JP3841405B2 - ネガ型レジスト組成物 - Google Patents

ネガ型レジスト組成物 Download PDF

Info

Publication number
JP3841405B2
JP3841405B2 JP2002096410A JP2002096410A JP3841405B2 JP 3841405 B2 JP3841405 B2 JP 3841405B2 JP 2002096410 A JP2002096410 A JP 2002096410A JP 2002096410 A JP2002096410 A JP 2002096410A JP 3841405 B2 JP3841405 B2 JP 3841405B2
Authority
JP
Japan
Prior art keywords
group
resin
general formula
repeating unit
resist composition
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2002096410A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003295438A (ja
JP2003295438A5 (US20030203305A1-20031030-C00004.png
Inventor
昭一郎 安波
豊 阿出川
浩司 白川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Holdings Corp
Original Assignee
Fuji Photo Film Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Photo Film Co Ltd filed Critical Fuji Photo Film Co Ltd
Priority to JP2002096410A priority Critical patent/JP3841405B2/ja
Priority to US10/396,583 priority patent/US6746813B2/en
Publication of JP2003295438A publication Critical patent/JP2003295438A/ja
Publication of JP2003295438A5 publication Critical patent/JP2003295438A5/ja
Application granted granted Critical
Publication of JP3841405B2 publication Critical patent/JP3841405B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004Photosensitive materials
    • G03F7/038Macromolecular compounds which are rendered insoluble or differentially wettable
    • G03F7/0382Macromolecular compounds which are rendered insoluble or differentially wettable the macromolecular compound being present in a chemically amplified negative photoresist composition
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S430/00Radiation imagery chemistry: process, composition, or product thereof
    • Y10S430/1053Imaging affecting physical property or radiation sensitive material, or producing nonplanar or printing surface - process, composition, or product: radiation sensitive composition or product or process of making binder containing
    • Y10S430/1055Radiation sensitive composition or product or process of making
    • Y10S430/106Binder containing
JP2002096410A 2002-03-29 2002-03-29 ネガ型レジスト組成物 Expired - Lifetime JP3841405B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2002096410A JP3841405B2 (ja) 2002-03-29 2002-03-29 ネガ型レジスト組成物
US10/396,583 US6746813B2 (en) 2002-03-29 2003-03-26 Negative resist composition

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002096410A JP3841405B2 (ja) 2002-03-29 2002-03-29 ネガ型レジスト組成物

Publications (3)

Publication Number Publication Date
JP2003295438A JP2003295438A (ja) 2003-10-15
JP2003295438A5 JP2003295438A5 (US20030203305A1-20031030-C00004.png) 2005-04-07
JP3841405B2 true JP3841405B2 (ja) 2006-11-01

Family

ID=29239480

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002096410A Expired - Lifetime JP3841405B2 (ja) 2002-03-29 2002-03-29 ネガ型レジスト組成物

Country Status (2)

Country Link
US (1) US6746813B2 (US20030203305A1-20031030-C00004.png)
JP (1) JP3841405B2 (US20030203305A1-20031030-C00004.png)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4448705B2 (ja) * 2004-02-05 2010-04-14 富士フイルム株式会社 感光性組成物及び該感光性組成物を用いたパターン形成方法
CN1930526A (zh) * 2004-02-19 2007-03-14 斯蒂茨丁荷兰聚合物学会 用于制备聚合物凸起结构的方法
TWI494697B (zh) 2004-12-24 2015-08-01 Mitsubishi Gas Chemical Co 光阻用化合物
JP4396849B2 (ja) * 2005-01-21 2010-01-13 信越化学工業株式会社 ネガ型レジスト材料及びパターン形成方法
JP4866605B2 (ja) * 2005-12-28 2012-02-01 富士フイルム株式会社 感光性組成物、該感光性組成物を用いたパターン形成方法及び該感光性組成物に用いられる化合物
US8404427B2 (en) * 2005-12-28 2013-03-26 Fujifilm Corporation Photosensitive composition, and pattern-forming method and resist film using the photosensitive composition
JP2011035173A (ja) * 2009-07-31 2011-02-17 Fujifilm Corp ネガ型化学増幅レジスト組成物及びこれを用いたモールドの作成方法
JP2015152669A (ja) * 2014-02-12 2015-08-24 サンアプロ株式会社 光酸発生剤及びフォトリソグラフィー用樹脂組成物
US9872399B1 (en) * 2016-07-22 2018-01-16 International Business Machines Corporation Implementing backdrilling elimination utilizing anti-electroplate coating

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02253262A (ja) 1989-03-28 1990-10-12 Tosoh Corp フォトレジスト組成物
JP2962145B2 (ja) 1994-05-16 1999-10-12 信越化学工業株式会社 ネガ型パターン形成材料
NL1014545C2 (nl) * 1999-03-31 2002-02-26 Ciba Sc Holding Ag Oxim-derivaten en de toepassing daarvan als latente zuren.
KR100538501B1 (ko) * 1999-08-16 2005-12-23 신에쓰 가가꾸 고교 가부시끼가이샤 신규한 오늄염, 레지스트 재료용 광산발생제, 레지스트재료 및 패턴 형성 방법
US6338931B1 (en) * 1999-08-16 2002-01-15 Shin-Etsu Chemical Co., Ltd. Resist compositions and patterning process
US6395446B1 (en) * 1999-10-06 2002-05-28 Shin-Etsu Chemical Co., Ltd. Resist compositions and patterning process
JP4070393B2 (ja) 2000-01-17 2008-04-02 富士フイルム株式会社 ネガ型レジスト組成物
KR100587452B1 (ko) * 2001-09-28 2006-06-09 신에쓰 가가꾸 고교 가부시끼가이샤 신규 술포닐디아조메탄 화합물, 광산발생제 및 그것을이용한 레지스트 재료 및 패턴 형성 방법
KR100698444B1 (ko) * 2002-03-22 2007-03-23 신에쓰 가가꾸 고교 가부시끼가이샤 화학 증폭 레지스트 재료용 광산 발생제, 및 이것을사용한 레지스트 재료 및 패턴 형성 방법

Also Published As

Publication number Publication date
US6746813B2 (en) 2004-06-08
US20030203305A1 (en) 2003-10-30
JP2003295438A (ja) 2003-10-15

Similar Documents

Publication Publication Date Title
JP4478589B2 (ja) ネガ型レジスト組成物及びそれを用いたパターン形成方法
KR100895455B1 (ko) 네거티브 레지스트 조성물 및 이를 사용한 패턴 형성 방법
JP4070393B2 (ja) ネガ型レジスト組成物
JP4139575B2 (ja) シリコン含有2層レジスト用下層レジスト組成物
JP3790960B2 (ja) ネガ型レジスト組成物
JP3841405B2 (ja) ネガ型レジスト組成物
JP2003270779A (ja) ネガ型レジスト組成物
JP2002372783A (ja) ネガ型レジスト組成物
JP4213925B2 (ja) ネガ型レジスト組成物
JP2004062044A (ja) 電子線、x線又はeuv用ネガ型レジスト組成物
JP3856306B2 (ja) ネガ型レジスト組成物
JP2002278068A (ja) 電子線又はx線用ネガ型レジスト組成物
JP2002311585A (ja) 電子線又はx線用ネガ型レジスト組成物
JP4990344B2 (ja) ネガ型レジスト組成物及びそれを用いたパターン形成方法
JP2004198724A (ja) ネガ型レジスト組成物
JP2004117876A (ja) ネガ型レジスト組成物
JP4102140B2 (ja) ネガ型レジスト組成物
JP2002333714A (ja) レジスト組成物
JP2002072482A (ja) ポジ型フォトレジスト組成物
JP4328570B2 (ja) レジスト組成物及びそれを用いたパターン形成方法
JP4067359B2 (ja) ポジ型レジスト組成物
JP4070538B2 (ja) ネガ型レジスト組成物
JP2004334106A (ja) ネガ型レジスト組成物
JP2001142200A (ja) ネガ型レジスト組成物
JP2001174994A (ja) ネガ型レジスト組成物

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20040525

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20040525

RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20060324

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20060414

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20060510

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20060628

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20060802

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20060807

R150 Certificate of patent or registration of utility model

Ref document number: 3841405

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090818

Year of fee payment: 3

S111 Request for change of ownership or part of ownership

Free format text: JAPANESE INTERMEDIATE CODE: R313111

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090818

Year of fee payment: 3

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20090818

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20100818

Year of fee payment: 4

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110818

Year of fee payment: 5

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110818

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120818

Year of fee payment: 6

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120818

Year of fee payment: 6

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130818

Year of fee payment: 7

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term