JP4481410B2 - Ｘ線ｃｔ用二次元検出器、ｘ線ｃｔ用二次元検出器の製造方法及びｘ線ｃｔスキャナ - Google Patents

Ｘ線ｃｔ用二次元検出器、ｘ線ｃｔ用二次元検出器の製造方法及びｘ線ｃｔスキャナ Download PDF

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JP4481410B2
JP4481410B2 JP2000024579A JP2000024579A JP4481410B2 JP 4481410 B2 JP4481410 B2 JP 4481410B2 JP 2000024579 A JP2000024579 A JP 2000024579A JP 2000024579 A JP2000024579 A JP 2000024579A JP 4481410 B2 JP4481410 B2 JP 4481410B2
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substrate
ray
data collection
photodiode
scintillator
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JP2001215281A (ja
JP2001215281A5 (enExample
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美和 深澤
武史 宮城
真知子 小野
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Toshiba Corp
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JP2000024579A 2000-02-02 2000-02-02 Ｘ線ｃｔ用二次元検出器、ｘ線ｃｔ用二次元検出器の製造方法及びｘ線ｃｔスキャナ Expired - Lifetime JP4481410B2 (ja)

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JP2000024579A JP4481410B2 (ja) 2000-02-02 2000-02-02 Ｘ線ｃｔ用二次元検出器、ｘ線ｃｔ用二次元検出器の製造方法及びｘ線ｃｔスキャナ

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JP2001215281A5 JP2001215281A5 (enExample) 2007-03-22
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007298530A (ja) * 2000-08-14 2007-11-15 Toshiba Corp 放射線検出器、放射線検出システム、ｘ線コンピュータトモグラフィ装置

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3947376B2 (ja) * 2001-09-25 2007-07-18 株式会社日立メディコ Ｘ線ｃｔ装置
US20040022351A1 (en) * 2002-07-30 2004-02-05 Ge Medical Systems Global Technology Company, Llc Thermoelectrically controlled x-ray detector array
JP2004219318A (ja) * 2003-01-16 2004-08-05 Hamamatsu Photonics Kk 放射線検出器
JP4427282B2 (ja) * 2003-07-18 2010-03-03 株式会社東芝 コンピュータ断層撮影装置のｘ線検出器システム
US20050286682A1 (en) * 2004-06-29 2005-12-29 General Electric Company Detector for radiation imaging systems
US7208741B2 (en) 2004-11-26 2007-04-24 Kabushiki Kaisha Toshiba X-ray computed tomography scanner and x-ray detecting system
JP2007136050A (ja) * 2005-11-22 2007-06-07 National Univ Corp Shizuoka Univ Ｘ線検出器アレイ
US7586096B2 (en) * 2006-11-17 2009-09-08 General Electric Company Interface assembly for thermally coupling a data acquisition system to a sensor array
JP5184848B2 (ja) * 2007-08-31 2013-04-17 株式会社東芝 Ｘ線ｃｔ装置
JP2009089867A (ja) * 2007-10-09 2009-04-30 Hitachi Medical Corp Ｘ線ｃｔ装置
US8532250B2 (en) * 2010-02-24 2013-09-10 Kabushiki Kaisha Toshiba X-ray CT apparatus and control method for X-ray CT apparatus
JP5450188B2 (ja) * 2010-03-16 2014-03-26 株式会社東芝 放射線検出装置、放射線検出装置の製造方法および画像撮影装置
JP5661325B2 (ja) 2010-04-20 2015-01-28 株式会社東芝 Ｘ線ｃｔ装置
JP5595804B2 (ja) * 2010-06-21 2014-09-24 株式会社東芝 Ｘ線ｃｔ装置
JP5613487B2 (ja) * 2010-07-22 2014-10-22 株式会社東芝 Ｘ線ｃｔ装置
CN102639061B (zh) 2010-10-20 2015-11-25 株式会社东芝 Das检测器以及x射线计算机断层摄影装置
JP2013170922A (ja) * 2012-02-21 2013-09-02 Ge Medical Systems Global Technology Co Llc 放射線検出装置および放射線撮影装置
RU2689257C1 (ru) * 2014-09-26 2019-05-24 Конинклейке Филипс Н.В. Детектор излучения с нагревательным устройством
JP6559977B2 (ja) 2015-03-05 2019-08-14 キヤノンメディカルシステムズ株式会社 検出器パック、ｘ線ｃｔ装置
JP6793501B2 (ja) * 2015-09-30 2020-12-02 キヤノンメディカルシステムズ株式会社 放射線診断装置
JP2021016073A (ja) 2019-07-11 2021-02-12 キヤノンメディカルシステムズ株式会社 変換器アレイ、検出器およびフォトダイオードアレイ
CN112998730A (zh) * 2019-12-18 2021-06-22 上海联影医疗科技股份有限公司 Ct探测器模块以及ct探测器

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007298530A (ja) * 2000-08-14 2007-11-15 Toshiba Corp 放射線検出器、放射線検出システム、ｘ線コンピュータトモグラフィ装置

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