JP3898278B2 - 炭化ケイ素単結晶の製造方法及びその製造装置 - Google Patents
炭化ケイ素単結晶の製造方法及びその製造装置 Download PDFInfo
- Publication number
- JP3898278B2 JP3898278B2 JP11881797A JP11881797A JP3898278B2 JP 3898278 B2 JP3898278 B2 JP 3898278B2 JP 11881797 A JP11881797 A JP 11881797A JP 11881797 A JP11881797 A JP 11881797A JP 3898278 B2 JP3898278 B2 JP 3898278B2
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- Prior art keywords
- silicon carbide
- raw material
- graphite
- single crystal
- carbide single
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 239000013078 crystal Substances 0.000 title claims description 82
- 229910010271 silicon carbide Inorganic materials 0.000 title claims description 72
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 title claims description 69
- 238000004519 manufacturing process Methods 0.000 title claims description 13
- 238000000034 method Methods 0.000 title description 18
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 90
- 229910002804 graphite Inorganic materials 0.000 claims description 81
- 239000010439 graphite Substances 0.000 claims description 81
- 239000007789 gas Substances 0.000 claims description 43
- 239000002994 raw material Substances 0.000 claims description 43
- 238000000859 sublimation Methods 0.000 claims description 35
- 230000008022 sublimation Effects 0.000 claims description 35
- 239000002775 capsule Substances 0.000 claims description 20
- 238000006243 chemical reaction Methods 0.000 claims description 13
- 238000010438 heat treatment Methods 0.000 claims description 9
- 239000011261 inert gas Substances 0.000 claims description 3
- 239000010419 fine particle Substances 0.000 claims 2
- 230000007547 defect Effects 0.000 description 10
- 239000000843 powder Substances 0.000 description 8
- 229910052799 carbon Inorganic materials 0.000 description 7
- 229910052710 silicon Inorganic materials 0.000 description 6
- 239000000758 substrate Substances 0.000 description 5
- 230000004913 activation Effects 0.000 description 3
- 238000000354 decomposition reaction Methods 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- 239000010453 quartz Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 3
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- ATUOYWHBWRKTHZ-UHFFFAOYSA-N Propane Chemical compound CCC ATUOYWHBWRKTHZ-UHFFFAOYSA-N 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 230000009471 action Effects 0.000 description 2
- 239000012298 atmosphere Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 229910000077 silane Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 2
- 238000005092 sublimation method Methods 0.000 description 2
- 239000004215 Carbon black (E152) Substances 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- QZPSXPBJTPJTSZ-UHFFFAOYSA-N aqua regia Chemical compound Cl.O[N+]([O-])=O QZPSXPBJTPJTSZ-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 239000012300 argon atmosphere Substances 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 238000003763 carbonization Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000005229 chemical vapour deposition Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000003628 erosive effect Effects 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 239000008187 granular material Substances 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000011068 loading method Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 239000001294 propane Substances 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000000992 sputter etching Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Images
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- Crystals, And After-Treatments Of Crystals (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11881797A JP3898278B2 (ja) | 1997-04-21 | 1997-04-21 | 炭化ケイ素単結晶の製造方法及びその製造装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11881797A JP3898278B2 (ja) | 1997-04-21 | 1997-04-21 | 炭化ケイ素単結晶の製造方法及びその製造装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPH10291899A JPH10291899A (ja) | 1998-11-04 |
| JPH10291899A5 JPH10291899A5 (enExample) | 2004-12-09 |
| JP3898278B2 true JP3898278B2 (ja) | 2007-03-28 |
Family
ID=14745882
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11881797A Expired - Fee Related JP3898278B2 (ja) | 1997-04-21 | 1997-04-21 | 炭化ケイ素単結晶の製造方法及びその製造装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3898278B2 (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2415911A4 (en) * | 2009-04-03 | 2013-04-10 | Bridgestone Corp | METHOD OF PREPARING A SILICON CARBIDE SINGLE CRYSTAL |
| US12322087B1 (en) | 2024-05-24 | 2025-06-03 | Wolfspeed, Inc. | Multi-scale autoencoders for semiconductor workpiece understanding |
| US12454768B1 (en) | 2024-11-08 | 2025-10-28 | Wolfspeed, Inc. | Hybrid seed structure for crystal growth system |
Families Citing this family (33)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2000039372A1 (en) * | 1998-12-25 | 2000-07-06 | Showa Denko K. K. | Method for growing single crystal of silicon carbide |
| JP4230035B2 (ja) * | 1998-12-25 | 2009-02-25 | 昭和電工株式会社 | 炭化珪素単結晶およびその製造方法 |
| JP4691291B2 (ja) | 1999-07-07 | 2011-06-01 | エスアイクリスタル アクチエンゲゼルシャフト | 箔で内張りされた坩堝を有するSiC単結晶昇華成長装置 |
| US6508880B2 (en) * | 2000-02-15 | 2003-01-21 | The Fox Group, Inc. | Apparatus for growing low defect density silicon carbide |
| JP4619567B2 (ja) * | 2001-04-10 | 2011-01-26 | 株式会社ブリヂストン | 炭化ケイ素単結晶及びその製造方法 |
| US7553373B2 (en) | 2001-06-15 | 2009-06-30 | Bridgestone Corporation | Silicon carbide single crystal and production thereof |
| JP4986342B2 (ja) * | 2001-06-15 | 2012-07-25 | 株式会社ブリヂストン | 炭化ケイ素単結晶及びその製造方法 |
| DE10335538A1 (de) * | 2003-07-31 | 2005-02-24 | Sicrystal Ag | Verfahren und Vorrichtung zur AIN-Einkristall-Herstellung mit gasdurchlässiger Tiegelwand |
| JP4708746B2 (ja) * | 2004-09-02 | 2011-06-22 | 株式会社ブリヂストン | 炭化ケイ素単結晶の製造方法及び製造装置 |
| JP2008120617A (ja) * | 2006-11-09 | 2008-05-29 | Bridgestone Corp | 炭化珪素単結晶の製造方法 |
| KR100848810B1 (ko) | 2007-08-03 | 2008-07-28 | 한국전기연구원 | 단결정 성장 방법 및 그 장치 |
| JP5102697B2 (ja) * | 2008-05-21 | 2012-12-19 | 株式会社ブリヂストン | 炭化珪素単結晶の製造方法 |
| DE102009009614A1 (de) | 2008-12-24 | 2010-07-01 | Sicrystal Ag | Herstellungsverfahren für einen SiC-Volumeneinkristall und SiC-Substrat mit wenigen Kohlenstoffeinschlüssen |
| JP5779171B2 (ja) * | 2009-03-26 | 2015-09-16 | トゥー‐シックス・インコーポレイテッド | SiC単結晶の昇華成長方法及び装置 |
| JP5560862B2 (ja) * | 2010-04-07 | 2014-07-30 | 新日鐵住金株式会社 | 炭化珪素単結晶インゴットの製造装置 |
| DE102010029755B4 (de) * | 2010-06-07 | 2023-09-21 | Sicrystal Gmbh | Herstellungsverfahren für einen SiC-Volumeneinkristall ohne Facette und einkristallines SiC-Substrat mit homogener Widerstandsverteilung |
| KR20120131016A (ko) * | 2011-05-24 | 2012-12-04 | 엘지이노텍 주식회사 | 잉곳 제조 장치 |
| KR20120136219A (ko) * | 2011-06-08 | 2012-12-18 | 엘지이노텍 주식회사 | 잉곳 제조 장치 |
| KR20120138445A (ko) * | 2011-06-15 | 2012-12-26 | 엘지이노텍 주식회사 | 잉곳 제조 장치 |
| KR20120140151A (ko) * | 2011-06-20 | 2012-12-28 | 엘지이노텍 주식회사 | 잉곳 제조 장치 |
| KR101882321B1 (ko) * | 2011-12-26 | 2018-07-27 | 엘지이노텍 주식회사 | 잉곳 제조 장치 |
| CN102534763A (zh) * | 2012-01-17 | 2012-07-04 | 山东天岳先进材料科技有限公司 | 一种物理气相沉积法生长大尺寸碳化硅单晶的石墨坩埚及其应用 |
| CN105518187B (zh) * | 2013-09-06 | 2019-11-08 | Gtat公司 | 生产大块硅碳化物的方法 |
| DE112014004056T5 (de) | 2013-09-06 | 2016-06-02 | Gtat Corporation | Verfahren und Apparatur zur Herstellung von Massen-Siliciumcarbid aus einem Siliciumcarbid-Vorläufer |
| KR101537385B1 (ko) * | 2013-12-05 | 2015-07-17 | 재단법인 포항산업과학연구원 | 탄화규소(SiC) 단결정 성장 방법 |
| US10724151B2 (en) * | 2014-10-31 | 2020-07-28 | Sumitomo Electric Industries, Ltd. | Device of manufacturing silicon carbide single crystal |
| JP2016088805A (ja) * | 2014-11-05 | 2016-05-23 | 住友電気工業株式会社 | 炭化珪素単結晶の製造装置および炭化珪素単結晶の製造方法 |
| CN106544724B (zh) * | 2016-12-09 | 2019-01-22 | 河北同光晶体有限公司 | 一种碳化硅单晶生长热场结构中的石墨板涂层的制备方法 |
| US11846038B2 (en) | 2018-08-30 | 2023-12-19 | Senic Inc. | Method of growing semi-insulating silicon carbide single crystal using dopant coated with a carbon-based material |
| CN109402731B (zh) * | 2018-10-17 | 2021-01-15 | 福建北电新材料科技有限公司 | 一种高纯半绝缘碳化硅晶体生长装置及其方法 |
| CN113122916A (zh) * | 2021-04-25 | 2021-07-16 | 哈尔滨科友半导体产业装备与技术研究院有限公司 | 一种pvt法单晶批量制备装置及方法 |
| CN113445121A (zh) * | 2021-06-25 | 2021-09-28 | 哈尔滨科友半导体产业装备与技术研究院有限公司 | 一种减少石墨包裹物的碳化硅晶体的生长方法 |
| CN114990689B (zh) * | 2022-04-28 | 2024-03-22 | 中电化合物半导体有限公司 | 一种碳化硅粉料的合成方法及应用 |
-
1997
- 1997-04-21 JP JP11881797A patent/JP3898278B2/ja not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP2415911A4 (en) * | 2009-04-03 | 2013-04-10 | Bridgestone Corp | METHOD OF PREPARING A SILICON CARBIDE SINGLE CRYSTAL |
| US12322087B1 (en) | 2024-05-24 | 2025-06-03 | Wolfspeed, Inc. | Multi-scale autoencoders for semiconductor workpiece understanding |
| US12454768B1 (en) | 2024-11-08 | 2025-10-28 | Wolfspeed, Inc. | Hybrid seed structure for crystal growth system |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH10291899A (ja) | 1998-11-04 |
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