JP4083847B2 - メモリ・リフレッシュ方法及びシステム - Google Patents

メモリ・リフレッシュ方法及びシステム Download PDF

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Publication number
JP4083847B2
JP4083847B2 JP27554597A JP27554597A JP4083847B2 JP 4083847 B2 JP4083847 B2 JP 4083847B2 JP 27554597 A JP27554597 A JP 27554597A JP 27554597 A JP27554597 A JP 27554597A JP 4083847 B2 JP4083847 B2 JP 4083847B2
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JP
Japan
Prior art keywords
memory
sdram
self
bank
refresh mode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP27554597A
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English (en)
Japanese (ja)
Other versions
JPH10133960A (ja
JPH10133960A5 (enExample
Inventor
ジェイ・マイケル・アンドレワーサ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HP Inc
Original Assignee
Hewlett Packard Co
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Filing date
Publication date
Application filed by Hewlett Packard Co filed Critical Hewlett Packard Co
Publication of JPH10133960A publication Critical patent/JPH10133960A/ja
Publication of JPH10133960A5 publication Critical patent/JPH10133960A5/ja
Application granted granted Critical
Publication of JP4083847B2 publication Critical patent/JP4083847B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/406—Management or control of the refreshing or charge-regeneration cycles

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP27554597A 1996-10-10 1997-10-08 メモリ・リフレッシュ方法及びシステム Expired - Fee Related JP4083847B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US720,960 1996-10-10
US08/720,960 US5754557A (en) 1996-10-10 1996-10-10 Method for refreshing a memory, controlled by a memory controller in a computer system, in a self-refresh mode while scanning the memory controller

Publications (3)

Publication Number Publication Date
JPH10133960A JPH10133960A (ja) 1998-05-22
JPH10133960A5 JPH10133960A5 (enExample) 2005-06-23
JP4083847B2 true JP4083847B2 (ja) 2008-04-30

Family

ID=24895954

Family Applications (1)

Application Number Title Priority Date Filing Date
JP27554597A Expired - Fee Related JP4083847B2 (ja) 1996-10-10 1997-10-08 メモリ・リフレッシュ方法及びシステム

Country Status (4)

Country Link
US (1) US5754557A (enExample)
JP (1) JP4083847B2 (enExample)
DE (1) DE19740223C2 (enExample)
GB (1) GB2320774B (enExample)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5999481A (en) * 1997-08-22 1999-12-07 Micron Technology, Inc. Method and apparatus for controlling the operation of an integrated circuit responsive to out-of-synchronism control signals
US6295618B1 (en) * 1998-08-25 2001-09-25 Micron Technology, Inc. Method and apparatus for data compression in memory devices
JP2001290696A (ja) * 2000-04-07 2001-10-19 Minolta Co Ltd メモリ基板
JP4689087B2 (ja) * 2000-08-22 2011-05-25 キヤノン株式会社 情報処理装置及び省電力移行制御方法
US6901359B1 (en) * 2000-09-06 2005-05-31 Quickturn Design Systems, Inc. High speed software driven emulator comprised of a plurality of emulation processors with a method to allow high speed bulk read/write operation synchronous DRAM while refreshing the memory
US7236987B1 (en) 2003-02-28 2007-06-26 Sun Microsystems Inc. Systems and methods for providing a storage virtualization environment
US7447939B1 (en) * 2003-02-28 2008-11-04 Sun Microsystems, Inc. Systems and methods for performing quiescence in a storage virtualization environment
US7290168B1 (en) 2003-02-28 2007-10-30 Sun Microsystems, Inc. Systems and methods for providing a multi-path network switch system
US7383381B1 (en) 2003-02-28 2008-06-03 Sun Microsystems, Inc. Systems and methods for configuring a storage virtualization environment
US7107394B2 (en) * 2003-03-28 2006-09-12 Hewlett-Packard Development Company, L.P. Apparatus for capturing data on a debug bus
JP3811143B2 (ja) * 2003-07-09 2006-08-16 株式会社東芝 メモリ制御回路
JP5082727B2 (ja) * 2007-09-28 2012-11-28 ソニー株式会社 記憶制御装置、記憶制御方法およびコンピュータプログラム
US8495287B2 (en) 2010-06-24 2013-07-23 International Business Machines Corporation Clock-based debugging for embedded dynamic random access memory element in a processor core
WO2013076529A1 (en) * 2011-11-23 2013-05-30 Freescale Semiconductor, Inc. System-on-chip, method of manufacture thereof and method of controlling a system-on-chip
US11586383B2 (en) 2018-10-16 2023-02-21 Micron Technology, Inc. Command block management
US11543996B2 (en) 2020-05-20 2023-01-03 Western Digital Technologies, Inc. Systems and methods for power management in a data storage device
US11137823B1 (en) * 2020-05-20 2021-10-05 Western Digital Technologies, Inc. Systems and methods for power management in a data storage device
CN112328305B (zh) * 2020-10-30 2022-10-18 歌尔光学科技有限公司 一种眼图测试方法、装置、电子设备及可读存储介质

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4827476A (en) * 1987-04-16 1989-05-02 Tandem Computers Incorporated Scan test apparatus for digital systems having dynamic random access memory
JPH02255925A (ja) * 1988-11-30 1990-10-16 Hitachi Ltd メモリテスト方法および装置
US5255381A (en) * 1990-07-03 1993-10-19 Digital Equipment Corporation Mode switching for a memory system with diagnostic scan
WO1995018998A1 (en) * 1994-01-05 1995-07-13 Norand Corporation Safe-stop mode for a microprocessor operating in a pseudo-static random access memory environment
JP3260583B2 (ja) * 1995-04-04 2002-02-25 株式会社東芝 ダイナミック型半導体メモリおよびそのテスト方法

Also Published As

Publication number Publication date
DE19740223C2 (de) 2003-11-13
US5754557A (en) 1998-05-19
JPH10133960A (ja) 1998-05-22
DE19740223A1 (de) 1998-04-16
GB2320774A (en) 1998-07-01
GB2320774B (en) 2000-12-27
GB9721488D0 (en) 1997-12-10

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