JP4426438B2 - トランジスタの製造方法 - Google Patents
トランジスタの製造方法 Download PDFInfo
- Publication number
- JP4426438B2 JP4426438B2 JP2004502343A JP2004502343A JP4426438B2 JP 4426438 B2 JP4426438 B2 JP 4426438B2 JP 2004502343 A JP2004502343 A JP 2004502343A JP 2004502343 A JP2004502343 A JP 2004502343A JP 4426438 B2 JP4426438 B2 JP 4426438B2
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- shadow mask
- source
- aperture
- feature
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/04—Coating on selected surface areas, e.g. using masks
- C23C14/042—Coating on selected surface areas, e.g. using masks using masks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/01—Manufacture or treatment
- H10D30/021—Manufacture or treatment of FETs having insulated gates [IGFET]
- H10D30/031—Manufacture or treatment of FETs having insulated gates [IGFET] of thin-film transistors [TFT]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K10/00—Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
- H10K10/40—Organic transistors
- H10K10/46—Field-effect transistors, e.g. organic thin-film transistors [OTFT]
- H10K10/462—Insulated gate field-effect transistors [IGFETs]
- H10K10/466—Lateral bottom-gate IGFETs comprising only a single gate
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/16—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering
- H10K71/164—Deposition of organic active material using physical vapour deposition [PVD], e.g. vacuum deposition or sputtering using vacuum deposition
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/18—Deposition of organic active material using non-liquid printing techniques, e.g. thermal transfer printing from a donor sheet
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/20—Changing the shape of the active layer in the devices, e.g. patterning
- H10K71/221—Changing the shape of the active layer in the devices, e.g. patterning by lift-off techniques
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/60—Forming conductive regions or layers, e.g. electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/10—Organic polymers or oligomers
- H10K85/111—Organic polymers or oligomers comprising aromatic, heteroaromatic, or aryl chains, e.g. polyaniline, polyphenylene or polyphenylene vinylene
- H10K85/113—Heteroaromatic compounds comprising sulfur or selene, e.g. polythiophene
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02172—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides
- H01L21/02197—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material containing at least one metal element, e.g. metal oxides, metal nitrides, metal oxynitrides or metal carbides the material having a perovskite structure, e.g. BaTiO3
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/10—Organic polymers or oligomers
- H10K85/111—Organic polymers or oligomers comprising aromatic, heteroaromatic, or aryl chains, e.g. polyaniline, polyphenylene or polyphenylene vinylene
- H10K85/113—Heteroaromatic compounds comprising sulfur or selene, e.g. polythiophene
- H10K85/1135—Polyethylene dioxythiophene [PEDOT]; Derivatives thereof
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/20—Carbon compounds, e.g. carbon nanotubes or fullerenes
- H10K85/211—Fullerenes, e.g. C60
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/30—Coordination compounds
- H10K85/311—Phthalocyanine
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/60—Organic compounds having low molecular weight
- H10K85/615—Polycyclic condensed aromatic hydrocarbons, e.g. anthracene
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/942—Masking
- Y10S438/943—Movable
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/942—Masking
- Y10S438/944—Shadow
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Nanotechnology (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- Organic Chemistry (AREA)
- Metallurgy (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mathematical Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Theoretical Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Thin Film Transistor (AREA)
- Electrodes Of Semiconductors (AREA)
- Junction Field-Effect Transistors (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Control Of Motors That Do Not Use Commutators (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/137,562 US6667215B2 (en) | 2002-05-02 | 2002-05-02 | Method of making transistors |
| PCT/US2003/012022 WO2003094219A1 (en) | 2002-05-02 | 2003-04-17 | Method of making transistors |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005531131A JP2005531131A (ja) | 2005-10-13 |
| JP2005531131A5 JP2005531131A5 (enExample) | 2006-06-15 |
| JP4426438B2 true JP4426438B2 (ja) | 2010-03-03 |
Family
ID=29269106
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004502343A Expired - Fee Related JP4426438B2 (ja) | 2002-05-02 | 2003-04-17 | トランジスタの製造方法 |
Country Status (9)
| Country | Link |
|---|---|
| US (2) | US6667215B2 (enExample) |
| EP (1) | EP1502295B1 (enExample) |
| JP (1) | JP4426438B2 (enExample) |
| KR (1) | KR20040105251A (enExample) |
| CN (1) | CN100372082C (enExample) |
| AT (1) | ATE442673T1 (enExample) |
| AU (1) | AU2003226425A1 (enExample) |
| DE (1) | DE60329177D1 (enExample) |
| WO (1) | WO2003094219A1 (enExample) |
Families Citing this family (43)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6897164B2 (en) * | 2002-02-14 | 2005-05-24 | 3M Innovative Properties Company | Aperture masks for circuit fabrication |
| US20030151118A1 (en) * | 2002-02-14 | 2003-08-14 | 3M Innovative Properties Company | Aperture masks for circuit fabrication |
| US6821348B2 (en) * | 2002-02-14 | 2004-11-23 | 3M Innovative Properties Company | In-line deposition processes for circuit fabrication |
| EP1355359B1 (de) * | 2002-03-19 | 2007-04-04 | Scheuten Glasgroep | Selbstjustierende Serienverschaltung von Dünn- und Dickschichten und Verfahren zur Herstellung |
| EP1357602A1 (de) * | 2002-03-19 | 2003-10-29 | Scheuten Glasgroep | Selbstjustierende Serienverschaltung von Dünnschichten und Verfahren zur Herstellung |
| DE10212878B4 (de) * | 2002-03-22 | 2007-11-29 | Qimonda Ag | Halbleiterschaltungsanordnung und Halbleiterspeichereinrichtung |
| US6784017B2 (en) * | 2002-08-12 | 2004-08-31 | Precision Dynamics Corporation | Method of creating a high performance organic semiconductor device |
| JP2004319964A (ja) * | 2003-03-28 | 2004-11-11 | Mitsubishi Electric Corp | 半導体装置及びその製造方法 |
| US7556982B2 (en) * | 2003-08-07 | 2009-07-07 | Uchicago Argonne, Llc | Method to grow pure nanocrystalline diamond films at low temperatures and high deposition rates |
| US7459839B2 (en) * | 2003-12-05 | 2008-12-02 | Zhidan Li Tolt | Low voltage electron source with self aligned gate apertures, and luminous display using the electron source |
| US7078937B2 (en) * | 2003-12-17 | 2006-07-18 | 3M Innovative Properties Company | Logic circuitry powered by partially rectified ac waveform |
| US7772063B2 (en) * | 2004-08-11 | 2010-08-10 | Identifi Technologies, Inc. | Reduced-step CMOS processes for low-cost radio frequency identification devices |
| KR101090250B1 (ko) * | 2004-10-15 | 2011-12-06 | 삼성전자주식회사 | 유기 반도체를 이용한 박막 트랜지스터 표시판 및 그 제조방법 |
| ATE518259T1 (de) * | 2004-11-09 | 2011-08-15 | Creator Technology Bv | Selbstausgerichtetes verfahren zur herstellung organischer transistoren |
| US20060105550A1 (en) * | 2004-11-17 | 2006-05-18 | Manish Sharma | Method of depositing material on a substrate for a device |
| DE102004059467A1 (de) * | 2004-12-10 | 2006-07-20 | Polyic Gmbh & Co. Kg | Gatter aus organischen Feldeffekttransistoren |
| US20060128165A1 (en) * | 2004-12-13 | 2006-06-15 | 3M Innovative Properties Company | Method for patterning surface modification |
| JP4938984B2 (ja) * | 2005-02-02 | 2012-05-23 | 独立行政法人理化学研究所 | トップコンタクト型電界効果トランジスタの製造方法およびトップコンタクト型電界効果トランジスタ |
| KR20060104092A (ko) * | 2005-03-29 | 2006-10-09 | 삼성전자주식회사 | 유기 박막 트랜지스터 표시판 및 그 제조 방법 |
| US7410907B2 (en) * | 2005-03-31 | 2008-08-12 | Lucent Technologies Inc. | Fabricating integrated devices using embedded masks |
| EP1727219B1 (en) | 2005-05-25 | 2014-05-07 | Samsung SDI Germany GmbH | Organic thin film transistor and method for producing the same |
| US7615501B2 (en) * | 2005-08-11 | 2009-11-10 | 3M Innovative Properties Company | Method for making a thin film layer |
| JP5078246B2 (ja) * | 2005-09-29 | 2012-11-21 | 株式会社半導体エネルギー研究所 | 半導体装置、及び半導体装置の作製方法 |
| US8414962B2 (en) | 2005-10-28 | 2013-04-09 | The Penn State Research Foundation | Microcontact printed thin film capacitors |
| JP4722679B2 (ja) * | 2005-11-11 | 2011-07-13 | 日本電信電話株式会社 | 電極の製造方法及び素子の製造方法 |
| US20080187651A1 (en) * | 2006-10-24 | 2008-08-07 | 3M Innovative Properties Company | Conductive ink formulations |
| US20080171422A1 (en) * | 2007-01-11 | 2008-07-17 | Tokie Jeffrey H | Apparatus and methods for fabrication of thin film electronic devices and circuits |
| US7960708B2 (en) * | 2007-03-13 | 2011-06-14 | University Of Houston | Device and method for manufacturing a particulate filter with regularly spaced micropores |
| WO2008117362A1 (ja) * | 2007-03-23 | 2008-10-02 | Pioneer Corporation | 有機トランジスタ及びその製造方法 |
| JP2010532096A (ja) * | 2007-06-28 | 2010-09-30 | スリーエム イノベイティブ プロパティズ カンパニー | ゲート構造体を形成する方法 |
| US20090111086A1 (en) * | 2007-10-18 | 2009-04-30 | Katz Howard E | Kit for facile deposition and evaluation of semiconductor devices |
| KR20100054630A (ko) * | 2008-11-14 | 2010-05-25 | 엘지디스플레이 주식회사 | 유기 박막 트랜지스터와 이의 제조방법 그리고 이를 이용한표시장치 |
| US9625878B2 (en) | 2009-03-10 | 2017-04-18 | Drexel University | Dynamic time multiplexing fabrication of holographic polymer dispersed liquid crystals for increased wavelength sensitivity |
| WO2012058652A2 (en) | 2010-10-29 | 2012-05-03 | Drexel University | Tunable electro-optic filter stack |
| CN102379042B (zh) * | 2009-04-10 | 2015-04-29 | 三菱化学株式会社 | 场效应晶体管、其制造方法以及使用了该场效应晶体管的电子器件 |
| JPWO2012086609A1 (ja) * | 2010-12-22 | 2014-05-22 | 三菱化学株式会社 | 電界効果トランジスタ、その製造方法及びそれを有する電子デバイス |
| WO2013165599A1 (en) * | 2012-04-30 | 2013-11-07 | California Institute Of Technology | High-lead count implant device and method of making the same |
| US10008443B2 (en) | 2012-04-30 | 2018-06-26 | California Institute Of Technology | Implant device |
| US9781842B2 (en) | 2013-08-05 | 2017-10-03 | California Institute Of Technology | Long-term packaging for the protection of implant electronics |
| US10274819B2 (en) * | 2015-02-05 | 2019-04-30 | Taiwan Semiconductor Manufacturing Company, Ltd. | EUV pellicle fabrication methods and structures thereof |
| CN108024851A (zh) * | 2015-08-28 | 2018-05-11 | 加州理工学院 | 植入装置及其制造方法 |
| CN108735915B (zh) * | 2017-04-14 | 2021-02-09 | 上海视涯技术有限公司 | 用于oled蒸镀的荫罩及其制作方法、oled面板的制作方法 |
| WO2019063074A1 (en) * | 2017-09-27 | 2019-04-04 | Applied Materials, Inc. | MASK ARRANGEMENT FOR MASKING A SUBSTRATE, SUBSTRATE PROCESSING APPARATUS AND METHOD THEREOF |
Family Cites Families (48)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US105365A (en) * | 1870-07-12 | Improvement in corn-planter | ||
| US195929A (en) * | 1877-10-09 | Improvement in take-ups for knitting-machines | ||
| US150384A (en) * | 1874-04-28 | Improvement in valve-motions | ||
| US100779A (en) * | 1870-03-15 | Improved animal-trap | ||
| US151118A (en) * | 1874-05-19 | Improvement in carrbkakes | ||
| US152691A (en) * | 1874-06-30 | Improvement in ironing-boards | ||
| US3851379A (en) * | 1973-05-16 | 1974-12-03 | Westinghouse Electric Corp | Solid state components |
| US4065781A (en) * | 1974-06-21 | 1977-12-27 | Westinghouse Electric Corporation | Insulated-gate thin film transistor with low leakage current |
| NL7413977A (nl) * | 1974-10-25 | 1976-04-27 | Philips Nv | Aanbrengen van een geleiderlaagpatroon met op een geringe onderlinge afstand gelegen delen, in het bijzonder bij de vervaardiging van half- geleiderinrichtingen. |
| JPS52147063A (en) * | 1976-06-02 | 1977-12-07 | Toshiba Corp | Semiconductor electrode forming method |
| JPS5462984A (en) * | 1978-09-22 | 1979-05-21 | Hitachi Ltd | Masking deposition method |
| US4262296A (en) * | 1979-07-27 | 1981-04-14 | General Electric Company | Vertical field effect transistor with improved gate and channel structure |
| DE3128982C2 (de) * | 1981-07-22 | 1985-12-12 | Siemens AG, 1000 Berlin und 8000 München | Verfahren zur Herstellung mindestens eines Josephson-Tunnelelementes |
| US4469719A (en) * | 1981-12-21 | 1984-09-04 | Applied Magnetics-Magnetic Head Divison Corporation | Method for controlling the edge gradient of a layer of deposition material |
| DE3604368A1 (de) * | 1985-02-13 | 1986-08-14 | Sharp K.K., Osaka | Verfahren zur herstellung eines duennfilm-transistors |
| US4776868A (en) * | 1985-09-09 | 1988-10-11 | Corning Glass Works | Lenses and lens arrays |
| US4679311A (en) * | 1985-12-12 | 1987-07-14 | Allied Corporation | Method of fabricating self-aligned field-effect transistor having t-shaped gate electrode, sub-micron gate length and variable drain to gate spacing |
| US4883770A (en) * | 1986-09-19 | 1989-11-28 | Hewlett-Packard Company | Selective NIPI doping super lattice contacts and other semiconductor device structures formed by shadow masking fabrication |
| JPS63172121A (ja) * | 1987-01-09 | 1988-07-15 | Matsushita Electric Ind Co Ltd | 液晶表示パネルの製造法 |
| JP2813428B2 (ja) * | 1989-08-17 | 1998-10-22 | 三菱電機株式会社 | 電界効果トランジスタ及び該電界効果トランジスタを用いた液晶表示装置 |
| FR2662290B1 (fr) | 1990-05-15 | 1992-07-24 | France Telecom | Procede de realisation d'un ecran d'affichage a matrice active et a condensateurs de stockage et ecran obtenu par ce procede. |
| GB9114018D0 (en) | 1991-06-28 | 1991-08-14 | Philips Electronic Associated | Thin-film transistor manufacture |
| US5294869A (en) | 1991-12-30 | 1994-03-15 | Eastman Kodak Company | Organic electroluminescent multicolor image display device |
| US5294870A (en) | 1991-12-30 | 1994-03-15 | Eastman Kodak Company | Organic electroluminescent multicolor image display device |
| DE4241045C1 (de) | 1992-12-05 | 1994-05-26 | Bosch Gmbh Robert | Verfahren zum anisotropen Ätzen von Silicium |
| CN1542929B (zh) * | 1993-03-12 | 2012-05-30 | 株式会社半导体能源研究所 | 半导体器件的制造方法 |
| US5641611A (en) | 1995-08-21 | 1997-06-24 | Motorola | Method of fabricating organic LED matrices |
| US5625199A (en) | 1996-01-16 | 1997-04-29 | Lucent Technologies Inc. | Article comprising complementary circuit with inorganic n-channel and organic p-channel thin film transistors |
| US5612228A (en) * | 1996-04-24 | 1997-03-18 | Motorola | Method of making CMOS with organic and inorganic semiconducting region |
| US6037712A (en) | 1996-06-10 | 2000-03-14 | Tdk Corporation | Organic electroluminescence display device and producing method thereof |
| JP2833605B2 (ja) * | 1997-02-07 | 1998-12-09 | 日本電気株式会社 | 発光ディスプレイの製造方法 |
| JP3999837B2 (ja) | 1997-02-10 | 2007-10-31 | Tdk株式会社 | 有機エレクトロルミネッセンス表示装置 |
| US5946551A (en) * | 1997-03-25 | 1999-08-31 | Dimitrakopoulos; Christos Dimitrios | Fabrication of thin film effect transistor comprising an organic semiconductor and chemical solution deposited metal oxide gate dielectric |
| JPH10319870A (ja) * | 1997-05-15 | 1998-12-04 | Nec Corp | シャドウマスク及びこれを用いたカラー薄膜el表示装置の製造方法 |
| KR100393324B1 (ko) * | 1998-06-19 | 2003-07-31 | 띤 필름 일렉트로닉스 에이에스에이 | 집적 무기/유기 보상 박막 트랜지스터 회로 및 그 제조방법 |
| KR100451381B1 (ko) * | 1998-07-30 | 2005-06-01 | 엘지.필립스 엘시디 주식회사 | 박막트랜지스터및그제조방법 |
| GB9817745D0 (en) | 1998-08-15 | 1998-10-14 | Philips Electronics Nv | Manufacture of electronic devices comprising thin-film circuit elements |
| JP2000132762A (ja) | 1998-10-27 | 2000-05-12 | Matsushita Electric Works Ltd | 受光量表示ユニット付き光電式分離型感知器及び波形確認端子ユニット付き光電式分離型感知器 |
| US6384529B2 (en) | 1998-11-18 | 2002-05-07 | Eastman Kodak Company | Full color active matrix organic electroluminescent display panel having an integrated shadow mask |
| AU7137800A (en) | 1999-07-21 | 2001-02-13 | E-Ink Corporation | Preferred methods for producing electrical circuit elements used to control an electronic display |
| JP4053209B2 (ja) | 2000-05-01 | 2008-02-27 | 三星エスディアイ株式会社 | 有機elディスプレイの製造方法 |
| JP2002050764A (ja) * | 2000-08-02 | 2002-02-15 | Matsushita Electric Ind Co Ltd | 薄膜トランジスタ、アレイ基板、液晶表示装置、有機el表示装置およびその製造方法 |
| US6791258B2 (en) | 2001-06-21 | 2004-09-14 | 3M Innovative Properties Company | Organic light emitting full color display panel |
| WO2003028125A2 (en) | 2001-09-27 | 2003-04-03 | 3M Innovative Properties Company | Substituted pentacene semiconductors |
| US20030097010A1 (en) | 2001-09-27 | 2003-05-22 | Vogel Dennis E. | Process for preparing pentacene derivatives |
| US6897164B2 (en) | 2002-02-14 | 2005-05-24 | 3M Innovative Properties Company | Aperture masks for circuit fabrication |
| US6821348B2 (en) | 2002-02-14 | 2004-11-23 | 3M Innovative Properties Company | In-line deposition processes for circuit fabrication |
| US20030151118A1 (en) | 2002-02-14 | 2003-08-14 | 3M Innovative Properties Company | Aperture masks for circuit fabrication |
-
2002
- 2002-05-02 US US10/137,562 patent/US6667215B2/en not_active Expired - Fee Related
-
2003
- 2003-04-17 JP JP2004502343A patent/JP4426438B2/ja not_active Expired - Fee Related
- 2003-04-17 CN CNB038098725A patent/CN100372082C/zh not_active Expired - Fee Related
- 2003-04-17 WO PCT/US2003/012022 patent/WO2003094219A1/en not_active Ceased
- 2003-04-17 EP EP03747596A patent/EP1502295B1/en not_active Expired - Lifetime
- 2003-04-17 DE DE60329177T patent/DE60329177D1/de not_active Expired - Lifetime
- 2003-04-17 AU AU2003226425A patent/AU2003226425A1/en not_active Abandoned
- 2003-04-17 AT AT03747596T patent/ATE442673T1/de not_active IP Right Cessation
- 2003-04-17 KR KR10-2004-7017661A patent/KR20040105251A/ko not_active Withdrawn
- 2003-11-21 US US10/719,209 patent/US6806520B2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US20040106262A1 (en) | 2004-06-03 |
| CN1650409A (zh) | 2005-08-03 |
| CN100372082C (zh) | 2008-02-27 |
| ATE442673T1 (de) | 2009-09-15 |
| US6806520B2 (en) | 2004-10-19 |
| KR20040105251A (ko) | 2004-12-14 |
| AU2003226425A1 (en) | 2003-11-17 |
| US6667215B2 (en) | 2003-12-23 |
| EP1502295B1 (en) | 2009-09-09 |
| WO2003094219A1 (en) | 2003-11-13 |
| DE60329177D1 (de) | 2009-10-22 |
| EP1502295A1 (en) | 2005-02-02 |
| JP2005531131A (ja) | 2005-10-13 |
| US20030207505A1 (en) | 2003-11-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP4426438B2 (ja) | トランジスタの製造方法 | |
| US6844579B2 (en) | Organic device including semiconducting layer aligned according to microgrooves of photoresist layer | |
| US20060197881A1 (en) | Organic thin film transistor array panel and manufacturing method thereof | |
| US20070178710A1 (en) | Method for sealing thin film transistors | |
| TWI677104B (zh) | 薄膜電晶體、薄膜電晶體之製造方法及使用薄膜電晶體之影像顯示裝置 | |
| EP2110856A1 (en) | Thin film semiconductor device fabrication method and thin film semiconductor device | |
| EP4120325A1 (en) | Production method for patterned organic film, production apparatus for patterned organic film, organic semiconductor device produced by same, and integrated circuit including organic semiconductor device | |
| US9401430B1 (en) | VTFT with a top-gate structure | |
| US20050130422A1 (en) | Method for patterning films | |
| Nair et al. | Passivation of organic field effect transistor with photopatterned Parylene to improve environmental stability | |
| US9443887B1 (en) | Vertical and planar TFTS on common substrate | |
| Aljada et al. | High quality shadow masks for top contact organic field effect transistors using deep reactive ion etching | |
| CN100505186C (zh) | 垂直薄膜晶体管的制造方法 | |
| KR102693356B1 (ko) | 미세 패터닝된 유기박막 트랜지스터 및 이의 제조방법 | |
| JP5458296B2 (ja) | 微細加工構造及びその加工方法並びに電子デバイス及びその製造方法 | |
| US20050191801A1 (en) | Method for fabricating a field effect transistor | |
| US20090189147A1 (en) | Organic transistor comprising a self-aligning gate electrode, and method for the production thereof | |
| WO2012141225A1 (ja) | 有機半導体素子の製造方法 | |
| JP2012138549A (ja) | 薄膜トランジスタ | |
| US20080230771A1 (en) | Thin film transistor and method for manufacturing the same | |
| KR100897230B1 (ko) | 전도성 유기물 전극 형성 방법 | |
| WO2014147992A1 (ja) | 薄膜トランジスタアレイ | |
| Jo et al. | High Resolution Electrodes Fabrication for OTFT by using Microcontact Printing Process | |
| Jo et al. | Fabrication of Organic Thin Film Transistor (OTFT) Array by Using Nanoprinting Process | |
| JP2005191190A (ja) | 有機薄膜トランジスタ装置の製造方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20060417 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20060417 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20090708 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20090714 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20091009 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20091110 |
|
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20091210 |
|
| R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20121218 Year of fee payment: 3 |
|
| LAPS | Cancellation because of no payment of annual fees |