JP4774332B2 - 偏芯量測定方法 - Google Patents

偏芯量測定方法 Download PDF

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Publication number
JP4774332B2
JP4774332B2 JP2006157198A JP2006157198A JP4774332B2 JP 4774332 B2 JP4774332 B2 JP 4774332B2 JP 2006157198 A JP2006157198 A JP 2006157198A JP 2006157198 A JP2006157198 A JP 2006157198A JP 4774332 B2 JP4774332 B2 JP 4774332B2
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Japan
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image
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light
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JP2006157198A
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English (en)
Japanese (ja)
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JP2007327771A5 (enExample
JP2007327771A (ja
Inventor
萍 孫
隆行 齋藤
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Fujifilm Corp
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Fujifilm Corp
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Priority to JP2006157198A priority Critical patent/JP4774332B2/ja
Priority to KR1020070051119A priority patent/KR100923059B1/ko
Priority to TW096119269A priority patent/TW200745506A/zh
Priority to CNB2007101088518A priority patent/CN100567888C/zh
Publication of JP2007327771A publication Critical patent/JP2007327771A/ja
Publication of JP2007327771A5 publication Critical patent/JP2007327771A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G01M11/0264—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0221—Testing optical properties by determining the optical axis or position of lenses

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP2006157198A 2006-06-06 2006-06-06 偏芯量測定方法 Expired - Fee Related JP4774332B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2006157198A JP4774332B2 (ja) 2006-06-06 2006-06-06 偏芯量測定方法
KR1020070051119A KR100923059B1 (ko) 2006-06-06 2007-05-25 편심량 측정 방법
TW096119269A TW200745506A (en) 2006-06-06 2007-05-30 Method of measuring amount of eccentricity
CNB2007101088518A CN100567888C (zh) 2006-06-06 2007-06-05 偏心量测定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006157198A JP4774332B2 (ja) 2006-06-06 2006-06-06 偏芯量測定方法

Publications (3)

Publication Number Publication Date
JP2007327771A JP2007327771A (ja) 2007-12-20
JP2007327771A5 JP2007327771A5 (enExample) 2009-07-09
JP4774332B2 true JP4774332B2 (ja) 2011-09-14

Family

ID=38928343

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006157198A Expired - Fee Related JP4774332B2 (ja) 2006-06-06 2006-06-06 偏芯量測定方法

Country Status (4)

Country Link
JP (1) JP4774332B2 (enExample)
KR (1) KR100923059B1 (enExample)
CN (1) CN100567888C (enExample)
TW (1) TW200745506A (enExample)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5362431B2 (ja) * 2008-06-10 2013-12-11 富士フイルム株式会社 偏芯量測定方法
JP5359048B2 (ja) * 2008-06-20 2013-12-04 株式会社ニコン 偏芯測定装置および偏芯測定方法
JP5317619B2 (ja) * 2008-10-06 2013-10-16 富士フイルム株式会社 偏芯量測定方法
JP2010230578A (ja) 2009-03-27 2010-10-14 Fujifilm Corp 偏芯量測定方法
JP2010281792A (ja) * 2009-06-08 2010-12-16 Fujifilm Corp 非球面体測定方法および装置
JP5222796B2 (ja) * 2009-06-08 2013-06-26 富士フイルム株式会社 光学素子の偏芯調整組立方法および偏芯調整組立装置
JP2011069797A (ja) * 2009-09-28 2011-04-07 Saxa Inc 変位量測定装置及び変位量測定方法
JP6075993B2 (ja) * 2012-08-02 2017-02-08 株式会社ディスコ 板状ワーク中心検出方法
CN102879182B (zh) * 2012-09-27 2014-12-24 中国科学院长春光学精密机械与物理研究所 采用激光跟踪仪检测离轴非球面偏心量的方法
CN104101482B (zh) * 2013-04-10 2016-08-10 致茂电子(苏州)有限公司 发光模块检测装置以及发光模块检测方法
CN103940377B (zh) * 2014-03-26 2017-01-04 中国科学院长春光学精密机械与物理研究所 光学镜头球心偏差测量装置
KR101538129B1 (ko) * 2014-10-24 2015-07-23 한국표준과학연구원 검안용 굴절력계용 표준렌즈
CN104406547B (zh) * 2014-12-09 2017-11-07 上海新跃仪表厂 一种光学零件的偏心量测量装置及其测量方法
JP6218261B2 (ja) 2015-10-23 2017-10-25 株式会社カツラ・オプト・システムズ 光学素子特性測定装置
CN107339955B (zh) * 2017-01-07 2020-11-13 深圳市灿锐科技有限公司 一种高精度透镜中心偏检测仪器及其测量方法
CN107843213B (zh) * 2017-10-23 2020-06-16 北京理工大学 共焦自准直中心偏和曲率半径测量方法与装置
CN109946046B (zh) * 2017-12-21 2022-01-07 宁波舜宇车载光学技术有限公司 偏心测试装置及方法
WO2019176805A1 (ja) * 2018-03-12 2019-09-19 富士フイルム株式会社 偏芯測定装置及び方法
CN110595736A (zh) * 2019-08-20 2019-12-20 扬州辰亚光学科技有限公司 一种光学零件的偏心量测量装置
CN114216362B (zh) * 2021-12-15 2023-09-15 中国科学院合肥物质科学研究院 一种基于图像处理自动测量校靶镜机械轴线偏差的方法
CN117405358B (zh) * 2023-08-29 2024-07-19 河南微米光学科技有限公司 分离式光学透镜偏心仪

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2842310B2 (ja) * 1995-07-27 1999-01-06 日本電気株式会社 光モジュール光軸調整装置及び方法
JP3414975B2 (ja) * 1997-03-06 2003-06-09 日立電子エンジニアリング株式会社 位置ずれ量測定装置
JP4425449B2 (ja) * 2000-09-28 2010-03-03 フジノン株式会社 斜入射干渉計装置
JP2004309514A (ja) * 2003-04-01 2004-11-04 Pulstec Industrial Co Ltd ピンホール素子および同素子を用いた光学装置
JP2005024254A (ja) * 2003-06-30 2005-01-27 Mitsutoyo Corp 情報処理装置、情報処理装置の校正方法、情報処理プログラム、このプログラムを記録した記録媒体、偏芯測定装置
JP2005055202A (ja) * 2003-08-06 2005-03-03 Mitsutoyo Corp 偏芯測定装置、レンズ取付方法およびレンズ偏芯検査方法
JP4474150B2 (ja) * 2003-11-28 2010-06-02 キヤノン株式会社 偏心測定方法
JP4555021B2 (ja) 2004-08-04 2010-09-29 株式会社 ソキア・トプコン 測量機検査方法及びこの検査方法に使用するコリメータ

Also Published As

Publication number Publication date
KR100923059B1 (ko) 2009-10-22
KR20070116721A (ko) 2007-12-11
CN101086445A (zh) 2007-12-12
JP2007327771A (ja) 2007-12-20
TWI327639B (enExample) 2010-07-21
CN100567888C (zh) 2009-12-09
TW200745506A (en) 2007-12-16

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