYIPTUBI-UHFFFAOYSA-N 0.000 claims description 6
- FUZZWVXGSFPDMH-UHFFFAOYSA-N hexanoic acid Chemical compound CCCCCC(O)=O FUZZWVXGSFPDMH-UHFFFAOYSA-N 0.000 claims description 6
- FGKJLKRYENPLQH-UHFFFAOYSA-N isocaproic acid Chemical compound CC(C)CCC(O)=O FGKJLKRYENPLQH-UHFFFAOYSA-N 0.000 claims description 6
- WWZKQHOCKIZLMA-UHFFFAOYSA-N octanoic acid Chemical compound CCCCCCCC(O)=O WWZKQHOCKIZLMA-UHFFFAOYSA-N 0.000 claims description 6
- 150000007524 organic acids Chemical class 0.000 claims description 6
- 235000005985 organic acids Nutrition 0.000 claims description 6
- XNGIFLGASWRNHJ-UHFFFAOYSA-N phthalic acid Chemical compound OC(=O)C1=CC=CC=C1C(O)=O XNGIFLGASWRNHJ-UHFFFAOYSA-N 0.000 claims description 6
- WLJVNTCWHIRURA-UHFFFAOYSA-N pimelic acid Chemical compound OC(=O)CCCCCC(O)=O WLJVNTCWHIRURA-UHFFFAOYSA-N 0.000 claims description 6
- YGSDEFSMJLZEOE-UHFFFAOYSA-N salicylic acid Chemical compound OC(=O)C1=CC=CC=C1O YGSDEFSMJLZEOE-UHFFFAOYSA-N 0.000 claims description 6
- NQPDZGIKBAWPEJ-UHFFFAOYSA-N valeric acid Chemical compound CCCCC(O)=O NQPDZGIKBAWPEJ-UHFFFAOYSA-N 0.000 claims description 6
- BJEPYKJPYRNKOW-REOHCLBHSA-N (S)-malic acid Chemical compound OC(=O)[C@@H](O)CC(O)=O BJEPYKJPYRNKOW-REOHCLBHSA-N 0.000 claims description 5
- CMGDVUCDZOBDNL-UHFFFAOYSA-N 4-methyl-2h-benzotriazole Chemical compound CC1=CC=CC2=NNN=C12 CMGDVUCDZOBDNL-UHFFFAOYSA-N 0.000 claims description 5
- FEWJPZIEWOKRBE-JCYAYHJZSA-N Dextrotartaric acid Chemical compound OC(=O)[C@H](O)[C@@H](O)C(O)=O FEWJPZIEWOKRBE-JCYAYHJZSA-N 0.000 claims description 5
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 claims description 5
- 229910021529 ammonia Inorganic materials 0.000 claims description 5
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- 229910017604 nitric acid Inorganic materials 0.000 claims description 5
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- 239000011975 tartaric acid Substances 0.000 claims description 5
- 229920002554 vinyl polymer Polymers 0.000 claims description 5
- OSWFIVFLDKOXQC-UHFFFAOYSA-N 4-(3-methoxyphenyl)aniline Chemical group COC1=CC=CC(C=2C=CC(N)=CC=2)=C1 OSWFIVFLDKOXQC-UHFFFAOYSA-N 0.000 claims description 4
- 235000019253 formic acid Nutrition 0.000 claims description 4
- 150000003460 sulfonic acids Chemical class 0.000 claims description 4
- OBETXYAYXDNJHR-SSDOTTSWSA-M (2r)-2-ethylhexanoate Chemical compound CCCC[C@@H](CC)C([O-])=O OBETXYAYXDNJHR-SSDOTTSWSA-M 0.000 claims description 3
- RBNPOMFGQQGHHO-UHFFFAOYSA-N -2,3-Dihydroxypropanoic acid Natural products OCC(O)C(O)=O RBNPOMFGQQGHHO-UHFFFAOYSA-N 0.000 claims description 3
- RTBFRGCFXZNCOE-UHFFFAOYSA-N 1-methylsulfonylpiperidin-4-one Chemical compound CS(=O)(=O)N1CCC(=O)CC1 RTBFRGCFXZNCOE-UHFFFAOYSA-N 0.000 claims description 3
- PAWQVTBBRAZDMG-UHFFFAOYSA-N 2-(3-bromo-2-fluorophenyl)acetic acid Chemical compound OC(=O)CC1=CC=CC(Br)=C1F PAWQVTBBRAZDMG-UHFFFAOYSA-N 0.000 claims description 3
- OXQGTIUCKGYOAA-UHFFFAOYSA-N 2-Ethylbutanoic acid Chemical compound CCC(CC)C(O)=O OXQGTIUCKGYOAA-UHFFFAOYSA-N 0.000 claims description 3
- WLAMNBDJUVNPJU-UHFFFAOYSA-N 2-methylbutyric acid Chemical compound CCC(C)C(O)=O WLAMNBDJUVNPJU-UHFFFAOYSA-N 0.000 claims description 3
- CVKMFSAVYPAZTQ-UHFFFAOYSA-N 2-methylhexanoic acid Chemical compound CCCCC(C)C(O)=O CVKMFSAVYPAZTQ-UHFFFAOYSA-N 0.000 claims description 3
- MLMQPDHYNJCQAO-UHFFFAOYSA-N 3,3-dimethylbutyric acid Chemical compound CC(C)(C)CC(O)=O MLMQPDHYNJCQAO-UHFFFAOYSA-N 0.000 claims description 3
- 239000005711 Benzoic acid Substances 0.000 claims description 3
- LSNNMFCWUKXFEE-UHFFFAOYSA-M Bisulfite Chemical compound OS([O-])=O LSNNMFCWUKXFEE-UHFFFAOYSA-M 0.000 claims description 3
- RBNPOMFGQQGHHO-UWTATZPHSA-N D-glyceric acid Chemical compound OC[C@@H](O)C(O)=O RBNPOMFGQQGHHO-UWTATZPHSA-N 0.000 claims description 3
- KDYFGRWQOYBRFD-UHFFFAOYSA-N Succinic acid Natural products OC(=O)CCC(O)=O KDYFGRWQOYBRFD-UHFFFAOYSA-N 0.000 claims description 3
- 235000011054 acetic acid Nutrition 0.000 claims description 3
- 239000001361 adipic acid Substances 0.000 claims description 3
- 235000011037 adipic acid Nutrition 0.000 claims description 3
- OBETXYAYXDNJHR-UHFFFAOYSA-N alpha-ethylcaproic acid Natural products CCCCC(CC)C(O)=O OBETXYAYXDNJHR-UHFFFAOYSA-N 0.000 claims description 3
- 235000019270 ammonium chloride Nutrition 0.000 claims description 3
- 229910001870 ammonium persulfate Inorganic materials 0.000 claims description 3
- JFCQEDHGNNZCLN-UHFFFAOYSA-N anhydrous glutaric acid Natural products OC(=O)CCCC(O)=O JFCQEDHGNNZCLN-UHFFFAOYSA-N 0.000 claims description 3
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- AWJWCTOOIBYHON-UHFFFAOYSA-N furo[3,4-b]pyrazine-5,7-dione Chemical compound C1=CN=C2C(=O)OC(=O)C2=N1 AWJWCTOOIBYHON-UHFFFAOYSA-N 0.000 claims description 3
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- 239000000600 sorbitol Substances 0.000 description 1
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Landscapes
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP35288499A JP4816836B2 (ja) | 1998-12-28 | 1999-12-13 | 金属用研磨液及びそれを用いた研磨方法 |
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
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| JP37260598 | 1998-12-28 | ||
| JP1998372605 | 1998-12-28 | ||
| JP10-372605 | 1998-12-28 | ||
| JP35288499A JP4816836B2 (ja) | 1998-12-28 | 1999-12-13 | 金属用研磨液及びそれを用いた研磨方法 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
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| JP2010181851A Division JP5429104B2 (ja) | 1998-12-28 | 2010-08-16 | 金属用研磨液及びそれを用いた研磨方法 |
Publications (3)
| Publication Number | Publication Date |
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| JP2000252242A JP2000252242A (ja) | 2000-09-14 |
| JP2000252242A5 JP2000252242A5 (enrdf_load_stackoverflow) | 2006-12-28 |
| JP4816836B2 true JP4816836B2 (ja) | 2011-11-16 |
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| Application Number | Title | Priority Date | Filing Date |
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| JP35288499A Expired - Lifetime JP4816836B2 (ja) | 1998-12-28 | 1999-12-13 | 金属用研磨液及びそれを用いた研磨方法 |
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Families Citing this family (21)
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| CN1243071C (zh) | 1998-12-28 | 2006-02-22 | 日立化成工业株式会社 | 金属研磨液材料、金属研磨液、其制造方法及使用它的研磨方法 |
| JP3463045B2 (ja) | 2000-03-03 | 2003-11-05 | Ｎｅｃエレクトロニクス株式会社 | 防食処理原液 |
| TWI229123B (en) | 2000-03-03 | 2005-03-11 | Nec Electronics Corp | Anticorrosive treating concentrate |
| JP4951808B2 (ja) * | 2000-10-26 | 2012-06-13 | 日立化成工業株式会社 | 金属用研磨液及び研磨方法 |
| SG144688A1 (en) * | 2001-07-23 | 2008-08-28 | Fujimi Inc | Polishing composition and polishing method employing it |
| KR20030013146A (ko) * | 2001-08-07 | 2003-02-14 | 에이스하이텍 주식회사 | 실리콘 웨이퍼 연마제 조성물과 그 제조방법 |
| KR100432637B1 (ko) * | 2001-08-07 | 2004-05-22 | 제일모직주식회사 | 구리배선 연마용 ｃｍｐ 슬러리 |
| US6936543B2 (en) * | 2002-06-07 | 2005-08-30 | Cabot Microelectronics Corporation | CMP method utilizing amphiphilic nonionic surfactants |
| JP4608196B2 (ja) * | 2003-09-30 | 2011-01-05 | 株式会社フジミインコーポレーテッド | 研磨用組成物 |
| EP1670047B1 (en) * | 2003-09-30 | 2010-04-07 | Fujimi Incorporated | Polishing composition and polishing method |
| JP2006121001A (ja) * | 2004-10-25 | 2006-05-11 | Matsushita Electric Ind Co Ltd | 半導体装置の製造方法および研磨剤 |
| US7348276B2 (en) | 2005-03-30 | 2008-03-25 | Fujitsu, Limited | Fabrication process of semiconductor device and polishing method |
| JP2007184395A (ja) * | 2006-01-06 | 2007-07-19 | Fujifilm Corp | 金属用研磨液 |
| JP5725145B2 (ja) * | 2006-10-11 | 2015-05-27 | 日立化成株式会社 | 金属用研磨液とその製造方法及び金属用研磨液を用いた被研磨膜の研磨方法 |
| JP2008124222A (ja) * | 2006-11-10 | 2008-05-29 | Fujifilm Corp | 研磨液 |
| JP5094112B2 (ja) * | 2006-12-28 | 2012-12-12 | 富士フイルム株式会社 | 研磨液 |
| JP5094139B2 (ja) * | 2007-01-23 | 2012-12-12 | 富士フイルム株式会社 | 研磨液 |
| JP5285866B2 (ja) * | 2007-03-26 | 2013-09-11 | 富士フイルム株式会社 | 研磨液 |
| JP5403922B2 (ja) | 2008-02-26 | 2014-01-29 | 富士フイルム株式会社 | 研磨液および研磨方法 |
| US10043678B2 (en) * | 2013-10-23 | 2018-08-07 | Dongjin Semichem Co., Ltd. | Metal film polishing slurry composition, and method for reducing scratches generated when polishing metal film by using same |
| CN108581814A (zh) * | 2018-05-21 | 2018-09-28 | 浙江工业大学 | 用于医用钛合金螺钉的气囊液态金属抛光机 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
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| DE3800834A1 (de) * | 1988-01-14 | 1989-07-27 | Henkel Kgaa | Verfahren und mittel zum gleichzeitigen gleitschleifen, reinigen und passivieren metallischer werkstuecke |
| JP3435698B2 (ja) * | 1992-03-11 | 2003-08-11 | 三菱瓦斯化学株式会社 | 半導体基板の洗浄液 |
| US5863838A (en) * | 1996-07-22 | 1999-01-26 | Motorola, Inc. | Method for chemically-mechanically polishing a metal layer |
| JP3291205B2 (ja) * | 1996-08-27 | 2002-06-10 | 松下電工株式会社 | 磁気研磨方法 |
| KR19980032145A (ko) * | 1996-10-04 | 1998-07-25 | 포만제프리엘 | 알루미늄 구리 합금의 화학기계적 연마시 구리 도금을 방지하는 방법 |
| US6309560B1 (en) * | 1996-12-09 | 2001-10-30 | Cabot Microelectronics Corporation | Chemical mechanical polishing slurry useful for copper substrates |
| JPH10273648A (ja) * | 1997-03-28 | 1998-10-13 | Fuji Photo Film Co Ltd | 研磨液 |
| JPH10310766A (ja) * | 1997-05-14 | 1998-11-24 | Fujimi Inkooporeetetsudo:Kk | 研磨用組成物 |
| US6217416B1 (en) * | 1998-06-26 | 2001-04-17 | Cabot Microelectronics Corporation | Chemical mechanical polishing slurry useful for copper/tantalum substrates |
| US6063306A (en) * | 1998-06-26 | 2000-05-16 | Cabot Corporation | Chemical mechanical polishing slurry useful for copper/tantalum substrate |
| JP4053165B2 (ja) * | 1998-12-01 | 2008-02-27 | 株式会社フジミインコーポレーテッド | 研磨用組成物およびそれを用いた研磨方法 |
| JP2000160139A (ja) * | 1998-12-01 | 2000-06-13 | Fujimi Inc | 研磨用組成物およびそれを用いた研磨方法 |
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1999
- 1999-12-13 JP JP35288499A patent/JP4816836B2/ja not_active Expired - Lifetime
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| Publication number | Publication date |
|---|---|
| JP2000252242A (ja) | 2000-09-14 |
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