JPWO2021084369A5 - - Google Patents

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Publication number
JPWO2021084369A5
JPWO2021084369A5 JP2021553172A JP2021553172A JPWO2021084369A5 JP WO2021084369 A5 JPWO2021084369 A5 JP WO2021084369A5 JP 2021553172 A JP2021553172 A JP 2021553172A JP 2021553172 A JP2021553172 A JP 2021553172A JP WO2021084369 A5 JPWO2021084369 A5 JP WO2021084369A5
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JP
Japan
Prior art keywords
insulator
conductor
contact
semiconductor device
transistor
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Application number
JP2021553172A
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English (en)
Japanese (ja)
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JP7628956B2 (ja
JPWO2021084369A1 (https=
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Priority claimed from PCT/IB2020/059796 external-priority patent/WO2021084369A1/ja
Publication of JPWO2021084369A1 publication Critical patent/JPWO2021084369A1/ja
Publication of JPWO2021084369A5 publication Critical patent/JPWO2021084369A5/ja
Priority to JP2025013898A priority Critical patent/JP2025061974A/ja
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Publication of JP7628956B2 publication Critical patent/JP7628956B2/ja
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JP2021553172A 2019-11-01 2020-10-19 半導体装置 Active JP7628956B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2025013898A JP2025061974A (ja) 2019-11-01 2025-01-30 半導体装置

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2019200259 2019-11-01
JP2019200259 2019-11-01
JP2020068169 2020-04-06
JP2020068169 2020-04-06
PCT/IB2020/059796 WO2021084369A1 (ja) 2019-11-01 2020-10-19 半導体装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2025013898A Division JP2025061974A (ja) 2019-11-01 2025-01-30 半導体装置

Publications (3)

Publication Number Publication Date
JPWO2021084369A1 JPWO2021084369A1 (https=) 2021-05-06
JPWO2021084369A5 true JPWO2021084369A5 (https=) 2023-10-26
JP7628956B2 JP7628956B2 (ja) 2025-02-12

Family

ID=75715802

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2021553172A Active JP7628956B2 (ja) 2019-11-01 2020-10-19 半導体装置
JP2025013898A Pending JP2025061974A (ja) 2019-11-01 2025-01-30 半導体装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2025013898A Pending JP2025061974A (ja) 2019-11-01 2025-01-30 半導体装置

Country Status (6)

Country Link
US (2) US12376373B2 (https=)
JP (2) JP7628956B2 (https=)
KR (1) KR20220092517A (https=)
CN (1) CN114616681A (https=)
TW (1) TWI878367B (https=)
WO (1) WO2021084369A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7241068B2 (ja) * 2018-05-02 2023-03-16 株式会社半導体エネルギー研究所 半導体装置
JP7664171B2 (ja) 2019-11-08 2025-04-17 株式会社半導体エネルギー研究所 半導体装置
JP7710994B2 (ja) * 2019-12-27 2025-07-22 株式会社半導体エネルギー研究所 半導体装置
JP7629446B2 (ja) 2020-03-31 2025-02-13 株式会社半導体エネルギー研究所 半導体装置

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5046529B2 (ja) * 2005-02-25 2012-10-10 株式会社半導体エネルギー研究所 半導体装置
US7566633B2 (en) 2005-02-25 2009-07-28 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
JP5460108B2 (ja) * 2008-04-18 2014-04-02 株式会社半導体エネルギー研究所 半導体装置及び半導体装置の作製方法
KR101473684B1 (ko) 2009-12-25 2014-12-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR101809105B1 (ko) 2010-08-06 2017-12-14 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 집적 회로
TWI602303B (zh) 2011-01-26 2017-10-11 半導體能源研究所股份有限公司 半導體裝置及其製造方法
CN103348464B (zh) 2011-01-26 2016-01-13 株式会社半导体能源研究所 半导体装置及其制造方法
WO2012102182A1 (en) 2011-01-26 2012-08-02 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR20250154556A (ko) 2012-07-20 2025-10-28 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치, 및 표시 장치를 포함하는 전자 장치
JP6219562B2 (ja) 2012-10-30 2017-10-25 株式会社半導体エネルギー研究所 表示装置及び電子機器
US9397153B2 (en) 2013-09-23 2016-07-19 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
KR20210039507A (ko) * 2014-11-28 2021-04-09 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 모듈, 및 전자 기기
KR20170096956A (ko) 2016-02-17 2017-08-25 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치, 전자 기기
JP6968567B2 (ja) * 2016-04-22 2021-11-17 株式会社半導体エネルギー研究所 半導体装置の作製方法
CN109791950A (zh) * 2016-10-21 2019-05-21 株式会社半导体能源研究所 半导体装置
JP2019047101A (ja) * 2017-09-05 2019-03-22 株式会社半導体エネルギー研究所 半導体装置、および半導体装置の作製方法
US11152513B2 (en) * 2017-09-05 2021-10-19 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing semiconductor device
JP7229669B2 (ja) * 2017-11-17 2023-02-28 株式会社半導体エネルギー研究所 半導体装置、および半導体装置の作製方法
TWI852333B (zh) 2017-12-07 2024-08-11 日商半導體能源研究所股份有限公司 半導體裝置以及半導體裝置的製造方法

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