JP2020527702A - マザーボードとドーターボードとの間に焼結接続を備えるテストフィクスチャ - Google Patents
マザーボードとドーターボードとの間に焼結接続を備えるテストフィクスチャ Download PDFInfo
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- YCKOAAUKSGOOJH-UHFFFAOYSA-N copper silver Chemical compound [Cu].[Ag].[Ag] YCKOAAUKSGOOJH-UHFFFAOYSA-N 0.000 description 1
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- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
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- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2889—Interfaces, e.g. between probe and tester
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2834—Automated test systems [ATE]; using microprocessors or computers
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/11—Printed elements for providing electric connections to or between printed circuits
- H05K1/111—Pads for surface mounting, e.g. lay-out
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/14—Structural association of two or more printed circuits
- H05K1/142—Arrangements of planar printed circuit boards in the same plane, e.g. auxiliary printed circuit insert mounted in a main printed circuit
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/14—Structural association of two or more printed circuits
- H05K1/144—Stacked arrangements of planar printed circuit boards
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/36—Assembling printed circuits with other printed circuits
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/36—Assembling printed circuits with other printed circuits
- H05K3/368—Assembling printed circuits with other printed circuits parallel to each other
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/4007—Surface contacts, e.g. bumps
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/14—Structural association of two or more printed circuits
- H05K1/141—One or more single auxiliary printed circuits mounted on a main printed circuit, e.g. modules, adapters
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09009—Substrate related
- H05K2201/09036—Recesses or grooves in insulating substrate
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09145—Edge details
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09818—Shape or layout details not covered by a single group of H05K2201/09009 - H05K2201/09809
- H05K2201/09845—Stepped hole, via, edge, bump or conductor
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/11—Treatments characterised by their effect, e.g. heating, cooling, roughening
- H05K2203/1131—Sintering, i.e. fusing of metal particles to achieve or improve electrical conductivity
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
本明細書において銅パッドが記載されているが、例えば、他の実施例が、アルミニウム、金、ニッケルなど、パッドのためのその他のタイプの金属を用いてもよい。
Claims (13)
- テストフィクスチャであって、
テストステーションに結合するように構成される第1のテスト信号線を有するマザーボードであって、前記第1のテスト信号線に結合される第1のコンタクトパッドを含む、前記マザーボード、及び
ドーターボードであって、前記ドーターボード上の第2のコンタクトパッドに結合される第2のテスト信号線を有する、前記ドーターボード、
を含み、
第2のコンタクトパッドが、前記第1のコンタクトパッドと整合し、焼結結合によって前記第1のコンタクトパッドに結合される、
テストフィクスチャ。 - 請求項1に記載のテストフィクスチャであって、前記マザーボードが、前記ドーターボードに外接する窪んだ領域を有する、テストフィクスチャ。
- 請求項2に記載のテストフィクスチャであって、前記ドーターボードの頂部表面が、前記マザーボードの頂部表面とほぼ同一平面上にある、テストフィクスチャ。
- 請求項2に記載のテストフィクスチャであって、窪んだ領域が或る深さを有し、前記ドーターボードが、前記窪んだ領域の前記深さにほぼ等しい厚みを有する、テストフィクスチャ。
- 請求項2に記載のテストフィクスチャであって、前記ドーターボードが、窪んだ領域を有し、前記マザーボード上の前記窪んだ領域と係合するように構成される、テストフィクスチャ。
- 請求項5に記載のテストフィクスチャであって、前記マザーボード上の前記窪んだ領域が或る深さを有し、前記ドーターボードが、前記マザーボード上の前記窪んだ領域の前記深さより大きい厚みを有する、テストフィクスチャ。
- テストフィクスチャであって、
テストステーションに結合するように構成される第1のテスト信号線を有するマザーボードであって、前記第1のテスト信号線に結合される第1のコンタクトパッドを含む、前記マザーボード、及び
ドーターボードであって、前記ドーターボード上の第2のコンタクトパッドに結合される第2のテスト信号線を有する、前記ドーターボード、
を含み、
第2のコンタクトパッドが、前記第1のコンタクトパッドと整合し、焼結結合によって前記第1のコンタクトパッドに結合され、
前記マザーボードが、前記ドーターボードに外接する窪んだ領域を有する、
テストフィクスチャ。 - 請求項7に記載のテストフィクスチャであって、前記窪んだ領域が或る深さを有し、前記ドーターボードが前記窪んだ領域の前記深さにほぼ等しい厚みを有する、テストフィクスチャ。
- 請求項7に記載のテストフィクスチャであって、前記ドーターボードが、窪んだ領域を有し、前記マザーボード上の前記窪んだ領域と係合するように構成される、テストフィクスチャ。
- 請求項9に記載のテストフィクスチャであって、前記マザーボード上の前記窪んだ領域が或る深さを有し、前記ドーターボードが、前記マザーボード上の前記窪んだ領域の前記深さより大きい厚みを有する、テストフィクスチャ。
- テストフィクスチャをつくるための方法であって、
マザーボード上のコンタクトパッド上、及び/又は、ドーターボード上のコンタクトパッド上に導電性粒子を堆積させること、
前記ドーターボード上の前記コンタクトパッドが前記マザーボード上の前記コンタクトパッドと整合するように、前記マザーボード上に前記ドーターボードを位置決めすること、及び
前記ドーターボード上の前記コンタクトパッドと前記マザーボード上の前記コンタクトパッドとの間に結合を形成するため、前記導電性粒子を焼結すること、
を含む、方法。 - 請求項11に記載の方法であって、前記マザーボードが、窪んだ領域を含み、前記ドーターボードを位置決めすることが、前記ドーターボードの頂部表面が前記マザーボードの頂部表面とほぼ同一平面上にあるように、前記ドーターボードを前記窪んだ領域と係合させることを含む、方法。
- 請求項11に記載の方法であって、前記マザーボード及び前記ドーターボードを、前記導電性粒子を含むバルク材料の融点未満の温度まで加熱することによって、焼結が行われる、方法。
Applications Claiming Priority (3)
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US15/644,817 | 2017-07-09 | ||
US15/644,817 US20190011497A1 (en) | 2017-07-09 | 2017-07-09 | Test Fixture with Sintered Connections Between Mother Board and Daughter Board |
PCT/US2018/041297 WO2019014132A1 (en) | 2017-07-09 | 2018-07-09 | TEST ASSEMBLY COMPRISING SINTEEN CONNECTIONS BETWEEN A MOTHER CARD AND A GIRL CARD |
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JP2020527702A true JP2020527702A (ja) | 2020-09-10 |
JP7339237B2 JP7339237B2 (ja) | 2023-09-05 |
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US (1) | US20190011497A1 (ja) |
JP (1) | JP7339237B2 (ja) |
KR (1) | KR20200033843A (ja) |
CN (1) | CN111065930A (ja) |
WO (1) | WO2019014132A1 (ja) |
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CN110380273A (zh) * | 2019-07-24 | 2019-10-25 | 维沃移动通信有限公司 | 一种电路板组件及终端设备 |
CN110996512B (zh) * | 2019-12-30 | 2022-03-04 | 展讯通信(上海)有限公司 | 一种印制电路板及其制作方法、终端 |
CN112083199A (zh) * | 2020-09-11 | 2020-12-15 | 中国航空工业集团公司雷华电子技术研究所 | 一种接口适配器 |
US20240206066A1 (en) * | 2022-12-20 | 2024-06-20 | Qualcomm Incorporated | Hybrid circuit board device to support circuit reuse and method of manufacture |
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JP7339237B2 (ja) | 2023-09-05 |
KR20200033843A (ko) | 2020-03-30 |
US20190011497A1 (en) | 2019-01-10 |
CN111065930A (zh) | 2020-04-24 |
WO2019014132A1 (en) | 2019-01-17 |
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