JP2594020B2 - テストエレメントのための貯蔵システム - Google Patents
テストエレメントのための貯蔵システムInfo
- Publication number
- JP2594020B2 JP2594020B2 JP6085118A JP8511894A JP2594020B2 JP 2594020 B2 JP2594020 B2 JP 2594020B2 JP 6085118 A JP6085118 A JP 6085118A JP 8511894 A JP8511894 A JP 8511894A JP 2594020 B2 JP2594020 B2 JP 2594020B2
- Authority
- JP
- Japan
- Prior art keywords
- chamber
- test
- test strip
- sealed
- opening
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00722—Communications; Identification
- G01N35/00732—Identification of carriers, materials or components in automatic analysers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L9/00—Supporting devices; Holding devices
- B01L9/52—Supports specially adapted for flat sample carriers, e.g. for plates, slides, chips
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L99/00—Subject matter not provided for in other groups of this subclass
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8483—Investigating reagent band
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
- G01N33/48—Biological material, e.g. blood, urine; Haemocytometers
- G01N33/483—Physical analysis of biological material
- G01N33/487—Physical analysis of biological material of liquid biological material
- G01N33/4875—Details of handling test elements, e.g. dispensing or storage, not specific to a particular test method
- G01N33/48778—Containers specially adapted therefor, e.g. for dry storage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L2300/00—Additional constructional details
- B01L2300/08—Geometry, shape and general structure
- B01L2300/0809—Geometry, shape and general structure rectangular shaped
- B01L2300/0825—Test strips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
- G01N2035/00039—Transport arrangements specific to flat sample substrates, e.g. pusher blade
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00029—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor provided with flat sample substrates, e.g. slides
- G01N2035/00089—Magazines
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N2035/00178—Special arrangements of analysers
- G01N2035/00277—Special precautions to avoid contamination (e.g. enclosures, glove- boxes, sealed sample carriers, disposal of contaminated material)
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
- G01N35/00584—Control arrangements for automatic analysers
- G01N35/00722—Communications; Identification
- G01N35/00732—Identification of carriers, materials or components in automatic analysers
- G01N2035/00742—Type of codes
- G01N2035/00782—Type of codes reprogrammmable code
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S435/00—Chemistry: molecular biology and microbiology
- Y10S435/808—Optical sensing apparatus
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S436/00—Chemistry: analytical and immunological testing
- Y10S436/805—Optical property
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S436/00—Chemistry: analytical and immunological testing
- Y10S436/807—Apparatus included in process claim, e.g. physical support structures
- Y10S436/808—Automated or kit
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/11—Automated chemical analysis
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/11—Automated chemical analysis
- Y10T436/112499—Automated chemical analysis with sample on test slide
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/11—Automated chemical analysis
- Y10T436/113332—Automated chemical analysis with conveyance of sample along a test line in a container or rack
- Y10T436/114165—Automated chemical analysis with conveyance of sample along a test line in a container or rack with step of insertion or removal from test line
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- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Health & Medical Sciences (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analytical Chemistry (AREA)
- Biomedical Technology (AREA)
- Clinical Laboratory Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Molecular Biology (AREA)
- Urology & Nephrology (AREA)
- Hematology (AREA)
- Optics & Photonics (AREA)
- Food Science & Technology (AREA)
- Medicinal Chemistry (AREA)
- Biophysics (AREA)
- Investigating Or Analysing Biological Materials (AREA)
- Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
- Investigating Or Analyzing Non-Biological Materials By The Use Of Chemical Means (AREA)
- Packages (AREA)
- Medical Preparation Storing Or Oral Administration Devices (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Radar Systems Or Details Thereof (AREA)
- Examining Or Testing Airtightness (AREA)
- Lubricants (AREA)
- Prostheses (AREA)
- Automatic Analysis And Handling Materials Therefor (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Memory System Of A Hierarchy Structure (AREA)
- Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
- Rotational Drive Of Disk (AREA)
Description
ためのシステムに関する。さらに詳しくは、2またはそ
れ以上の数の個々のテストエレメントが、貯蔵容器の水
蒸気が透過しないチャンバー内に保存されるテストエレ
メント用貯蔵システムに関し、該貯蔵容器は硬質材料で
つくられており、各チャンバーは水蒸気が透過しないよ
うホイルによって密封されている1または複数の開口部
を有する。
は、たとえば体液中の成分を定性的におよび/または定
量的に検出する臨床分析の分野で用いられる。とくに血
中グルコース定量のためのテストエレメントに重きを置
くものであり、そのようなテストエレメントは、テスト
ストリップの形で提供されることが多い。本発明の貯蔵
システムを用いることができる血中グルコース定量のた
めのハンディタイプの機器は、一般に知られている。
ルミニウムラミネートのホイル内に個々に密封されたも
のが知られている。テストエレメントを取出すために、
使用者はホイルを破って開け、テストエレメントを取出
す。
蔵することが知られている。いわゆる錠剤ブリスターパ
ック(blister pack)では、錠剤がチャンバー内に個々に
密封され、機械的圧力を付すことによって錠剤をチャン
バーから取出すことができる。この方法においては、錠
剤が密封を破壊する。
めの前記先行技術には、いくつかの欠点がある。アルミ
ニウムラミネート内にテストエレメントを密封すること
は材料の無駄が多く、またアルミニウムラミネートを破
ることがしばしば問題を惹き起こすので使用者にとって
比較的、非実用的である。パックからテストストリップ
を取出すには、老齢者ならびに罹患者に欠けている手指
の運動性がかなり要求される。自動化されたデバイスに
よる、可撓性を有するアルミニウムラミネートからのテ
ストストリップの自動的な取出しは、多大な技術的困難
をもってしか可能とならない。
エレメントが通常可撓性を有する薄いストリップである
ため、ブリスターパックの密封から問題なく押出すこと
が可能ではないのでテストエレメントには適用されえな
い。
解消するためになされたものであり、テストエレメント
を個々に密封することができ、手動でまたは機械的にテ
ストエレメントを個々に取出すことができるテストエレ
メント貯蔵のためのシステムを提供することを目的とす
る。また前記システムは、テストストリップを取出すこ
とによって残余のテストストリップの貯蔵安定性が有意
に減少しないことを確実にする必要がある。さらにシス
テムからテストストリップを取出す際に、できうる限り
変形を免れるシステムであるべきである。
それ以上のテストストリップが硬い貯蔵容器の水蒸気が
透過しないチャンバー内に個々に配置された、サンプル
流体分析用の柔軟性のあるテストストリップ(4)のた
めの貯蔵システム(1)であって、前記チャンバーは両
端を有するとともに互いに平行な長手方向の軸を有する
管の形状を呈しており、前記管はチャンバー内のテスト
ストリップが周囲の水蒸気に対して個々に密閉されるよ
うにホイル(5)によって封じられている開口部を前記
両端に有しており、さらに各チャンバーが内部のテスト
ストリップを当該テストストリップの長手方向の軸に沿
って保護しテストストリップの曲げを制限する断面を有
してなることを特徴とするシステムにより成し遂げるこ
とができる。
2の開口部をもち、断面が三角形または多角形、円形ま
たは長円形である管の形状を有する。
くは接着(gluing)、プレス(pressing)または溶接(weldi
ng) によって付されるアルミニウムまたはアルミニウム
ラミネートからなるホイルにより水蒸気が透過しないよ
う密封される。
ーの内部が周囲の水蒸気に対して密封されるようホイル
5により密封される開口部を両端に有し、その長手方向
の軸が平行な配列で存在する管の形状を有する。
セグメントの形状を有し、貯蔵容器がシリンダーの形状
を有するように該チャンバーが配列される。
前記チャンバー2の密封ホイルに穴をあけるためのデバ
イスを備える。
イスが、好ましくはラム11、ガイドピン15およびカ
バー14を含んでなり、ラムが密封ホイル12に穴をあ
けるようガイドピンを介してラムに圧力が付される。
ップの形状を有し、互いに平行にまたは隣合わせに1つ
の平面上に配列され、個々のテストエレメント用のチャ
ンバー内にテストエレメントが収納されており、該チャ
ンバーがホイルによって密封されたシステムであって、
該配列に、システムをスナップ閉じ構成に保持するため
にヒンジおよびシステムの2つの相対する側に互いに係
合させるデバイスが備えられている。
されてもよい。
この端部の向かいの開口部とが、5°より大であり45
°より小である角度を形成する。
取付けられる。
をも提供する。
を呈しかつ水蒸気が透過しないチャンバーを有する硬い
貯蔵容器内に配置された、柔軟性のあるテストストリッ
プを供給する方法であって、前記管の長手方向の軸は互
いに平行であり、前記管はチャンバー内のテストストリ
ップが周囲の水蒸気に対して個々に密閉されるようにホ
イルによって封じられている開口部を前記両端に有して
おり、前記方法が、チャンバーの開口部を密封するホイ
ルに孔をあける工程、および前記チャンバー内に収納さ
れているテストストリップに機械的圧力を加え、その圧
力によって前記テストエレメントがチャンバーの他方の
開口部を密封する第2のホイルに孔をあけ、当該チャン
バーから押し出される工程からなるものである。
から直接サンプル流体の分析用機器に挿入される。
したチャンバーを有する貯蔵容器を含んでなる。チャン
バーの空間的な独立は、チャンバー間の水蒸気の交換を
大いに減じるので本発明の重要な特徴である。したがっ
てテストエレメントを取出すためにチャンバーを開けて
も、システム内に残るテストエレメントに水蒸気を含む
かもしれない周囲の空気との接触がもたらされることは
ない。
すことに関して重大な、貯蔵容器の別の局面である。シ
ステムのチャンバーは、テストエレメントのかなりの部
分を取囲むように形成され、一方複数のチャンバーは互
いに強固に連結されている。本発明によればチャンバー
は幾何学的に規則的な配列で存在し、システムが正しく
用いられれば、たとえばアルミニウムラミネートのばあ
いにあるように変形させられてしまうことはない。個々
のチャンバーは、好ましくはその断面が本質的に三角形
もしくは多角形、または円形もしくは長円形または円形
セグメントである管の形状を有する。矩形の断面を有す
るチャンバーがとくに好ましい。チャンバーの断面の好
ましい形状は、テストエレメントを長手方向の軸に沿っ
て覆うがすべての側においてはテストエレメントと直接
接触せず、よってテストエレメントが1または2方向に
移動することができるものである。本発明の貯蔵容器の
チャンバーは、好ましくは互いに隣接しており、よって
スペースも材料も節約できる。
ュール成分の形の配列であると理解され、このような要
素が連続的に配列されたばあいにそれによって貯蔵容器
システムがつくられる。
性および低減された水蒸気透過性を兼ね備えた特性を有
する材料でつくることができる。これら2つの特性を兼
ね備えた数多くの材料のなかで、独立したチャンバーを
うるのに容易に用いることができる材料が好ましい。好
ましい材料には、ポリエチレンおよびポリプロピレンな
どのプラスチックがある。
つ、好ましくは2つの開口部を有する。テストエレメン
トがストリップの形状を有するばあい、チャンバーの開
口部は好ましくはテストストリップの小端部(small edg
e)の向かいに位置する。チャンバーの開口部は、テスト
エレメントの向かいの位置に対して平行であることがで
きる。しかしながら有利には、開口部はテストエレメン
トの向かいの位置と鋭角、好ましくは1°〜45°のあ
いだ、とくに好ましくは5°より大であり45°より小
である鋭角を形成する。
0のチャンバーを有し、対応する数のテストエレメント
を貯蔵する。
蒸気を透過しない材料で密封される。本発明において
は、「水蒸気が透過しないこと」および「減じられた水
蒸気透過性」の語は、相対的な特性であると理解され
る。該特性で、水蒸気によってテストエレメントに容認
しえない変化を惹き起こすことなく、数カ月にわたって
貯蔵することができるシステムを提供する、対応する材
料の利用可能性の度合いがわかる。
は、金属ホイル(たとえばアルミニウムホイル)、アル
ミニウムラミネート、ならびに好適な強度の(通常1mm
より大)のプラスチックである。これらの材料は、接
着、溶融(melting) 、またはプレスによりチャンバーの
開口部に付することができる。好ましい方法において
は、複数の開口部を密封するのに、対応するサイズの材
料1枚を用いることができるよう、開口部のいくつかは
互いに近接している。
システムのチャンバーの内部に備えられる。テストエレ
メント、とくにテストストリップとしては先行技術に包
括的に記載されており、本明細書中ではさらに詳細には
議論しない。しかしながら本発明のシステムは、曲げま
たは湿気に対する感受性の高いテストエレメントのため
に有利に用いることができる。
は水蒸気の大部分を透過しない材料を使用したにもかか
わらずシステム内に入り込むかもしれない湿気を吸収す
るための乾燥剤を、貯蔵容器のチャンバー内に備えても
よい。好適な乾燥剤は、先行技術において知られる固形
の乾燥剤であり、とくに好適なものはシリカゲルおよび
モレキュラーシーブである。
口部の密封に穴をあけるための1または複数のデバイス
を、チャンバーの外側に備えることができる。これらの
デバイスはまた、テストエレメントをチャンバーの外へ
押すのにも用いられうる。好ましい方法においては、テ
ストエレメントが押出される際第2の開口部における密
封に穴をあける。密封に穴をあけるためのデバイスは、
たとえばチャンバーの外側に取付けられたプラスチック
の針(thorn) を含むことができる。貯蔵容器との接続端
部により与えられる軸を中心に回転するようにそれぞれ
の針が回ることによって密封に穴をあけることができ
る。
るための針はチャンバーからチャンバーへと移動するこ
とができ、その度ごとにそれぞれのチャンバーに穴をあ
けるように貯蔵容器に取付けられる。
のみ有する実施態様においては、チャンバーの密封ホイ
ルが剥ぎ取られ、チャンバー内に収納されているテスト
エレメントが取出される。破壊されさらにホイルととも
に剥ぎ取ることができるタップ(tap) を備えることによ
って、密封を開けるのを容易とすることができる。この
原理は、たとえばヨーグルトのカップから知られるもの
である。
データおよびたとえば耐用年数やシステム内のストリッ
プ数などの分析に関する付加的なデータのためのデータ
キャリアをシステムの外側に備えることができる。この
データはバーコードまたは磁気ストリップのかたちで文
字と数字の組合わせで存在しうる。
するための方法を含み、該方法においてチャンバーの密
封された開口部に穴があけられ、機械的圧力がチャンバ
ーに収納されるテストエレメントに働き、かくして該チ
ャンバーからテストエレメントが取出される。
メントを個々に密封することが可能である。これは、た
だ1つのテストエレメントの密封のみを破壊することが
でき、一方システム内に残されるテストエレメントの密
封は無傷なままであることを意味する。テストエレメン
トはもっとも簡単な方法で、たとえばチャンバーの開口
部を手動でもしくは機械的に開け、さらにたとえば容器
を傾ける(tilt)ことによりテストエレメントを取出すこ
とによって、取出すことができる。密封材料に穴をあけ
ることにより、または開口部からチャンバーの密封を剥
ぎ取ることにより、密封を破壊することができる。
部が針もしくはレバー(lever) により穴をあけられ、つ
いでチャンバー内に収納されるテストエレメントが針も
しくはレバ−によって第2の開口部の方へ動かされる。
針またはレバーがテストエレメントに対して充分な圧力
を働かせば、テストエレメントは第2の密封された開口
部に穴をあけ、貯蔵容器を出る。テストエレメントによ
って第2の密封に穴をあけることは、密封とその向かい
のテストエレメント端部とが鋭角を形成していれば、と
くに簡単な方法で成し遂げることができる。この構成に
おいて、密封はまずテストエレメントの角により穴をあ
けられ、そののちエレメントの端部により完全に開けら
れる。
グに比較して、本発明のシステムは手動でまたはデバイ
スによってすべてのテストエレメントを個々に取出すこ
とができ、一方システム内に残存するテストエレメント
はさらになお湿気から保護されるという利点を有する。
また、これまでに出されている形のパッケージングに比
較して、本発明のシステムからテストストリップを取出
すことがかなり容易である。
の実施態様を参照して説明するが、本発明はもとよりか
かる実施態様のみに限定されるものではない。図6は、
実施態様1のシステムからテストエレメントを取出すた
めのデバイスの機能を説明するものである。
3のチャンバー2は、矩形の断面をもつ管の形状を有す
る。チャンバー2に収納されるテストエレメント4は、
互いに平行に配列されている。貯蔵容器はポリエチレン
でつくられ、射出成形法で製造した。貯蔵容器3の頂部
および底部でチャンバーの開口部を密封するためのアル
ミニウムラミネートからなるホイルは、超音波溶接によ
って付した。
トエレメント4が長手方向に平行に配列されている様子
を示す説明図である。この図により、テストエレメント
4を連続配列とすることで空間を節約するテストエレメ
ントのパッケージングをとくに強調している。図2の右
側に、テストエレメントの正面図を示す。
有するシステム1を示す断面図である。縦長の(longitu
dinal)テストエレメント4は、テストエレメント4の長
手方向の軸が円の中心から外側へと向けられている図3
に示すような配列とすることもできるし、貯蔵容器3の
円の軸とテストエレメント4の長手方向の軸とが平行な
配列となるように備えることもできる。前者のばあい、
システムはかなりフラットな円形ディスクの形状を有す
るのに対し、第2のばあい、システムは縦長のシリンダ
ーの形状を有する。
本発明のシステム1の一例を示す斜視図である。チャン
バー2は、1つの側の壁が開いている縦長の箱のような
形状を有する。よって各チャンバーはアルミニウムラミ
ネートからなる密封ホイル5で密封される1つの開口部
を有する。開口部の一方、ホイルの下には決められた(d
esignated)破壊点との連結によって貯蔵容器3のプラス
チックケーシングと連結するレバー9が備えられる。テ
ストエレメント4を取出すため、レバー9は折返され、
密封ホイル5とともに剥ぎ取られる。
る2つの部分を含んでなる。システム1を貯蔵するため
に、貯蔵容器3の両方の部分は開閉歯形部材(closing p
rofile) 7が材料の凹部8と係合してスナップ閉じを行
なうことができ、よってシステムが閉じた状態に保たれ
る。
本発明のシステムの一例が閉じられたばあいの断面図を
示す。未使用のテストエレメントの密封ホイルが外的な
ダメージから保護されるよう、システムのチャンバーの
開口部は貯蔵容器の内側に位置される。容器表面には取
扱いやすくするために波形が施されている。
を以下に説明する。
を取出すためのデバイスがどのように機能するかを示す
説明図である。小ラム11がチャンバー13の密封され
た開口部12の向かいに配されている。除去デバイスの
カバー14に対して、開口部12に向かう方向に圧力を
働かせることによって、デバイスは活動化される(図6
A)。小ラム11は開口部12の密封に穴をあけ、チャ
ンバー13の外にテストエレメント16を押し出す。カ
バー14が動くあいだは、移動の目的位置となった(ass
ume)のちカバー14およびガイドピン15とがラムを形
作る結果となるような位置に、ガイドピン15はとどま
る。小ラム11はそののち、このラム上へ横方向に動か
される(図6B)。
小ラム11が新しい休止位置に噛合う(snap)よう再び同
方向に横へ動かされて第2のラムを形成する。カバー1
4のプロジェクティング部分とガイドピン15とのあい
だの距離は、ラムがa、bおよびcと移動したのち新し
いチャンバー開口部の向かいに位置するに必要な長さと
する。
れる複数のテストエレメントを水蒸気が透過しないよう
それぞれ個々に密封することにより、テストエレメント
の個々の取出しが容易で、システム内に収納されるテス
トエレメントが外界の作用から保護される貯蔵システム
が提供される。
ムの説明図ならびにテストエレメントの正面図である。
する実施態様2のシステムの断面図である。
システムの一例を開いたばあいの斜視図である。
システムの一例を閉じたばあいの断面図である。
デバイスがどのように機能するかを示す説明図である。
Claims (2)
- 【請求項1】 2またはそれ以上のテストストリップが
硬い貯蔵容器の水蒸気が透過しないチャンバー内に個々
に配置された、サンプル流体分析用の柔軟性のあるテス
トストリップ(4)のための貯蔵システム(1)であっ
て、前記チャンバーは両端を有するとともに互いに平行
な長手方向の軸を有する管の形状を呈しており、前記管
はチャンバー内のテストストリップが周囲の水蒸気に対
して個々に密閉されるようにホイル(5)によって封じ
られている開口部を前記両端に有しており、さらに各チ
ャンバーが内部のテストストリップを当該テストストリ
ップの長手方向の軸に沿って保護しテストストリップの
曲げを制限する断面を有してなることを特徴とするシス
テム。 - 【請求項2】 両端を備えた管の形状を呈しかつ水蒸気
が透過しないチャンバーを有する硬い貯蔵容器内に配置
された、柔軟性のあるテストストリップを供給する方法
であって、前記管の長手方向の軸は互いに平行であり、
前記管はチャンバー内のテストストリップが周囲の水蒸
気に対して個々に密閉されるようにホイルによって封じ
られている開口部を前記両端に有しており、前記方法
が、 チャンバーの開口部を密封するホイルに孔をあける工
程、および 前記チャンバー内に収納されているテストストリップに
機械的圧力を加え、その圧力によって前記テストエレメ
ントがチャンバーの他方の開口部を密封する第2のホイ
ルに孔をあけ、当該チャンバーから押し出される工程か
らなるテストストリップを供給する方法 。
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE4313252A DE4313252A1 (de) | 1993-04-23 | 1993-04-23 | System zur Analyse von Inhaltsstoffen flüssiger Proben |
DE4328816.2 | 1993-08-27 | ||
DE4328816A DE4328816A1 (de) | 1993-08-27 | 1993-08-27 | System zur Bevorratung von Testelementen |
DE4313252.9 | 1993-08-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH06308115A JPH06308115A (ja) | 1994-11-04 |
JP2594020B2 true JP2594020B2 (ja) | 1997-03-26 |
Family
ID=25925169
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6085118A Expired - Lifetime JP2594020B2 (ja) | 1993-04-23 | 1994-04-22 | テストエレメントのための貯蔵システム |
JP6085139A Expired - Lifetime JP2768899B2 (ja) | 1993-04-23 | 1994-04-22 | 液体サンプルに含有される化合物の分析システム |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6085139A Expired - Lifetime JP2768899B2 (ja) | 1993-04-23 | 1994-04-22 | 液体サンプルに含有される化合物の分析システム |
Country Status (7)
Country | Link |
---|---|
US (4) | US5489414A (ja) |
EP (3) | EP0622119B1 (ja) |
JP (2) | JP2594020B2 (ja) |
AT (1) | ATE186232T1 (ja) |
DE (3) | DE59408870D1 (ja) |
DK (1) | DK0622119T3 (ja) |
ES (1) | ES2139684T3 (ja) |
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-
1994
- 1994-04-15 DE DE59408870T patent/DE59408870D1/de not_active Expired - Lifetime
- 1994-04-15 DK DK94105882T patent/DK0622119T3/da active
- 1994-04-15 EP EP94105882A patent/EP0622119B1/de not_active Expired - Lifetime
- 1994-04-15 AT AT94105882T patent/ATE186232T1/de active
- 1994-04-15 EP EP94105883A patent/EP0622626B1/de not_active Expired - Lifetime
- 1994-04-15 ES ES94105882T patent/ES2139684T3/es not_active Expired - Lifetime
- 1994-04-15 DE DE59410066T patent/DE59410066D1/de not_active Expired - Lifetime
- 1994-04-15 EP EP01113369A patent/EP1130383B1/de not_active Expired - Lifetime
- 1994-04-15 DE DE59410388T patent/DE59410388D1/de not_active Expired - Lifetime
- 1994-04-22 JP JP6085118A patent/JP2594020B2/ja not_active Expired - Lifetime
- 1994-04-22 US US08/231,712 patent/US5489414A/en not_active Expired - Lifetime
- 1994-04-22 JP JP6085139A patent/JP2768899B2/ja not_active Expired - Lifetime
-
1995
- 1995-06-05 US US08/464,405 patent/US5645798A/en not_active Expired - Lifetime
-
1996
- 1996-03-01 US US08/609,166 patent/US5720924A/en not_active Expired - Lifetime
-
1997
- 1997-09-22 US US08/934,779 patent/US5863800A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE59410066D1 (de) | 2002-04-11 |
DE59410388D1 (de) | 2004-10-21 |
EP0622626B1 (de) | 2002-03-06 |
US5720924A (en) | 1998-02-24 |
EP1130383A1 (de) | 2001-09-05 |
DK0622119T3 (da) | 2000-04-10 |
EP1130383B1 (de) | 2004-09-15 |
US5489414A (en) | 1996-02-06 |
EP0622119A1 (de) | 1994-11-02 |
EP0622119B1 (de) | 1999-11-03 |
ES2139684T3 (es) | 2000-02-16 |
JP2768899B2 (ja) | 1998-06-25 |
DE59408870D1 (de) | 1999-12-09 |
ATE186232T1 (de) | 1999-11-15 |
US5645798A (en) | 1997-07-08 |
JPH06308115A (ja) | 1994-11-04 |
EP0622626A2 (de) | 1994-11-02 |
US5863800A (en) | 1999-01-26 |
EP0622626A3 (de) | 1995-01-25 |
JPH06313765A (ja) | 1994-11-08 |
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