JP4761868B2 - スパッタリングターゲット、その製造方法及び透明導電膜 - Google Patents
スパッタリングターゲット、その製造方法及び透明導電膜 Download PDFInfo
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- JP4761868B2 JP4761868B2 JP2005217432A JP2005217432A JP4761868B2 JP 4761868 B2 JP4761868 B2 JP 4761868B2 JP 2005217432 A JP2005217432 A JP 2005217432A JP 2005217432 A JP2005217432 A JP 2005217432A JP 4761868 B2 JP4761868 B2 JP 4761868B2
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- sputtering target
- target
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- sputtering
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- 238000005477 sputtering target Methods 0.000 title claims description 59
- 238000004519 manufacturing process Methods 0.000 title claims description 9
- 239000011701 zinc Substances 0.000 claims description 42
- 239000002184 metal Substances 0.000 claims description 40
- 229910052751 metal Inorganic materials 0.000 claims description 40
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 23
- 229910052738 indium Inorganic materials 0.000 claims description 20
- 239000000843 powder Substances 0.000 claims description 20
- 229910052760 oxygen Inorganic materials 0.000 claims description 15
- 229910052718 tin Inorganic materials 0.000 claims description 14
- 229910052725 zinc Inorganic materials 0.000 claims description 13
- 239000011787 zinc oxide Substances 0.000 claims description 11
- 150000004706 metal oxides Chemical class 0.000 claims description 9
- 229910044991 metal oxide Inorganic materials 0.000 claims description 8
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 claims description 6
- 229910001887 tin oxide Inorganic materials 0.000 claims description 6
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims description 4
- 238000005530 etching Methods 0.000 claims description 4
- 238000000034 method Methods 0.000 claims description 4
- 238000002156 mixing Methods 0.000 claims description 4
- 150000001875 compounds Chemical class 0.000 claims description 3
- 229910003437 indium oxide Inorganic materials 0.000 claims description 3
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 claims description 3
- OYQCBJZGELKKPM-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O-2].[Zn+2].[O-2].[In+3] OYQCBJZGELKKPM-UHFFFAOYSA-N 0.000 claims description 2
- 239000010408 film Substances 0.000 description 35
- 229910045601 alloy Inorganic materials 0.000 description 19
- 239000000956 alloy Substances 0.000 description 19
- 238000004544 sputter deposition Methods 0.000 description 19
- 125000004429 atom Chemical group 0.000 description 13
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 12
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 12
- 239000001301 oxygen Substances 0.000 description 11
- 239000007789 gas Substances 0.000 description 9
- 238000005245 sintering Methods 0.000 description 9
- 239000000203 mixture Substances 0.000 description 7
- 125000004430 oxygen atom Chemical group O* 0.000 description 7
- 238000002441 X-ray diffraction Methods 0.000 description 6
- 238000004453 electron probe microanalysis Methods 0.000 description 6
- 239000002245 particle Substances 0.000 description 6
- 230000015572 biosynthetic process Effects 0.000 description 5
- 239000002994 raw material Substances 0.000 description 4
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 3
- 238000005401 electroluminescence Methods 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- 239000011812 mixed powder Substances 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- 238000002834 transmittance Methods 0.000 description 3
- CPLXHLVBOLITMK-UHFFFAOYSA-N Magnesium oxide Chemical compound [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- 229910006404 SnO 2 Inorganic materials 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 238000009694 cold isostatic pressing Methods 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 2
- -1 etc.) Substances 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 238000005211 surface analysis Methods 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 1
- 238000007088 Archimedes method Methods 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910052684 Cerium Inorganic materials 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 1
- 229910052693 Europium Inorganic materials 0.000 description 1
- 229910052779 Neodymium Inorganic materials 0.000 description 1
- 239000004698 Polyethylene Substances 0.000 description 1
- 241000283984 Rodentia Species 0.000 description 1
- 229910052772 Samarium Inorganic materials 0.000 description 1
- 241000519995 Stachys sylvatica Species 0.000 description 1
- 235000021355 Stearic acid Nutrition 0.000 description 1
- KKEYTLVFLSCKDE-UHFFFAOYSA-N [Sn+2]=O.[O-2].[Zn+2].[O-2] Chemical compound [Sn+2]=O.[O-2].[Zn+2].[O-2] KKEYTLVFLSCKDE-UHFFFAOYSA-N 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000001133 acceleration Effects 0.000 description 1
- 239000008186 active pharmaceutical agent Substances 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000000149 argon plasma sintering Methods 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 229910052793 cadmium Inorganic materials 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000000280 densification Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 239000002270 dispersing agent Substances 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010894 electron beam technology Methods 0.000 description 1
- 239000000839 emulsion Substances 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910002804 graphite Inorganic materials 0.000 description 1
- 239000010439 graphite Substances 0.000 description 1
- 238000010438 heat treatment Methods 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 239000000314 lubricant Substances 0.000 description 1
- 239000000395 magnesium oxide Substances 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000000155 melt Substances 0.000 description 1
- 238000000465 moulding Methods 0.000 description 1
- QIQXTHQIDYTFRH-UHFFFAOYSA-N octadecanoic acid Chemical compound CCCCCCCCCCCCCCCCCC(O)=O QIQXTHQIDYTFRH-UHFFFAOYSA-N 0.000 description 1
- OQCDKBAXFALNLD-UHFFFAOYSA-N octadecanoic acid Natural products CCCCCCCC(C)CCCCCCCCC(O)=O OQCDKBAXFALNLD-UHFFFAOYSA-N 0.000 description 1
- 235000006408 oxalic acid Nutrition 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 238000001028 reflection method Methods 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000000790 scattering method Methods 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000010944 silver (metal) Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 239000008117 stearic acid Substances 0.000 description 1
- 238000000092 stir-bar solid-phase extraction Methods 0.000 description 1
- 230000001988 toxicity Effects 0.000 description 1
- 231100000419 toxicity Toxicity 0.000 description 1
- RUDFQVOCFDJEEF-UHFFFAOYSA-N yttrium(III) oxide Inorganic materials [O-2].[O-2].[O-2].[Y+3].[Y+3] RUDFQVOCFDJEEF-UHFFFAOYSA-N 0.000 description 1
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
- C23C14/3414—Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
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- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
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- C04B35/453—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zinc, tin, or bismuth oxides or solid solutions thereof with other oxides, e.g. zincates, stannates or bismuthates
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- C04B35/457—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zinc, tin, or bismuth oxides or solid solutions thereof with other oxides, e.g. zincates, stannates or bismuthates based on tin oxides or stannates
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- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
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- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
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- C04B2235/3293—Tin oxides, stannates or oxide forming salts thereof, e.g. indium tin oxide [ITO]
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Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005217432A JP4761868B2 (ja) | 2005-07-27 | 2005-07-27 | スパッタリングターゲット、その製造方法及び透明導電膜 |
KR1020087002030A KR101302332B1 (ko) | 2005-07-27 | 2006-07-24 | 스퍼터링 타겟, 그의 제조 방법 및 투명 도전막 |
CN2006800269295A CN101233258B (zh) | 2005-07-27 | 2006-07-24 | 溅射靶、其制造方法以及透明导电膜 |
PCT/JP2006/314550 WO2007013387A1 (ja) | 2005-07-27 | 2006-07-24 | スパッタリングターゲット、その製造方法及び透明導電膜 |
TW095127511A TWI394852B (zh) | 2005-07-27 | 2006-07-27 | A sputtering target, a method for manufacturing the same, and a transparent conductive film |
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KR (1) | KR101302332B1 (zh) |
CN (1) | CN101233258B (zh) |
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JP4552950B2 (ja) | 2006-03-15 | 2010-09-29 | 住友金属鉱山株式会社 | ターゲット用酸化物焼結体、その製造方法、それを用いた透明導電膜の製造方法、及び得られる透明導電膜 |
CN103274608A (zh) | 2007-05-07 | 2013-09-04 | 出光兴产株式会社 | 半导体薄膜、半导体薄膜的制备方法和半导体元件 |
JPWO2009078329A1 (ja) * | 2007-12-19 | 2011-04-28 | 日立金属株式会社 | 酸化亜鉛焼結体およびその製造方法、スパッタリングターゲット、電極 |
JP4982423B2 (ja) * | 2008-04-24 | 2012-07-25 | 株式会社日立製作所 | 酸化亜鉛薄膜形成用スパッタターゲットと、それを用いて得られる酸化亜鉛薄膜を有する表示素子及び太陽電池 |
CN104926289A (zh) * | 2008-12-12 | 2015-09-23 | 出光兴产株式会社 | 复合氧化物烧结体及由其构成的溅射靶 |
CN101775576A (zh) * | 2009-01-12 | 2010-07-14 | 上海广电电子股份有限公司 | ZnO基粉末-金属复合溅射靶材及其制备方法 |
TW201112265A (en) * | 2009-09-22 | 2011-04-01 | chuan-sheng Lv | Method of manufacturing transparent conductive thin films for flexible polymer substrate and transparent conductive thin films |
JP4875135B2 (ja) * | 2009-11-18 | 2012-02-15 | 出光興産株式会社 | In−Ga−Zn−O系スパッタリングターゲット |
JP5545448B2 (ja) * | 2010-09-29 | 2014-07-09 | 三菱マテリアル株式会社 | スパッタリングターゲット |
JP5651095B2 (ja) | 2010-11-16 | 2015-01-07 | 株式会社コベルコ科研 | 酸化物焼結体およびスパッタリングターゲット |
JP5460619B2 (ja) * | 2011-01-13 | 2014-04-02 | 住友重機械工業株式会社 | ターゲット、およびこれを備えた成膜装置 |
JP6212869B2 (ja) * | 2012-02-06 | 2017-10-18 | 三菱マテリアル株式会社 | 酸化物スパッタリングターゲット |
JP2012229490A (ja) * | 2012-07-12 | 2012-11-22 | Fujifilm Corp | 成膜方法 |
JP2014167163A (ja) * | 2013-01-31 | 2014-09-11 | Nitto Denko Corp | 赤外線反射フィルムの製造方法 |
JP2014167162A (ja) * | 2013-01-31 | 2014-09-11 | Nitto Denko Corp | 赤外線反射フィルムの製造方法 |
CN103304220B (zh) * | 2013-06-04 | 2014-10-22 | 信利半导体有限公司 | 靶材及其制备方法、显示装置 |
JP6282142B2 (ja) * | 2014-03-03 | 2018-02-21 | 日東電工株式会社 | 赤外線反射基板およびその製造方法 |
JP6159867B1 (ja) * | 2016-12-22 | 2017-07-05 | Jx金属株式会社 | 透明導電膜形成用ターゲット、透明導電膜形成用ターゲットの製造方法及び透明導電膜の製造方法 |
JP6859841B2 (ja) * | 2017-05-12 | 2021-04-14 | 住友金属鉱山株式会社 | Sn−Zn−O系酸化物焼結体とその製造方法 |
KR102192713B1 (ko) * | 2018-09-08 | 2020-12-17 | 바짐테크놀로지 주식회사 | 박막 증착용 스퍼터링 타겟 조성물 및 이의 제조방법 |
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- 2006-07-24 CN CN2006800269295A patent/CN101233258B/zh not_active Expired - Fee Related
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KR101302332B1 (ko) | 2013-08-30 |
JP2007031786A (ja) | 2007-02-08 |
TW200714724A (en) | 2007-04-16 |
CN101233258B (zh) | 2010-08-18 |
KR20080032121A (ko) | 2008-04-14 |
CN101233258A (zh) | 2008-07-30 |
TWI394852B (zh) | 2013-05-01 |
WO2007013387A1 (ja) | 2007-02-01 |
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