JP4215803B2 - 読出しとベリファイの均一なしきい値を有するメモリ - Google Patents

読出しとベリファイの均一なしきい値を有するメモリ Download PDF

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Publication number
JP4215803B2
JP4215803B2 JP2006532842A JP2006532842A JP4215803B2 JP 4215803 B2 JP4215803 B2 JP 4215803B2 JP 2006532842 A JP2006532842 A JP 2006532842A JP 2006532842 A JP2006532842 A JP 2006532842A JP 4215803 B2 JP4215803 B2 JP 4215803B2
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cell
voltage
current
specific cell
cells
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JP2006532842A
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Japanese (ja)
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JP2006528403A (ja
JP2006528403A5 (enExample
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ルーパーバー、フランキー
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Micron Technology Inc
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Micron Technology Inc
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/26—Sensing or reading circuits; Data output circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/08—Address circuits; Decoders; Word-line control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/30—Power supply circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/344—Arrangements for verifying correct erasure or for detecting overerased cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/344—Arrangements for verifying correct erasure or for detecting overerased cells
    • G11C16/3445—Circuits or methods to verify correct erasure of nonvolatile memory cells

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Read Only Memory (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
JP2006532842A 2003-05-08 2004-05-07 読出しとベリファイの均一なしきい値を有するメモリ Expired - Fee Related JP4215803B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/431,862 US6975542B2 (en) 2003-05-08 2003-05-08 NAND flash memory with improved read and verification threshold uniformity
PCT/US2004/014248 WO2004102580A2 (en) 2003-05-08 2004-05-07 Memory with uniform read and verification threshold

Publications (3)

Publication Number Publication Date
JP2006528403A JP2006528403A (ja) 2006-12-14
JP2006528403A5 JP2006528403A5 (enExample) 2007-03-22
JP4215803B2 true JP4215803B2 (ja) 2009-01-28

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JP2006532842A Expired - Fee Related JP4215803B2 (ja) 2003-05-08 2004-05-07 読出しとベリファイの均一なしきい値を有するメモリ

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Country Link
US (3) US6975542B2 (enExample)
EP (1) EP1620860B1 (enExample)
JP (1) JP4215803B2 (enExample)
KR (1) KR100709642B1 (enExample)
CN (1) CN1806295A (enExample)
WO (1) WO2004102580A2 (enExample)

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WO2004102580A3 (en) 2005-03-24
KR20060008998A (ko) 2006-01-27
JP2006528403A (ja) 2006-12-14
KR100709642B1 (ko) 2007-04-23
US7079419B2 (en) 2006-07-18
WO2004102580A2 (en) 2004-11-25
US6975542B2 (en) 2005-12-13
US20040223371A1 (en) 2004-11-11
US20050195651A1 (en) 2005-09-08
EP1620860A2 (en) 2006-02-01
US20060239081A1 (en) 2006-10-26
CN1806295A (zh) 2006-07-19
EP1620860B1 (en) 2012-05-30
US7274600B2 (en) 2007-09-25

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