JP2021019197A5 - - Google Patents

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Publication number
JP2021019197A5
JP2021019197A5 JP2020120378A JP2020120378A JP2021019197A5 JP 2021019197 A5 JP2021019197 A5 JP 2021019197A5 JP 2020120378 A JP2020120378 A JP 2020120378A JP 2020120378 A JP2020120378 A JP 2020120378A JP 2021019197 A5 JP2021019197 A5 JP 2021019197A5
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JP
Japan
Prior art keywords
insulating film
layer
insulating
metal oxide
film
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JP2020120378A
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English (en)
Japanese (ja)
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JP2021019197A (ja
JP7599859B2 (ja
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Publication of JP2021019197A publication Critical patent/JP2021019197A/ja
Publication of JP2021019197A5 publication Critical patent/JP2021019197A5/ja
Priority to JP2024211161A priority Critical patent/JP7813338B2/ja
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Publication of JP7599859B2 publication Critical patent/JP7599859B2/ja
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JP2020120378A 2019-07-19 2020-07-14 半導体装置 Active JP7599859B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2024211161A JP7813338B2 (ja) 2019-07-19 2024-12-04 半導体装置

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2019133334 2019-07-19
JP2019133334 2019-07-19

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2024211161A Division JP7813338B2 (ja) 2019-07-19 2024-12-04 半導体装置

Publications (3)

Publication Number Publication Date
JP2021019197A JP2021019197A (ja) 2021-02-15
JP2021019197A5 true JP2021019197A5 (https=) 2023-07-14
JP7599859B2 JP7599859B2 (ja) 2024-12-16

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ID=74171497

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JP2020120378A Active JP7599859B2 (ja) 2019-07-19 2020-07-14 半導体装置
JP2024211161A Active JP7813338B2 (ja) 2019-07-19 2024-12-04 半導体装置

Family Applications After (1)

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JP2024211161A Active JP7813338B2 (ja) 2019-07-19 2024-12-04 半導体装置

Country Status (5)

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US (3) US11211501B2 (https=)
JP (2) JP7599859B2 (https=)
KR (1) KR20210010333A (https=)
CN (1) CN112242448A (https=)
TW (2) TWI849170B (https=)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11211501B2 (en) * 2019-07-19 2021-12-28 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP7608159B2 (ja) * 2020-12-29 2025-01-06 京セラ株式会社 3次元表示装置および画像表示システム
CN112713235A (zh) * 2021-02-04 2021-04-27 曹建峰 一种基于金属基底的高温氮化铝压电传感器的制作方法
JP2024011504A (ja) * 2022-07-14 2024-01-25 株式会社ジャパンディスプレイ 半導体装置
TW202450128A (zh) * 2023-01-13 2024-12-16 日商半導體能源研究所股份有限公司 半導體裝置及其製造方法
JP2024121394A (ja) * 2023-02-27 2024-09-06 株式会社ジャパンディスプレイ 半導体装置
JP7724249B2 (ja) * 2023-03-24 2025-08-15 コネクテックジャパン株式会社 インプリント用マスターモールドの作製方法

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107591316B (zh) 2012-05-31 2021-06-08 株式会社半导体能源研究所 半导体装置
TWI644434B (zh) 2013-04-29 2018-12-11 日商半導體能源研究所股份有限公司 半導體裝置及其製造方法
US9590109B2 (en) * 2013-08-30 2017-03-07 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
KR102513517B1 (ko) 2015-07-30 2023-03-22 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 전자 기기
US9917207B2 (en) 2015-12-25 2018-03-13 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
CN114068724A (zh) 2016-01-29 2022-02-18 株式会社半导体能源研究所 半导体装置以及晶体管
KR102859159B1 (ko) 2016-02-18 2025-09-15 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 이의 제작 방법, 표시 장치, 및 전자 기기
CN106784014A (zh) * 2016-12-23 2017-05-31 京东方科技集团股份有限公司 薄膜晶体管及其制作方法、显示基板、显示装置
US10692994B2 (en) 2016-12-23 2020-06-23 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
JP6925819B2 (ja) 2017-02-17 2021-08-25 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP2018190753A (ja) 2017-04-28 2018-11-29 株式会社半導体エネルギー研究所 半導体装置、および表示装置
US11152512B2 (en) * 2017-05-19 2021-10-19 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, display device, and method for manufacturing semiconductor device
CN111033757B (zh) 2017-09-01 2024-04-26 株式会社半导体能源研究所 半导体装置及显示装置
US11069816B2 (en) * 2017-09-01 2021-07-20 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and display device
JP2019103054A (ja) 2017-12-06 2019-06-24 株式会社半導体エネルギー研究所 半導体装置、メモリモジュール及び電子機器
TWI852333B (zh) * 2017-12-07 2024-08-11 日商半導體能源研究所股份有限公司 半導體裝置以及半導體裝置的製造方法
US11482626B2 (en) * 2018-03-29 2022-10-25 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and manufacturing method of semiconductor device
US11211501B2 (en) * 2019-07-19 2021-12-28 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device

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